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31. 发明申请

WO2006116060A2 DIRECT DETECT SENSOR FOR FLAT PANEL DISPLAYS 审中-公开
标题翻译：用于平板显示器的直接检测传感器
公开(公告)号：WO2006116060A2
公开(公告)日：2006-11-02
申请号：PCT/US2006/015056
申请日：2006-04-21
申请人： PHOTON DYNAMICS, INC. , GARDNER, David, W. , HAWRYLUK, Andrew, M.
发明人： GARDNER, David, W. , HAWRYLUK, Andrew, M.
IPC分类号： H01L27/00
CPC分类号： G02F1/1309 , G09G3/006
摘要： Each sensor of a linear array of sensors includes, in part, a sensing electrode and an associated feedback circuit. The sensing electrodes are adapted to be brought in proximity to a flat panel having formed thereon a multitude of pixel electrodes in order to capacitively measure the voltage of the pixel electrodes. Each feedback circuit is adapted to actively drive its associated electrode via a feedback signal so as to maintain the voltage of its associated electrode at a substantially fixed bias. Each feedback circuit may include an amplifier having a first input terminal coupled to the sensing electrode and a second input terminal coupled to receive a biasing voltage. The output signal of the amplification circuit is used to generate the feedback signal that actively drives the sensing electrode. The biasing voltage may be the ground potential.
摘要翻译：传感器的线性阵列的每个传感器部分地包括感测电极和相关联的反馈电路。感测电极适于接近其上形成有多个像素电极的平板，以便电容地测量像素电极的电压。每个反馈电路适于经由反馈信号主动驱动其相关联的电极，以便将其相关电极的电压维持在基本上固定的偏压。每个反馈电路可以包括具有耦合到感测电极的第一输入端和耦合以接收偏置电压的第二输入端的放大器。放大电路的输出信号用于产生主动驱动感测电极的反馈信号。偏置电压可能是地电位。

32. 发明申请

WO2005101113A3 POLYMER DISPERSED LIQUID CRYSTAL FORMULATIONS FOR MODULATOR FABRICATION 审中-公开
标题翻译：用于调制器制造的聚合物分散液晶配方
公开(公告)号：WO2005101113A3
公开(公告)日：2006-09-14
申请号：PCT/US2005012054
申请日：2005-04-07
申请人： PHOTON DYNAMICS INC , CHEN XIANHAI
发明人： CHEN XIANHAI
IPC分类号： C09K19/38 , G01R31/00 , G02F1/03 , G02F1/13 , G02F1/1334 , G02F1/1347 , G02F1/1362
CPC分类号： G02F1/1309 , G02F1/1334 , G02F2001/136254
摘要： Embodiments of polymer dispersed liquid crystals (PDLCs) in accordance with the present invention comprise TL-series liquid crystal materials and a polymer matrix comprising polyacrylate resins having hydroxyl groups. These hydroxyl groups allow crosslinking by using isocyanate, improving mechanical properties and heat resistance. Typical ratios of liquid crystal to polymer range between about 50/50 to 70/30 (wt/wt). The PDLC materials exhibit enhanced sensitivity to driving voltages and higher transmission ~voltage (T-V) curve slope. In testing thin film transistors (TFTs), these PDLC materials can be used to compensate for an increased air gap accommodating flatness variation in the TFT substrate, and to reduce electrostatic forces between modulator and panel. Embodiments of PDLC materials in accordance with the present invention form solid films upon evaporation of the solvent. Homogeneity of embodiments of solvent-based PDLC formulations in accordance with the present invention allow for the use of many different coating methods, such as spin, doctor blade, and slot-die coatings.
摘要翻译：根据本发明的聚合物分散液晶（PDLC）的实施方案包括TL系列液晶材料和包含具有羟基的聚丙烯酸酯树脂的聚合物基体。这些羟基允许通过使用异氰酸酯进行交联，改善机械性能和耐热性。液晶与聚合物的典型比例在约50/50至70/30（wt / wt）之间。 PDLC材料对驱动电压和更高的透射电压（T-V）曲线斜率具有增强的灵敏度。在测试薄膜晶体管（TFT）时，这些PDLC材料可用于补偿TFT基板中容纳平坦度变化的增加的气隙，并减少调制器和面板之间的静电力。根据本发明的PDLC材料的实施方案在溶剂蒸发时形成固体膜。根据本发明的基于溶剂的PDLC制剂的实施方案的均匀性允许使用许多不同的涂布方法，例如旋涂，刮刀和狭缝模头涂层。

