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81. 发明申请

WO2005065039A3 AN X-RAY DIFFRACTION (XRD) MEANS FOR IDENTIFYING THE CONTENT IN A VOLUME OF INTEREST AND A METHOD THEREOF 审中-公开
标题翻译：一种X射线衍射（XRD）手段，用于识别一系列利益的内容及其方法
公开(公告)号：WO2005065039A3
公开(公告)日：2006-02-02
申请号：PCT/IL2005000037
申请日：2005-01-11
申请人： HOMELAND SECUR E T , HAREL ZE EV , ZUK ASAF , BURSHTEIN ZEEV
发明人： HAREL ZE EV , ZUK ASAF , BURSHTEIN ZEEV
IPC分类号： G01T1/36 , G01N23/20 , G01N23/207 , G01T7/12
CPC分类号： G01N23/207
摘要： The present invention discloses an XRD means for identifying the content of a volume of interest (VOI) and a method thereof. A remote XRD means is comprised of a plurality of X-ray sources (41A-41C) targeted towards said VOI (44) ; a plurality of X-ray detectors (46) adapted to receive diffracted X-rays (47A-47C) ; a processor adapted to measure said patterns; a database comprising records of pattern parameters; and an alerting means adapted for identifying a material in the VOI as one of a predetermined group. This invention also discloses a method of acquiring XRD images of a material in a VOI (44), comprised of receiving VOI coordinates; irradiating the material in the VOI; acquiring, extracting and converting of XRD patterns (47A-47C) of said VOI to standard powder X-ray diffraction spectrum; matching records in a database for material identification; and alerting when said material is in matches a predetermined record.
摘要翻译：本发明公开了一种用于识别感兴趣体积（VOI）的内容的XRD装置及其方法。远程XRD装置由面向所述VOI（44）的多个X射线源（41A-41C）组成。适于接收衍射X射线的多个X射线检测器（46）（47A-47C）; 适于测量所述图案的处理器; 包括模式参数记录的数据库; 以及适于将VOI中的材料识别为预定组之一的警报装置。本发明还公开了一种获取VOI（44）中的材料的XRD图像的方法，包括接收VOI坐标; 在VOI中照射材料; 获取，提取和转换所述VOI的XRD图谱（47A-47C）至标准粉末X射线衍射光谱; 在数据库中匹配记录以进行材料识别; 并且当所述材料匹配预定记录时发出警报。

82. 发明申请

WO2005045726A3 METHOD FOR MONTE CARLO INDEXING OF POWDER DIFFRACTION DATA 审中-公开
标题翻译：蒙特卡罗指数粉末衍射数据的方法
公开(公告)号：WO2005045726A3
公开(公告)日：2005-10-06
申请号：PCT/US2004035444
申请日：2004-10-27
申请人： SSCI INC , BATES SIMON , IVANISEVIC IGOR , STAHLY BARBARA C
发明人： BATES SIMON , IVANISEVIC IGOR , STAHLY BARBARA C
IPC分类号： G01N23/207
CPC分类号： G01N23/207
摘要： Crystalline solid forms may be characterized by their unit cell parameters through a process known as indexing. An embodiment of the invention searches for the unit cell parameters of a crystalline solid form using a Monte-Carlo algorithm that incorporates certain rules to reduce search space. Another embodiment refines the results of the search to identify the correct unit cell parameters of the crystalline solid form. These methods may be automated, conveniently requiring little interaction from the user. The indexing method of the invention may be applied, for example, to distinguish between different crystalline solid forms of a substance.
摘要翻译：结晶固体形式可以通过称为分度的方法通过其单元电池参数来表征。本发明的实施例使用包含某些规则以减少搜索空间的蒙特卡罗算法搜索结晶固体形式的晶胞参数。另一个实施方案提炼出结晶固体形式的正确的晶胞参数的搜索结果。这些方法可以是自动的，方便地需要用户几乎没有交互。本发明的分度方法可以用于例如区分物质的不同结晶固体形式。

