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1. 发明申请

US20040165203A1 Methods and systems for ascertaining the roughness of a print media surface 失效
标题翻译：用于确定印刷介质表面的粗糙度的方法和系统
公开(公告)号：US20040165203A1
公开(公告)日：2004-08-26
申请号：US10626021
申请日：2003-07-24
发明人： Darin D. Lindig
IPC分类号： G01B011/30 , B41J002/385 , G03G021/00 , G01B005/28 , B41J013/00
CPC分类号： B65H43/00 , B41J11/009 , B41J11/0095 , B65H2511/135 , B65H2553/414 , G01B21/30 , B65H2220/03
摘要： In one embodiment, a printing device comprises a printer configured to print upon paper, a surface-engaging member associated with the printer and configured to physically engage a paper surface, the surface-engaging member comprising a flexure material body that is supported in a cantilevered disposition proximate a piece of paper to be printed upon by the printer, a reflective member joined with the surface-engaging member, one or more light sources in operable proximity to the reflective member and configured to project light energy toward the reflective member, and a position detector mounted in operable proximity to the reflective member and configured to receive light energy that is reflected from the reflective member, the surface-engaging member being configured for displacement by the paper's surface in accordance with variations in the roughness of the surface sufficiently so that light that is reflected by the reflective member and received by the position detector can be utilized to ascertain a measure of the paper surface's roughness.
摘要翻译：在一个实施例中，打印装置包括被配置为在纸张上打印的打印机，与打印机相关联并且被配置为物理地接合纸张表面的表面接合构件，所述表面接合构件包括弯曲材料体，所述弯曲材料体被支撑在悬臂靠近由打印机打印的一张纸的配置，与表面接合构件连接的反射构件，可操作地接近反射构件并被配置为将光能投射到反射构件的一个或多个光源，以及位置检测器安装在可操作地接近反射构件并且被配置为接收从反射构件反射的光能，表面接合构件被构造成根据表面的粗糙度的变化被充分地位移，使得可以通过反射构件反射并被位置检测器接收的光用于确定纸张表面粗糙度的度量。

2. 发明申请

US20040154402A1 Remote laser beam delivery system and method for use with a robotic positioning system for ultrasonic testing purposes 审中-公开
标题翻译：远程激光束传送系统和用于超声波测试目的的机器人定位系统的方法
公开(公告)号：US20040154402A1
公开(公告)日：2004-08-12
申请号：US10753208
申请日：2004-01-07
申请人： Lockheed Martin Corporation
发明人： Thomas E. Drake JR.
IPC分类号： G01N029/10 , G01N029/26 , G01N021/88 , G01N023/20 , G01B011/30
CPC分类号： G01S17/89 , G01B11/161 , G01D5/266 , G01N29/04 , G01N29/2418 , G01N29/50 , G01N2291/0231 , G01N2291/0421 , G01N2291/044 , G01N2291/2694 , G01S5/0247 , G01S5/16 , G01S13/89 , G01S15/8906 , G01S17/46
摘要： The invention is directed to an ultrasonic testing system. The system tests a manufactured part for various physical attributes, including specific flaws, defects, or composition of materials. The part can be housed in a gantry system that holds the part stable. An energy generator illuminates the part with energy and the part emanates energy from that illumination. Based on the emanations from the part, the system can determined precisely where the part is in free space. The energy illumination device and the receptor have a predetermined relationship in free space. This means the location of the illumination mechanism and the reception mechanism is known. Additionally, the coordinates of the actual testing device also have a predetermined relationship to the illumination device, the reception device, or both.
摘要翻译：本发明涉及一种超声波检测系统。系统测试制造零件的各种物理属性，包括特定缺陷，缺陷或材料组成。该部件可以安装在保持部件稳定的龙门架系统中。能量发生器用能量照射部件，部件发出该照明的能量。基于该部分的发射，系统可以准确地确定零件在自由空间中的位置。能量照明装置和受体在自由空间中具有预定的关系。这意味着照明机构和接收机构的位置是已知的。此外，实际测试装置的坐标也与照明装置，接收装置或两者具有预定的关系。

