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1. 发明申请

WO2009028377A1 MEASUREMENT APPARATUS AND METHOD FOR MEASURING SURFACE SHAPE AND ROUGHNESS 审中-公开
标题翻译：测量装置和测量表面形状和粗糙度的方法
公开(公告)号：WO2009028377A1
公开(公告)日：2009-03-05
申请号：PCT/JP2008/064859
申请日：2008-08-14
申请人： CANON KABUSHIKI KAISHA , OTA, Kazuyuki , YOSHIKAWA, Hiroshi , MITARAI, Yusuke , TAKIMOTO, Masafumi , OKUDOMI, Kazunori , SHINBATA, Hiroyuki , SAITOH, Kenji , MATSUGU, Masakazu
发明人： OTA, Kazuyuki , YOSHIKAWA, Hiroshi , MITARAI, Yusuke , TAKIMOTO, Masafumi , OKUDOMI, Kazunori , SHINBATA, Hiroyuki , SAITOH, Kenji , MATSUGU, Masakazu
IPC分类号： G01B11/24 , G01B11/30 , G01N21/00
CPC分类号： G01B11/24 , G01B11/30
摘要： A measurement apparatus includes an illumination light setting unit which sets illumination light having an optical characteristic corresponding to a microstructure which is formed on the surface of a measurement target and is to be measured, a measurement unit which measures reflected light when the measurement target is irradiated with the illumination light, and an extraction unit which extracts, from the measured reflected light, information about the surface shape of the measurement target and the microstructure formed on the surface.
摘要翻译：测量装置包括照明光设定单元，其设置具有对应于形成在测量对象物的表面上并要被测量的微结构的光学特性的照明光，测量单元，其在测量对象被照射时测量反射光以及从测量的反射光中提取关于测量对象的表面形状和形成在表面上的微结构的信息的提取单元。

2. 发明申请

WO2009096592A2 INFORMATION PROCESSING APPARATUS AND METHOD 审中-公开
标题翻译：信息处理装置和方法
公开(公告)号：WO2009096592A2
公开(公告)日：2009-08-06
申请号：PCT/JP2009/051829
申请日：2009-01-28
申请人： CANON KABUSHIKI KAISHA , YOSHIKAWA, Hiroshi , MITARAI, Yusuke , TAKIMOTO, Masafumi , OTA, Kazuyuki , SAITOH, Kenji , MATSUGU, Masakazu
发明人： YOSHIKAWA, Hiroshi , MITARAI, Yusuke , TAKIMOTO, Masafumi , OTA, Kazuyuki , SAITOH, Kenji , MATSUGU, Masakazu
IPC分类号： G01N21/47
CPC分类号： G01N21/57 , G01N21/4738 , G01N2021/4735
摘要： An information processing apparatus includes an obtaining unit configured to obtain first information regarding a distribution of reflected light from a target to be measured and second information regarding geometrical-optics components of the reflected light, a calculating unit configured to calculate third information on the basis of the first information and the second information, the third information indicating an approximation of the distribution of reflected light, and an output unit configured to output information regarding wave-optics components of the reflected light on the basis of the third information.
摘要翻译：一种信息处理设备，包括：获取单元，被配置为获得关于来自待测目标的反射光的分布的第一信息和关于反射光的几何光学分量的第二信息;计算单元，被配置为基于所述第一信息和所述第二信息，所述第三信息指示反射光的分布的近似值;以及输出单元，被配置为基于所述第三信息输出关于所述反射光的波长成分的信息。

3. 发明申请

WO2012081506A1 OPTICAL DISTANCE MEASUREMENT SYSTEM WITH MODULATED LUMINANCE 审中-公开
标题翻译：具有调制亮度的光学距离测量系统
公开(公告)号：WO2012081506A1
公开(公告)日：2012-06-21
申请号：PCT/JP2011/078500
申请日：2011-12-02
申请人： CANON KABUSHIKI KAISHA , YOSHIKAWA, Hiroshi
发明人： YOSHIKAWA, Hiroshi
IPC分类号： G01B11/25
CPC分类号： G01C3/08 , G01B11/026 , G01B11/2513
摘要： A distance measurement apparatus comprising: modulation means for modulating a luminance value of measurement pattern light to be projected on a measurement object for each two-dimensional position of the pattern light within a predetermined luminance value range; projection means for projecting, on the measurement object, the pattern light modulated by the modulation means; image capturing means for capturing the measurement object on which the pattern light has been projected by the projection means; and distance calculation means for calculating a distance to the measurement object based on the captured image captured by the image capturing means.
摘要翻译：一种距离测量装置，包括：调制装置，用于对预定亮度值范围内的图案光的每个二维位置调制要投影在测量对象上的测量图案光的亮度值; 投影装置，用于在测量对象上投影由调制装置调制的图案光; 用于捕获由所述投影装置投射了所述图案光的所述测量对象的图像捕获装置; 以及距离计算装置，用于基于由图像捕获装置拍摄的拍摄图像计算到测量对象的距离。

4. 发明申请

WO2011013373A1 MEASURING APPARATUS, MEASURING METHOD, AND PROGRAM 审中-公开
标题翻译：测量装置，测量方法和程序
公开(公告)号：WO2011013373A1
公开(公告)日：2011-02-03
申请号：PCT/JP2010/004802
申请日：2010-07-28
申请人： CANON KABUSHIKI KAISHA , TAKABAYASHI, Shiki , YOSHIKAWA, Hiroshi
发明人： TAKABAYASHI, Shiki , YOSHIKAWA, Hiroshi
IPC分类号： G01B11/25 , G06T1/00
CPC分类号： G01B11/2536 , G06T7/521
摘要： A measuring apparatus includes a projection control unit configured to cause a projection unit to project, onto an object, a first light pattern with light and dark portions, a second light pattern, which is smaller in distance between the light and dark portions than that of the first light pattern and has a boundary position between the light and dark portions common to the first light pattern, and a third light pattern in which the light and dark portions of the second light pattern are reversed to each other, an acquisition unit configured to acquire a first captured image of the object onto which the first light pattern is projected, a second captured image of the object onto which the second light pattern is projected, and a third captured image of the object onto which the third light pattern is projected, and a calculation unit configured to calculate the boundary position between the light and dark portions of the first captured image based on the second and the third captured image to measure the position of the object.
摘要翻译：一种测量装置，包括：投影控制单元，其被配置为使投影单元向物体突出具有明暗部分的第一光图案;第二光图案，其在明暗部分之间的距离小于第一光图案，并且具有第一光图案共同的光和暗部分之间的边界位置，以及第三光图案，其中第二光图案的明暗部分彼此反转;获取单元，被配置为拍摄投影有第一光图案的物体的第一拍摄图像，投影有第二光图案的物体的第二拍摄图像和投影有第三光图案的物体的第三拍摄图像，以及计算单元，被配置为基于所捕获的第二和第三来计算第一拍摄图像的亮部和暗部之间的边界位置图像来测量对象的位置。

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