83. 发明申请

WO2005065039A2 AN X-RAY DIFFRACTION (XRD) MEANS FOR IDENTIFYING THE CONTENT IN A VOLUME OF INTEREST AND A METHOD THEREOF 审中-公开
标题翻译：一种X射线衍射（XRD）手段，用于识别一系列利益的内容及其方法
公开(公告)号：WO2005065039A2
公开(公告)日：2005-07-21
申请号：PCT/IL2005/000037
申请日：2005-01-11
申请人： Homeland Secur-E.T. , HAREL, Ze'ev , ZUK, Asaf , BURSHTEIN, Zeev
发明人： HAREL, Ze'ev , ZUK, Asaf , BURSHTEIN, Zeev
IPC分类号： G01N23/207
CPC分类号： G01N23/207
摘要： The present invention discloses an XRD means for identifying the content of a volume of interest (VOI) and a method thereof. A remote XRD means is comprised inter alia of a plurality of X-ray sources targeted towards said VOI; a plurality of X-ray detectors adapted to receive diffracted X-rays; a processor adapted to measure said patterns; a database comprising records of patterns' parameters; and, an alerting means adapted for identifying material as one of said predetermined group. This invention also discloses a method of acquiring XRD image of a material in a VOI, comprised of receiving VOI coordinates; irradiating the material in the VOI; acquiring, extracting and converting of XRD patterns of said VOI to standard powder X-ray diffraction spectrum; matching records in a database for material identification; and alerting when said material is in matching a predetermined record.
摘要翻译：本发明公开了一种用于识别感兴趣体积（VOI）的内容的XRD装置及其方法。远程XRD装置尤其包括针对所述VOI的多个X射线源; 适用于接收衍射X射线的多个X射线检测器; 适于测量所述图案的处理器; 包括模式参数记录的数据库; 以及适于将材料识别为所述预定组之一的报警装置。本发明还公开了一种获取VOI中的材料的XRD图像的方法，包括接收VOI坐标; 在VOI中照射材料; 将所述VOI的XRD图案获取，提取和转换为标准粉末X射线衍射光谱; 在数据库中匹配记录以进行材料识别; 并且当所述材料匹配预定记录时发出警报。

84. 发明申请

WO2003081222A1 SCREENING OF COMBINATORIAL LIBRARY USING X-RAY ANALYSIS 审中-公开
标题翻译：使用X射线分析筛选组合图书馆
公开(公告)号：WO2003081222A1
公开(公告)日：2003-10-02
申请号：PCT/US2002/008434
申请日：2002-03-19
申请人： X-RAY OPTICAL SYSTEMS, INC. , NICOLICH, Jeffrey, P. , GIBSON, David, M.
发明人： NICOLICH, Jeffrey, P. , GIBSON, David, M.
IPC分类号： G01N23/207
CPC分类号： G01N23/223 , G01N23/207 , G01N2223/076 , G21K1/06
摘要： An x-ray apparatus and method are presented for controlling x-rays to analyze combinatorial libraries for the rapid screening of different materials and different conditions. The apparatus includes a laboratory x-ray source, one or more x-ray optics, a combinatorial library, and a detector such as an x-ray detector or an electron energy detector. The apparatus can be used to perform analytical measurements on individual members of the library, where the measurements may comprise x-ray fluorescence, x-ray diffraction, total reflection x-ray fluorescent spectrometry, and/or extended x-ray absorption fine structure.
摘要翻译：提出了一种用于控制x射线以分析组合文库用于快速筛选不同材料和不同条件的X射线装置和方法。该装置包括实验室X射线源，一个或多个x射线光学器件，组合库和诸如x射线检测器或电子能量检测器的检测器。该装置可以用于对文库的各个成员进行分析测量，其中测量可以包括x射线荧光，x射线衍射，全反射x射线荧光光谱法和/或扩展的x射线吸收精细结构。