33. 发明申请

WO2006053344A1 SCRATCH AND MAR RESISTANT PDLC MODULATOR 审中-公开
标题翻译： SCRATCH和MAR抗PDLC调制器
公开(公告)号：WO2006053344A1
公开(公告)日：2006-05-18
申请号：PCT/US2005/042117
申请日：2005-11-09
申请人： PHOTON DYNAMICS, INC. , CHEN, Xianhai
发明人： CHEN, Xianhai
IPC分类号： G02F1/00
CPC分类号： G02F1/1341 , G02F1/1334 , G02F2201/50 , Y10T428/10
摘要： A PDLC modulator is fabricated using at least one of a selection of specially-formulated UV curable organic hard coatings as a protective layer on the exposed side of polyester (Mylar) film . The hard coatings of various related types show good adhesion on a polyester film substrate, superior hardness and toughness, and have a slippery top surface, which minimizes unnecessary wear. The coating as applied on the modulator surface significantly reduces scratch damage on modulators caused by unexpected particles on the panels under test. In addition, the slip surface will reduce stickiness to particles and therefore also reduce the possibility of panel damage.
摘要翻译：使用特殊配制的UV可固化有机硬涂层的选择中的至少一种作为聚酯（Mylar）膜的暴露侧上的保护层来制造PDLC调制器。各种相关类型的硬涂层在聚酯薄膜基材上表现出良好的粘合性，优异的硬度和韧性，并且具有光滑的顶表面，这使得不必要的磨损最小化。施加在调制器表面上的涂层显着地减少了由被测试板上的意外的颗粒引起的调节剂的划痕损伤。此外，滑动表面将减少对颗粒的粘性，因此也降低了面板损坏的可能性。

34. 发明申请

WO2005114154A2 IMPROVED INSPECTION OF TFT LCD PANELS USING ON-DEMAND AUTOMATED OPTICAL INSPECTION SUB-SYSTEM 审中-公开
标题翻译：使用自动光学检测子系统改进TFT液晶面板的检查
公开(公告)号：WO2005114154A2
公开(公告)日：2005-12-01
申请号：PCT/US2005/015356
申请日：2005-05-02
申请人： PHOTON DYNAMICS, INC. , WEISS, Adam , SARANLI, Afsar
发明人： WEISS, Adam , SARANLI, Afsar
IPC分类号： G01N21/88
CPC分类号： G01N21/95 , G01N2021/9513
摘要： In an inspection system for electrical and electro-optical inspection of TFT-LCD panels, a fine resolution area imaging camera with a pulse illumination source disposed to scan the region and operative capture images of the region illuminated with pulses of short illumination and automatically maintained in focus while continuously scanning in order to resolve points of defects.
摘要翻译：在用于TFT-LCD面板的电气和电光检查的检查系统中，具有脉冲照明源的精细分辨率区域成像照相机，用于扫描该区域并且用短照明脉冲照射的区域的操作捕获图像并自动维持不断扫描，以解决缺陷点。

