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    • 1. 发明申请
    • SPECTRAL DETECTION FOR IMAGING SYSTEM INCLUDING A MICROMIRROR ARRAY
    • 用于成像系统的光谱检测,包括微型扫描阵列
    • WO2015156782A1
    • 2015-10-15
    • PCT/US2014/033336
    • 2014-04-08
    • PANDATA RESEARCH LLC
    • G01J3/02G01J3/28G01J3/14G01J3/457
    • G01J3/2823G01J3/021G01J3/0229G01J3/14G01J3/457
    • An optical system includes a micromirror array, conjugate to a sample and disposed in incident and/or return optical paths to/from the sample. Micromirrors in the array are imaged onto corresponding lateral locations on the sample. The micromirrors are modulated at unique assigned frequencies. Imaging optics produce a modulated image of the sample at a multi-pixel detector. The image is dispersed in one dimension by a spectrally dispersive element in the return optical path. The detector pixels produce time-varying electrical signals. Lock-in amplifiers or a Fast Fourier Transform module spectrally analyze the time-varying electrical signals. Signal amplitudes at the assigned frequencies determine how much light from a particular lateral location at the sample is present at each detector pixel. The signal amplitudes along the spectral direction, referenced to the lateral location, provide a wavelength spectrum of the sample at the particular lateral location.
    • 光学系统包括微镜阵列,与样品共轭并且设置在到/从样品的入射和/或返回光路中。 阵列中的微镜被成像到样品上相应的横向位置上。 微镜以独特的分配频率进行调制。 成像光学器件在多像素检测器处产生样本的调制图像。 图像通过在返回光路中的光谱色散元件在一个维度上分散。 检测器像素产生时变电信号。 锁定放大器或快速傅里叶变换模块对时变电信号进行光谱分析。 在分配频率处的信号幅度决定了在每个检测器像素处存在来自样品的特定横向位置的光量。 参考横向位置沿着光谱方向的信号幅度在特定的横向位置提供样品的波长谱。
    • 2. 发明申请
    • OPTICAL DETECTION SYSTEM INCLUDING A MICROMIRROR ARRAY
    • 包括微型扫描阵列的光学检测系统
    • WO2015156783A1
    • 2015-10-15
    • PCT/US2014/033340
    • 2014-04-08
    • PANDATA RESEARCH LLC
    • G02B21/00
    • G02B21/008G02B21/0032
    • A detection system includes a micromirror array, conjugate to a desired depth below the surface of a sample, in incident and/or return optical paths. The micromirrors in the array are modulated at unique assigned frequencies that can be within a single octave. An optical detector in the return optical path produces an electrical signal that can be spectrally analyzed to determine a sample reflectivity as a function of lateral location on the micromirror array. In a confocal configuration, signal amplitudes at the assigned frequencies, within the single octave, correspond to light rays striking the same micromirror twice, and represent light reflected from the desired depth. Signals at frequencies outside the single octave correspond to light rays striking two different micromirrors, which receive modulation at two different frequencies in the same octave and therefore heterodyne out of the octave, and represent light reflected from depths other than the desired depth.
    • 检测系统包括在入射和/或返回光路中与样品表面下方的期望深度共轭的微镜阵列。 阵列中的微镜在独特的分配频率下进行调制,可以在单个八度范围内。 返回光路中的光学检测器产生可以被光谱分析的电信号,以确定作为微镜阵列上的横向位置的函数的样本反射率。 在共焦配置中,在单倍频程内的分配频率处的信号幅度对应于撞击相同微镜两次的光线,并且表示从期望深度反射的光。 在单个八度音频之外的频率处的信号对应于照射两个不同微镜的光线,其接收在相同八度中的两个不同频率处的调制,并且因此在八度音程内接收外差,并且表示从期望深度以外的深度反射的光。
    • 3. 发明申请
    • OPTICAL MEASUREMENT SYSTEM HAVING AN INTEGRATED INTERNAL REFLECTION ELEMENT AND ARRAY DETECTOR
    • 具有集成内部反射元件和阵列检测器的光学测量系统
    • WO2015156777A1
    • 2015-10-15
    • PCT/US2014/033321
    • 2014-04-08
    • PANDATA RESEARCH LLC
    • A61B5/145A61B5/1455G01N21/35G01N21/55
    • A61B5/1455A61B5/0075A61B5/14532A61B2562/046G01N21/552
    • A prism is configured to receive a collimated beam and propagate an internal beam that follows a path having multiple reflections inside the prism. The multiple reflections occur among an ATR face, a detector face, and a high-reflectance face of the prism. An angle between a surface normal of the high-reflectance face and a surface normal of the ATR face is equal to an angle between a surface normal of the detector face and the surface normal of the ATR face. The surface normals of the ATR face, the detector face, and the high-reflectance face are all coplanar. An array detector is fixedly attached to the prism proximate the detector face to sense an internal position of the internal beam and an intensity of the internal beam for each reflection of the internal beam off the detector face.