85. 发明申请

WO0144792A3 APPARATUS FOR FAST DETECTION OF X-RAYS 审中-公开
标题翻译：快速检测X射线的装置
公开(公告)号：WO0144792A3
公开(公告)日：2002-03-21
申请号：PCT/GB0004361
申请日：2000-11-17
申请人： SECR DEFENCE , CARTER TONY , JUPP IAN DAVID , DERMODY GERAINT SPENCER , BOYD ANDREW JAMES , BURROWS JOHN DAVID
发明人： CARTER TONY , JUPP IAN DAVID , DERMODY GERAINT SPENCER , BOYD ANDREW JAMES , BURROWS JOHN DAVID
IPC分类号： G01N23/207 , G01N23/20
CPC分类号： G01N23/20
摘要： This invention relates to the field of X-ray inspection systems and more particularly to those that use X-ray diffraction to analyse an object under inspection. Essential to prior art diffraction systems employing angular dispersion is the provision of a monochromatic incident X-ray beam. Conventionally, this is provided by filtering out the desired spectral peak from a polychromatic or quasi-monochromatic X-ray beam by means of the balanced filter technique. There are disadvantages to this technique in that it requires two diffraction images to be subtracted form one another in order to get the desired spectral peak. This results in beam attenuation and data of poor statistical quality. The invention proposes the use of an array of semiconductor detector elements and associated electronics which are capable of extracting an essentially monochromatic diffraction pattern from scattered polychromatic or quasi-monochromatic X-rays.
摘要翻译：本发明涉及X射线检查系统的领域，更具体地涉及使用X射线衍射来分析被检查物体的那些。采用角度色散的现有技术衍射系统的必要条件是提供单色入射X射线束。通常，这是通过借助于平衡滤波器技术从多色或准单色X射线束滤出期望的光谱峰来提供的。这种技术存在缺点，因为它需要相互减去两个衍射图像，以获得所需的光谱峰值。这导致光束衰减和统计质量差的数据。本发明提出使用能够从散射的多色或准单色X射线提取基本上单色的衍射图案的半导体检测器元件阵列和相关联的电子器件。

86. 发明申请

WO0146677A3 IRRADIATING DEVICE WITH HIGHLY FLEXIBLE MEMBRANE BELLOWS 审中-公开
标题翻译：具有高柔性辐射装置焊接波纹管
公开(公告)号：WO0146677A3
公开(公告)日：2002-01-24
申请号：PCT/EP0011207
申请日：2000-11-13
申请人： MAX PLANCK GESELLSCHAFT , BESTEC GMBH , BIEDERMANN CHRISTOPH , RADTKE RAINER , DEUCHLER SIMON
发明人： BIEDERMANN CHRISTOPH , RADTKE RAINER , DEUCHLER SIMON
IPC分类号： G01N21/01 , G01N23/20 , H01J37/252 , G01N23/207
CPC分类号： H01J37/252 , G01N21/01 , G01N23/20 , H01J2237/2555
摘要： The invention relates to an irradiating device (100) for irradiating a sample (21) in a sample chamber (20), comprising an irradiating source (10) and a detector device (30) which are each connected to a sample chamber (20) in a gas tight manner, in addition to a slewing device (40) which enables the irradiation source (10) and/or the detector device (30) to be swiveled relative to the sample (21). The irradiation source (10) and/or the detector device (30) can be connected to the sample chamber (20) via a flexible bellow connector (50). The invention also relates to a swivel connecting element in order to connect housing components in a gas tight manner. Said housing components can be swiveled towards each other.
摘要翻译：用的照射装置（100），用于照射在样品室（20）与辐射源（10）和探测器设备（30）的样品（21），每个连接的气密与样品室（20）和枢转装置（40 ）相对于所述辐射源（10）和/或所述检测器装置（30）到样品（21）可枢转，经由关节柔性波纹管的放射线源（10）和/或所述检测器装置（30）与所述样品室（20）（50）。还有描述的枢转连接件，用于的相互可转动的壳体部分气密连接。