35. 发明申请

WO2005035834A2 VACUUM DEPOSITION OF DIELECTRIC COATINGS ON VOLATILE MATERIAL 审中-公开
标题翻译：介电涂层在挥发性材料上的真空沉积
公开(公告)号：WO2005035834A2
公开(公告)日：2005-04-21
申请号：PCT/US2004033676
申请日：2004-10-12
申请人： PHOTON DYNAMICS INC , PETHE RAJIV , GUPTA PRAMOD , CHEN XIANHAI , NAGY ALEXANDER
发明人： PETHE RAJIV , GUPTA PRAMOD , CHEN XIANHAI , NAGY ALEXANDER
IPC分类号： C23C14/02 , C25D2/00 , G02F1/1334 , G02F1/1335 , C25D
CPC分类号： C23C14/024 , G02F1/1334 , G02F1/133516 , G02F1/133553 , G02F2001/133521
摘要： In order to allow application of any coating under a vacuum over a volatile gelatinous layer, such as polymer dispersed liquid crystal (PDLC) on an optical glass substrate with a transparent electrode, such as indium tin oxide (ITO) on its surface, a layer of an intermediate stress absorbing polymeric material is first applied to cover the volatile gelatinous layer to prevent evaporation and escape of volatiles, thereafter the coating is applied under a very high vacuum using for example a technique called Physical Vapor Deposition (PVD) or sputtering.
摘要翻译：为了允许在具有透明电极的光学玻璃基板上的诸如聚合物分散液晶（PDLC）之类的挥发性凝胶层上的真空下涂覆任何涂层，例如其表面上的氧化铟锡（ITO），层首先施加中等应力吸收聚合物材料以覆盖挥发性凝胶层以防止挥发物的蒸发和逸出，然后使用例如称为物理气相沉积（PVD）或溅射的技术在非常高的真空下施加涂层。

36. 发明申请

WO2004070693A2 METHOD AND APPARATUS FOR OPTICAL INSPECTION OF A DISPLAY 审中-公开
标题翻译：用于光学检查显示器的方法和装置
公开(公告)号：WO2004070693A2
公开(公告)日：2004-08-19
申请号：PCT/US2004/003217
申请日：2004-02-03
申请人： PHOTON DYNAMICS INC. , SAFAEE-RAD, Reza , CRNATOVIC, Aleksander , HAWTHORNE, Jeffrey , BUKAL, Branko , LEERENTVELD, Ray
发明人： SAFAEE-RAD, Reza , CRNATOVIC, Aleksander , HAWTHORNE, Jeffrey , BUKAL, Branko , LEERENTVELD, Ray
IPC分类号： G09G
CPC分类号： G06T7/0004 , G06T2207/30108 , H04N17/02 , H04N17/04
摘要： METHOD AND APPARATUS FOR OPTICAL INSPECTION OF A DISPLAY ABSTRACT OF THE DISCLOSURE A method and apparatus for optically inspecting a display employs sub-pixel accuracy for each primary color to take into account angle of rotation. The method includes capturing images of a display with R x S sensors, determining sets of sensor coordinates mapping to a pixel, determining multiple misalignment angles between the pixel on the display and the R x S sensors, determining multiple x scaling ratios, determining multiple weighting factors associated with RxS sensors in response to the corresponding multiple misalignment angle and the corresponding multiple x and y scaling ratios, determining multiple luminance values for RxS sensors, determining multiple total luminance values in response to the weighting factors and the luminance values, forming scaled images including first and second luminance values, and inspecting the scaled image to identify potential defects of the pixel on the display.
摘要翻译：用于对本发明的显示器的光学检查的方法和装置用于光学检查显示器的方法和装置对于每个基色采用子像素精度来考虑旋转角度。该方法包括用R x S传感器捕获显示器的图像，确定映射到像素的传感器坐标的集合，确定显示器上的像素与R x S传感器之间的多个不对准角度，确定多个x缩放比例，确定多个加权与RxS传感器相关联的因素响应于相应的多重不对准角和相应的多个x和y缩放比，确定RxS传感器的多个亮度值，响应加权因子和亮度值确定多个总亮度值，形成缩放图像包括第一和第二亮度值，并且检查缩放图像以识别显示器上的像素的潜在缺陷。