3. 发明申请

US20040129064A1 Topography and recognition imaging atomic force microscope and method of operation 有权
标题翻译：地形和识别成像原子力显微镜及其操作方法
公开(公告)号：US20040129064A1
公开(公告)日：2004-07-08
申请号：US10697841
申请日：2003-10-30
发明人： Peter Hinterdorfer , Jeremy Nelson
IPC分类号： G01N013/16 , G01N013/10 , G01N033/53 , G12B021/08 , G01B011/30
CPC分类号： G01Q60/42 , G01Q10/06 , Y10S977/852
摘要： A recognition force microscope for detecting interactions between a probe and a sensed agent on a scanned surface and methods for its operation are provided. The microscope includes a scanning probe having a tip that is sensitive to a property of the scanned surface, and the probe is adapted to oscillate with a low mechanical Q factor. Operation of the microscope includes recording the displacement of the probe tip as a function of time and simultaneously recording both topographic images and the spatial location of interactions between said probe and one or more sensed agents on the surface.
摘要翻译：提供了一种用于检测扫描表面上的探针和检测到的试剂之间的相互作用的识别力显微镜及其操作方法。显微镜包括具有对扫描表面的特性敏感的尖端的扫描探针，并且探针适于以低机械Q因子振荡。显微镜的操作包括记录探针尖端的位移作为时间的函数，同时记录所述探针和表面上的一个或多个感测到的试剂之间的相互作用的两个地形图像和空间位置。

4. 发明申请

US20020186415A1 Method, apparatus and article of manufacture using media roughness as a print parameter 有权
标题翻译：使用介质粗糙度作为打印参数的方法，设备和制品
公开(公告)号：US20020186415A1
公开(公告)日：2002-12-12
申请号：US09876507
申请日：2001-06-06
申请人： International Business Machines Corporation
发明人： John B. Condon , Joan LaVerne Mitchell , David Joseph Shields
IPC分类号： H04N001/405 , G06T007/40 , G01B011/30 , G06K015/02
CPC分类号： H04N1/405 , G06K15/02
摘要： A method, apparatus and article of manufacture for providing improved print quality regardless of media smoothness is disclosed. Information regarding the smoothness of media is ascertained and the information about the media smoothness is used in the generation of an output. A selectable halftone screen is used in the print device to provide different halftone screens for different media smoothness. The halftoning screens can be changed depending on the roughness of the media being used. Pre-defined halftone screens may be stored and selected for a range of media smoothness. The selection of the pre-defined halftones may be selected by the operator or may be selected automatically by the print device.
摘要翻译：公开了一种用于提供改善的打印质量而不管介质平滑度的方法，装置和制品。确定介质平滑性的信息，并且在生成输出时使用关于媒体平滑度的信息。在打印设备中使用可选择的半色调屏幕，以提供用于不同媒体平滑度的不同半色调屏幕。可以根据所使用的介质的粗糙度来改变半色调屏幕。预定义的半色调屏幕可以存储和选择一定范围的介质平滑度。可以由操作者选择预定义的半色调，或者可以由打印设备自动选择。

5. 发明申请

US20020131056A1 Measuring system with improved method of reading image data of an object 失效
标题翻译：测量系统，改进了读取物体图像数据的方法
公开(公告)号：US20020131056A1
公开(公告)日：2002-09-19
申请号：US10075230
申请日：2002-02-15
发明人： Eiro Fujii , Shigeaki Imai , Toshio Norita
IPC分类号： G01B011/24 , G01B011/30
CPC分类号： G01B11/2518 , G06T7/521
摘要： When a scanning start position set signal is input in an area image sensor, the content is transferred to a vertical scanning circuit, and the scan start position is set. Image of a desired row is read by horizontal scanning. Then, one shift signal for vertical scanning is input, the position of scanning is shifted by one row, and horizontal scanning is performed. Thus image of the next row is read. By repeating this operation, a desired strip-shaped image is read. The shape of the object is determined and when a portion is determined to have complicated shape, the image data is input by means of a lens having long focal length, and image data of other portions are input by means of a lens having short focal length. By putting together a plurality of input image data, image data as a whole is generated.
摘要翻译：当在区域图像传感器中输入扫描开始位置设置信号时，将内容传送到垂直扫描电路，并设置扫描开始位置。通过水平扫描读取所需行的图像。然后，输入用于垂直扫描的一个移位信号，扫描的位置移位一行，并进行水平扫描。因此，读取下一行的图像。通过重复该操作，读取期望的条形图像。确定物体的形状，并且当确定部分具有复杂形状时，通过具有长焦距的透镜输入图像数据，并且借助于具有短焦距的透镜输入其他部分的图像数据。通过合成多个输入图像数据，生成整体的图像数据。

