会员体验
专利管家(专利管理)
工作空间(专利管理)
风险监控(情报监控)
数据分析(专利分析)
侵权分析(诉讼无效)
联系我们
交流群
官方交流:
QQ群: 891211   
微信请扫码    >>>
现在联系顾问~
热词
    • 2. 发明申请
    • METHOD AND DEVICE FOR ANALYSING A HIGHLY DYNAMIC WAVEFRONT
    • 用于分析高动态波形的方法和装置
    • WO0042401A3
    • 2001-08-16
    • PCT/FR0000063
    • 2000-01-14
    • IMAGINE OPTICLEVECQ XAVIER JEAN FRANCOISBUCOURT SAMUEL HENRI
    • LEVECQ XAVIER JEAN-FRANCOISBUCOURT SAMUEL HENRI
    • G01M11/00G01J9/00
    • G01J9/00
    • The invention concerns the analysis of an optical wavefront. The inventive device comprises in particular an array (ML) of micro-lenses (Li), a detector (DET) and signal processing means. Each micro-lens (Li) defines a sub-soft aperture (SPi), and focuses an elementary surface of said wavefront, intercepted by said sub-soft aperture, to form a spot (Ti) on the detector. For each sub-soft aperture (SPi), a zone (Zi) of assumed localisation of the spot is defined. The processing means enable to establish a measurement file associating with each sub-soft aperture the position of said spot. The array structure (ML) has one or several local variations. By comparing the contribution derived therefrom taken from the measurement file, with their contribution derived from a reference file, the shift between the sub-soft aperture wherefrom is derived a detected spot and the sub-soft aperture which defines the assumed localisation zone wherein the spot is located is measured.
    • 本发明涉及光波前的分析。 本发明的装置特别包括微透镜(Li)的阵列(ML),检测器(DET)和信号处理装置。 每个微透镜(Li)限定子软孔(SPi),并且聚焦由所述子软孔截取的所述波前的基本表面,以在检测器上形成点(Ti)。 对于每个子软孔径(SPi),定义了点的假定定位区域(Zi)。 处理装置使得能够建立与每个子软孔相关联的所述点的位置的测量文件。 阵列结构(ML)具有一个或多个局部变化。 通过将从测量文件获得的贡献与从参考文件得到的贡献进行比较,从其导出的子软孔径之间的偏移导致检测到的点和限定假定的定位区域的子软孔,其中该点 被测量。
    • 3. 发明申请
    • DEVICE FOR MEASURING ABERRATIONS IN AN EYE-TYPE SYSTEM
    • 用于测量眼睛类型系统中的异常的装置
    • WO03015622A2
    • 2003-02-27
    • PCT/FR0202859
    • 2002-08-12
    • BUCOURT SAMUEL HENRILEVECQ XAVIER JEAN-FRANCOIS
    • BUCOURT SAMUEL HENRILEVECQ XAVIER JEAN-FRANCOIS
    • A61B3/10A61B3/103A61B3/107A61B3/15
    • A61B3/158
    • The invention relates to a device for measuring aberrations in an eye-type system comprising, in particular, an illumination path (VE) with an illumination diaphragm (APT) and a test path (VA), imaging means (L1) and means of positioning the eye (VI) in relation to said imaging means. The inventive device also comprises a stray reflection filtration element (FLT), which is centred on the measurement axis (z) of the imaging means, and means for the optical conjugation (L2, L3) of the pupil of the eye with the plane of the illumination diaphragm and the test plane. According to the invention, the illumination beam path converges at the centre of the filtration element (FLT). The filtration element, the illumination path, the test path and the conjugation means are all interdependent and positioned on a platform (PTF1) that can move in relation to the imaging means (L1) along axis z. The illumination diaphragm is off-centre in relation to the measurement axis (z) such that the stray light flux reflected in particular by the imaging means (L1) is deflected from the test path by the filtration element (FLT).
    • 本发明涉及一种用于测量眼睛型系统中的像差的装置,特别是包括具有照明光圈(APT)和测试路径(VA)的照明路径(VE),成像装置(L1)和定位装置 眼睛(VI)相对于所述成像装置。 本发明的装置还包括以成像装置的测量轴(z)为中心的杂散反射过滤元件(FLT),以及用于眼睛瞳孔的光共轭(L2,L3)与平面 照明光阑和测试平面。 根据本发明,照明光束路径在过滤元件(FLT)的中心处会聚。 过滤元件,照明路径,测试路径和共轭装置都相互依赖并且位于可以沿着z轴相对于成像装置(L1)移动的平台(PTF1)上。 照明光圈相对于测量轴(z)偏心,使得特别由成像装置(L1)反射的杂散光通量由过滤元件(FLT)从测试路径偏转。