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    • 2. 发明申请
    • SYSTEM AND METHOD FOR MEASURING PROPERTIES OF A THIN FILM COATED GLASS
    • 薄膜涂层玻璃的性能测量系统和方法
    • WO2013126317A1
    • 2013-08-29
    • PCT/US2013/026626
    • 2013-02-19
    • CARDINAL CG COMPANY
    • LAGERMAN, Jordan, B.BURROWS, Keith, J.THERING, Kyle, R.
    • G01N21/27G01N21/84G01N21/86
    • G01J3/42G01N21/274G01N21/8422G01N21/896G01N2021/8427G01N2021/8609
    • A system (10) for measuring properties of a thin film coated glass comprises a light source (12), a spectrometer (16), at least one pair of probes (24, 26), a first optical fiber switch (20), and a second optical fiber switch (22). The pair of probes includes a first probe (24) located on one (top) side of a glass sheet and a second probe (26) located on the opposite (bottom) side of the glass sheet, directly across from the first probe. Each optical probe comprises a first leg (27) and a second leg (29). The first optical fiber switch is adapted to couple the first leg of either probe to the light source. The second optical fiber switch is adapted to couple the second leg of either probe to the spectrometer. The design of the system is optically symmetrical, so that calibration may be performed without the use of a reference material such as a tile or mirror.
    • 用于测量薄膜涂覆玻璃的性质的系统(10)包括光源(12),光谱仪(16),至少一对探针(24,26),第一光纤开关(20)和 第二光纤开关(22)。 一对探针包括位于玻璃板的一个(顶部)侧的第一探针(24)和位于玻璃板的相对(底部)侧上的第二探针(26),其直接与第一探针对置。 每个光学探针包括第一腿部(27)和第二腿部(29)。 第一光纤开关适于将任一探针的第一支腿耦合到光源。 第二光纤开关适于将任一探头的第二支腿耦合到光谱仪。 该系统的设计是光学对称的,因此可以在不使用诸如瓷砖或镜子的参考材料的情况下执行校准。