会员体验
专利管家(专利管理)
工作空间(专利管理)
风险监控(情报监控)
数据分析(专利分析)
侵权分析(诉讼无效)
联系我们
交流群
官方交流:
QQ群: 891211   
微信请扫码    >>>
现在联系顾问~
热词
    • 3. 发明申请
    • SENSOR FOR MICROSCOPY.
    • 传感器用于显微镜。
    • WO2011080670A1
    • 2011-07-07
    • PCT/IB2010/056005
    • 2010-12-22
    • KONINKLIJKE PHILIPS ELECTRONICS N.V.HULSKEN, BasSTALLINGA, Sjoerd
    • HULSKEN, BasSTALLINGA, Sjoerd
    • G02B21/36
    • G02B21/367G02B21/241G02B21/361
    • This invention pertains to a method for microscopically imaging a sample, with a digital scanner comprising a sensor including a 2D array of pixels and to a digital scanning microscope carrying out this method. It is notably provided a method for microscopically imaging a sample with a scanner comprising a sensor including a 2D array of pixels in an XY coordinate system, the axis Y being substantially perpendicular to the scan direction, wherein the scanner is arranged such that the sensor can image an oblique cross section of the sample, and wherein the method comprises the steps of: • activating a first sub-array of the 2D array of pixels, the first sub-array extending mainly along the Y axis at a first X coordinate (X1), • creating a first image by imaging a first area of the sample by means of the first sub-array of pixels. According to aspects of the invention, it is further proposed a scanner carryout this method and using the same 2D array sensor for imaging and auto-focusing purpose.
    • 本发明涉及一种用于对样品进行微观成像的方法,数字扫描器包括包含2D阵列像素的传感器和执行该方法的数字扫描显微镜。 特别提供了一种用于使用扫描仪对样品进行显微成像的方法,所述扫描器包括在XY坐标系中包括像素的2D阵列的传感器,所述轴线Y基本上垂直于扫描方向,其中扫描器被布置成使得传感器可 对样本的倾斜横截面进行成像,并且其中所述方法包括以下步骤:激活2D阵列的第一子阵列,所述第一子阵列主要沿着Y轴在第一X坐标(X1 ),°通过借助于第一像素子阵列对样本的第一区域进行成像而产生第一图像。 根据本发明的方面,进一步提出扫描器执行该方法并使用相同的2D阵列传感器用于成像和自动聚焦目的。
    • 6. 发明申请
    • AUTOFOCUS FOR A MICROSCOPE SYSTEM.
    • 自动识别系统。
    • WO2010067256A1
    • 2010-06-17
    • PCT/IB2009/055431
    • 2009-12-01
    • KONINKLIJKE PHILIPS ELECTRONICS N.V.KIEFT, ErikVan DIJK, ErikSTALLINGA, SjoerdHULSKEN, Bas
    • KIEFT, ErikVan DIJK, ErikSTALLINGA, SjoerdHULSKEN, Bas
    • G02B21/24
    • G02B21/245G02B21/006
    • A scanning microscope (10) for imaging a sample (12) comprises imaging optics (54, 56) for generating an imaging light spot (44); a scan mechanism for translating the sample (12) relative to the imaging light spot (44) in a horizontal plane, a focusing mechanism for translating the sample (12) relative to the imaging light spot (44) on a vertical axis; autofocus optics (36, 58, 60, 66, 56, 54) for generating during an autofocus interval a set of autofocus light spots (46, 47) in the sample (12), the autofocus light spots having different vertical positions; a detector (52, 53) for receiving autofocus light (40) from each of the autofocus light spots (46, 47) and for delivering a detector signal as a function of the received autofocus light (40); a controller for determining from the detector signal a vertical position of an object in the sample (12) and for causing the focusing mechanism to adapt the vertical position of the imaging light spot (44) to the vertical position of the object in the sample (12). The sample (12) may comprise a substrate layer (18), a specimen layer (16) containing organic matter (24), and a cover layer (14); the organic matter (24) being the object in the sample. In a preferred embodiment, the detector is comprises a confocal arrangement.
    • 用于对样品(12)成像的扫描显微镜(10)包括用于产生成像光点(44)的成像光学器件(54,56)。 用于在水平平面中相对于成像光点(44)平移样本(12)的扫描机构,用于在垂直轴上相对于成像光点(44)平移样本(12)的聚焦机构; 自动对焦光学器件(36,58,60,66,56,54),用于在自动聚焦间隔期间在样本(12)中产生一组自动聚焦光点(46,47),所述自动聚焦光点具有不同的垂直位置; 用于从每个自动聚焦光点(46,47)接收自动聚焦光(40)并用于传送作为所接收的自动聚焦光(40)的函数的检测器信号的检测器(52,53); 控制器,用于根据检测器信号确定样品(12)中的物体的垂直位置,并使聚焦机构使成像光点(44)的垂直位置适应样品中的物体的垂直位置( 12)。 样品(12)可以包括基底层(18),含有有机物质的试样层(16)和覆盖层(14); 有机物(24)是样品中的物体。 在优选实施例中,检测器包括共焦排列。
    • 7. 发明申请
    • METHOD AND MEANS FOR NEAR-FIELD MICROSCOPY BASED ON TRANSIENT PROBES IN A PHASE-CHANGE MATERIAL.
