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1. 发明申请

WO2006113145A2 SYSTEMS AND METHODS FOR MITIGATING VARIANCES ON A PATTERNED WAFER USING A PREDICTION MODEL 审中-公开
标题翻译：使用预测模型减少图形波形上的变量的系统和方法
公开(公告)号：WO2006113145A2
公开(公告)日：2006-10-26
申请号：PCT/US2006012846
申请日：2006-04-07
申请人： KLA TENCOR TECH CORP , WATSON STERLING G , LEVY ADY , MACK CHRIS A , STOKOWSKI STANLEY E , SAIDIN ZAIN K
发明人： WATSON STERLING G , LEVY ADY , MACK CHRIS A , STOKOWSKI STANLEY E , SAIDIN ZAIN K
IPC分类号： G06F17/50 , G03F1/00
CPC分类号： G03F1/84 , G03F1/36 , Y10S430/146
摘要： Disclosed are systems and methods for mitigating variances (e.g., critical dimension variances) on a patterned wafer are provided. In general, variances of a patterned wafer are predicted using one or more reticle fabrication and/or wafer processing models. The predicted variances are used to modify selected transparent portions of the reticle that is to be used to produce the patterned wafer. In a specific implementation, an optical beam, such as a femto-second laser, is applied to the reticle at a plurality of embedded positions, and the optical beam is configured to form specific volumes of altered optical properties within the transparent material of the reticle at the specified positions. These reticle volumes that are created at specific positions of the reticle result in varying amounts of light transmission or dose through the reticle at such specific positions so as to mitigate the identified variances on a wafer that is patterned using the modified reticle.
摘要翻译：公开了用于减轻图案化晶片上的方差（例如，临界尺寸方差）的系统和方法。通常，使用一个或多个掩模版制造和/或晶片处理模型预测图案化晶片的变化。预测的方差用于修改用于产生图案化晶片的掩模版的所选透明部分。在具体实现中，诸如毫微微秒激光器的光束在多个嵌入位置被施加到掩模版，并且光束被配置为在掩模版的透明材料内形成改变的光学特性的特定体积在指定位置。在掩模版的特定位置处产生的这些掩模版体积在这样的特定位置处导致通过掩模版的光透射或剂量的变化量，以便减轻使用修改的掩模版图案化的晶片上识别的方差。

2. 发明申请

WO2005008747A3 METHODS AND SYSTEMS FOR INSPECTION OF WAFERS AND RETICLES USING DESIGNER INTENT DATA 审中-公开
标题翻译：使用设计者信息数据检查波形和反射的方法和系统
公开(公告)号：WO2005008747A3
公开(公告)日：2005-08-25
申请号：PCT/US2004021459
申请日：2004-07-02
申请人： KLA TENCOR TECHNOLOGIES , MARELLA PAUL FRANK , MCCAULEY SHARON , CHANG ELLIS , VOLK WILLIAM , WILEY JAMES , WATSON STERLING , KEKARE SAGAR A , HESS CARL
发明人： MARELLA PAUL FRANK , MCCAULEY SHARON , CHANG ELLIS , VOLK WILLIAM , WILEY JAMES , WATSON STERLING , KEKARE SAGAR A , HESS CARL
IPC分类号： G01N21/95 , G03F1/44 , G03F7/20 , G03F1/00 , G01N21/956
CPC分类号： G06T7/0006 , G01N21/9501 , G01N21/956 , G01N2021/95676 , G03F1/84 , G03F7/7065 , G06T7/0008 , G06T2207/30148
摘要： Methods and systems for inspection of wafers and reticles using designer intent data are provided. One computer-implemented method includes identifying nuisance defects on a wafer based on inspection data produced by inspection of a reticle, which is used to form a pattern on the wafer prior to inspection of the wafer. Another computer-implemented method includes detecting defects on a wafer by analyzing data generated by inspection of the wafer in combination with data representative of a reticle, which includes designations identifying different types of portions of the reticle. An additional computer-implemented method includes determining a property of a manufacturing process used to process a wafer based on defects that alter a characteristic of a device formed on the wafer. Further computer-implemented methods include altering or simulating one or more characteristics of a design of an integrated circuit based on data generated by inspection of a wafer.
摘要翻译：提供了使用设计人员意图数据检查晶圆和标线的方法和系统。一种计算机实现的方法包括基于通过检查光罩产生的检查数据来识别晶片上的有害缺陷，其用于在晶片检查之前在晶片上形成图案。另一种计算机实现的方法包括通过结合表示标线的数据分析由晶片的检查产生的数据来检测晶片上的缺陷，该数据包括标识掩模版的不同类型的部分的标记。附加的计算机实现的方法包括基于改变晶片上形成的器件的特性的缺陷来确定用于处理晶片的制造工艺的特性。进一步的计算机实现的方法包括基于通过检查晶片产生的数据来改变或模拟集成电路的设计的一个或多个特性。

