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    • 2. 发明申请
    • PULSE ELECTROTHERMAL DEICER FOR POWER CABLES
    • 电源电路用电极探测器
    • WO2005083862A1
    • 2005-09-09
    • PCT/US2004/027408
    • 2004-08-23
    • THE TRUSTEES OF DARTMOUTH COLLEGEPETRENKO, VictorSULLIVAN, Charles, Roger
    • PETRENKO, VictorSULLIVAN, Charles, Roger
    • H02G7/16
    • H02G7/16
    • A system for deicing a power cable includes a power cable having an inner conductor (302) and a metal shell (304) separated from the inner conductor (302) by a dielectric material (306); and a switch module (309) that can divert power from the inner conductor (302) to the metal shell (304), generating heat to melt ice on the power cable. A method for deicing a power cable having an inner conductor (302) and a metal shell (304) includes generating a control signal indicating ice on the power cable, and diverting power from the inner conductor to the metal shell to generate heat to melt ice on the power cable. A method for preventing ice formation on a power cable includes providing a power cable having an inner conductor (302) and a metal shell (304), and periodically diverting power from the inner conductor to the metal shell to generate heat to prevent the ice formation.
    • 用于除电电力电缆的系统包括具有通过介电材料(306)与内导体(302)分离的内导体(302)和金属壳(304)的电力电缆。 以及可将来自内部导体(302)的功率转移到金属壳(304)的开关模块(309),产生热量以熔化电力电缆上的冰。 一种用于对具有内部导体(302)和金属壳(304)的电力电缆进行除冰的方法包括产生指示电力电缆上的冰的控制信号,并将功率从内部导体转移到金属壳以产生热量以熔化冰 在电源线上。 一种用于防止电力电缆上的冰的形成的方法包括提供具有内部导体(302)和金属外壳(304)的电力电缆,并且周期性地将电力从内部导体转移到金属壳体以产生热量以防止形成冰 。
    • 3. 发明申请
    • LOW IMPEDANCE TEST FIXTURE FOR IMPEDANCE MEASUREMENTS
    • 阻尼测量的测试仪器
    • WO2004113935A2
    • 2004-12-29
    • PCT/US2004/019760
    • 2004-06-21
    • THE TRUSTEES OF DARTMOUTH COLLEGESULLIVAN, Charles, RogerPRABHAKARAN, Satish
    • SULLIVAN, Charles, RogerPRABHAKARAN, Satish
    • G01R1/04
    • G01R1/06772G01R1/0408G01R27/02G01R27/08H05K1/0219H05K1/0268H05K1/111
    • A test fixture couples with a test instrument to measure impedance of a device. An upper layer of the test fixture has (a) a first and a second solder pad for electrical connection to the device, (b) a first, second, third and fourth tri-solder pad for electrical connection to four SMA connectors of the type that match the test instrument, (c) a first copper track for connecting the first solder pad to a middle solder pad of the first tri-solder pad, (d) a second copper track for connecting the first solder pad to a middle solder pad of the second tri-solder pad, (e) a third copper track for connecting the second solder pad to a middle solder pad of the third tri-solder pad, and (f) a fourth copper track for connecting the second solder pad to a middle solder pad of the fourth tri-solder pad. Each tri-solder pad has a pair of ground solder pads. A lower layer of the test fixture has copper tracks connected to ground and to each pair of ground solder pads. A polyimide substrate of the test fixture has substantially uniform thickness separating the upper layer from the bottom layer.
    • 测试夹具(10)与测试仪器耦合以测量设备(DUT)的阻抗。 测试夹具的上层具有(a)用于与设备电连接的第一和第二焊盘(30,32),(b)第一,第二,第三和第四三焊盘,用于电连接到四个 SMA连接器,(c)用于将第一焊盘连接到第一三焊盘的中间焊盘的第一铜轨道,(d)用于连接第一焊盘的第二铜轨道 到第二三焊盘的中间焊盘,(e)用于将第二焊盘连接到第三三焊盘的中间焊盘的第三铜轨,以及(f)第四铜轨, 第二焊盘焊接到第四三焊盘的中间焊盘。 每个三焊盘(44,46,48,50,52,54,56,58,60,62,64,66)具有一对接地焊盘。 测试夹具的下层具有连接到地面和每对接地焊盘的铜轨道。 测试夹具(10)的聚酰亚胺基底具有将上层与底层分开的基本均匀的厚度。