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    • 2. 发明申请
    • SENSOR DEVICE FOR TARGET PARTICLES IN A SAMPLE
    • 传感器装置在样品中的目标颗粒
    • WO2009053902A3
    • 2009-12-10
    • PCT/IB2008054329
    • 2008-10-21
    • KONINKL PHILIPS ELECTRONICS NVVERSCHUREN COEN AKAHLMAN JOSEPHUS A H MIMMINK ALBERT H JMEGENS MISCHAVEEN JEROENDE BOER BART MJANSEN THEODORUS P H G
    • VERSCHUREN COEN AKAHLMAN JOSEPHUS A H MIMMINK ALBERT H JMEGENS MISCHAVEEN JEROENDE BOER BART MJANSEN THEODORUS P H G
    • G01N15/06
    • G01N15/06G01N15/0656G01N2015/0693G01R33/1269
    • The invention relates to a sensor device(100) and a method for the determination of the amount of target particles(1) at a contact surface(112) adjacent to a sample chamber(2). Target particles(1) in the sample chamber are detected by a sensor element(SE) and at least one corresponding sensor-signal (s, s') is provided. An evaluation unit(EU) then determines the amount of target particles(1) in a first zone(Z1) immediately at the contracts surface(112) and a second zone(Z2) a distance(z) away from the contact surface based on this sensor-signal. In an optical measurement approach, frustrated total internal reflection taking place under different operating conditions (e.g. wavelength, angle of incidenceq) may be used to extract information about the first and second zones(Z1, Z2). In a magnetic measurement approach, different magnetic excitation fields may be used to excite magnetic target particles differently inthe first and second zone(Z2). Moreover, the temporalcourse of a sensor-signal(s, s') can be evaluated, particularly with respect to stochastic movements ofthe target particles(1).
    • 本发明涉及一种传感器装置(100)和用于确定在与样品室(2)相邻的接触表面(112)处的目标颗粒(1)的量的方法。 通过传感器元件(SE)检测样品室中的目标颗粒(1),并提供至少一个对应的传感器信号(s,s')。 然后,评估单元(EU)基于紧接表面(112)立即确定第一区域(Z1)中的目标颗粒(1)的数量和远离接触表面的距离(z)的第二区域(Z2),基于 这个传感器信号。 在光学测量方法中,可以使用在不同操作条件(例如,波长,入射角q)处发生的沮丧的全内反射来提取关于第一和第二区域(Z1,Z2)的信息。 在磁测量方法中,可以使用不同的磁激励场来在第一和第二区(Z2)中不同地激励磁性目标颗粒。 此外,可以评估传感器信号(s,s')的时间,特别是关于目标颗粒(1)的随机运动。
    • 5. 发明申请
    • METHOD OF CLEANING A REFRACTIVE ELEMENT AND OPTICAL SCANNING APPARATUS FOR NEAR-FIELD OPTICAL SYSTEMS
    • 清洁近场光学系统的折射元件和光学扫描装置的方法
    • WO2007010437A2
    • 2007-01-25
    • PCT/IB2006052337
    • 2006-07-11
    • KONINKL PHILIPS ELECTRONICS NVVERSCHUREN COEN A
    • VERSCHUREN COEN A
    • G11B7/12G11B7/135
    • G11B7/1387G11B7/121G11B2007/13727
    • A method of cleaning an optical exit face of refractive element of a near field optical scanning apparatus for scanning an optical disc, the method comprising a contacting step, comprising bringing into mechanical contact the refractive element and a cleaning pad such that the optical exit face of the refractive element is non-parallel to a surface of the cleaning pad, the refractive element contacting the surface pad along a contact edge and a first cleaning step, comprising at least a relative movement of the cleaning pad relative to the refractive element at least along cleaning axis, wherein the cleaning axis is in the plane of the cleaning pad and substantially perpendicular to the contact edge. The invention also related to a near field optical scanning apparatus enabled to clean a refractive element according to the said method.
    • 一种清洁用于扫描光盘的近场光学扫描装置的折射元件的光学出射面的方法,所述方法包括接触步骤,包括使所述折射元件和清洁垫进行机械接触,使得所述光学出射面 所述折射元件不平行于所述清洁垫的表面,所述折射元件沿着接触边缘和所述第一清洁步骤接触所述表面焊盘,所述第一清洁步骤至少包括所述清洁垫相对于所述折射元件的至少相对运动 清洁轴线,其中所述清洁轴线位于所述清洁垫的平面内且基本上垂直于所述接触边缘。 本发明还涉及能够根据所述方法清洁折射元件的近场光学扫描装置。
    • 6. 发明申请
    • METHOD, APPARATUS AND RECORD CARRIER WITH AVERAGE-RUNLENGTH PRESERVING CODE FOR IMPROVED READOUT PARAMETER CONTROL
    • 用于改进读出参数控制的具有平均运行长度保存代码的方法,装置和记录载体
    • WO2005069281A3
    • 2005-10-13
    • PCT/IB2005050036
    • 2005-01-05
    • KONINKL PHILIPS ELECTRONICS NVVERSCHUREN COEN ACOENE WILLEM M J M
    • VERSCHUREN COEN ACOENE WILLEM M J M
    • G11B7/125G11B11/105G11B20/14H03M5/14
    • G11B7/1263G11B7/1267G11B11/1051G11B11/10515G11B11/10595G11B20/1426H03M5/145
    • The present invention relates to a method and apparatus for controlling at least one readout parameter of a magneto-optical domain expansion recording medium. An average detected runlength of the reading signal is monitored, and an error signal is generated on the basis of a comparison of the monitoring result with the predetermined average runlength that has been set during the encoding step. The at least one readout parameter is then controlled by means of the generated error signal. Furthermore, the present invention relates to a method, apparatus and record carrier wherein a runlength constraint is applied to at least one of the following quantities: mark regions and space regions in said storage layer, said runlength constraint being selected to keep an accumulated runlength deviation from a predetermined average runlength within a predetermined range. The proposed runlength property and control scheme provide the advantage that all detected runlengths contribute to the error signal to make the response must faster and to reduce readout errors.