37. 发明申请

WO2003005335A1 MOIRE SUPPRESSION METHOD AND APPARATUS 审中-公开
标题翻译： MOIRE抑制方法和装置
公开(公告)号：WO2003005335A1
公开(公告)日：2003-01-16
申请号：PCT/US2002/021187
申请日：2002-07-03
申请人： PHOTON DYNAMICS, INC.
发明人： SAFAEE-RAD, Reza , CRNATOVIC, Aleksander , HAWTHORNE, Jeffrey, A. , LEERENTVELD, Ray , PRATT, William, K. , SAWKAR, Sunil, S.
IPC分类号： G09G3/36
CPC分类号： G06T7/0004 , G02F1/1309 , G06T7/001
摘要： A method and a device for inspecting a display panel (10) includes capturing images of a portion of a plurality of display panels (30) having display elements with an image acquisition (20) device having sensor elements, each image comprising an image of approximately a first number of display elements captured with approximately a second number of sensor elements, the first number different from the second number, each image including a Moire' artifact pattern, combining the images of the portions of the plurality panels to form a reference image including a Moire' artifact pattern reference, capturing a sample image of a portion of a sample display panel having display elements with image acquisition device, the sample image comprising an image of approximately the first number of display elements on the sample display captured with approximately the second number of sensor elements.
摘要翻译：一种用于检查显示面板（10）的方法和装置，包括用具有传感器元件的图像采集（20）装置拍摄具有显示元件的多个显示面板（30）的一部分的图像，每个图像包括大约以大约第二数量的传感器元件捕获的第一数量的显示元件，第一数量不同于第二数量，每个图像包括莫尔'伪像图案，组合多个面板的部分的图像以形成参考图像，包括一种莫尔'伪影图案参考，采集具有图像获取装置的具有显示元件的样本显示面板的一部分的样本图像，该样本图像包括大约第二次捕获的样本显示器上的第一数量的显示元素的图像传感器元件数量。

38. 发明申请

WO9700452A3 MURA DETECTION APPARATUS AND METHOD 审中-公开
标题翻译：木瓜检测装置和方法
公开(公告)号：WO9700452A3
公开(公告)日：1997-06-05
申请号：PCT/US9610219
申请日：1996-06-11
申请人： PHOTON DYNAMICS INC
发明人： HAWTHORNE JEFFREY A , SETZER JOSEPH
IPC分类号： G01R31/00 , G02F1/13 , G06T1/00 , G09G3/00 , G01R
CPC分类号： G09G3/006 , G02F1/1303 , G02F1/1309 , G02F1/136259 , G02F2001/136254
摘要： A method and apparatus for identifying and classifying pixel defects, and in particular Mura defects using digital processing techniques. The present method includes steps of acquiring an image with a Mura defect, and performing a Laplacian convolution on the image to enhance the Mura defect against background illumination. A step of thresholding the Mura defect against the background illumination is also provided. The thresholded Mura defect is compared against the original Mura defect to define statistical parameters of the original Mura defect. An annular region is defined around the periphery of the Mura defect. Statistics of the annular region define statistics for background illumination as compared to the original Mura defect. The statistics from the Mura defect are then compared to the background illumination statistics for Mura defect classification and analysis.