    • 基于相变材料瞬态探测的近场微观方法与方法。
    • WO2010018514A1
    • 2010-02-18
    • PCT/IB2009/053488
    • 2009-08-07
    • KONINKLIJKE PHILIPS ELECTRONICS N.V.HULSKEN, BasSTALLINGA, Sjoerd
    • HULSKEN, BasSTALLINGA, Sjoerd
    • G01Q60/18G02B21/34
    • G01Q60/22G02B5/23G02B21/34
    • A slide for carrying a sample (38), for use with a near-field optical microscope (10), comprises a phase-change layer (36). Any region (40) of the phase-change layer is capable of reversibly assuming a first phase or a second phase independently of other regions of the phase-change layer. With regard to illumination light (44), the region's transmittance is substantially higher in the second phase than in the first phase, or the region's reflectivity is substantially higher in the second phase than in the first phase. A method of imaging a sample (38) comprises the steps of placing the sample (38) on a slide of the type described above; creating a probe region (40) in the phase-change layer (36), the probe region being surrounded by a surrounding region (42) of the phase-change layer (36), wherein the surrounding region (42) is in the first phase while the probe region (40) is in the second phase; illuminating the probe region (40) by illumination light (44), whereby illumination light is at least partially transmitted through or reflected by the probe region (40) so as to illuminate a region (50) of the sample (38); and detecting light (48) from the sample (38). A near-field optical microscope comprising a slide as described above is also disclosed.
    • 用于携带用于近场光学显微镜(10)的样品(38)的载玻片包括相变层(36)。 相变层的任何区域(40)能够独立于相变层的其它区域可逆地假设第一相或第二相。 对于照明光(44),第二相中的区域的透射率比第一相中的透射率明显更高,或者第二相中的区域的反射率比在第一相中显着更高。 成像样品(38)的方法包括以下步骤:将样品(38)放置在上述类型的载玻片上; 在所述相变层(36)中产生探针区域(40),所述探针区域被所述相变层(36)的周围区域(42)包围,其中所述周围区域(42)处于所述第一 而探针区域(40)处于第二阶段; 通过照明光(44)照射探针区域(40),由此照明光至少部分透射通过探针区域(40)或由探针区域(40)反射,以照射样品(38)的区域(50)。 以及从所述样品(38)检测光(48)。 还公开了包括如上所述的载玻片的近场光学显微镜。
    • 10. 发明申请
    • SCANNING MICROSCOPE.
    • 扫描显微镜
    • WO2010070553A1
    • 2010-06-24
    • PCT/IB2009/055659
    • 2009-12-10
    • KONINKLIJKE PHILIPS ELECTRONICS N.V.Van DIJK, ErikHULSKEN, BasHEZEMANS, CorneliusVERBERNE, Henricus
    • Van DIJK, ErikHULSKEN, BasHEZEMANS, CorneliusVERBERNE, Henricus
    • G02B21/36
    • G02B21/367G01D5/34746G02B21/245
    • A scanning microscope (10) comprises a stage (18) for holding a sample (20), a scan mechanism, a probing system for probing a region (24) of the sample (20), a position sensor (80, 82), and a controller. The scan mechanism is designed for translating the stage (18) between at least two axial positions. The probing system 10 comprises an optical element and a photosensor having a readout region, wherein the readout region extends in a direction (14), which is transverse to an ideal orientation (72) of the stage (18). The position sensor (80, 82) serves for measuring a transverse position (84, 86) of the stage (18) and/or of an orientation (74) of the stage (18). The controller (30) serves for adapting the probing system as a function of the measured 15 transverse position (84, 86) and/or the measured orientation (74).
    • 扫描显微镜(10)包括用于保持样品(20)的台(18),扫描机构,用于探测样品(20)的区域(24)的探测系统,位置传感器(80,82) 和控制器。 扫描机构设计用于在至少两个轴向位置之间平移台架(18)。 探测系统10包括光学元件和具有读出区域的光电传感器,其中读出区域沿横向于平台(18)的理想取向(72)的方向(14)延伸。 位置传感器(80,82)用于测量载物台(18)的横向位置(84,86)和/或载物台(18)的取向(74)。 控制器(30)用于根据测量的15横向位置(84,86)和/或所测量的取向(74)来调整探测系统。