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    • 2. 发明申请
    • METHOD AND SYSTEM FOR INCORPORATION OF PATTERNS AND DESIGN RULE CHECKING
    • 用于加载图案和设计规则检查的方法和系统
    • WO2006127485A3
    • 2007-06-21
    • PCT/US2006019509
    • 2006-05-19
    • CADENCE DESIGN SYSTEMS INCSCHEFFER LOUIS KNOICE DAVID C
    • SCHEFFER LOUIS KNOICE DAVID C
    • G06F17/50
    • G06F17/5081
    • Methods and systems for representing the limitations of a lithographic process using a pattern library instead of, or in addition to, using design rules. The pattern library includes "known good" patterns, which chip fabricators know from experience are successful, and "known bad" patterns, which chip fabricators know to be unsuccessful. The pattern library can be used to contain exceptions to specified design rules, or to replace the design rules completely. In some implementations, the pattern library contains statistical information that is used to contribute to an overall figure of merit for the design. In other implementations, a routing tool may generate a plurality of possible IC layouts, and select one IC layout based on information contained in the pattern library.
    • 用于使用模式库代替使用设计规则或除了使用设计规则来表示光刻过程的限制的方法和系统。 模式库包括“已知的”模式,哪些芯片制造商从经验中知道是成功的,以及“已知的坏”模式,哪些芯片制造商知道是不成功的。 模式库可用于包含指定设计规则的异常,或者完全替换设计规则。 在一些实现中,模式库包含统计信息,用于为设计提供整体品质因数。 在其他实现中,路由工具可以生成多个可能的IC布局,并且基于包含在模式库中的信息来选择一个IC布局。
    • 3. 发明申请
    • METHOD AND SYSTEM FOR INCORPORATION OF PATTERNS AND DESIGN RULE CHECKING
    • 用于加载图案和设计规则检查的方法和系统
    • WO2006127485A2
    • 2006-11-30
    • PCT/US2006/019509
    • 2006-05-19
    • CADENCE DESIGN SYSTEMS, INC.SCHEFFER, Louis, K.NOICE, David, C.
    • SCHEFFER, Louis, K.NOICE, David, C.
    • G06F17/50
    • G06F17/5081
    • Methods and systems for representing the limitations of a lithographic process using a pattern library instead of, or in addition to, using design rules. The pattern library includes "known good" patterns, which chip fabricators know from experience are successful, and "known bad" patterns, which chip fabricators know to be unsuccessful. The pattern library can be used to contain exceptions to specified design rules, or to replace the design rules completely. In some implementations, the pattern library contains statistical information that is used to contribute to an overall figure of merit for the design. In other implementations, a routing tool may generate a plurality of possible IC layouts, and select one IC layout based on information contained in the pattern library.
    • 用于使用模式库代替使用设计规则或除了使用设计规则来表示光刻过程的限制的方法和系统。 模式库包括“已知的”模式,哪些芯片制造商从经验中知道是成功的,以及“已知的坏”模式,哪些芯片制造商知道是不成功的。 模式库可用于包含指定设计规则的异常,或者完全替换设计规则。 在一些实现中,模式库包含统计信息,用于为设计提供整体品质因数。 在其他实现中,路由工具可以生成多个可能的IC布局,并且基于包含在模式库中的信息来选择一个IC布局。