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    • 1. 发明申请
    • SEALING COMPOSITION
    • 密封组合物
    • WO2018031992A1
    • 2018-02-15
    • PCT/US2017/046730
    • 2017-08-14
    • PRC-DESOTO INTERNATIONAL, INC.
    • MORRIS, Eric L.POST, Gordon L.MAYO, Michael A.OKERBERG, Brian C.LIM, Mary Lyn Chong
    • C23C22/83C23C22/34C23C22/56C23C22/66
    • Disclosed is a method of treating a substrate. The surface is contacted with a sealing composition comprising a lithium cation; and optionally, with conversion composition comprising a cation of a lanthanide, a Group IIIB, and/or a Group IVB metal. The conversion composition is applied to provide a film on the substrate surface resulting in a level of the lanthanide, Group IIIB metal, and/or Group IV metal thereon of at least 100 counts greater than on a surface of a substrate that does not have the film thereon as measured by X-ray fluorescence (measured using X-Met 7500, Oxford Instruments; operating parameters 60 second timed assay, 15Kv, 45μA, filter 3, T(p) = 1.5μs for lanthanides, Group IIIB metals, and Group IVB metals except zirconium; operating parameters 60 second timed assay, 40Kv, 10μA, filter 4, T(p) = 1.5μs for zirconium). A substrate obtainable by the methods also is disclosed.
    • 公开了一种处理基材的方法。 该表面与包含锂阳离子的密封组合物接触; 并任选地与包含镧系元素,IIIB族和/或IVB族金属的阳离子的转化组合物接触。 应用该转化组合物以在基材表面上提供膜,导致其上的镧系元素,IIIB族金属和/或第IV族金属的水平比在不具有该基材的基材的表面上高至少100计数 (使用X-Met 7500,牛津仪器测量;对于镧系元素,IIIB族金属和第IIIB族金属,对于镧系元素来说,测量操作参数60第二定时测定,15Kv,45μA,过滤器3,T(p)=1.5μs) 除锆之外的IVB金属;操作参数60次第二次测定,40Kv,10μA,过滤器4,对于锆,T(p)=1.5μs)。 还公开了通过该方法可获得的基材。