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1. 发明申请

WO2020013865A1 THIN FILM MULTIVARIATE OPTICAL ELEMENT AND DETECTOR COMBINATIONS, THIN FILM OPTICAL DETECTORS, AND DOWNHOLE OPTICAL COMPUTING SYSTEMS 审中-公开
公开(公告)号：WO2020013865A1
公开(公告)日：2020-01-16
申请号：PCT/US2018/042118
申请日：2018-07-13
申请人： HALLIBURTON ENERGY SERVICES, INC.
发明人： LI, Jian , PRICE, James, M. , DAI, Bin , JONES, Christopher, Michael , STARK, Daniel , MAIDA, John, Laureto, Jr.
IPC分类号： G01V8/10 , E21B49/08
摘要： The disclosed embodiments include thin film multivariate optical element and detector combinations, thin film optical detectors, and downhole optical computing systems. In one embodiment, a thin film multivariate optical element and detector combination includes at least one layer of multivariate optical element having patterns that manipulate at least one spectrum of optical signals. The thin film multivariate optical element and detector combination also includes at least one layer of detector film that converts optical signals into electrical signals. The thin film optical detector further includes a substrate. The at least one layer of multivariate optical element and the at least one layer of detector film are deposited on the substrate.

2. 发明申请

WO2021071474A1 TRANSMISSIVE SCATTERING FOR RADIOMETRY 审中-公开
公开(公告)号：WO2021071474A1
公开(公告)日：2021-04-15
申请号：PCT/US2019/055207
申请日：2019-10-08
申请人： HALLIBURTON ENERGY SERVICES, INC.
发明人： LI, Jian , DAI, Bin , JONES, Christopher, Michael , PRICE, James, M.
IPC分类号： G01N21/31 , G01N21/47 , G01V8/10 , G01N33/24 , E21B49/08 , E21B47/00
摘要： Systems and procedures for implementing radiometric calibration are disclosed. In some embodiments a radiometry system includes a light source that generates light. The radiometry system further includes a transmissive diffuser configured to receive the light and comprising a first translucent element having a surface and/or internal diffusion structure that substantially scatters the light. An optical detector is configured to receive and detect diffused light from the transmissive diffuser.

3. 发明申请

WO2020190348A1 DEPOSITING COATINGS ON AND WITHIN A HOUSING, APPARATUS, OR TOOL USING A COATING SYSTEM POSITIONED THEREIN 审中-公开
公开(公告)号：WO2020190348A1
公开(公告)日：2020-09-24
申请号：PCT/US2019/067204
申请日：2019-12-18
申请人： HALLIBURTON ENERGY SERVICES, INC.
发明人： PRICE, James, M.
IPC分类号： E21B17/10 , E21B23/00 , F16L58/02 , C23C16/455 , C23C16/513
摘要： A method of coating an interior surface of a housing defining a volume includes partitioning the volume into a first zone and a second zone, the first zone isolated from fluid communication with the second zone; introducing one or more reactant gases, plasma, ions, or a combination thereof to the first zone and the second zone; and forming one or more coating layers on all or a portion of the interior surface within the first and second zones via reaction of the reactant gases, the plasma, or the combination thereof. A device for coating an interior surface of a housing is also provided.

4. 发明申请

WO2017039675A1 FORMATION FLUID ANALYSIS TOOL COMPRISING AN INTEGRATED COMPUTATIONAL ELEMENT AND AN OPTICAL FILTER 审中-公开
标题翻译：包含集成计算元件和光学滤波器的形成流体分析工具
公开(公告)号：WO2017039675A1
公开(公告)日：2017-03-09
申请号：PCT/US2015/048375
申请日：2015-09-03
申请人： HALLIBURTON ENERGY SERVICES, INC.
发明人： PRICE, James, M. , NAYAK, Aditya, B. , DAI, Bin
IPC分类号： E21B49/08 , E21B47/00 , G01V8/02
CPC分类号： G01V8/02 , C23C14/24 , C23C14/35 , C23C16/45525 , E21B49/08 , E21B2049/085 , G02B5/20
摘要： An example formation fluid analysis tool includes an optical element and a detector configured to receive light passed through the optical element. The optical element is configured to receive light from a fluid sample and comprises a substrate, an integrated computational element (ICE) fabricated on a first side of the substrate, and an optical filter fabricated on a second side of the substrate opposite the first side.
摘要翻译：示例性地层流体分析工具包括光学元件和被配置为接收通过光学元件的光的检测器。光学元件被配置为从流体样品接收光，并且包括衬底，在衬底的第一侧上制造的集成计算元件（ICE）和制造在与第一侧相对的衬底的第二侧上的滤光器。

5. 发明申请

WO2016167826A1 SAMPLE ANALYSIS TOOL EMPLOYING A BROADBAND ANGLE-SELECTIVE FILTER 审中-公开
标题翻译：使用宽带角度选择过滤器的样品分析工具
公开(公告)号：WO2016167826A1
公开(公告)日：2016-10-20
申请号：PCT/US2015/044910
申请日：2015-08-12
申请人： HALLIBURTON ENERGY SERVICES, INC.
发明人： PRICE, James, M. , PERKINS, David, L.
IPC分类号： G01N21/17 , G01N21/47 , G01N21/49 , G01V8/10
CPC分类号： G01N21/49 , E21B47/00 , E21B49/088 , G01M11/00 , G01N21/211 , G01N21/25 , G01N21/31 , G01N21/55 , G01N2021/215 , G01N2021/4704 , G01N2021/556 , G01N2201/068
摘要： A sample analysis tool includes a sample chamber to hold a sample. The tool also includes a broadband angle-selective filter arranged along an optical path with the sample chamber. The tool also includes an electromagnetic radiation (ER) transducer that outputs a signal in response to electromagnetic radiation that passes through the broadband angle - selective filter. The tool also includes a storage device that stores data corresponding to the signal output from the ER transducer, wherein the data indicates a property of the sample.
摘要翻译：样品分析工具包括用于保持样品的样品室。该工具还包括沿着具有样品室的光学路径布置的宽带角选择滤光器。该工具还包括电磁辐射（ER）传感器，其输出响应于穿过宽带角度选择性滤波器的电磁辐射的信号。该工具还包括存储装置，其存储对应于从ER换能器输出的信号的数据，其中数据表示样品的性质。

