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1. 发明申请

WO0131286A3 METHOD AND DEVICE FOR NON-DESTRUCTIVE INSPECTION OF OBJECTS BY MEANS OF OPTICAL HOLOGRAPHIC INTERFEROMETRY 审中-公开
标题翻译：通过光学全息干涉法对物体进行非破坏性检测的方法和装置
公开(公告)号：WO0131286A3
公开(公告)日：2001-11-01
申请号：PCT/NO0000346
申请日：2000-10-18
申请人： HOLOTECH AS
发明人： FJELDSTAD JOHN PETTER , FJELDSTAD IRINA EVGENIEVNA , LOBANOV LEONID MIKHAILOVICH , PIVTORAK VJACHESLAV AVTONOMOVI , KUVSHINSKY NIKOLAY GEORGIEVICH , DAVIDENKO NIKOLAY ALEKSANDROVI , KUSHNIRUK VLADIMIR PETROVICH , KROTENKO PETER DMITRIEVICH , PAVLOV VALERIY ALEKSANDROVICH , TKACHUK GALINA IVANOVNA
IPC分类号： G01B9/02 , G01B11/16 , G01B11/30 , G01N21/88 , G01B9/021
CPC分类号： G01B11/164
摘要： This invention relates to a method and device for non-destructive inspection by means of holographic interferometry of details, machine units, mechanisms, and various materials, which eliminates the problem of relative displacement of the object with regard to the holographic equipment, especially due to vibratory motion of the object. This is achieved by transporting the reference and object beams between the investigated object, light source, and interferometer in flexible wave guidance cables and that the endpoints of the flexible wave guidance cables are securely attached in a fixed distance from the investigated object, recording medium of the interferometer and light source, respectively. This will also give the benefit of dividing the holographic interferometer into an object part and a registering part which forms the interferograms. Thus it becomes possible to perform measurements on objects in situ under any weather condition while the sensitive recording equipment of the holographic interferometer can be operated in a distant protected location.
摘要翻译：本发明涉及通过全息干涉测量细节，机器单元，机构和各种材料进行非破坏性检查的方法和装置，其消除了物体相对于全息设备的相对位移问题，特别是由于物体的振动运动。这是通过在受检对象，光源和干涉仪之间传输参考物体和物体光束在柔性波导引导电缆中实现的，并且柔性波导引缆索的端点与被检查物体，记录介质的固定距离牢固地连接干涉仪和光源。这也将有利于将全息干涉仪分成物体部分和形成干涉图的配准部分。因此，在全息干涉仪的敏感记录设备可以在遥远的受保护的位置中操作的情况下，可以在任何天气条件下在现场对物体进行测量。

2. 发明申请

WO1987007365A1 APPARATUS AND METHOD FOR DETERMINING STRESS AND STRAIN IN PIPES, PRESSURE VESSELS, STRUCTURAL MEMBERS AND OTHER DEFORMABLE BODIES 审中-公开
标题翻译：用于确定管道，压力容器，结构构件和其他可变体的应力和应变的装置和方法
公开(公告)号：WO1987007365A1
公开(公告)日：1987-12-03
申请号：PCT/US1986001124
申请日：1986-05-23
申请人： VACHON, Reginald, I. , RANSON, William, F.
IPC分类号： G01B11/16
CPC分类号： G01B11/164 , G01L1/24
摘要： A method and apparatus for measuring stress and strain associated with a pipe, pressurized vessel (12), structural member or deformable body containing a flaw or stress concentration utilizes a laser beam (18) to illuminate a surface (14) being analyzed and an optical data digitizer (20) to sense a signal provided by a speckle pattern produced by the light beam reflected from the illuminated surface. One signal is received from the surface (14) in a reference condition and subsequent signals are received from the surface (14) after surface deformation. The optical data digitizer (20) provides the received signal to an image processor (98), and the processor stores the signals and correlates the deformed image received with the reference image and then sends this correlated information to a minicomputer (28) which performs mathematical analyses of the signal to determine stress and strain associated with the surface. The apparatus is constructed as one integral unit (34), and further includes a digital and tape display (30), as well as a television monitor (26) and an electro-optic range indicator (23).
摘要翻译：用于测量与管道，加压容器（12），结构构件或包含缺陷或应力集中的可变形体相关的应力和应变的方法和装置利用激光束（18）照射被分析的表面（14）和光学数据数字转换器（20），用于感测由被照射表面反射的光束产生的斑纹图案提供的信号。在参考条件下从表面（14）接收一个信号，并且在表面变形之后从表面（14）接收后续的信号。光学数据数字化仪（20）将接收到的信号提供给图像处理器（98），并且处理器存储信号并将接收到的变形图像与参考图像相关联，然后将该相关信息发送到小型计算机（28），该小型计算机执行数学分析信号以确定与表面相关的应力和应变。该装置被构造为一个整体单元（34），并且还包括数字和磁带显示器（30）以及电视监视器（26）和电光范围指示器（23）。