3. 发明申请

WO2006113126A2 METHOD FOR MONITORING A RETICLE 审中-公开
标题翻译：监控方法
公开(公告)号：WO2006113126A2
公开(公告)日：2006-10-26
申请号：PCT/US2006/012608
申请日：2006-04-03
申请人： KLA-TENCOR TECHNOLOGIES CORPORATION , WATSON, Sterling, G. , LEVY, Ady , MACK, Chris, A. , STOKOWSKI, Stanley, E. , SAIDIN, Zain, K.
发明人： WATSON, Sterling, G. , LEVY, Ady , MACK, Chris, A. , STOKOWSKI, Stanley, E. , SAIDIN, Zain, K.
IPC分类号： G03F1/00 , G03C5/00 , G06K9/00
CPC分类号： G03F1/84 , G03F1/38 , G03F1/50 , G03F7/70433 , G03F7/70625 , Y10S430/146
摘要： Reticles may comprise shading elements (SEs) for locally altering the reticle optical properties. However, such reticles may degrade over time as a result of repeated exposure to radiation in a lithography process, as the radiation may "heal" the SEs. Disclosed are techniques for monitoring a reticle in order to maintain confidence about the reticle's optical properties and the uniformity of patterns on wafers that are to be printed using the reticle. Reticles undergo periodic inspection comprising reticle transmission measurement and/or aerial imaging of the reticle. When such inspection indicates sufficient reticle degradation, the reticle is tagged for correction prior to its subsequent use in a lithography process.
摘要翻译：网状物可以包括用于局部改变光罩光学性质的遮蔽元件（SE）。然而，由于辐射可能“治愈”SE，因此在光刻过程中由于反复暴露于辐射而导致这样的掩模版可能随时间而降解。公开了用于监测掩模版的技术，以便保持关于掩模版的光学性质和将使用掩模版印刷的晶片上的图案的均匀性的置信度。网格线进行定期检查，包括掩模版传输测量和/或掩模版的空中成像。当这种检查表明足够的掩模版降解时，标线片被标记以在其后续在光刻工艺中使用之前进行校正。

4. 发明申请

WO2006113146A3 SYSTEMS AND METHODS FOR MODIFYING A RETICLE'S OPTICAL PROPERTIES 审中-公开
标题翻译：用于修改虚拟光学特性的系统和方法
公开(公告)号：WO2006113146A3
公开(公告)日：2007-08-30
申请号：PCT/US2006012847
申请日：2006-04-07
申请人： KLA TENCOR TECH CORP , WATSON STERLING G , LEVY ADY , MACK CHRIS A , STOKOWSKI STANLEY E , SAIDIN ZAIN K , ZURBRICK LARRY S
发明人： WATSON STERLING G , LEVY ADY , MACK CHRIS A , STOKOWSKI STANLEY E , SAIDIN ZAIN K , ZURBRICK LARRY S
IPC分类号： G03F1/00
CPC分类号： G06K9/2063 , G03F1/72 , G03F1/84 , Y10S430/146
摘要： Disclosed are systems and methods for modifying a reticle. In general, inspection results from a plurality of wafers or prediction results from a lithographic model are used to individually decrease the dose or any other optical property at specific locations of the reticle. In one embodiment, any suitable optical property of the reticle is modified by an optical beam, such as a femto-second laser, at specific locations on the reticle so as to widen the process window for such optical property. Examples of optical properties include dose, phase, illumination angle, and birefringence. Techniques for adjusting optical properties at specific locations on a reticle using an optical beam may be practiced for other purposes besides widening the process window.
摘要翻译：公开了用于修改掩模版的系统和方法。通常，来自多个晶片的检查结果或来自光刻模型的预测结果被用于单独地减小光罩的特定位置处的剂量或任何其它光学特性。在一个实施例中，掩模版的任何合适的光学性质通过光束（例如毫微微秒级激光器）在掩模版上的特定位置处被修改，以便加宽用于这种光学性质的工艺窗口。光学性质的实例包括剂量，相位，照射角度和双折射率。使用光束在光罩上的特定位置处调整光学特性的技术可以用于除加宽工艺窗口之外的其它目的。

