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1. 发明申请

WO2007131134A3 MULTI-ZONE, SINGLE TRIP WELL COMPLETION SYSTEM AND METHODS OF USE 审中-公开
标题翻译：多区，单步完井系统及其使用方法
公开(公告)号：WO2007131134A3
公开(公告)日：2008-03-06
申请号：PCT/US2007068182
申请日：2007-05-03
申请人： BJ SERVICES CO , WALKER DAVID J
发明人： WALKER DAVID J
IPC分类号： E21B34/14 , E21B43/04
CPC分类号： E21B23/006 , E21B33/12 , E21B34/06 , E21B34/063 , E21B43/08 , E21B43/14 , E21B43/26
摘要： An improved well completion system (100) for completing two or more separate production zones in a well bore during a single downhole trip is disclosed. The improved completion system comprises a completion assembly comprising two or more production zone assemblies (108) and a completion tool assembly. Each production zone assembly (106) may comprise an automatic system locating assembly and at least two inverted seal systems for sealing against the tool assembly.
摘要翻译：公开了一种改进的完井系统（100），用于在单次井下行程期间在井眼中完成两个或更多个分开的生产区。改进的完井系统包括完成组件，其包括两个或更多个生产区组件（108）和完井工具组件。每个生产区组件（106）可以包括自动系统定位组件和用于密封工具组件的至少两个倒置的密封系统。

2. 发明申请

WO9825074A2 CIRCULATING FLUIDIZED BED FURNACE/REACTOR WITH AN INTEGRAL SECONDARY AIR PLENUM 审中-公开
标题翻译：循环流化床炉/反应器与一体二次空气气体
公开(公告)号：WO9825074A2
公开(公告)日：1998-06-11
申请号：PCT/US9722257
申请日：1997-12-02
申请人： BABCOCK & WILCOX CO , BELIN FELIX , WALKER DAVID J
发明人： BELIN FELIX , WALKER DAVID J
IPC分类号： F23C10/02 , F22B31/00 , F23C10/10 , F23C10/20 , F23G5/30 , F23L9/02 , F23C
CPC分类号： F22B31/0084 , F23C10/10 , F23L9/02
摘要： A circulating fluidized bed processor has a processor enclosure at least partially defined by a front wall and a rear wall spaced away from the front wall. A bottom wall is connected between the front and rear walls and a mechanism is provided for supplying primary air through the bottom wall for fluidizing a circulating bed in the enclosure. Another mechanism is provided for recirculating the bed from a top of the enclosure back to the enclosure. One or more secondary air plenum(s) are provided in the enclosure between the front and rear walls for supplying secondray air into the fluidized bed, above the bottom wall, so that secondary air reaches deep into the enclosure. The plenum(s) are formed of a waterwall which has a plurality of openings therein to allow communication of gases and solids therethrough from one side of the waterwall to the other.
摘要翻译：循环流化床处理器具有至少部分地由前壁和与前壁间隔开的后壁限定的处理器外壳。底壁连接在前壁和后壁之间，并且设置有用于通过底壁供应一次空气以使外壳中的循环床流化的机构。提供另一机构用于将床从外壳的顶部再循环回外壳。一个或多个二次空气通风室设置在前壁和后壁之间的外壳中，用于将二次空气提供到底壁上方的流化床中，使二次空气深入到外壳内。增压室由水壁形成，其中具有多个开口，以允许气体和固体从水壁的一侧到另一侧连通。

3. 发明申请

WO2012078919A3 METHOD AND APPARATUS FOR MESSAGE HANDLING DURING POWER SAVING MODES 审中-公开
标题翻译：节电模式下的消息处理方法与装置
公开(公告)号：WO2012078919A3
公开(公告)日：2012-11-01
申请号：PCT/US2011064018
申请日：2011-12-08
申请人： QUALCOMM INC , TEAGUE EDWARD H , WALKER DAVID J
发明人： TEAGUE EDWARD H , WALKER DAVID J
IPC分类号： H04W52/02 , G06F13/36
CPC分类号： H04W52/0229 , Y02D70/00 , Y02D70/26
摘要： A method for implementing a sleep control that includes the steps of receiving a message from a sending block via a messaging bus, wherein the message is destined for a receiving block; determining whether the receiving block is awake; and delaying further transmission of the message until the receiving block is awake. An apparatus for performing the method is also disclosed.
摘要翻译：一种用于实现睡眠控制的方法，包括以下步骤：经由消息总线从发送块接收消息，其中所述消息指定给接收块; 确定接收块是否清醒; 并延迟消息的进一步传输，直到接收块清醒。还公开了一种用于执行该方法的装置。

