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1. 发明申请

WO2010086135A3 THIN FILM SOLAR CELL 审中-公开
标题翻译：薄膜太阳能电池
公开(公告)号：WO2010086135A3
公开(公告)日：2010-10-14
申请号：PCT/EP2010000440
申请日：2010-01-26
申请人： SCHOTT AG , RUDIGIER EVELINE , BOCKMEYER MATTHIAS , BAUER STEFAN , HAGEMANN VOLKER
发明人： RUDIGIER EVELINE , BOCKMEYER MATTHIAS , BAUER STEFAN , HAGEMANN VOLKER
IPC分类号： H01L31/0236
CPC分类号： H01L31/0392 , H01L31/02366 , H01L31/055 , H01L31/056 , Y02E10/52
摘要： A structured layer (2) made of a matrix obtained according to the sol-gel process and particles providing structure are applied to the transparent substrate (1) of a thin film solar cell. Thereon, several layers are successively deposited, including a front electrode layer (3), at least one semiconductor layer (4) and a back electrode layer (12). The structured layer (2) thus forms a texture template for the various layers, including the front electrode (3) and back electrode layer (12), which thus are each provided with a structured, light-scattering surface. The structured layer (2) has a refractive index that is greater than the refractive index of the substrate (1) and no greater than the refractive index of the front electrode layer (3).
摘要翻译：在薄膜太阳能电池的透明基板（1）上，施加根据溶胶 - 凝胶法获得的基体的结构化层（2）和施加结构的颗粒。随后，依次沉积包括前电极层（3），至少一个半导体层（4）和后电极层（12）的多个层。图案层（2）因此形成用于包括前电极（3）和后电极层（12）的各个层的纹理模板，每个层因此提供图案化的光漫射表面。结构化层（2）的折射率大于衬底（1）的折射率，并且至多与前电极层（3）的折射率一样大。

2. 发明申请

WO2004036656A2 NON-DESTRUCTIVE ANALYSIS METHOD FOR DETERMINING THE QUALITY OF A SOLAR CELL, AND APPLICATION OF THE SAME 审中-公开
标题翻译：无破坏分析方法用于太阳能电池及其使用质量评价。
公开(公告)号：WO2004036656A2
公开(公告)日：2004-04-29
申请号：PCT/DE0303372
申请日：2003-10-09
申请人： HAHN MEITNER INST BERLIN GMBH , LUCK ILKA , RUDIGIER EVELINE , SCHEER ROLAND
发明人： LUCK ILKA , RUDIGIER EVELINE , SCHEER ROLAND
IPC分类号： G01N21/65 , H01L31/00
CPC分类号： G01N21/65
摘要： Known analysis methods do not enable a correlation to be identified between the structural properties of a semiconductor layer and the electrical properties of a solar cell mounted on the same. The inventive analysis method is based on rapid and non-destructive Raman spectroscopy by which means significant structural parameters (FWHM) relating to the structural properties of a processed absorber layer can be determined in a solar cell. The knowledge of such structural parameters enables a correlation to be established with electric parameters (Voc) which are relevant in terms of the expected electrical properties of the finished processed solar cell. A linear correlation is indicated between the parameters with a saturation region of satisfying electrical properties and a threshold value of a region of unsatisfying electrical properties of the solar cell. The inventive analysis method thus enables the electrical quality of the finished processed solar cell to be determined, exclusively from the structural parameters of the absorber layer. Accordingly, it can be decided in situ, in a production line for, for example, polycrystalline solar cells with heterojunctions, whether an absorber layer analysed ex situ can be reprocessed or must be extracted.
摘要翻译：随着分析的公知的方法可被检测的半导体层的结构特性和基于它的太阳能电池的电特性之间没有相关性。根据本发明的分析方法是基于快速和非破坏性拉曼光谱法，处理后的吸收体层的结构特性的显著结构参数（FWHM）可以在太阳能电池相对于找到。与具有用于完全处理太阳能电池的预期的电特性相关的电参数（VOC）的连接的这样的结构参数的知识然后制备。它示出了具有满意的电特性的饱和区域和限制值的太阳能电池的不令人满意的电特性的区域中的参数之间的线性关系。与根据本发明的分析方法中，吸收层，因此只能得出结论，完全加工的太阳能电池的从结构参数的当前知识的电质量。根据这一决定可以在一个生产线例如由直原位连接多晶太阳能电池是否非原位分析吸收层可以被进一步处理，或者需要进行排序。

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