6. 发明申请

US20010013935A1 Surface inspection using the ratio of intensities of s- and p-polarized light components of a laser beam reflected a rough surface 失效
公开(公告)号：US20010013935A1
公开(公告)日：2001-08-16
申请号：US09819245
申请日：2001-03-28
发明人： Masao Watanabe , Akiko Okubo
IPC分类号： G01B011/30
CPC分类号： G01N21/211 , G01B11/303 , G01N21/88 , G01N21/94 , G01N21/9501
摘要： A surface inspection device irradiates a laser beam onto the surface of a sample, scans the surface two-dimensionally, and detects the intensities of the s-polarized light component and p-polarized light component of the reflected laser beam. RR (reflectance ratio), which is the ratio of the reflective intensities of the s- and p-polarized light components, is calculated for each position of the surface of the sample, and the two-dimensional distribution of RR on the surface of the sample is detected. The distribution width of this measured RR is compared with the natural width for a clean sample, and the surface of the sample is determined to be contaminated when, as the result of comparison, the RR distribution width diverges from the natural width. The absence or presence of contamination on the microscopically rough surface of a sample can therefore be quickly and easily determined based on the RR of the reflective intensities of the s- and p-polarized light components.

7. 发明申请

US20010008448A1 Reflectance method for evaluating the surface characteristics of opaque materials 失效
标题翻译：用于评估不透明材料表面特性的反射方法
公开(公告)号：US20010008448A1
公开(公告)日：2001-07-19
申请号：US09793435
申请日：2001-02-26
发明人： Randhir P.S. Thakur , Michael Nuttall , J. Brett Rolfson , Robert James Burke
IPC分类号： G01B011/30
CPC分类号： G01B11/303
摘要： Disclosed is a process for analyzing the surface characteristics of opaque materials. The method comprises in one embodiment the use of a UV reflectometer to build a calibration matrix of data from a set of control samples and correlating a desired surface characteristic such as roughness or surface area to the set of reflectances of the control samples. The UV reflectometer is then used to measure the reflectances of a test sample of unknown surface characteristics. Reflectances are taken at a variety of angles of reflection for a variety of wavelengths, preferably between about 250 nanometers to about 400 nanometers. These reflectances are then compared against the reflectances of the calibration matrix in order to correlate the closest data in the calibration matrix. By so doing, a variety of information is thereby concluded, due to the broad spectrum of wavelengths and angles of reflection used. This includes information pertaining to the roughness and surface area, as well as other surface characteristics such as grain size, grain density, grain shape, and boundary size between the grains. Surface characteristic evaluation can be conducted in-process in a manner which is non-destructive to the test sample. The method is particularly useful for determining the capacitance of highly granular polysilicon test samples used in the construction of capacitator plates in integrated circuit technology, and can be used to determine the existence of flat smooth surfaces, the presence of prismatic and hemispherical irregularities on flat smooth surfaces, and the size of such irregularities.
摘要翻译：公开了一种用于分析不透明材料的表面特性的方法。该方法在一个实施方案中包括使用UV反射计来构建来自一组对照样品的数据的校准矩阵，并将期望的表面特性如粗糙度或表面积与对照样品的一组反射率相关联。然后使用UV反射计来测量未知表面特性的测试样品的反射率。对于各种波长，优选地在约250纳米至约400纳米之间的各种反射角度下进行反射。然后将这些反射率与校准矩阵的反射率进行比较，以便将校准矩阵中最接近的数据相关联。通过这样做，由于广泛的波长和使用的反射角度，从而得出各种信息。这包括关于粗糙度和表面积的信息，以及晶粒之间的其他表面特性，例如晶粒尺寸，晶粒密度，晶粒形状和边界尺寸。表面特性评估可以以对测试样品非破坏性的方式进行。该方法特别有助于确定集成电路技术中用于构建电容器板的高度粒状多晶硅测试样品的电容，并且可用于确定平滑光滑表面的存在，平坦光滑的棱镜和半球形不规则的存在表面和这种不规则的大小。