3. 发明申请

WO1987007363A1 A METHOD FOR MONITORING THE MANUFACTURE OF A PRODUCT 审中-公开
标题翻译：监测产品制造的方法
公开(公告)号：WO1987007363A1
公开(公告)日：1987-12-03
申请号：PCT/SE1987000232
申请日：1987-05-12
申请人： DIRTOFT, Ingegerd
IPC分类号： G01B09/021
CPC分类号： G01B11/164
摘要： A method for monitoring a product under manufacture for possible deformation or changes in shape. In accordance with the method there is produced at given time intervals a series of product images from which the rate at which possible changes in shape or deformation take place in time can be estimated or evaluated. These estimated values relating to the rate of deformation and the rate of progressive changes therein are extrapolated so as to obtain the final value of the deformation of the product in relation to the state or form of the product immediately subsequent to the time of its manufacture. The process of manufacture is controlled on the basis of this final value, and the product is preferably cooled forcibly prior to producing the series of images.
摘要翻译：一种用于监测制造商品的可能变形或形状变化的方法。根据该方法，可以以给定的时间间隔产生一系列产品图像，可以从其中及时发生形状或变形的可能变化的速率。这些与变形率有关的估计值和其逐渐变化的速率被外推，以便在其制造时间之后立即获得与产品的状态或形式相关的产品变形的最终值。基于该最终值控制制造过程，并且在产生一系列图像之前优选强制地冷却产品。

4. 发明申请

WO02035180A1 METHOD AND DEVICE FOR NON-DESTRUCTIVE REAL-TIME MEASUREMENTS OF RESIDUAL STRESSES IN PLANAR AND NON-PLANAR OBJECTS 审中-公开
标题翻译：用于平面和非平面对象中残留应力的非破坏性实时测量的方法和装置
公开(公告)号：WO02035180A1
公开(公告)日：2002-05-02
申请号：PCT/NO2001/000424
申请日：2001-10-23
IPC分类号： G01B9/021 , G01B11/16 , G01L1/24 , G01L5/00
CPC分类号： G01L1/24 , G01B9/021 , G01B11/164 , G01L5/0047
摘要： Method and device for performing non-destructive measurements of residual stresses in an investigation area of an object based on use of optical holographic interferometry technique. The holographic interferometer is divided into a holographic probe which contains means for illuminating the investigation area of the object by coherent light, collecting the coherent light that scatters off this investigation area and means for performing a non-destructive dislocation release pulse of the residual stresses in a small region of the investigation area by exposing the object to an electric high currency, and a holographic camera which contains means for formation, registration, and development of a hologram and for formation of an interferogram of the investigation area of the object. The object coherent light is sent from the light source to the probe by a single-mode light guidance cable, from the probe to the holographic camera by an other single-mode light guidance cable, and the reference coherent light from the light source to the holographic camera in a third single-mode light guidance cable. In this way, one is allowed to measure residual stresses on surfaces of an object with high curvatures, in hardly accessible places, and under many weather conditions by a simple hand-held manual positioning of the holographic probe during the measurements.
摘要翻译：基于使用光学全息干涉测量技术对物体的研究区域中的残余应力进行非破坏性测量的方法和装置。全息干涉仪被分为全息探头，其包含用于通过相干光照射物体的调查区域的装置，收集从该调查区域散射的相干光，以及用于执行残余应力的非破坏性位错释放脉冲的装置调查区域的小区域通过将对象暴露于电高货币，以及全息照相机，其包含用于形成，配准和显影全息图以及用于形成对象的调查区域的干涉图的装置。物体相干光通过单模光引导电缆从光源发送到探头，通过另一单模光引导电缆从探头到全息摄像机，以及从光源到参考相干光的参考相干光全息摄像机在第三单模光导电缆中。以这种方式，允许测量具有高曲率的物体的表面上的残余应力，在难以接近的地方，并且在许多天气条件下，通过在测量期间通过简单的手持式手动定位全息探头来测量残余应力。

