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1. 发明申请

WO2007050008A1 MULTILAYER DETECTOR AND METHOD FOR SENSING AN ELECTRON BEAM 审中-公开
标题翻译：用于感测电子束的多层检测器和方法
公开(公告)号：WO2007050008A1
公开(公告)日：2007-05-03
申请号：PCT/SE2006/001147
申请日：2006-10-10
申请人： TETRA LAVAL HOLDINGS & FINANCE S.A. , KRISTIANSSON, Anders , NÄSLUND, Lars Åke , HALLSTADIUS, Hans
发明人： KRISTIANSSON, Anders , NÄSLUND, Lars Åke , HALLSTADIUS, Hans
IPC分类号： G01T1/18 , H01J47/14
CPC分类号： G01R19/0061
摘要： A detector and method are disclosed for sensing an intensity of an electron beam (106). An exemplary detector includes a multilayer composite structure (104) having a conductive core (110), an insulating layer (112) formed on the conductive core (110), and an outer conductive layer (114) electrically connected to a voltage potential and formed on the insulating layer (112). A support (116) is configured to locate the conductive core (110) in alignment with an electron beam generator (102), between an electron beam generator (102) and a target area (108), and within a direct path of an electron beam (106) to be generated by the electron beam generator (102).
摘要翻译：公开了用于感测电子束（106）的强度的检测器和方法。示例性检测器包括具有导电芯（110）的多层复合结构（104），形成在导电芯（110）上的绝缘层（112））和电连接到电压电位的外部导电层（114）在绝缘层（112）上。支撑件（116）被配置为将导电芯（110）定位成与电子束发生器（102）对准，在电子束发生器（102）和目标区域（108）之间并且在电子的直接通路内光束（106）由电子束发生器（102）产生。

2. 发明申请

WO2014086675A2 DEVICE AND METHOD FOR IRRADIATING PACKAGING CONTAINERS WITH ELECTRON BEAM 审中-公开
标题翻译：用电子束辐射包装容器的装置和方法
公开(公告)号：WO2014086675A2
公开(公告)日：2014-06-12
申请号：PCT/EP2013/075083
申请日：2013-11-29
申请人： TETRA LAVAL HOLDINGS & FINANCE S.A.
发明人： MELLBIN, Håkan , CLOETTA, Dominique , HANSEN, Fredrik , HALLSTADIUS, Hans
IPC分类号： G01T1/29 , A61L2/08 , A61L2/28 , B65B55/08 , B67C7/00 , G01T1/02 , G21K5/10
CPC分类号： A61L2/24 , A61L2/087 , A61L2202/14 , A61L2202/23 , B65B55/08 , G21K5/02 , H01J2237/24507
摘要： The present invention relates to irradiation device for irradiating objects with electron beams (16). Said irradiation device comprises at least one electron beam emitter (10) having an electron exit window (20) through which said electron beam (16) is emitted,at least one sensor device (56) for measuring at least a first dose control parameter of the electron beam (16). The sensor device comprises a sensing area (58) in form of a plate (74) adapted to be at least temporarily exposed to said electron beam, said plate (74) being further adapted to generate x-rays (76) when hit by electrons (e - ) of said electron beam (16), and at least one x-ray imaging sensor (70) adapted to detect the generated x-rays (76).The invention also relates to a method.
摘要翻译：本发明涉及用电子束（16）照射物体的照射装置。所述照射装置包括至少一个电子束发射器（10），该电子束发射器（10）具有发射所述电子束（16）的电子出射窗（20），至少一个传感器装置（56），用于至少测量第电子束（16）。传感器装置包括适于至少临时暴露于所述电子束的板形式的感测区域（58），所述板（74）进一步适于在被电子击中时产生X射线（76）（e），以及适于检测所产生的X射线（76）的至少一个X射线成像传感器（70）。本发明还涉及一种方法。