5. 发明申请

WO2006113145A3 SYSTEMS AND METHODS FOR MITIGATING VARIANCES ON A PATTERNED WAFER USING A PREDICTION MODEL 审中-公开
公开(公告)号：WO2006113145A3
公开(公告)日：2006-10-26
申请号：PCT/US2006/012846
申请日：2006-04-07
申请人： KLA-TENCOR TECHNOLOGIES CORPORATION , WATSON, Sterling, G. , LEVY, Ady , MACK, Chris, A. , STOKOWSKI, Stanley, E. , SAIDIN, Zain, K.
发明人： WATSON, Sterling, G. , LEVY, Ady , MACK, Chris, A. , STOKOWSKI, Stanley, E. , SAIDIN, Zain, K.
IPC分类号： G01P3/36 , G01N21/00 , G02B23/10
摘要： Disclosed are systems and methods for mitigating variances (e.g., critical dimension variances) on a patterned wafer are provided. In general, variances of a patterned wafer are predicted using one or more reticle fabrication and/or wafer processing models. The predicted variances are used to modify selected transparent portions of the reticle that is to be used to produce the patterned wafer. In a specific implementation, an optical beam, such as a femto-second laser, is applied to the reticle at a plurality of embedded positions, and the optical beam is configured to form specific volumes of altered optical properties within the transparent material of the reticle at the specified positions. These reticle volumes that are created at specific positions of the reticle result in varying amounts of light transmission or dose through the reticle at such specific positions so as to mitigate the identified variances on a wafer that is patterned using the modified reticle.

6. 发明申请

WO2006113135A2 METHOD FOR DETERMINING AND CORRECTING RETICLE VARIATIONS 审中-公开
标题翻译：用于确定和修正版本变化的方法
公开(公告)号：WO2006113135A2
公开(公告)日：2006-10-26
申请号：PCT/US2006012741
申请日：2006-04-05
申请人： KLA TENCOR TECH CORP , WATSON STERLING G , LEVY ADY , MACK CHRIS A , STOKOWSKI STANLEY E , SAIDIN ZAIN K
发明人： WATSON STERLING G , LEVY ADY , MACK CHRIS A , STOKOWSKI STANLEY E , SAIDIN ZAIN K
IPC分类号： G03F1/00 , G03C5/00 , G06K9/00
CPC分类号： G03F1/84 , Y10S430/146
摘要： Disclosed are techniques for determining and correcting reticle variations using a reticle global variation map generated by comparing a set of measured reticle parameters to a set of reference reticle parameters. The measured reticle parameters are obtained by reticle inspection, and the variation map identifies reticle regions and associated levels of correction. In one embodiment, the variation data is communicated to a system which modifies the reticle by embedding scattering centers within the reticle at identified reticle regions, thereby improving the variations. In another embodiment the variation data is transferred to a wafer stepper or scanner which in turn modifies the conditions under which the reticle is used to manufacture wafers, thereby compensating for the variations and producing wafers that are according to design.
摘要翻译：公开了用于使用通过将测量的标线参数的集合与一组参考掩模版参数进行比较而生成的光罩全局变化图来确定和校正光罩变化的技术。通过掩模版检查获得测量的掩模版参数，并且变化图识别标线区域和相关联的校正水平。在一个实施例中，将变化数据传送到通过在标定的标线区域内的散射中心嵌入来修改掩模版的系统，从而改善变化。在另一个实施例中，变化数据被传送到晶片步进器或扫描器，该晶片步进器或扫描器又改变了使用掩模版制造晶片的条件，从而补偿了根据设计的变化和生产晶片。