5. 发明申请

WO1995001548A1 SHEARING OPTICAL ELEMENT FOR INTERFEROMETRIC ANALYSIS SYSTEM 审中-公开
标题翻译：用于干涉分析系统的剪切光学元件
公开(公告)号：WO1995001548A1
公开(公告)日：1995-01-12
申请号：PCT/US1994007253
申请日：1994-06-24
申请人： GRANT ENGINEERING, INC.
发明人： GRANT ENGINEERING, INC. , GRANT, Ralph, M. , WRIGHT, Forrest
IPC分类号： G01B09/02
CPC分类号： G01B11/164
摘要： Method and apparatus for analyzing the deformation of an object (20) resulting from the application of stress. A novel optical element is used to perform shearometric analysis upon a test object. The novel optical element has an overall pattern of first and second pluralities of regions having significantly different indices of transmissivity (22). The pattern of variations causes pairs of light rays which are reflected from two distinct points (P1, P2) on the test object at a divergent angle to emerge from the optical element so that they are nearly parallel. The nearly parallel rays are then received upon a photoelectrical sensing means (24) such as video camera or photoelectric array.
摘要翻译：用于分析由应力引起的物体（20）的变形的方法和装置。一种新的光学元件用于对测试对象进行测湿分析。新颖的光学元件具有第一和第二多个区域的总体图案，其具有显着不同的透射率（22）。变化的图案使得从发光角度检测对象上的两个不同点（P1，P2）反射的光线对从光学元件出射，使得它们几乎平行。然后，近似平行的光线被接收在诸如摄像机或光电阵列的光电检测装置（24）上。

6. 发明申请

WO1994017362A1 NON-DESTRUCTIVE INSPECTION METHOD FOR MECHANICAL BEHAVIOUR OF ARTICLE WITH LOAD, ITS JUDGEMENT METHOD AND APPARATUS 审中-公开
标题翻译：非负载检测方法，用于装载物品的机械性能，其判断方法和装置
公开(公告)号：WO1994017362A1
公开(公告)日：1994-08-04
申请号：PCT/JP1993001424
申请日：1993-10-05
申请人： KABUSHIKIGAISYA HUTECH , ROSSIYSKIY MATERIALOVEDCHESKIY CENTR , PANIN, Victor Yevgenievich , ZUEV, Lev Borisovich , MAKAROV, Pavel Vasilyevich , YEGORUSHKIN, Valery Efimovich , GORBATENKO, Vadim Vladimirovich , DANILOV, Vladimir Ivanovich
发明人： KABUSHIKIGAISYA HUTECH , ROSSIYSKIY MATERIALOVEDCHESKIY CENTR
IPC分类号： G01B11/16
CPC分类号： G01N3/068 , G01B11/164 , G01L1/24 , G01N2203/0647
摘要： This invention inspects non-destructively the mechanical behavior of an article, to which a load is applied, on the basis of analysis of spatial and time distribution of elastoplastic deformation and a rotary displacement speed. Optical images of the surfaces of an object of inspection are taken as holographic images, and they are superimposed in predetermined short intervals of time to obtain a diffraction image. The diffraction image is converted to a wave pattern of a spatial and time distribution of deformation and rotary displacement in a predetermined axial direction. The resulting distribution is analyzed on the wave theory of plasticity and strength, and the wavelength, amplitude and velocity of a mitigation wave of plastic deformation are determined. The timing and place of destruction which will occur in future are predicted from these wave parameters.
摘要翻译：本发明基于弹塑性变形的空间和时间分布以及旋转位移速度的分析，非破坏地检查施加了载荷的制品的机械性能。将检查对象的表面的光学图像作为全息图像，并且以预定的短时间间隔叠加以获得衍射图像。衍射图像被转换成在预定轴向上的变形和旋转位移的空间和时间分布的波形图案。对塑性和强度波理论进行分析，确定塑性变形缓和波的波长，振幅和速度。将来会发生的破坏的时间和地点由这些波形参数预测。