3. 发明申请

WO2014086674A2 DEVICE AND METHOD FOR IRRADIATING OBJECTS WITH ELECTRON BEAM 审中-公开
标题翻译：用电子束照射物体的装置和方法
公开(公告)号：WO2014086674A2
公开(公告)日：2014-06-12
申请号：PCT/EP2013/075082
申请日：2013-11-29
申请人： TETRA LAVAL HOLDINGS & FINANCE S.A.
发明人： NÄSLUND, Lars-Åke , BENGTSSON, Kristoffer , MELLBIN, Håkan , HALLSTADIUS, Hans , HANSEN, Fredrik , LAVALLE, Marco
IPC分类号： B67C7/00 , G01T1/02 , G01T1/29 , G01R19/00 , A61L2/08 , B65B55/08 , G21K5/10 , H01J47/14
CPC分类号： A61L2/087 , A61L2202/14 , A61L2202/23 , B65B55/08 , G01T1/02 , H01J33/00
摘要： The present invention relates to an irradiation device (36) for irradiating objects (12) with electron beams (16). The irradiation device (36) comprisesat least one electron beam emitter (10) having an electron exit window (20)and at least one sensor device (56) for detecting a first dose control parameter of the electron beam (16). The electron beam emitter (10) is adapted to move past the sensor device (56) such that the electron beam (16) emitted from the electron exit window (20) passes within a sensing area (58) of the sensor device (56). Said sensor device comprises more than one conductor (64) each having a conductor surface (68) in the sensing area (58) of the sensor device (56), and the conductor surface (68) is adapted to be exposed to electrons of said electron beam (16).The invention also relates to a method.
摘要翻译：本发明涉及用电子束（16）照射物体（12）的照射装置（36）。照射装置（36）包括具有电子出射窗（20）的至少一个电子束发射器（10）和用于检测电子束（16）的第一剂量控制参数的至少一个传感器装置（56）。电子束发射器（10）适于移动经过传感器装置（56），使得从电子出射窗口（20）发射的电子束（16）在传感器装置（56）的感测区域（58）内通过，。所述传感器装置包括多于一个导体（64），每个导体在传感器装置（56）的感测区域（58）中具有导体表面（68），并且导体表面（68）适于暴露于所述传感器装置电子束（16）。本发明还涉及一种方法。

4. 发明申请

WO2020088963A1 A METHOD FOR QUALITY ASSESSMENT OF A SEALING SECTION OF A PACKAGE, AND AN APPARATUS THEREOF 审中-公开
公开(公告)号：WO2020088963A1
公开(公告)日：2020-05-07
申请号：PCT/EP2019/078505
申请日：2019-10-21
申请人： TETRA LAVAL HOLDINGS & FINANCE S.A.
发明人： RÅBE, Magnus , HALLSTADIUS, Hans , PETERSSON, Viktor , ZULUMOVSKI, Daniel , ANDERSSON, Håkan , FANTINI, Stefano
IPC分类号： B29C65/82 , B29C65/08 , B29C65/36
摘要： A method (1600) for quality assessment of a sealing section (414) of a package (100), wherein the package (100) comprises at least a robustness layer (406a, 406b) and a plastic layer (408a, 408b). The sealing section (414) is formed by holding a first section (402a) and a second section (402b) of the package (100) against each other while providing heat such that the plastic layer (408a, 408b) of the first and second section (402a, 402b) melt and thereby provide for that the first and second section (402a, 402b) adhere to each other. The method (1600) comprises capturing (1602) image data depicting the sealing section (414) using a camera (814), identifying (1604) a reference line (1204, 1304, 1404, 1504) in the image data, identifying (1606) a sealing section boundary line (1202,1302, 1402, 1502) in the image data, determining (1608) a sealing section assessment feature set based on the reference line (1204, 1304, 1404, 1504) and the sealing section boundary line (1202,1302, 1402, 1502), and comparing (1610) the sealing section assessment feature set with a reference feature set.