7. 发明申请

WO2006113126A3 METHOD FOR MONITORING A RETICLE 审中-公开
标题翻译：监控方法
公开(公告)号：WO2006113126A3
公开(公告)日：2009-04-09
申请号：PCT/US2006012608
申请日：2006-04-03
申请人： KLA TENCOR TECH CORP , WATSON STERLING G , LEVY ADY , MACK CHRIS A , STOKOWSKI STANLEY E , SAIDIN ZAIN K
发明人： WATSON STERLING G , LEVY ADY , MACK CHRIS A , STOKOWSKI STANLEY E , SAIDIN ZAIN K
IPC分类号： G06K9/00 , G01R31/26 , H01L21/22 , H01L21/38 , H01L21/66
CPC分类号： G03F1/84 , G03F1/38 , G03F1/50 , G03F7/70433 , G03F7/70625 , Y10S430/146
摘要： Reticles may comprise shading elements (SEs) for locally altering the reticle optical properties. However, such reticles may degrade over time as a result of repeated exposure to radiation in a lithography process, as the radiation may "heal" the SEs. Disclosed are techniques for monitoring a reticle in order to maintain confidence about the reticle's optical properties and the uniformity of patterns on wafers that are to be printed using the reticle. Reticles undergo periodic inspection comprising reticle transmission measurement and/or aerial imaging of the reticle. When such inspection indicates sufficient reticle degradation, the reticle is tagged for correction prior to its subsequent use in a lithography process.
摘要翻译：网状物可以包括用于局部改变光罩光学性质的遮蔽元件（SE）。然而，由于辐射可能“治愈”SE，因此在光刻过程中由于反复暴露于辐射而导致这样的掩模版可能随时间而降解。公开了用于监测掩模版的技术，以便保持关于掩模版的光学性质和将使用掩模版印刷的晶片上的图案的均匀性的置信度。网格线进行定期检查，包括掩模版传输测量和/或掩模版的空中成像。当这种检查表明足够的掩模版降解时，标线片被标记以在其后续在光刻工艺中使用之前进行校正。

8. 发明申请

WO2006113135A3 METHOD FOR DETERMINING AND CORRECTING RETICLE VARIATIONS 审中-公开
公开(公告)号：WO2006113135A3
公开(公告)日：2006-10-26
申请号：PCT/US2006/012741
申请日：2006-04-05
申请人： KLA-TENCOR TECHNOLOGIES CORPORATION , WATSON, Sterling, G. , LEVY, Ady , MACK, Chris, A. , STOKOWSKI, Stanley, E. , SAIDIN, Zain, K.
发明人： WATSON, Sterling, G. , LEVY, Ady , MACK, Chris, A. , STOKOWSKI, Stanley, E. , SAIDIN, Zain, K.
IPC分类号： G03F1/00 , G03F9/00 , G03C5/00 , G06F17/50
摘要： Disclosed are techniques for determining and correcting reticle variations using a reticle global variation map generated by comparing a set of measured reticle parameters to a set of reference reticle parameters. The measured reticle parameters are obtained by reticle inspection, and the variation map identifies reticle regions and associated levels of correction. In one embodiment, the variation data is communicated to a system which modifies the reticle by embedding scattering centers within the reticle at identified reticle regions, thereby improving the variations. In another embodiment the variation data is transferred to a wafer stepper or scanner which in turn modifies the conditions under which the reticle is used to manufacture wafers, thereby compensating for the variations and producing wafers that are according to design.

