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    • 1. 发明申请
    • ELECTROMAGNETIC AND OPTICAL ANALYZER
    • 电磁和光学分析仪
    • WO0210705A3
    • 2002-08-15
    • PCT/US0141460
    • 2001-07-27
    • WAVECREST CORP
    • WILSTRUP JAN BRIANLI PENG
    • G01M11/00
    • G01M11/333G01M11/335G01M11/338
    • A method and apparatus for measuring characteristics in an electromagnetic or optical system. A modulation signal is provided to a device under test to provide a first signal and to a reference device which provides a second signal, and a time domain optical analyzer measures the transitions of the first signal and the transitions of the second signal to determine characteristics of the device under test. In one embodiment, the characteristics of the reference device are determined with a modulated light source having two or more known wavelengths that provides a first signal, and a second signal is provided to a reference device to create a third signal. A time domain optical analyzer measures the transitions of the first signal and the transitions of the third signal for two or more wavelengths to determine reference device signal delay time characteristics as a function of wavelength.
    • 一种用于测量电磁或光学系统中的特性的方法和设备。 调制信号被提供给被测设备以提供第一信号并提供给提供第二信号的参考设备,并且时域光分析仪测量第一信号的转变和第二信号的转变以确定 被测设备。 在一个实施例中,利用具有提供第一信号的两个或更多个已知波长的调制光源来确定参考设备的特性,并且将第二信号提供给参考设备以创建第三信号。 时域光分析仪测量第一信号的转换和第三信号对于两个或更多个波长的转换,以确定作为波长的函数的参考设备信号延迟时间特性。
    • 4. 发明申请
    • MULTICHANNEL SYSTEM ANALYZER
    • 多通道系统分析仪
    • WO0211321A3
    • 2003-02-13
    • PCT/US0123664
    • 2001-07-27
    • WAVECREST CORP
    • LI PENGWILSTRUP JAN BRIAN
    • H04B10/00H04B10/02H04B10/079H04B10/08G01M11/00
    • H04B10/0795H04B10/07957H04B10/0799
    • A system for multichannel analysis and testing is provided. The analysis system includes a modulated electromagnetic source having two or more wavelengths or frequency, a multichannel system having a plurality of signals, coupled to the modulated electromagnetic source, a switch for selecting more than one of the signals, and a time domain analyzer for measuring delay between one of the signals and more than one of the other signals to determine system characteristics. The time domain analyzer measures delays between the transitions of a first signal, measures delay between the transition of a first signal and the transition of each of many of the other signals for many signals, and then generates a matrix of the measurements. The matrix is analyzed to determine system characteristics.
    • 提供了一种用于多通道分析和测试的系统。 分析系统包括具有两个或多个波长或频率的调制电磁源,具有耦合到调制电磁源的多个信号的多通道系统,用于选择多于一个信号的开关,以及用于测量的时域分析仪 一个信号之间的延迟和多个其他信号中的一个以确定系统特性。 时域分析器测量第一信号的转变之间的延迟,测量第一信号的转变与许多信号的许多其他信号中的每一个的转变之间的延迟,然后生成测量的矩阵。 分析矩阵以确定系统特性。