会员体验
专利管家(专利管理)
工作空间(专利管理)
风险监控(情报监控)
数据分析(专利分析)
侵权分析(诉讼无效)
联系我们
交流群
官方交流:
QQ群: 891211   
微信请扫码    >>>
现在联系顾问~
热词
    • 2. 发明授权
    • Waste water classifying recovery apparatus in wafer cleaning system
    • 晶圆清洗系统废水分级回收装置
    • US06178975B2
    • 2001-01-30
    • US09305199
    • 1999-05-05
    • Shoji Aoki
    • Shoji Aoki
    • B08B1300
    • C02F1/008Y10S134/902
    • In a single wafer cleaning system of a single tank type in which wafers are one by one sprayed with chemical liquid and rinse water used in a successive order, not only can waste water is recovered while being classified into chemical liquid waste water and rinse waste water, but also the rinse waste water is recovered while being classified into cloudy rinse waste water and clean rinse waste water. A waste water classifying recovery apparatus comprises: chemical liquid waste water lines 15, 16 and a rinse waste water line 17 connected to a treatment tank 1; chemical liquid/rinse selective distributor automatic valves 10, 11, 12 respectively provided on the lines; a concentration meter sensor 18 for detecting a concentration of the rinse waste water on the rinse waste water line 17 downstream from the distributor automatic valve 12; a cloudy rinse waste water line 17a and a clean rinse waste water line 17b branched from the rinse waste water line 17 downstream from the concentration meter sensor 18; and cloudy/clean rinse distributor valves 13, 14 respectively provided on the waste water lines 17a, 17b; wherein the distributor automatic valve 13 on the cloudy rinse waste water line 17a or the distributor automatic valve 14 on the clean rinse waste water line 17b is opened according to a detection signal of the concentration meter sensor 18, so that the cloudy rinse waste water or the clean rinse waste water is separately drained.
    • 在单个槽式单晶片清洗系统中,其中晶片依次喷洒有化学液体和冲洗水,不仅可以将废水分类为化学液体废水和冲洗废水 ,而且冲洗后的废水也被分类为浑浊的冲洗废水和干净的漂洗废水。 废水分级回收装置包括:化学废液管线15,16和连接到处理槽1的冲洗废水管线17; 分别设置在线路上的化学液体/冲洗选择性分配器自动阀10,11,12; 用于检测分配器自动阀12下游的冲洗废水管线17上的冲洗废水浓度的浓度计传感器18; 从浓度计传感器18下游的冲洗废水管线17分支的多云冲洗废水管线17a和清洁的漂洗废水管线17b; 分别设置在废水管线17a,17b上的多雾/清洁冲洗分配阀13,14; 其中根据浓度计传感器18的检测信号打开清洁冲洗废水管线17b上的浑浊冲洗废水管线17a或分配器自动阀14上的分配器自动阀13,使得混浊的漂洗废水或 干净的冲洗废水分开排干。
    • 4. 发明授权
    • Treatment apparatus
    • 治疗仪器
    • US06318386B1
    • 2001-11-20
    • US09546291
    • 2000-04-10
    • Yuji KamikawaNaoki ShindoShigenori Kitahara
    • Yuji KamikawaNaoki ShindoShigenori Kitahara
    • B08B1300
    • H01L21/67028B08B3/10F04B43/04F04B43/0736F04B2205/063Y10S134/902
    • A cleaning tank 30 stores a cleaning liquid to clean the surfaces of semiconductor wafers W immersed in the cleaning liquid. A cleaning liquid supply pipe 33 connects the cleaning tank 30 to a pure water supply source 31. A chemical liquid container 34 stores a chemical liquid, and a chemical liquid supply pipe 36 connects the cleaning liquid supply pipe 33 to the chemical liquid container 34 via an infusion open/close switching valve 35, and a chemical liquid feed means is interposed in the chemical liquid supply pipe 36. The chemical liquid feed means is a reciprocal pump, such as diaphragm pump 37. Thus, a predetermined quantity of the chemical liquid can be infused into pure water or to a drying gas generator to ensure that the chemical liquid of a predetermined concentration be available for washing or drying treatment, regardless of fluctuations in flow amount or pressure of pure water or a drying gas carrier gas.