5. 发明申请

WO2012091661A1 A METHOD AND A DEVICE FOR DETECTING DEFECTS IN A PACKAGING MATERIAL 审中-公开
标题翻译：用于检测包装材料中的缺陷的方法和装置
公开(公告)号：WO2012091661A1
公开(公告)日：2012-07-05
申请号：PCT/SE2011/051574
申请日：2011-12-22
申请人： TETRA LAVAL HOLDINGS & FINANCE S.A. , HALLSTADIUS, Hans , LINGOIS, Philippe
发明人： HALLSTADIUS, Hans
IPC分类号： G01N27/92 , G01M3/40 , B65B57/00 , G01N27/61 , G01R31/12
CPC分类号： G01N27/92 , G01M3/40 , G01R31/1227
摘要： A method and a device for detecting defects in a packaging laminate having at least one conductive layer are provided. The method comprises the steps of grounding the conductive layer of the packaging laminate, arranging an electrode adjacent to said packaging laminate,applying a high voltage to said electrode by ramping the voltage from an initial value towards an upper predetermined value, and detecting a defect in said packaging material by registering dielectric breakdown between the electrode and the conductive layer of the packaging laminate.
摘要翻译：提供了一种用于检测具有至少一个导电层的包装层压体中的缺陷的方法和装置。该方法包括以下步骤：将包装层压体的导电层接地，将邻近所述包装层压体的电极布置，通过将电压从初始值倾斜到上限值，向所述电极施加高电压，并检测缺陷所述包装材料通过在电极和包装层压体的导电层之间配准电介质击穿。

6. 发明申请

WO2020088964A1 AN APPARATUS FOR QUALITY ASSESSMENT OF A SEALING SECTION OF A PACKAGE FOR FOOD PRODUCTS, AND A METHOD THEREOF 审中-公开
公开(公告)号：WO2020088964A1
公开(公告)日：2020-05-07
申请号：PCT/EP2019/078506
申请日：2019-10-21
申请人： TETRA LAVAL HOLDINGS & FINANCE S.A.
发明人： HALLSTADIUS, Hans , RÅBE, Magnus
IPC分类号： B29C65/08 , B29C65/36 , B29C65/82
摘要： An apparatus (800, 900, 1000) for quality assessment of a sealing section (414) of a package (100) for food products. The package (100) comprises at least a robustness layer (406a, 406b) and a plastic layer (408a, 408b). The sealing section (414) is formed by holding a first section (402a) and a second section (402b) of the package (100) against each other while providing heat such that the plastic layer (408a, 408b) of the first and second section (402a, 402b) melt and thereby provide for that the first and second section (402a, 402b) adhere to each other. The apparatus (800) comprises a sample holder (804, 902, 1002) arranged for fixating a sample (802, 904) comprising the sealing section (414) of the package (100), wherein at least part of the sample holder (804) is transparent, a magnification device (1004) arranged on a first side (I) of the sample holder (804), and an illumination device (808, 910, 1002) arranged on a second side (II) of the sample holder (804), such that light is provided to the magnification device (1004) through the sample holder (804, 902, 1002), wherein the first and second side (I, II) are opposite sides of the sample holder (804, 902, 1002).

