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    • 5. 发明申请
    • QUANTIFICATION METHOD OF FUNCTIONAL GROUPS OF ORGANIC LAYER
    • 有机层功能组数量化方法
    • WO2010036038A2
    • 2010-04-01
    • PCT/KR2009005454
    • 2009-09-24
    • KOREA RES INST OF STANDARDSLEE TAE GEOLMOON DAE WONMIN HYEGEUN
    • LEE TAE GEOLMOON DAE WONMIN HYEGEUN
    • G01N33/48G01N23/225
    • G01N23/2255
    • A quantification method of functional groups in an organic thin layer includes: a) measuring an absolute quantity per unit area of an analysis reference material having functional groups included in a reference organic thin layerby means of MEIS spectroscopy; b) carrying out spectrometry for the same reference organic thin layer as in a) and thereby obtaining peak intensities of the functional groups in the reference organic thin layer; c) carrying out the same spectrometry as in b) for an organic thin layer to be analyzed having the same functional groups and thereby measuring peak intensities of the functional groups with unknown quantity; and d) comparing the peak intensities of the functional groups measured in b) with respect to the absolute quantity of the analysis reference material in a) and thereby determining the absolute quantity per unit area of the functional groups with unknown quantity measured in c).
    • 有机薄层中的官能团的定量方法包括:a)通过MEIS光谱测量具有包括在参考有机薄层中的官能团的分析参考材料的每单位面积的绝对量; b)进行与a)相同的参考有机薄层的光谱测定,从而获得参考有机薄层中的官能团的峰值强度; c)进行与b)相同的光谱测定,对于具有相同官能团的待分析有机薄层,从而测量具有未知量的官能团的峰强度; 和d)比较a)中测定的官能团的峰强度相对于分析参考物质的绝对量,从而确定在c)中测量的具有未知量的官能团的每单位面积的绝对量。