4. 发明申请

WO0180304A8 IMPROVED TEST STRUCTURES AND METHODS FOR INSPECTING AND UTILIZING THE SAME 审中-公开
标题翻译：改进的检查和使用它们的测试结构和方法
公开(公告)号：WO0180304A8
公开(公告)日：2001-12-27
申请号：PCT/US0034086
申请日：2000-12-14
申请人： KLA TENCOR CORP , SATYA AKELLA V S , PINTO GUSTAVO A , ADLER DAVID L , LONG ROBERT THOMAS , RICHARDSON NEIL , WEINER KURT H , WALKER DAVID J , MANTALAS LYNDA C
发明人： SATYA AKELLA V S , PINTO GUSTAVO A , ADLER DAVID L , LONG ROBERT THOMAS , RICHARDSON NEIL , WEINER KURT H , WALKER DAVID J , MANTALAS LYNDA C
IPC分类号： H01L21/66 , H01L23/544
CPC分类号： H01L22/34 , H01L22/12 , H01L2924/0002 , H01L2924/00
摘要： A sample is inspected by moving to a first field associated with a first group of test structures, which are partially within the first field, which is scanned to determine whether there are any defects present. If defects are present a specific defect location is determined by repeatedly stepping to areas and scanning such areas within the first group of test structures. In a second method, a sample is scanned in a first direction and in a second direction at an angle to the first direction with at least one particle beam. The number of defects per area of the sample are found as a result of the first scan, and the position of one or more of the found defects is determined from the second scan. A semiconductor die includes test structures located entirely within a scanning area and only partially within the scanning area. The test structures are arranged so that a scan of the scanning area results in detection of defects outside of the scanning area.
摘要翻译：通过移动到与第一组测试结构相关联的第一场来检查样本，该第一场是部分地在第一场内，其被扫描以确定是否存在任何缺陷。如果存在缺陷，则通过反复步进到区域并扫描第一组测试结构内的这些区域来确定特定缺陷位置。在第二种方法中，使用至少一个粒子束，在第一方向和第二方向上以与第一方向成一定角度扫描样品。作为第一扫描的结果，发现样品的每个区域的缺陷数，并且从第二扫描确定发现的一个或多个缺陷的位置。半导体管芯包括完全位于扫描区域内并且仅部分地位于扫描区域内的测试结构。测试结构被布置成使得扫描区域的扫描导致检测到扫描区域外的缺陷。

5. 发明申请

WO9640083A3 METHODS AND COMPOSITIONS FOR PREPARING SOFT GELATIN CAPSULES HAVING SHELLS RESISTANT TO PERMEATION BY FILL MATERIALS 审中-公开
标题翻译：用于制备具有抗渗透性的薄膜的软胶囊的方法和组合物
公开(公告)号：WO9640083A3
公开(公告)日：1997-02-06
申请号：PCT/US9609145
申请日：1996-06-06
申请人： SCHERER CORP R P , SUNDARARAJAN MANI R , YOUNGBLOOD ELIZABETH , RODRIGUES GILBERT T , WALKER DAVID J , BEKE PETER , STROUD NORMAN S
发明人： SUNDARARAJAN MANI R , YOUNGBLOOD ELIZABETH , RODRIGUES GILBERT T , WALKER DAVID J , BEKE PETER , STROUD NORMAN S
IPC分类号： A61K9/48
CPC分类号： A61K9/4891
摘要： Disclosed are gelatin capsules having a means for isolating the fill material from the gelatin material forming the shell of the capsule.

6. 发明申请

WO0180304A3 IMPROVED TEST STRUCTURES AND METHODS FOR INSPECTING AND UTILIZING THE SAME 审中-公开
标题翻译：改进的检查和使用它们的测试结构和方法
公开(公告)号：WO0180304A3
公开(公告)日：2003-05-15
申请号：PCT/US0034086
申请日：2000-12-14
申请人： KLA TENCOR CORP , SATYA AKELLA V S , PINTO GUSTAVO A , ADLER DAVID L , LONG ROBERT THOMAS , RICHARDSON NEIL , WEINER KURT H , WALKER DAVID J , MANTALAS LYNDA C
发明人： SATYA AKELLA V S , PINTO GUSTAVO A , ADLER DAVID L , LONG ROBERT THOMAS , RICHARDSON NEIL , WEINER KURT H , WALKER DAVID J , MANTALAS LYNDA C
IPC分类号： H01L21/66 , H01L23/544
CPC分类号： H01L22/34 , H01L22/12 , H01L2924/0002 , H01L2924/00
摘要： A sample is inspected by moving to a first field associated with a first group of test structures, which are partially within the first field, which is scanned to determine whether there are any defects present. If defects are present a specific defect location is determined by repeatedly stepping to areas and scanning such areas within the first group of test structures. In a second method, a sample is scanned in a first direction and in a second direction at an angle to the first direction with at least one particle beam. The number of defects per area of the sample are found as a result of the first scan, and the position of one or more of the found defects is determined from the second scan. A semiconductor die includes test structures located entirely within a scanning area and only partially within the scanning area. The test structures are arranged so that a scan of the scanning area results in detection of defects outside of the scanning area.
摘要翻译：通过移动到与第一组测试结构相关联的第一场来检查样本，该第一场是部分地在第一场内，其被扫描以确定是否存在任何缺陷。如果存在缺陷，则通过反复步进到区域并扫描第一组测试结构内的这些区域来确定特定缺陷位置。在第二种方法中，使用至少一个粒子束，在第一方向和第二方向上以与第一方向成一定角度扫描样品。作为第一扫描的结果，发现样品的每个区域的缺陷数，并且从第二扫描确定发现的一个或多个缺陷的位置。半导体管芯包括完全位于扫描区域内并且仅部分地位于扫描区域内的测试结构。测试结构被布置成使得扫描区域的扫描导致检测到扫描区域外的缺陷。

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