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    • 1. 发明申请
    • BACK-BIASING WORD LINE SWITCH TRANSISTORS
    • 反向偏移字线开关晶体管
    • WO2013062936A1
    • 2013-05-02
    • PCT/US2012/061421
    • 2012-10-23
    • SANDISK TECHNOLOGIES, INC.TOYAMA, FumiakiHIGASHITANI, Masaaki
    • TOYAMA, FumiakiHIGASHITANI, Masaaki
    • G11C16/04G11C16/08
    • G11C16/0483G11C16/08
    • Back biasing word line switch transistors is disclosed. One embodiment includes word line switch transistors that are in a well in a substrate. A memory array having non-volatile storage devices may be in a separate well in the substrate. The well of the word line switch transistors may be biased separately from the well of the non-volatile storage devices. While programming the non-volatile storage devices, a negative voltage may be applied to the well of the word line switch transistors. This may reduce the voltage that needs to be applied to the gate of a WL switch transistor to pass the program voltage to the selected word line. Therefore, charge pumps can be made smaller, since the maximum voltage they need to generate is smaller. A word line switch transistor may be back-biased during a read operation to pass a negative read compare voltage to a selected word line.
    • 公开了背偏置字线开关晶体管。 一个实施例包括位于衬底中的阱中的字线开关晶体管。 具有非易失性存储装置的存储器阵列可以在衬底中的单独的阱中。 字线开关晶体管的阱可以与非易失性存储器件的阱分开偏置。 在对非易失性存储设备进行编程时,可以向字线开关晶体管的阱施加负电压。 这可以降低需要施加到WL开关晶体管的栅极的电压,以将编程电压传递到所选择的字线。 因此,可以使电荷泵更小,因为它们需要产生的最大电压较小。 在读取操作期间,字线开关晶体管可以被反向偏置,以将负的读取比较电压传递到所选择的字线。