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    • 1. 发明申请
    • METHOD AND APPARATUS FOR DRYING SUBSTRATES
    • 用于干燥基材的方法和设备
    • WO9908057A3
    • 1999-06-17
    • PCT/US9816298
    • 1998-08-05
    • APPLIED MATERIALS INC
    • FISHKIN BORISHEARNE JOHN SLOWRANCE ROBERT B
    • F26B5/00F26B9/06F26B21/00H01L21/00H01L21/304H01L21/687
    • H01L21/68728H01L21/67034Y10S134/902
    • A drying apparatus (20) for removing residual liquid from a substrate surface comprises a vapor chamber (25) having a vapor distributor (30) for introducing vapor into the chamber. The drying apparatus (20) further comprises a fluid system (35) comprising (i) a reservoir (40), (ii) a fluid dispenser (45) for introducing fluid into the reservoir, and (iii) a fluid level adjuster (50) for lowering a fluid surface level in the reservoir (40). A multi-point holder (62) is used for holding the substrate (55) at different holding points (63) on the substrate, while the fluid surface level is lowered relative to the substrate, so that residual liquid flows off the substrate surface without intersection of the lowering fluid surface level with holding points (63) on the substrate. The drying apparatus (20) dries substrates (55) substantially without forming stains or streaks, or causing contamination or liquid residue to remain on the substrate (55).
    • 一种用于从基底表面去除残留液体的干燥设备(20)包括具有蒸气分配器(30)的蒸气室(25),蒸气分配器(30)用于将蒸气引入室中。 (20)还包括流体系统(35),该流体系统包括(i)储存器(40),(ii)用于将流体引入储存器中的流体分配器(45),以及(iii)流体水平调节器 )用于降低储存器(40)中的流体表面水平。 多点支架(62)用于将基板(55)保持在基板上的不同保持点(63)处,同时流体表面高度相对于基板降低,使得残余液体从基板表面流出而没有 下降流体表面水平与基板上的保持点(63)相交。 干燥设备(20)基本上不形成污点或条纹或使污染物或液体残留物保留在基底(55)上而干燥基底(55)。