会员体验
专利管家(专利管理)
工作空间(专利管理)
风险监控(情报监控)
数据分析(专利分析)
侵权分析(诉讼无效)
联系我们
交流群
官方交流:
QQ群: 891211   
微信请扫码    >>>
现在联系顾问~
热词
    • 5. 发明申请
    • COMBINATION LASER AND CHARGED PARTICLE BEAM SYSTEM
    • 组合激光和充电粒子束系统
    • WO2011127327A3
    • 2012-02-02
    • PCT/US2011031644
    • 2011-04-07
    • FEI COSTRAW MARCUSUTLAUT MARK WPARKER N WILLIAM
    • STRAW MARCUSUTLAUT MARK WPARKER N WILLIAM
    • H01J37/08H01J37/06H01J37/244
    • H01J37/28H01J37/226H01J37/244H01J37/3056H01J2237/2815H01J2237/2855H01J2237/3174H01J2237/31749
    • A combined laser and charged particle beam system. A pulsed laser enables milling of a sample at material removal rates several orders of magnitude larger than possible for a focused ion beam. In some embodiments, a scanning electron microscope enables high resolution imaging of the sample during laser processing. In some embodiments, a focused ion beam enables more precise milling of the sample. A method and structure for deactivating the imaging detectors during laser milling enables the removal of imaging artifacts arising from saturation of the detector due to a plasma plume generated by the laser beam. In some embodiments, two types of detectors are employed: type-1 detectors provide high gain imaging during scanning of the sample with an electron or ion beam, while type-2 detectors enable lower gain imaging and endpoint detection during laser milling.
    • 组合激光和带电粒子束系统。 脉冲激光器可以以比聚焦离子束可能的数个数量级的材料去除速率对样品进行铣削。 在一些实施例中,扫描电子显微镜能够在激光加工期间对样品进行高分辨率成像。 在一些实施例中,聚焦离子束使得能够更精确地研磨样品。 用于在激光研磨期间去激活成像检测器的方法和结构使得能够消除由激光束产生的等离子体羽流引起的由检测器的饱和引起的成像伪影。 在一些实施例中,采用两种类型的检测器:第一类检测器在用电子或离子束扫描样品期间提供高增益成像,而类型2检测器在激光研磨期间能够进行较低增益成像和端点检测。
    • 6. 发明申请
    • WAFER PROCESSING SYSTEM WITH DUAL WAFER ROBOTS CAPABLE OF ASYNCHRONOUS MOTION
    • 具有能够异步运动的双晶片机器人的晶圆加工系统
    • WO2008039943A3
    • 2008-06-19
    • PCT/US2007079773
    • 2007-09-27
    • VSERV TECHCHIDAMBARAM MAHENDRANTRUONG QUOCSCHOCK JERRYPARKER N WILLIAM
    • CHIDAMBARAM MAHENDRANTRUONG QUOCSCHOCK JERRYPARKER N WILLIAM
    • B66C23/00
    • H01L21/6719B25J9/107B25J18/025H01L21/67184H01L21/67196H01L21/67742Y10T74/20305
    • A robot assembly for transferring substrates includes a central tube assembly oriented along a central axis, perpendicular to a substrate transfer plane, and having an inner surface that forms part of a first enclosure at a first pressure, and an outer surface that forms part of a second enclosure at a second, different pressure. The robot assembly further includes a transfer robot which itself includes multiple rotor assemblies, each configured to rotate parallel to the substrate transfer plane. The various rotor assemblies are organized in pairs, each pair having one rotor fitted with a telescoping support arm/end effector arrangement to support substrates thereon, and the other rotor fitted with inner and outer actuator arms that cooperate to effect radial movement of the corresponding end effector of the paired rotor assembly. Each rotor is controlled to effect the transfer of substrates within a wafer processing system asynchronously and at differing heights.
    • 一种用于传送基板的机器人组件包括中心管组件,该中心管组件沿着垂直于基板传送平面的中心轴定向并且具有形成第一压力下的第一外壳的一部分的内表面和形成 第二个外壳处于第二个不同的压力下。 机器人组件还包括传送机器人,传送机器人本身包括多个转子组件,每个转子组件均被构造成平行于基板传送平面旋转。 各种转子组件成对组装,每一对具有一个转子,该转子装配有伸缩式支撑臂/端部执行器装置以在其上支撑基板,而另一个转子装配有内部和外部致动器臂,这些致动器配合以实现相应端部的径向移动 成对转子组件的效应器。 控制每个转子以异步地且在不同的高度实现晶片处理系统内的衬底的传送。