会员体验
专利管家(专利管理)
工作空间(专利管理)
风险监控(情报监控)
数据分析(专利分析)
侵权分析(诉讼无效)
联系我们
交流群
官方交流:
QQ群: 891211   
微信请扫码    >>>
现在联系顾问~
热词
    • 1. 发明申请
    • DOPED SEMICONDUCTOR NANOCRYSTAL LAYERS AND PREPARATION THEREOF
    • DOPED SEMICONDUCTOR NANOCRYSTAL LAYERS AND PREPARTING THEREOF
    • WO2004066345A2
    • 2004-08-05
    • PCT/CA2004/000075
    • 2004-01-22
    • GROUP IV SEMICONDUCTOR INC.MCMASTER UNIVERSITYHILL, Steven, E.WOJCIK, JacekMASCHER, PeterIRVING, Edward, A.
    • HILL, Steven, E.WOJCIK, JacekMASCHER, PeterIRVING, Edward, A.
    • H01L
    • B82Y15/00B82Y20/00B82Y30/00C09K11/77C09K11/7706H01S3/09403
    • The present invention relates to a doped semiconductor nanocrystal layer comprising (a) a group IV oxide layer which is free of ion implantation damage, (b) from 30 to 50 atomic percent of a semiconductor nanocrystal distributed in the group IV oxide layer, and (c) from 0.5 to 15 atomic percent of one or more rare earth element, the one or more rare earth element being (i) dispersed on the surface of the semiconductor nanocrystal and (ii) distributed substantially equally through the thickness of the group IV oxide layer. The present invention also relates to a semiconductor structure comprising the above semiconductor nanocrystal layer and tThe present invention relates to a doped semiconductor nanocrystal layer comprising (a) a group IV oxide layer which is free of ion implantation damage, (b) from 30 to 50 atomic percent of a semiconductor nanocrystal distributed in the group IV oxide layer, and (c) from 0.5 to 15 atomic percent of one or more rare earth element, the one or more rare earth element being (i) dispersed on the surface of the semiconductor nanocrystal and (ii) distributed substantially equally through the thickness of the group IV oxide layer. The present invention also relates to a semiconductor structure comprising the above semiconductor nanocrystal layer and to processes for preparing the semiconductor nanocrystal layer.
    • 掺杂半导体纳米晶体层本发明涉及掺杂半导体纳米晶层,其包括(a)不含离子注入损伤的Ⅳ族氧化物层,(b)分布在IV族氧化物层中的半导体纳米晶体的30至50原子% c)0.5至15原子%的一种或多种稀土元素,所述一种或多种稀土元素为(i)分散在半导体纳米晶体的表面上,以及(ii)基本上相等地分布在IV族氧化物的厚度上 层。 本发明还涉及包含上述半导体纳米晶层的半导体结构,以及掺杂半导体纳米晶层技术领域本发明涉及一种掺杂半导体纳米晶层,其包括(a)不含离子注入损伤的Ⅳ族氧化物层,(b)30至50 分布在IV族氧化物层中的半导体纳米晶体的原子百分比,和(c)0.5至15原子%的一种或多种稀土元素,所述一种或多种稀土元素为(i)分散在半导体的表面上 纳米晶体和(ii)基本上均匀地分布在IV族氧化物层的厚度上。 本发明还涉及包含上述半导体纳米晶层的半导体结构和制备半导体纳米晶层的工艺。