    • 本发明涉及用于控制磁光域扩展记录介质的至少一个读出参数的方法和设备。 监测读取信号的平均检测游程长度,并且基于监测结果与在编码步骤期间已经设定的预定平均游程长度的比较来生成错误信号。 然后通过生成的误差信号来控制至少一个读出参数。 此外,本发明涉及一种方法,装置和记录载体,其中游程长度约束被应用于以下量中的至少一个:所述存储层中的标记区域和空间区域,所述游程长度约束被选择为保持累积游程长度偏差 从预定范围内的预定平均游程长度。 所提出的游程长度特性和控制方案提供了以下优点:所有检测到的游程长度都对误差信号有贡献,从而使响应速度更快并且减少读出误差。
    • 8. 发明申请
    • MICROELECTRONIC SENSOR DEVICE FOR OPTICAL EXAMINATIONS WITH TOTAL INTERNAL REFLECTION
    • 用于内部全反射光学检测的微电子传感器装置
    • WO2009013706A3
    • 2009-05-28
    • PCT/IB2008052926
    • 2008-07-21
    • KONINKL PHILIPS ELECTRONICS NVVERSCHUREN COEN A
    • VERSCHUREN COEN A
    • G01N21/55G01N21/64
    • G01N21/552G01N21/59G01N21/648G01N33/54326
    • The invention relates to a microelectronic sensor device for optical examinations like the detection of target components that comprise label particles(1), for example magnetic particles(1). An input light beam(L1) is transmitted into a carrier(111) and totally internally reflected at a binding surface(112) to yield a "TIR- beam of first order" (LTIR(1) ), which is redirected by a mirroring system (e.g. reflective 5 facets(114)) to the binding surface(112), where it is againtotally internally reflected as a "TIR-beam of second order" (LTIR(2) ), and so on. Finally, an output light beam(L2) comprising lightofthe "TIR-beam of (N+1)-thorder", witha given natural number N, leaves the carrier to be detected by a lightdetector(31).
    • 用于光学检查的微电子传感器装置技术领域本发明涉及一种用于光学检查的微电子传感器装置,例如包括标签颗粒(1),例如磁性颗粒(1)的目标部件的检测。 输入光束(L1)被发射到载体(111)中并且在结合表面(112)处被全内反射以产生“一阶TIR光束”(LTIR(1)),该光束通过镜像 系统(例如,反射的小平面(114))到达结合表面(112),其中它又被完全内部地反射为“二阶TIR光束”(LTIR(2)),等等。 最后,包括具有给定自然数N的“第N + 1阶TIR光束”的输出光束(L2)离开载体以被光检测器(31)检测到。
    • 10. 发明申请
    • ANALYSIS OF OPTICAL EFFECTS ON STORAGE MEDIUM
    • 对存储介质的光学效应分析
    • WO2006067686A3
    • 2006-11-09
    • PCT/IB2005054235
    • 2005-12-14
    • KONINKL PHILIPS ELECTRONICS NVVERSCHUREN COEN A
    • VERSCHUREN COEN A
    • G11B7/004G11B7/1267
    • G11B7/004G11B7/1267G11B20/10009G11B20/10481G11B20/1816G11B27/36G11B2020/1288G11B2220/2541
    • A method of analyzing the quality of optical effects on an optical recording medium as well as applications of the method in connection with optimizing a write strategy and analyzing the write quality for an optical recording medium are disclosed. The method comprising the steps of determining waveforms of a measured (61) and a nominal (60) optical signal, and calculating an amplitude-difference parameter from a difference (62-65) in the measured and nominal waveforms. A quality measure of the optical effects can thereby be determined from the amplitude-difference parameter. The applications of the method include, but are not limited to: a device for reading optical effects from an optical storage medium with means for determining the an amplitude-difference parameter, an optical recording apparatus with means for adjusting the power level and/or level duration in a write strategy and an IC for controlling an optical storage apparatus.
    • 公开了分析光学记录介质的光学效果的质量的方法以及该方法在优化写入策略和分析光学记录介质的写入质量方面的应用。 该方法包括以下步骤:确定所测量的(61)和标称(60)光信号的波形,以及根据测量和标称波形中的差(62-65)计算振幅差参数。 因此可以根据振幅差参数来确定光学效果的质量测量。 该方法的应用包括但不限于:用于从具有用于确定幅度差参数的装置的光学存储介质读取光学效应的装置,具有用于调整功率电平和/或电平的装置的光学记录装置 写入策略中的持续时间和用于控制光学存储设备的IC。