87. 发明申请

WO0102842A3 ANALYSIS DEVICE WHICH USES X-RAY FLUORESCENCE 审中-公开
标题翻译：设备X射线荧光分析
公开(公告)号：WO0102842A3
公开(公告)日：2001-05-03
申请号：PCT/DE0002052
申请日：2000-06-22
申请人： FRAUNHOFER GES FORSCHUNG , HOLZ THOMAS
发明人： HOLZ THOMAS
IPC分类号： G01N23/207 , G01N23/223
CPC分类号： G01N23/223 , G01N23/2076 , G01N2223/076
摘要： The invention relates to an analysis device which uses x-ray fluorescence, in which X-rays from an X-ray source are directed at a sample which is located on a sample carrier and the fluorescent radiation is measured by a detector. The aim of the invention is to increase the detection sensitivity for all manner of samples, in particular, in relation to the analysis of the total reflection X-ray fluorescence. To this end, the sample to be analysed is placed on a multi-layer system, or a fluidic sample flows over a multi-layer system of this type. Said multi-layer system consists of at least two or more individual layers which are arranged in a periodically repeating pattern. Neighbouring individual layers consist of materials with a different X-ray optical refractive index, whereby the period thickness d in the multi-layer system and the angle of incidence theta of the X-rays satisfy the BRAGG equation for the wavelength of X-rays that is used.
摘要翻译：本发明涉及一种用于Röntgenfluoreszenzananlyse的装置，目的是一种X射线源，其被集成在一个样品载体上和荧光辐射与一个检测器测量的X辐射。其目的是检测灵敏度，特别是向Totalreflexionröntgenfluroreszenzanalyse（TXRF）可以为veschiedenste样品增加。为了解决这个问题，要分析的试样置于一个多层系统上，或者这样的多层系统上的流体样品流动。多层系统由至少两个或更多个周期性重复排列各个层的。相邻的单个层由具有不同的X射线的光学折射率的材料，其中，所述Periordendicken d在多层系统和X射线辐射的入射角θ表示在所使用的X射线波长的λ满足布拉格方程。

88. 发明申请

WO00079252A1 METHOD AND APPARATUS FOR X-RAY DIFFRACTION ANALYSES 审中-公开
标题翻译： X射线衍射分析的方法和装置
公开(公告)号：WO00079252A1
公开(公告)日：2000-12-28
申请号：PCT/AU2000/000697
申请日：2000-06-21
IPC分类号： G01N23/20 , G01N33/38 , G01N23/207
CPC分类号： G01N23/20 , G01N33/383
摘要： A method and apparatus for continuously presenting a sample from a stream of particulate material which contains crystalline substances and effectively continuously analysing the sample by X-ray diffraction. An extracted sample flow (23-22-24) is fed onto a continuously moving carrier (10-12) and its surface smoothed and flattened (25-26-30-32) for X-ray diffraction patterns to be detected (34-36) and analysed (38) to provide a compositional analysis for the crystalline substances. The sample (24) is continuously removed (40) from the carrier (10) prior to further sample being fed onto the carrier. The invention is particularly applicable for phase composition analysis of cement and cement clinker and provides and effectively continuous analysis substantially in real time in contrast to prior art laboratory analysis of discrete samples.
摘要翻译：一种用于从含有结晶物质的颗粒材料流中连续呈现样品并通过X射线衍射有效连续分析样品的方法和装置。提取的样品流（23-22-24）被馈送到连续移动的载体（10-12）上，其表面平滑并平坦化（25-26-30-32），以检测X射线衍射图案（34- 36）并分析（38）以提供结晶物质的组成分析。在将进一步的样品送入载体之前，将样品（24）从载体（10）连续地除去（40）。本发明特别适用于水泥和水泥熟料的相组成分析，与离散样品的现有技术实验室分析相比，实质上实时提供和有效连续分析。

