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    • 1. 发明申请
    • METHOD AND APPARATUS FOR TESTING A DEVICE-UNDER-TEST
    • 用于测试设备下测试的方法和装置
    • WO2011088893A1
    • 2011-07-28
    • PCT/EP2010/050641
    • 2010-01-20
    • VERIGY (SINGAPORE) PTE. LTD.GOLOV, GilHENKEL, ThomasLARSON, RonaldKNOCH, Ulrich
    • GOLOV, GilHENKEL, ThomasLARSON, RonaldKNOCH, Ulrich
    • G01R31/319G01R31/28
    • G01R31/319G01R31/31907
    • Disclosed is a concept for testing a device-under-test (130), the concept comprising receiving, from at least one test channel integrated circuit (240-n) dedicated to communicate with an input or output pin of the device-under-test (130) by means of at least one hardware resource (615; 616), at least one logical control command (U-CTRL-n) describing a desired operation of the at least one hardware resource (150), and converting, by means of a resource control means (260), the at least one logical control command (U-CTRL-n) into at least one dedicated control command (D-CTRL-n) for the at least one hardware resource, wherein the at least one dedicated control command (D-CTRL-n) is adapted to a physical implementation of the at least one hardware resource (615; 616).
    • 公开了用于测试被测器件(130)的概念,该概念包括从至少一个专用于与被测器件的输入或输出引脚通信的测试通道集成电路(240-n)接收 (130),借助于至少一个硬件资源(615,616),至少一个描述所述至少一个硬件资源(150)的期望操作的逻辑控制命令(U-CTRL-n),并且通过装置 资源控制装置(260)将所述至少一个逻辑控制命令(U-CTRL-n)转换成用于所述至少一个硬件资源的至少一个专用控制命令(D-CTRL-n),其中所述至少一个 专用控制命令(D-CTRL-n)适于所述至少一个硬件资源(615,616)的物理实现。