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    • 2. 发明申请
    • LOW VOLTAGE CHARGE PUMP
    • 低电压充电泵
    • WO2008153781A1
    • 2008-12-18
    • PCT/US2008/006669
    • 2008-05-23
    • ATMEL CORPORATIONFORT, JimmySIRACUSA, Fabrice
    • FORT, JimmySIRACUSA, Fabrice
    • H02M3/07
    • H02M3/073H02M2003/075
    • A single pump stage (200) of a multi-stage charge pump couples a first low-voltage NMOS transistor (N1) in series with a first low-voltage PMOS transistor (P1) between charge transfer capacitors (Ct1, Ct2). A second low- voltage NMOS transistor (N2) is coupled between the gate and the source of the first NMOS transistor (N1). A second low-voltage PMOS transistor (P2) is coupled between the gate and the source of the first PMOS transistor (P1). Respective boost voltages are applied to gates of the first NMOS transistor (N1) and the first PMOS transistor (P1) to minimize threshold voltage losses. A stabilizing capacitor (Ci) is connected between the first NMOS transistor (N1) and the first PMOS transistor (P1).
    • 多级电荷泵的单个泵级(200)将第一低电压NMOS晶体管(N1)与电荷转移电容器(Ct1,Ct2)之间的第一低电压PMOS晶体管(P1)串联耦合。 第二低电压NMOS晶体管(N2)耦合在第一NMOS晶体管(N1)的栅极和源极之间。 第二低电压PMOS晶体管(P2)耦合在第一PMOS晶体管(P1)的栅极和源极之间。 相应的升压电压施加到第一NMOS晶体管(N1)和第一PMOS晶体管(P1)的栅极,以最小化阈值电压损耗。 稳定电容器(Ci)连接在第一NMOS晶体管(N1)和第一PMOS晶体管(P1)之间。
    • 3. 发明申请
    • SINGLE ENDED SENSE AMPLIFIER
    • 单端感应放大器
    • WO2008100428A1
    • 2008-08-21
    • PCT/US2008/001696
    • 2008-02-08
    • ATMEL CORPORATIONFORT, Jimmy
    • FORT, Jimmy
    • G11C7/06
    • G11C7/067
    • A sense amplifier has a transimpedance amplifier capable of producing an output voltage level proportionate to a current variation sensed going into a bitline. A transconductance device is configured to produce varying bitline current in response to the transimpedance amplifier output voltage. The transconductance device is capable of utilizing the transimpedance amplifier output voltage as feedback to produce a bitline clamp voltage level. The transimpedance amplifier configured to produce an output voltage proportionate to a cell current of a selected memory cell and provide an output signal corresponding to a memory cell state. An output amplifier is coupled to the transimpedance amplifier and capable of producing an output signal level proportionate to the transimpedance amplifier output voltage. A bias circuit is coupled to the transimpedance amplifier and the output amplifier, the bias circuit is capable of producing reference mirror currents through the transimpedance amplifier and the output amplifier.
    • 读出放大器具有跨阻抗放大器,能够产生与感测进入位线的电流变化成比例的输出电压电平。 跨导装置被配置为响应于跨阻放大器输出电压产生变化的位线电流。 跨导器件能够利用跨阻放大器输出电压作为反馈来产生位线钳位电压电平。 跨阻放大器被配置为产生与所选择的存储器单元的单元电流成比例的输出电压,并提供对应于存储单元状态的输出信号。 输出放大器耦合到跨阻放大器,并且能够产生与跨阻放大器输出电压成比例的输出信号电平。 偏置电路耦合到跨阻放大器和输出放大器,偏置电路能够通过跨阻放大器和输出放大器产生参考反射镜电流。
    • 4. 发明申请
    • HIGH-SPEED, SELF-SYNCHRONIZED CURRENT SENSE AMPLIFIER
    • 高速,自同步电流检测放大器
    • WO2008021655A2
    • 2008-02-21
    • PCT/US2007/074009
    • 2007-07-20
    • ATMEL CORPORATIONFORT, JimmyDAGA, Jean-michel
    • FORT, JimmyDAGA, Jean-michel
    • G11C7/00
    • G11C7/067G11C7/14G11C16/26G11C16/28G11C2207/063
    • A sense amplifier circuit (10) and a method for reading a memory cell. A circuit comprises a bit line (46) associated with a memory cell. A first input of a latch (12) is coupled to the bit line and a second input of the latch is coupled to a second node (32) of a dummy bit line (48). There is a means for biasing (24, 26, 38, 40) the first input and the second input of the latch to a differential voltage between the first node (30) coupled to the bit line and the second node. There is also a means for switching (52, 54, 56, 78) the latch according to memory cell current. There is also a means (74, 66, 68) for producing an output signal (dout) indicating the direction of switch. A method of reading a memory cell comprises precharging a bit line which is associated with a memory cell. The memory cell current is driven according to the programmed state of the memory cell. Latch circuitry is biased based on a differential voltage between a first node coupled to the bit line and a second node. The latch circuitry is then activated and the latch circuitry switches according to the memory cell current. An output signal indicating the direction of the latch circuitry's switch is then produced.
    • 一种读出放大器电路(10)和一种用于读取存储单元的方法。 电路包括与存储器单元相关联的位线(46)。 锁存器(12)的第一输入端耦合到位线,并且锁存器的第二输入端耦合到虚拟位线(48)的第二节点(32)。 存在用于将第一输入和锁存器的第二输入偏置(24,26,38,40)到耦合到位线和第二节点的第一节点(30)之间的差分电压的装置。 还存在根据存储器单元电流来切换(52,54,56,78)锁存器的装置。 还有一种用于产生指示切换方向的输出信号(dout)的装置(74,66,68)。 读取存储器单元的方法包括对与存储器单元相关联的位线进行预充电。 根据存储单元的编程状态来驱动存储单元电流。 锁存电路基于耦合到位线的第一节点与第二节点之间的差分电压而偏置。 然后锁存电路被激活,并且锁存电路根据存储单元电流进行切换。 然后产生指示锁存电路的开关方向的输出信号。