89. 发明申请

WO00073773A1 COMBINATORIAL X-RAY DIFFRACTOR 审中-公开
标题翻译：组合X射线衍射
公开(公告)号：WO00073773A1
公开(公告)日：2000-12-07
申请号：PCT/JP2000/003258
申请日：2000-05-22
IPC分类号： G01N23/20 , G01N23/207 , H01L21/66
CPC分类号： G01N23/207 , B01J2219/00527 , B01J2219/00585 , B01J2219/00596 , B01J2219/00605 , B01J2219/00612 , B01J2219/00659 , B01J2219/00689 , B01J2219/00707 , B01J2219/00756
摘要： A combinatorial X-ray diffractor, particularly a combinatorial X-ray diffractor which can measure one row of samples among a plurality of samples arranged into a matrix simultaneously by X-ray diffraction. For the purpose of high throughput screening, a plurality of samples (10) are arranged into a row X1, a row X2, a row X3 and a row X4 on a sample stage and samples in each row are measured simultaneously by X-ray diffraction, measured data are processed by an information processor (20), information data useful for the evaluation of thin film material are automatically extracted and arranged and the extracted and arranged information data are displayed on a display apparatus (27).
摘要翻译：组合X射线衍射器，特别是组合X射线衍射器，其可以通过X射线衍射同时测量排列成矩阵的多个样本中的一行样本。为了高通量筛选的目的，将多个样品（10）排列成样品台上的行X1，行X2，行X3和行X4，并且通过X射线衍射同时测量每行中的样品测量数据由信息处理器（20）处理，自动提取和布置用于评估薄膜材料的信息数据，并将所提取和排列的信息数据显示在显示装置（27）上。

90. 发明申请

WO00031523A2 X-RAY ANALYSIS APPARATUS INCLUDING A PARABOLIC X-RAY MIRROR AND A CRYSTAL MONOCHROMATOR 审中-公开
标题翻译：包含抛物面X射线镜和晶体单色仪的X射线分析装置
公开(公告)号：WO00031523A2
公开(公告)日：2000-06-02
申请号：PCT/EP1999/008939
申请日：1999-11-15
IPC分类号： G01N23/207 , G01N23/20 , G02B17/00 , G21K1/06 , G21K5/02
CPC分类号： G01N23/20 , G01N23/20016
摘要： An apparatus for X-ray analysis of materials advantageously utilizes a parabolic multilayer mirror for parallelizing the X-rays. Moreover, it may be desirable to monochromatize the parallelized radiation, for example by means of a crystal monochromator. According to the invention an influencing device for the X-rays is constructed as a single mechanical unit comprising a combination of an X-ray mirror (46) and a monochromator (48). This unit (66) can be arranged in the analysis apparatus in at least two positions (74, 76) in such a manner that the X-rays travel via the X-ray mirror (46) and the monochromator (48) in the first position (74) whereas the X-rays travel only via the X-ray mirror (46) in the second position (76). Consequently, no separate units comprising only an X-ray mirror or a combination of an X-ray mirror and a monochromator are required, so that a substantial saving in costs is achieved.
摘要翻译： X射线材料扫描设备有利地利用多层抛物面镜来平行X射线。另外，可能期望例如使用晶体单色器对平行辐射进行单色化。。根据本发明，X射线影响装置被构造为包括X射线镜（46）和单色器（48）的组合的单独的机械单元。该单元（66）可以在分析仪中布置在至少两个位置（74,76）中，使得X射线穿过X射线反射镜（46）和单色器（48）第一位置（74），而X射线仅在第二位置（76）经由X射线反射镜（46）移动。因此，不需要仅包括X射线反射镜或X射线反射镜与单色器的组合的单独单元，这允许显着节省成本。

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