7. 发明申请

WO2011144333A1 MIKROFEROSKOP 审中-公开
公开(公告)号：WO2011144333A1
公开(公告)日：2011-11-24
申请号：PCT/EP2011/002480
申请日：2011-05-18
申请人： FACHHOCHSCHULE TRIER , SCHUTH, Michael , ROBERT, Dietmar , NÄGEL, Daniel
发明人： SCHUTH, Michael , ROBERT, Dietmar , NÄGEL, Daniel
IPC分类号： G01B9/02 , G01B11/24
CPC分类号： G01B11/164 , G01B9/0201 , G01B9/02072 , G01B9/02095
摘要： Die Erfindung betrifft optische Messsysteme und optische Messverfahren basierend auf Digital-Holografie zur Messung zumindest einer Komponente der Verformung und/oder Dehnung eines Messobjekts in zumindest einer vorgegebenen oder vorgebbaren Richtung mittels Digital-Holographie. Das optische Messsystem umfasst eine Digital-Holographie Vorrichtung (12, 12-1, 12-2, 12-3) zum Beleuchten eines Abtastbereichs eines Messobjekts, welche eine out-of-plane und/oder eine in-plane Digital-Holographie Anordnung mit zumindest zwei kohärenten Strahlen aufweist, und ein Mikroskopobjektiv (24) dessen optische Achse im Wesentlichen parallel zu einer vertikalen Richtung ist und welches in dem optischen Pfad des zumindest einen Teils des vom Messobjekt (22) reflektierten Lichts angeordnet ist, wobei, wenn gesehen in der vertikalen Richtung, die Digital-Holographie Vorrichtung (12, 12-1, 12-2, 12-3) unterhalb oder oberhalb des Mikroskopobjektivs (24) und/oder eines Mikroskopgrundkörpers angeordnet ist.
摘要翻译：本发明涉及一种基于数字全息用于通过数字全息来测量测试对象的变形和/或伸长率的至少一个部件中的至少一个预定的或可预定方向的光学测量系统和光学测量方法。光学测量系统包括用于与测量对象物的扫描范围照明的数字全息装置（12，12-1,12-2，12-3）其中外的平面和/或面内数字全息装置具有至少两个相干光束，和一个显微镜物镜（24），其光轴基本上平行于垂直方向和光配置在测定对象物（22），其中，当在可见的至少一部分的光路，其反射垂直方向上，上述数字全息装置（12，12-1,12-2，12-3）设置的下方或上方的显微镜物镜（24）和/或显微镜主体。

8. 发明申请

WO01095037A2 DEVICE FOR REGISTRATION OF OPTICAL HOLOGRAMS ON THE AMORPHOUS MOLECULAR SEMICONDUCTOR FILMS 审中-公开
标题翻译：用于在非晶分子半导体膜上注册光学器件的装置
公开(公告)号：WO01095037A2
公开(公告)日：2001-12-13
申请号：PCT/NO2001/000237
申请日：2001-06-08
IPC分类号： G01B11/16 , G03H1/02 , G03H1/18 , G11B7/0065
CPC分类号： G03H1/02 , G01B11/164 , G03H2001/0264 , G03H2001/0268 , G03H2260/53
摘要： This invention relates to the field of holography, in particular to a method and a device for recording optical holograms by means of amorphous molecular semiconductor (AMS) films deposited on a glass substrate pre-covered with a transparent electric conducting sub-layer. More precisely, the invention relates to a method and device for registering optical holograms on AMS-films which operates in such a way that the AMS-films possess the maximum achievable information parameters: Holographic sensitivity, optimal spatial frequency of the transmitted characteristic, band parameters for the spatial frequencies of the transmitted characteristic, "signal-to-noise" ratio in the restored holographic image, reference and object beam intensities ratio during hologram registration, and cycling ability. It is also an advantage that the device provides optimal operation efficiency of the registering media based on AMS-films, and restricts the development and erasing of the hologram upon reaching the pre-set value of the diffraction efficiency measured in the zeroth order of diffraction. The latter makes the device a universal device.
摘要翻译：本发明涉及全息术领域，特别涉及一种通过沉积在预先覆盖有透明导电子层的玻璃衬底上的非晶分子半导体（AMS）膜来记录光学全息图的方法和装置。更确切地说，本发明涉及用于在AMS膜上配准光学全息图的方法和装置，其操作使得AMS膜具有最大可实现的信息参数：全息灵敏度，传输特性的最佳空间频率，频带参数对于传输特性的空间频率，恢复的全息图像中的“信噪比”，全息对准期间的参考和物体光束强度比以及循环能力。还有一个优点是器件提供了基于AMS薄膜的配准介质的最佳操作效率，并且在达到以衍射次数测量的衍射效率的预设值时限制了全息图的显影和擦除。后者使该设备成为通用设备。