6. 发明申请

WO2016167825A1 OPTICAL ELEMENT TESTING METHODS AND SYSTEMS EMPLOYING A BROADBAND ANGLE-SELECTIVE FILTER 审中-公开
标题翻译：采用宽带角度选择滤光片的光学元件测试方法和系统
公开(公告)号：WO2016167825A1
公开(公告)日：2016-10-20
申请号：PCT/US2015/044908
申请日：2015-08-12
申请人： HALLIBURTON ENERGY SERVICES, INC.
发明人： PERKINS, David, L. , PRICE, James, M.
IPC分类号： E21B49/08 , E21B47/00 , G01V3/18
CPC分类号： G01N21/49 , E21B47/00 , E21B49/088 , G01M11/00 , G01N21/211 , G01N21/25 , G01N21/31 , G01N21/55 , G01N2021/215 , G01N2021/4704 , G01N2021/556 , G01N2201/068
摘要： An optical element testing system includes a broadband angle-selective filter arranged along an optical path with an optical element to be tested. The system also includes a electromagnetic radiation transducer that outputs a signal in response to electromagnetic radiation that passes through the broadband angle-selective filter. The system also includes a storage device that stores data corresponding to the signal output from the electromagnetic radiation transducer, wherein the data indicates a property of the optical element in response to a test.
摘要翻译：光学元件测试系统包括沿光路布置的宽带角度选择滤光片和待测试的光学元件。该系统还包括电磁辐射换能器，其输出响应于穿过宽带角度选择性滤波器的电磁辐射的信号。该系统还包括存储装置，其存储对应于从电磁辐射换能器输出的信号的数据，其中数据表示响应于测试的光学元件的特性。

7. 发明申请

WO2016148706A1 METHOD FOR DESIGNING A HIGH SENSITIVITY INTEGRATED COMPUTATIONAL ELEMENT 审中-公开
标题翻译：设计高灵敏度集成计算元件的方法
公开(公告)号：WO2016148706A1
公开(公告)日：2016-09-22
申请号：PCT/US2015/021054
申请日：2015-03-17
申请人： HALLIBURTON ENERGY SERVICES, INC.
发明人： NAYAK, Aditya, B. , PRICE, James, M. , PERKINS, David, L.
IPC分类号： G06F1/16 , E21B47/00 , G01V3/18 , G01V3/38
CPC分类号： G06F17/5045 , G02B5/281 , G02B27/0012
摘要： A system and method to design highly-sensitive Integrated Computational Elements for optical computing devices. A harmonic line shape is defined and used to simulate an optical response function which has a plurality of parameters that are varied until an ideal optical response function is determined. The ideal optical response function will be that function which maximizes the output sensitivity and/or minimizes the Standard Error of Calibration. Thereafter, the method designs a film stack having an optical response function that matches the ideal transmission function, and an ICE is fabricated based upon this design.
摘要翻译：一种用于设计光学计算设备的高灵敏度集成计算元件的系统和方法。谐波线形状被定义并用于模拟具有多个参数的光学响应函数，直到确定理想的光学响应函数为止。理想的光学响应功能将是使输出灵敏度最大化和/或最小化校准标准误差的功能。此后，该方法设计具有与理想透射功能相匹配的光学响应函数的薄膜叠层，并且基于该设计制造ICE。

8. 发明申请

WO2015084303A1 INTEGRATED COMPUTATIONAL ELEMENT FABRICATION METHODS AND SYSTEMS 审中-公开
标题翻译：综合计算元件制造方法与系统
公开(公告)号：WO2015084303A1
公开(公告)日：2015-06-11
申请号：PCT/US2013/072614
申请日：2013-12-02
申请人： HALLIBURTON ENERGY SERVICES, INC.
发明人： PRICE, James, M.
IPC分类号： G01B11/06 , H01L21/66
CPC分类号： G06E3/001 , G01B11/0633 , G05B19/402 , G05B2219/49021 , G06E3/00
摘要： Methods and systems for manufacturing optical computing elements, including a method for correcting element layer thickness measurements during manufacturing that includes depositing an element layer on a glass substrate or a previously deposited layer, illuminating the deposited layer and sampling reflected or transmitted light produced by said illuminating, detecting and measuring an actual magnitude of the sampled light as a function of wavelength, and modeling the sampled light to produce a predicted magnitude of the sampled light. The method further includes determining a discrepancy between the actual and predicted magnitudes, adjusting the actual magnitude based on said discrepancy, calculating the thickness of the deposited layer based upon the adjusted actual magnitude of the sampled light, and adjusting the deposited layer's thickness if the calculated thickness is not within a tolerance range of a target thickness.
摘要翻译：用于制造光学计算元件的方法和系统，包括用于在制造期间校正元件层厚度测量的方法，包括在玻璃基底或先前沉积的层上沉积元件层，照射沉积层并对由所述照明产生的反射或透射光进行采样检测和测量作为波长的函数的采样光的实际幅度，以及对采样光进行建模以产生采样光的预测幅度。该方法还包括确定实际和预测幅度之间的差异，基于所述差异来调整实际幅度，基于经调整的采样光的实际幅度来计算沉积层的厚度，以及如果计算的厚度不在目标厚度的公差范围内。

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