9. 发明申请

WO2006113146A2 SYSTEMS AND METHODS FOR MODIFYING A RETICLE'S OPTICAL PROPERTIES 审中-公开
标题翻译：用于修改虚拟光学特性的系统和方法
公开(公告)号：WO2006113146A2
公开(公告)日：2006-10-26
申请号：PCT/US2006/012847
申请日：2006-04-07
申请人： KLA-TENCOR TECHNOLOGIES CORPORATION , WATSON, Sterling, G. , LEVY, Ady , MACK, Chris, A. , STOKOWSKI, Stanley, E. , SAIDIN, Zain, K. , ZURBRICK, Larry, S.
发明人： WATSON, Sterling, G. , LEVY, Ady , MACK, Chris, A. , STOKOWSKI, Stanley, E. , SAIDIN, Zain, K. , ZURBRICK, Larry, S.
IPC分类号： G03F1/00 , G03C5/00 , G06K9/00
CPC分类号： G06K9/2063 , G03F1/72 , G03F1/84 , Y10S430/146
摘要： Disclosed are systems and methods for modifying a reticle. In general, inspection results from a plurality of wafers or prediction results from a lithographic model are used to individually decrease the dose or any other optical property at specific locations of the reticle. In one embodiment, any suitable optical property of the reticle is modified by an optical beam, such as a femto-second laser, at specific locations on the reticle so as to widen the process window for such optical property. Examples of optical properties include dose, phase, illumination angle, and birefringence. Techniques for adjusting optical properties at specific locations on a reticle using an optical beam may be practiced for other purposes besides widening the process window.
摘要翻译：公开了用于修改掩模版的系统和方法。通常，来自多个晶片的检查结果或来自光刻模型的预测结果被用于单独地减小光罩的特定位置处的剂量或任何其它光学特性。在一个实施例中，掩模版的任何合适的光学性质通过光束（例如毫微微秒级激光器）在掩模版上的特定位置处被修改，以便加宽用于这种光学性质的工艺窗口。光学性质的实例包括剂量，相位，照射角度和双折射率。使用光束在光罩上的特定位置处调整光学特性的技术可以用于除加宽工艺窗口之外的其它目的。

10. 发明申请

WO2005008747A2 METHODS AND SYSTEMS FOR INSPECTION OF WAFERS AND RETICLES USING DESIGNER INTENT DATA 审中-公开
标题翻译：使用设计者目的数据检验晶片和晶片的方法和系统
公开(公告)号：WO2005008747A2
公开(公告)日：2005-01-27
申请号：PCT/US2004/021459
申请日：2004-07-02
申请人： KLA-TENCOR TECHNOLOGIES , MARELLA, Paul Frank , MCCAULEY, Sharon , CHANG, Ellis , VOLK, William , WILEY, James , WATSON, Sterling , KEKARE, Sagar A. , HESS, Carl
发明人： MARELLA, Paul Frank , MCCAULEY, Sharon , CHANG, Ellis , VOLK, William , WILEY, James , WATSON, Sterling , KEKARE, Sagar A. , HESS, Carl
IPC分类号： H01L21/00
CPC分类号： G06T7/0006 , G01N21/9501 , G01N21/956 , G01N2021/95676 , G03F1/84 , G03F7/7065 , G06T7/0008 , G06T2207/30148
摘要： Methods and systems for inspection of wafers and reticles using designer intent data are provided. One computer-implemented method includes identifying nuisance defects on a wafer based on inspection data produced by inspection of a reticle, which is used to form a pattern on the wafer prior to inspection of the wafer. Another computer-implemented method includes detecting defects on a wafer by analyzing data generated by inspection of the wafer in combination with data representative of a reticle, which includes designations identifying different types of portions of the reticle. An additional computer-implemented method includes determining a property of a manufacturing process used to process a wafer based on defects that alter a characteristic of a device formed on the wafer. Further computer-implemented methods include altering or simulating one or more characteristics of a design of an integrated circuit based on data generated by inspection of a wafer.
摘要翻译：提供了使用设计者意图数据检查晶片和分划板的方法和系统。一种计算机实现的方法包括基于通过检查标线产生的检查数据来识别晶片上的滋扰缺陷，所述标线用于在检查晶片之前在晶片上形成图案。另一种计算机实现的方法包括通过结合表示掩模版的数据分析通过检查晶片产生的数据来检测晶片上的缺陷，其包括识别掩模版的不同类型部分的标记。另外的计算机实现的方法包括基于改变晶片上形成的器件的特性的缺陷来确定用于处理晶片的制造工艺的特性。其他计算机实现的方法包括基于通过检查晶片产生的数据改变或模拟集成电路设计的一个或多个特性。

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