    • 棱镜被配置为接收准直光束并且传播沿着在棱镜内部具有多个反射的路径的内部光束。 在ATR面,检测器面和棱镜的高反射面之间发生多次反射。 高反射面的表面法线与ATR面的表面法线之间的角度等于检测器面的表面法线与ATR面的表面法线之间的角度。 ATR面,检测器面和高反射面的表面法线都是共面的。 阵列检测器固定地附接到靠近检测器面的棱镜,以感测内部光束的内部位置和内部光束的强度,用于内部光束的每次反射离开检测器面。
    • 5. 发明申请
    • OPTICAL DETECTION SYSTEM INCLUDING AT LEAST ONE OF A MODULATED SOURCE OR MODULATED DETECTOR
    • 包括至少一个调制源或调制探测器的光学检测系统
    • WO2015156780A1
    • 2015-10-15
    • PCT/US2014/033331
    • 2014-04-08
    • PANDATA RESEARCH LLC
    • G02B21/00
    • G02B21/0032G02B21/008
    • An optical system optically characterizes a sample. The optical system includes an incident optical path, extending from a light source to the sample, and a return optical path, extending from the sample to a detector. The optical system assigns unique frequencies to lateral locations on the sample, modulates light for each lateral location at the corresponding assigned frequency, and spectrally analyzes electrical signals produced by pixels at the detector to determine how much light from a particular lateral location at the sample is present at each detector pixel. In some configurations, the system can detect confocally by performing modulation twice, in two of the following four locations: at the light source, in the incident optical path at a modulator between the light source and the sample, in the return optical path at a modulator between the sample and the detector, or at the detector.
    • 光学系统光学地表征样品。 光学系统包括从光源延伸到样品的入射光路,以及从样品延伸到检测器的返回光路。 光学系统为样本上的横向位置分配唯一的频率,以相应的分配频率调制每个横向位置的光,并对分析由检测器上的像素产生的电信号进行频谱分析,以确定来自样品的特定侧向位置的光量是 存在于每个检测器像素处。 在一些配置中,系统可以通过在以下四个位置中的两个中执行两次调制来共检测:在光源处,在光源和样品之间的调制器处的入射光路中,在返回光路中 在样品和检测器之间或在检测器处的​​调制器。
    • 7. 发明申请
    • ANTI-REFLECTIVE COATING FOR THE FAR INFRARED
    • 防反射涂层用于红外线
    • WO2015134012A1
    • 2015-09-11
    • PCT/US2014/020756
    • 2014-03-05
    • PANDATA RESEARCH LLC
    • G02B1/11
    • G02B1/113
    • Optical element (300) including a substrate (306) having an interface onto which a coating (310) is disposed. The thickness (in microns) of the coating (310) is greater than 0.03 and smaller than 0.6 / N where N denotes the refractive index of said coating at a wavelength of 12 microns. The substrate may be formed of germanium (Ge) or of a chalcogenide glass (including e.g. Se, As, Sn, S or Te). Materials suitable for the coating include silicon carbide (SiC), boron nitride (BN), alumina (AI2O3), diamond-like carbon (C), or chemical vapor deposition diamond. The coating can be a single, monolithic layer but shall be thin enough to significantly affect the optical reflectivity at the interface surface between the substrate and a sample and be thick enough to both physically and chemically protect the substrate.