7. 发明申请

WO2013143859A1 A SENSOR ARRANGEMENT FOR MEASURING THE CONCENTRATION OF A SUBSTANCE 审中-公开
标题翻译：用于测量物质浓度的传感器布置
公开(公告)号：WO2013143859A1
公开(公告)日：2013-10-03
申请号：PCT/EP2013/055200
申请日：2013-03-14
申请人： TETRA LAVAL HOLDINGS & FINANCE S.A.
发明人： MASELLI, Andrea , SIGHINOLFI, Eugenio , RUNNBERG, Bo , HALLSTADIUS, Hans , DEBAECKER, Sylvain
IPC分类号： B65B55/10 , G01N21/31 , G01N21/33
CPC分类号： G01N21/59 , B65B3/04 , B65B55/10 , G01N1/40 , G01N21/256 , G01N21/27 , G01N21/3151 , G01N2201/0696
摘要： A sensor arrangement for determining the concentration of a substance in an open sample (130) in the presence of an interfering material, comprising a first light source (200) emitting pulsed light (S 1 ) at a first wavelength being absorbed by said substance, a second light source (210) emitting pulsed light (S 2 ) at a second wavelength being transmitted through said substance, optical means (250, 252, 254, 310, 320, 330, 340) for directing at least a part of the emitted pulsed light (S 1 , S 2 ) of said first and second wavelength through the open sample (130) along the same optical path, and a sample detector (230) arranged at the end of the optical path for receiving the emitted light (S 1 , S 2 ) of said first and second wavelength being transmitted through the sample (130), wherein said interfering material is formed as deposits on at least one of said optical means (254, 310, 340, 256) being exposed to said substance, and wherein said first wavelength and said second wavelength is absorbed by said interfering material.
摘要翻译：一种用于在存在干扰材料的情况下确定开放样品（130）中的物质浓度的传感器装置，包括以第一波长发射出被所述物质吸收的第一波长的脉冲光（S1）的第一光源（200）发射第二波长的脉冲光（S2）的第二光源（210）透射通过所述物质;光学装置（250,252,254,310,320,330,340），用于引导至少一部分所发射的脉冲光所述第一和第二波长的所述第一和第二波长（S1，S2）沿着相同的光路通过所述开放样本（130）;以及样本检测器（230），布置在所述光路的端部处，用于接收所述发射光所述第一和第二波长透射通过样品（130），其中所述干扰材料形成为暴露于所述物质的所述光学装置（254,310,340,256）中的至少一个上的沉积物，并且其中所述第一波长并且所述第二波长被吸收通过所述干扰材料。

8. 发明申请

WO2007145560A1 SENSOR AND SYSTEM FOR SENSING AN ELECTRON BEAM 审中-公开
标题翻译：用于感应电子束的传感器和系统
公开(公告)号：WO2007145560A1
公开(公告)日：2007-12-21
申请号：PCT/SE2007/000444
申请日：2007-05-05
申请人： TETRA LAVAL HOLDINGS & FINANCE S.A. , KRISTIANSSON, Anders , NÄSLUND, Lars Åke , HALLSTADIUS, Hans , HAAG, Werner , HOLM, Kurt , ZIGERLIG, Benno
发明人： KRISTIANSSON, Anders , NÄSLUND, Lars Åke , HALLSTADIUS, Hans , HAAG, Werner , HOLM, Kurt , ZIGERLIG, Benno
IPC分类号： G01T1/29 , B65B55/08 , G01R19/00 , G01T1/16
CPC分类号： B65B55/08 , H01J2237/24507
摘要： The invention concerns a sensor (10) for sensing an intensity of an electron beam generated by an electron beam generator along a path towards a target within a target area, the electron beam being exited from the generator through an exit window (24). The sensor (10) is characterised in that it comprises at least one area (26) of at least one conductive layer (28) located within the path and connected to a current detector, and in that each said area (26) of the at least one conductive layer (28) being substantially shielded off from each other, from the surrounding environment and from the exit window (24) by a shield (32), said shield (32) being formed on the exit window (24). The invention also relates to a system comprising said sensor.
摘要翻译：本发明涉及一种传感器（10），用于感测由电子束发生器沿目标区域内的目标路线产生的电子束的强度，电子束通过出射窗（24）从发生器离开。传感器（10）的特征在于它包括至少一个位于路径内并连接到电流检测器的至少一个导电层（28）的区域（26），并且每个所述区域（26）中的至少一个导电层（28）通过屏蔽（32）与周围环境和出射窗（24）基本上相互隔离，所述屏蔽（32）形成在出射窗（24）上。本发明还涉及包括所述传感器的系统。

