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    • 1. 发明申请
    • DEVICE FOR INTERACTION-FREE MEASUREMENTS
    • 用于交互式测量的设备
    • WO2005057128A1
    • 2005-06-23
    • PCT/GB2004/005202
    • 2004-12-10
    • GHOSE, TathagataGHOSE, Parthasarathy
    • GHOSE, Parthasarathy
    • G01B11/30
    • G02B6/12004B82Y20/00G01B9/02001G01B9/02023G01B11/30G01B2290/45G01B2290/55G01N21/45G01N21/552G02B2006/12159G11B7/005
    • A device for detecting an object includes a beam splitter (BS1) which splits a beam of light from a source between a first path (U) and a second path (D). The first path (U) includes a first prism (TIR U ) arranged to reflect light from the beam splitter (B S1) by total internal reflection at a sensing surface of the first prism (TIR U ). The total internal reflection creates an evanescent wave at the sensing surface. The second path (D) includes a corresponding second prism (TIR D ). A second beam splitter (BS2) splits light from both the first path (U) and the second path (D) between two detectors (D b , D d ). The first and second paths are configured such that light from the first path (U) and light from the second path (D) interfere constructively in the direction of one of the detectors (D b ) and destructively in the direction of the other detector (D d ) when no object is present so that no light is received by the detector (D d ). When an object nears the sensing surface of the first prism (TIR U ) in the first path (U), the object scatters the evanescent wave and allows a small fraction of photons to tunnel out of the first prism (TIR U ). This disturbs the total destructive interference at the dark detector (D d ), which therefore detects photons with a non-zero probability. The detection of a photon at this detector (D d ) indicates the presence of an object in the proximity of the sensing surface of the first prism (TIR U ). When single photons are made to pass through the device one at a time, the object can be detected without the photon touching it and being scattered or absorbed.
    • 用于检测物体的装置包括在第一路径(U)和第二路径(D)之间分裂来自源的光束的分束器(BS1)。 第一路径(U)包括布置成通过在第一棱镜(TIRU)的感测表面处的全内反射来反射来自分束器(B S1)的光的第一棱镜(TIRU)。 全内反射在感测表面产生ev逝波。 第二路径(D)包括相应的第二棱镜(TIRD)。 第二分束器(BS2)在两个检测器(Db,Dd)之间分离来自第一路径(U)和第二路径(D)的光。 第一和第二路径被配置为使得来自第一路径(U)的光和来自第二路径(D)的光在检测器(Db)之一的方向上建设性地干涉并且在另一个检测器(Dd)的方向上破坏性地 )当没有物体存在时,使得检测器(Dd)没有接收到光。 当物体靠近第一路径(U)中的第一棱镜(TIRU)的感测表面时,物体散射ev逝波,并允许少部分光子从第一棱镜(TIRU)中穿出。 这会干扰暗检测器(Dd)处的全部破坏性干扰,因此会以非零概率检测光子。 在该检测器(Dd)处的光子的检测表示在第一棱镜(TIRU)的感测表面附近存在物体。 当单个光子一次通过设备时,可以检测到物体,而不会使光子接触它并被散射或吸收。