    • 光学元件(300)包括具有界面的基底(306),涂层(310)布置在该界面上。 涂层(310)的厚度(微米)大于0.03且小于0.6 / N,其中N表示所述涂层在12微米波长处的折射率。 衬底可以由锗(Ge)或硫族化物玻璃(包括例如Se,As,Sn,S或Te)形成。 适用于涂层的材料包括碳化硅(SiC),氮化硼(BN),氧化铝(Al2O3),类金刚石碳(C)或化学气相沉积金刚石。 涂层可以是单一的整体层,但应足够薄以显着影响基材和样品之间的界面处的光学反射率,并且足够厚以物理和化学保护基材。
    • 8. 发明申请
    • SPECTROMETER WITH MULTIPLE WAVEGUIDES
    • 具有多个波形的光谱仪
    • WO2015030833A1
    • 2015-03-05
    • PCT/US2013/057749
    • 2013-08-31
    • PANDATA RESEARCH LLC
    • G01N21/55G01J3/02
    • G01N21/552G01J3/0205G01N21/31G01N21/35G01N2021/3133G01N2021/3137G01N2021/3166G01N2021/3177
    • A device and method for measuring a reflectivity of a sample at a plurality of discrete, predefined incident angles. The device includes a sample interface that simultaneously spans across measurement faces of multiple waveguides. Each waveguide is associated with a respective, single incident angle. At least two of the incident angles are different. In some cases, the incident angles are invariant for each waveguide and vary from waveguide to waveguide. In some examples, the device includes a broadband light source and at least one spectral filter. For configurations in which a particular waveguide performs measurements at more than one wavelength, the device includes a spectral filter for each wavelength, which are switchable into and out of the optical path. In some examples, the waveguide geometry determines the incident angle on the sample, and the geometry varies from waveguide to waveguide.
    • 一种用于在多个离散的预定入射角度测量样品的反射率的装置和方法。 该装置包括同时跨越多个波导的测量面的样本接口。 每个波导与相应的单个入射角相关联。 至少两个入射角度是不同的。 在一些情况下,入射角度对于每个波导是不变的,并且从波导到波导变化。 在一些示例中,该装置包括宽带光源和至少一个光谱滤波器。 对于其中特定波导在多于一个波长上进行测量的配置,该器件包括用于每个波长的光谱滤波器,其可切换进入和离开光路。 在一些示例中,波导几何形状确定样品上的入射角,并且几何形状从波导到波导变化。
    • 10. 发明申请
    • SPECTROMETER INCLUDING DYNAMIC AMBIENT LIGHT CORRECTION
    • 光谱仪包括动态环境光校正
    • WO2016048293A1
    • 2016-03-31
    • PCT/US2014/057118
    • 2014-09-24
    • PANDATA RESEARCH LLC
    • G01J3/28G01J3/42G01N21/55G01J3/02
    • G01J3/42G01J3/0232G01J3/28G01N21/55G01N2201/0691
    • A spectrometer can optically characterize a sample. An illuminator/collector directs light onto the sample at one of a plurality of wavelengths and, optionally, one of a plurality of incident angles, and collects light from the sample. A detector converts the collected light to an electrical signal. For a typical scan of a sample, a computer can switch off the incident light between sample measurements, during which the computer can adjust the incident angle and/or the wavelength of the incident light. During the times that the incident light is on, the computer can take measurements of the sample, known as light levels. During the times that the incident light is switched off, the computer can take measurements of ambient light, known as dark levels. The computer can use ongoing dark level measurements to perform dynamic correction for ambient light.
    • 光谱仪可以光学地表征样品。 照明器/收集器以多个波长中的一个和可选地多个入射角中的一个将光引导到样品上,并从样品中收集光。 检测器将收集的光转换成电信号。 对于样品的典型扫描,计算机可以在样品测量之间关闭入射光,在此期间计算机可以调节入射角和/或入射光的波长。 在入射光亮的时间内,计算机可以对样品进行测量,称为光照水平。 在入射光被关闭的时间内,计算机可以测量环境光,称为暗电平。 计算机可以使用正在进行的暗电平测量来对环境光进行动态校正。