9. 发明申请

WO2007050010A1 SENSOR AND SYSTEM FOR SENSING AN ELECTRON BEAM 审中-公开
标题翻译：用于感应电子束的传感器和系统
公开(公告)号：WO2007050010A1
公开(公告)日：2007-05-03
申请号：PCT/SE2006/001160
申请日：2006-10-13
申请人： TETRA LAVAL HOLDINGS & FINANCE S.A. , KRISTIANSSON, Anders , NÄSLUND, Lars Åke , HALLSTADIUS, Hans
发明人： KRISTIANSSON, Anders , NÄSLUND, Lars Åke , HALLSTADIUS, Hans
IPC分类号： G01T1/29 , B65B55/08 , G01R19/00 , G01T1/16
CPC分类号： A61L2/08 , B65B55/08 , B65B57/00 , G21K5/10 , H01J33/04 , H01J2237/164 , H01J2237/2446 , H01J2237/24495
摘要： The present invention refers to a sensor (10) for sensing an intensity of an electron beam generated by an electron beam generator along a path, the electron beam being exited from the generator through an exit window (24). The invention is characterized in that the sensor (10) comprises a conductor (26) located within the path and exposed to the exit window (24), and an insulating housing (28) for shielding the conductor (26), said housing (28) being engaged with the exit window (24) forming a chamber (30) with said exit window (24), and that the conductor (26) is positioned within said chamber (30). The invention also refers to a system for sensing an intensity of an electron beam.
摘要翻译：本发明涉及用于感测沿着路径由电子束发生器产生的电子束的强度的传感器（10），电子束通过出射窗（24）从发生器排出。本发明的特征在于，传感器（10）包括位于路径内并暴露于出射窗（24）的导体（26）和用于屏蔽导体（26）的绝缘壳体（28），所述壳体）与与所述出射窗（24）形成腔室（30）的出射窗（24）接合，并且导体（26）位于所述腔室（30）内。本发明还涉及用于感测电子束强度的系统。

10. 发明申请

WO2007050007A1 EXPOSED CONDUCTOR SYSTEM AND METHOD FOR SENSING AN ELECTRON BEAM 审中-公开
标题翻译：用于感测电子束的曝光导体系统和方法
公开(公告)号：WO2007050007A1
公开(公告)日：2007-05-03
申请号：PCT/SE2006/001146
申请日：2006-10-10
申请人： TETRA LAVAL HOLDINGS & FINANCE S.A. , NÄSLUND, Lars Åke , HALLSTADIUS, Hans , KRISTIANSSON, Anders , HEDSE OLSSON, Anders
发明人： NÄSLUND, Lars Åke , HALLSTADIUS, Hans , KRISTIANSSON, Anders , HEDSE OLSSON, Anders
IPC分类号： G01T1/18 , H01J47/14
CPC分类号： H01J33/02 , A61L2/087 , H01J2237/244
摘要： A detector (104) is disclosed for sensing an intensity of an electron beam (106) generated along a path. An exemplary detector includes an exposed conductor (105) attached to a support (112) which is configured to locate the exposed conductor (105) within a path of an electron beam (106); a grounded conductor (107) isolated from the exposed conductor (105), the grounded conductor (107) partly surrounding the exposed conductor (105) to form a plasma shield having a window positioned at least in a direction of the electron beam path.
摘要翻译：公开了一种用于感测沿着路径产生的电子束（106）的强度的检测器（104）。示例性的检测器包括附接到支撑件（112）的暴露的导体（105），其被构造成将暴露的导体（105）定位在电子束（106）的路径内; 与暴露的导体（105）隔离的接地导体（107），接地导体（107）部分地围绕暴露的导体（105）形成等离子屏蔽，其具有至少位于电子束路径的方向上的窗口。

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