9. 发明申请

WO1992011506A1 STRUCTURAL EXAMINATION USING HOLOGRAPHIC INTERFEROMETRY 审中-公开
标题翻译：使用全息图进行结构检查
公开(公告)号：WO1992011506A1
公开(公告)日：1992-07-09
申请号：PCT/AU1991000595
申请日：1991-12-20
申请人： UNISEARCH LIMITED , BAIRD, John, Patrick , CLARK, Robert, Keith
发明人： UNISEARCH LIMITED
IPC分类号： G01B09/021
CPC分类号： G01B11/164 , G01B9/021
摘要： In-situ, nondestructive examination to test the efficacy of a rivetted, bolted or bonded join of metal sheets (10, 11), or to test whether a composite material is faulted, or to test whether a multi-layer patch is bonded properly, involves the creation of an interferometric hologram. A photographic film or plate (20) is mounted closely above, and isolated vibrationally from a region (21) of a structure containing the join, composite material or patch. The film or plate is illuminated by the expanded beam (26) from a laser (24) firstly when the structure is in a first state of stress, and secondly when the structure is in a second state of stress (the change in stress being sufficient to deform the region over which the film or plate is mounted). At each illumination, a diffraction pattern is produced in the emulsion of the plate or film by interference between the illuminating beam and that part of it which is reflected from the region. The two diffraction patterns combine to produce a fringe pattern in the emulsion. That fringe pattern, when compared with the fringe pattern produced by a good join or a non-faulted composite body or patch, provides information about the region under investigation. The technique is especially useful for testing the joins in the skin of an aircraft fuselage, or potentially damaged composite structures.
摘要翻译：进行非破坏性检查，以测试金属板（10,11）的铆接，螺栓连接或粘合连接的功效，或测试复合材料是否发生故障，或测试多层贴片是否正确连接，涉及创建干涉全息图。照相胶片或印版（20）紧密地安装在上方，并从包含接合，复合材料或贴片的结构的区域（21）振动分离。首先当结构处于第一应力状态时，薄膜或板被来自激光器（24）的膨胀梁（26）照亮，其次当该结构处于第二应力状态时（应力的变化是足够的以使安装薄膜或板的区域变形）。在每个照明下，通过照射光束和从该区域反射的部分之间的干涉，在板或膜的乳液中产生衍射图案。两种衍射图案结合在乳液中产生条纹图案。当与良好连接或非断层复合体或贴片产生的边缘图案相比时，该条纹图案提供关于被调查区域的信息。该技术对于测试飞机机身皮肤中的连接或潜在的损坏的复合结构特别有用。

10. 发明申请

WO2004081491A1 METHOD AND DEVICE FOR DETERMINATION OF RESIDUAL STRESSES 审中-公开
标题翻译：用于确定残余应力的方法和装置
公开(公告)号：WO2004081491A1
公开(公告)日：2004-09-23
申请号：PCT/SE2004/000356
申请日：2004-03-10
申请人： AGELLIS AB
发明人： DAVIDENKO, Nikolay Alexandrovich , FJELDSTAD, Irina, Evgenievna , PAVLOV, Valeriy Aleksandrovich , KUVSHINSKIY, Nikolay Georgievich
IPC分类号： G01B9/021
CPC分类号： G01L5/0047 , G01B9/021 , G01B11/164 , G01L1/24
摘要： A method and device for nondestructive testing of objects such as machine units and mechanisms, of various materials, and in particular, to a method and device for nondestructive determination of residual stresses which are based on an optical holographic interferometry technique. First, a hologram of the investigation area of the object in its initial state is registered. Then a release of the residual stresses in an investigation point in the investigation area is performed by exposing the surface of the object to a high-current electric pulse and applying a small mechanical pressure. Finally, an interferogram of exactly the same area of the object is made, and the residual stresses at the investigation area are determined from the shape and size of the fringes in the interferogram.
摘要翻译：用于对诸如机械单元和各种材料的机构进行非破坏性测试的方法和装置，特别是用于基于光学全息干涉测量技术的残余应力的非破坏性测定的方法和装置。首先，记录对象在其初始状态的调查区域的全息图。然后通过将物体的表面暴露于高电流电脉冲并施加小的机械压力来进行调查区域中的调查点中的残余应力的释放。最后，进行与物体完全相同面积的干涉图，并且根据干涉图中条纹的形状和大小来确定调查区域的残余应力。

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