专利快速检索-快速检索全球专利，免费商用专利数据库-IPRDB

2. 发明申请

WO2008118440A1 MEASURING AIR QUALITY USING A MICRO-OPTICAL MECHANICAL GAS SENSOR 审中-公开
标题翻译：使用微光机械气体传感器测量空气质量
公开(公告)号：WO2008118440A1
公开(公告)日：2008-10-02
申请号：PCT/US2008/003916
申请日：2008-03-26
申请人： KING, Robert, A. , RUDA, Harry, E. , FERNANDES, Carlos
发明人： RUDA, Harry, E. , FERNANDES, Carlos
IPC分类号： G01N33/00
CPC分类号： G01N21/67 , F24F11/30 , F24F2110/50 , G01N1/2273 , G01N33/0004 , G01N2021/0346 , H05H1/0037
摘要： A system and method for measuring air quality using a micro-optical mechanical gas sensor is disclosed. The system includes an emission source that includes a conduit gap for receiving a gas; a plurality of electrodes for applying an electric field to at least a portion of the conduit gap, the application of the electric field creating a plasma in the conduit gap; and a detector that detects an emission from the plasma. The method includes the steps of (1) placing a chip containing an emission source and a detector in a gas flow; (2) applying an electric field to at least a portion of a conduit gap within the emission source, the electric field creating a plasma; (3) detecting an emission from the plasma; and (4) processing data related to the detected emission to determine at least one constituent of the gas flow.
摘要翻译：公开了一种使用微光学机械气体传感器测量空气质量的系统和方法。该系统包括排放源，其包括用于接收气体的导管间隙; 用于向导管间隙的至少一部分施加电场的多个电极，施加在导管间隙中产生等离子体的电场; 以及检测来自等离子体的发射的检测器。该方法包括以下步骤：（1）将含有发射源和检测器的芯片放置在气流中; （2）向发射源内的导管间隙的至少一部分施加电场，产生等离子体的电场; （3）检测等离子体的发射; 和（4）处理与检测到的发射有关的数据，以确定气流的至少一个成分。

IPRDB

热门服务

关于我们

友情链接

联系方式