39. 发明申请

WO1997013140A1 TECHNIQUE FOR DETERMINING DEFECT POSITIONS IN THREE DIMENSIONS IN A TRANSPARENT STRUCTURE 审中-公开
标题翻译：用于确定三维尺寸在透明结构中的缺陷位置的技术
公开(公告)号：WO1997013140A1
公开(公告)日：1997-04-10
申请号：PCT/US1996015907
申请日：1996-10-04
申请人： PHOTON DYNAMICS, INC.
发明人： PHOTON DYNAMICS, INC. , HENLEY, François, J. , BRYAN, Michael, A.
IPC分类号： G01N21/00
CPC分类号： G01N21/8806 , G01N21/958
摘要： A method (500) for inspecting anomalies (118, 135, 137, 139, 143), which are likely defects of several types, namely, particles on the surface, scratches into surface, and defects in bulk material (127), is provided. This inspection method involves two types of illumination, which can be used separately or together. These two types highlight anomalies sufficiently differently to enable the defect monitoring tool to distinguish between defect type and defect location along an inspection axis. The illumination methods are direct internal side illumination (114) where the plate (102) is used as light pipe, and external front-side illumination (117). In direct internal side illumination, a fiber optic feed (115) with flared end arranged as a line source is abutted to an edge (123) of the plate (102). In external side illumination, the source (117) is light directed at an acute angle, preferably a grazing angle, to one of the surfaces (121). Anomalies such as dust particles (118) of the illuminated surface will scatter light much more efficiently with external front-side illumination, than direct internal side lighting, since particles on the surface would otherwise scatter light only through weak evanescent coupling via the internal side lighting.
摘要翻译：提供了用于检查异常（118,135,137,139,143）的方法（118,135,137,139,143），其可能是几种类型的缺陷，即表面上的颗粒，划痕到表面和散装材料（127）中的缺陷。这种检查方法涉及两种类型的照明，可单独使用或一起使用。这两种类型强调异常，使缺陷监测工具能够区分沿着检查轴的缺陷类型和缺陷位置。照明方法是直接内侧照明（114），其中板（102）用作光管和外部前侧照明（117）。在直接内侧照明中，具有布置成线源的喇叭口端的光纤馈电（115）与板（102）的边缘（123）邻接。在外侧照明中，源（117）以一定角度（优选为掠角）指向一个表面（121）。例如照射表面的灰尘颗粒（118）的异常将比直接内侧照明更有效地散射光，因为表面上的颗粒否则将通过内侧照明通过弱的渐逝耦合散射光。

40. 发明申请

WO1992015021A1 VOLTAGE IMAGING SYSTEM USING ELECTRO-OPTICS 审中-公开
标题翻译：使用电光源的电压成像系统
公开(公告)号：WO1992015021A1
公开(公告)日：1992-09-03
申请号：PCT/US1992000350
申请日：1992-01-14
申请人： PHOTON DYNAMICS, INC.
发明人： PHOTON DYNAMICS, INC. , HENLEY, Francois, J.
IPC分类号： G01R31/28
CPC分类号： G01R31/308 , G01R15/241
摘要： A two-dimensional image of the voltage distribution across a surface at a large plurality voltage test points of a panel under test (14) is extracted by illuminating the surface with an input beam (24) of optical energy through an electro-optic modulator (30) wherein the modulator (30) is disposed to allow longitudinal probing geometries such that a voltage differential on the surface of the panel under test (14) causes a power modulation in the optical energy which can be observed through an area optical sensor (a camera) (48) for use to directly produce a two-dimensional spatially-dependent power modulation image directly representative of the spatially corresponding differential voltage state on the surface of the panel under test (14). Surface cross-talk is minimized by placing the face of the modulator (30) closer to the panel under test (14) than the spacing of voltage sites in the panel under test (14). The device may operate in a pass-through mode or in a reflective mode.
摘要翻译：通过光电调制器（14）的光能的输入光束（24）照射表面，提取测试板（14）的大的多个电压测试点的表面上的表面上的电压分布的二维图像 30），其中所述调制器（30）设置成允许纵向探测几何形状，使得被测试面板（14）的表面上的电压差导致光能的功率调制，所述光能可以通过区域光学传感器（a 相机）（48），用于直接产生直接代表待测试板（14）的表面上的空间对应差分电压状态的二维空间相关功率调制图像。通过将调制器（30）的表面放置在比被测试板（14）中的电压位置的间隔更靠近待测试板（14）的位置来最小化表面串扰。该装置可以以直通模式或反射模式操作。

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