8. 发明申请

US20040246495A1 Range finder and method 失效
公开(公告)号：US20040246495A1
公开(公告)日：2004-12-09
申请号：US10702597
申请日：2003-11-07
申请人： FUJI XEROX CO., LTD.
发明人： Tsutomu Abe
IPC分类号： G01C003/00 , G01C003/08 , G01C005/00 , G01B011/24 , G01B011/30
CPC分类号： G06T7/593 , G01C3/08 , G01C11/06 , G01S17/42 , G01S17/89 , G06T7/521 , H04N13/254 , H04N13/261
摘要： Pattern projection apparatuses are placed on each other in a stack manner in a stripe pattern direction for projecting the same patterns. An image pickup apparatus (camera 1) is placed between the pattern projection apparatuses. The optical axes of the pattern projection apparatuses and the image pickup apparatus are aligned on the same plane parallel with the stripe pattern direction. On the plane, the principal points also become the same. An image of a stripe pattern is picked up directly by the image pickup apparatus without the intervention of a half mirror, etc., and is recoded. An image of the recoded stripe pattern is picked up by an image pickup apparatus (camera 2) and is decoded and the range of an object is measured by triangulation based on image correspondence points.

9. 发明申请

US20040025579A1 Submerged sample observation apparatus and method 失效
公开(公告)号：US20040025579A1
公开(公告)日：2004-02-12
申请号：US10636565
申请日：2003-08-08
申请人： TOYOTA JIDOSHA KABUSHIKI KAISHA
发明人： Naoki Nakamura
IPC分类号： G01N013/10 , G01B011/30 , G01B011/00 , G01N021/49 , G01N021/47
CPC分类号： G01Q30/14 , Y10S977/86
摘要： An apparatus and a method for observing a submerged sample are disclosed, in which a scanning probe microscope comprises a cantilever with a probe arranged at the forward end thereof, a light source for applying light to the cantilever and a detector for detecting the light reflected from the cantilever, the apparatus further comprising a sample container having a side wall for holding a liquid therein. The probe is placed in closely opposed relation to the sample in the liquid in the sample container, and the relative positions of the probe and the sample are changed, so that based on the interaction between the probe and the sample, a surface image of the sample is produced to observe the sample. A device for preventing volatilization of the liquid having the sample submerged therein is formed on the surface of the liquid. An insulative liquid layer not mixed with the surface of the liquid having the sample submerged therein is formed on the surface of the liquid. Only the forward end of the probe is introduced into the liquid having the sample submerged therein, while the other portion of the probe is covered with the insulative liquid. The light from the light source is applied to the cantilever in the liquid without passing through the interface between the liquid and the atmosphere, and the reflected light is picked up in the liquid.

10. 发明申请

US20040013955A1 Best focus determining method 有权
标题翻译：最佳焦点确定方法
公开(公告)号：US20040013955A1
公开(公告)日：2004-01-22
申请号：US10313733
申请日：2002-12-05
申请人： NANYA TECHNOLOGY CORPORATION
发明人： Yuan-Hsun Wu
IPC分类号： G03F007/207 , G03B027/34 , G03B027/40 , G01B011/24 , G01B011/30
CPC分类号： G03F7/70641 , G02B7/28 , G03F7/70283
摘要： A best focus determining method. First, a test mask is provided, wherein the test mask comprises a transparent substrate and an opaque layer covering parts of the transparent substrate to define a first transparent area with 0null phase and a second transparent area with 90null phase. The sizes of the two transparent areas are the same. Next, a light source is provided and transmits the test mask to perform an exposure. Then, a first image corresponding to the first transparent area and a second image corresponding to the second transparent area are formed. The sizes of the first and second images are measured to ensure the best focus possible.
摘要翻译：最佳焦点确定方法。首先，提供测试掩模，其中测试掩模包括透明基底和覆盖透明基底部分的不透明层，以限定具有0°相位的第一透明区域和90°相位的第二透明区域。两个透明区域的大小相同。接下来，提供光源并发送测试掩模以进行曝光。然后，形成与第一透明区域对应的第一图像和对应于第二透明区域的第二图像。测量第一和第二图像的尺寸以确保最佳聚焦成为可能。

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