    • 清洗槽30储存清洗液体以清洁浸在清洗液中的半导体晶片W的表面。 清洗液供给管33将清洗槽30连接到纯水供给源31.化学液容器34储存药液,药液供给管36将清洗液供给管33与药液容器34连接,经由 输液开闭切换阀35以及化学液体供给装置插入化学液体供给管36中。药液供给装置是隔膜泵37等往复泵。因此,预定量的药液 可以输入纯水或干燥气体发生器,以确保预定浓度的化学液体可用于洗涤或干燥处理,而与纯水或干燥气体载体气体的流量或压力的波动无关。
    • 5. 发明授权
    • Method and system for measuring particles in a liquid sample
    • 用于测量液体样品中颗粒的方法和系统
    • US06172376B2
    • 2001-01-09
    • US09152520
    • 1998-09-14
    • Mindi XuWeiching Li
    • Mindi XuWeiching Li
    • B08B1300
    • G01N15/02G01N2021/054
    • Provided are a method and apparatus for measuring particles in a liquid sample. The method involves introducing a liquid sample into a heat exchanger, thereby cooling the sample to a predetermined temperature. A particle measurement is performed on the cooled sample by introducing the cooled sample into a particle detector. The method and apparatus in accordance with the invention effectively suppress bubbles present in a liquid chemical sample being measured, thereby allowing for accurate particle measurements. The invention has particular applicability in the semiconductor and pharmaceutical manufacturing industries.
    • 提供了一种用于测量液体样品中的颗粒的方法和装置。 该方法包括将液体样品引入热交换器,从而将样品冷却至预定温度。 通过将冷却的样品引入颗粒检测器中对冷却的样品进行颗粒测量。 根据本发明的方法和装置有效地抑制了被测量的液体化学样品中存在的气泡,从而允许精确的颗粒测量。 本发明在半导体和药物制造业中具有特别的适用性。
    • 6. 发明授权
    • Seal configuration for use with a motor drive assembly in a microelectronic workpiece processing system
    • 用于微电子工件处理系统中的电机驱动组件的密封配置
    • US06334453B1
    • 2002-01-01
    • US09503784
    • 2000-02-14
    • Raymon F. ThompsonScott Bruner
    • Raymon F. ThompsonScott Bruner
    • B08B1300
    • H01L21/67126Y10S134/902
    • An apparatus for processing a microelectronic workpiece, such as a semiconductor wafer, is set forth. The apparatus comprises a processing bowl that defines a processing chamber. A seal is provided to assist in removing fluids, such as processing fluids, from the processing chamber that are in the proximity of the seal. Further, the seal is provided to assist in preventing the fluids from entering the motor. To this end, flow generating threads and expulsion threads are provided at an end of a shaft assembly that is connected to be driven by the motor. A member substantially surrounds at least a portion of the flow generating threads and at least a portion of the expulsion threads. Together, the member defines a chamber with the shaft assembly. Rotation of the shaft assembly results in corresponding rotation of the flow generating threads and expulsion threads to drive fluids proximate the shaft assembly to an exhaust while concurrently assisting in preventing such fluids from entering the motor.
    • 阐述了一种用于处理诸如半导体晶片的微电子工件的装置。 该装置包括限定处理室的处理碗。 提供密封件以帮助从位于密封件附近的处理室中除去诸如处理流体的流体。 此外,设置密封件以帮助防止流体进入马达。 为此,在轴组件的端部设置有流动产生螺纹和排出螺纹,该组件的连接部由马达驱动。 构件基本上围绕流动产生螺纹的至少一​​部分和排出螺纹的至少一​​部分。 构件一起定义了具有轴组件的腔室。 轴组件的旋转导致流动产生螺纹和排出螺纹的相应旋转,以将靠近轴组件的流体驱动到排气,同时辅助防止这种流体进入马达。
    • 7. 发明授权
    • Waste material skimming device
    • 废料清理装置
    • US06189549B1
    • 2001-02-20
    • US09312804
    • 1999-05-17
    • Louis B. FontanaGerald B. Davis
    • Louis B. FontanaGerald B. Davis
    • B08B1300
    • B01D21/0003B01D17/0202B01D17/0208B01D17/0211B01D17/0214B01D21/00B01D21/0012B01D21/0018B01D21/0039B01D21/0042B01D21/2433B01D21/2438B01D21/2488B08B3/02
    • A compact, self-contained skimming system for removing waste material from aqueous cleaning solutions used in parts washers. A single tank contains a sloped floor, two compartments separated by a baffle, and an opening between a bottom edge of the baffle and the floor. Waste liquid collects in the first stage compartment, where gravity initially separates water and coarse debris from the waste material containing oil and grease, some water, and fine debris. A partially immersed rotating skimmer further adsorbs the waste material. A waste collection system transfers the waste material to the second stage compartment, where gravity further separates the fine debris and additional water from the oil and grease. The oil and grease flow through a waste drainage system out of the second stage compartment. The fine debris and water flow along the downwardly sloping floor, through the opening at the bottom of the baffle back into the first stage compartment. A single tank may incorporate multiple baffles, skimmer systems, and waste collection systems to perform the separation process in stages.
    • 一种紧凑,独立的撇取系统,用于从零件清洗机中使用的水性清洁溶液中除去废物。 单个箱体包含倾斜的地板,由挡板隔开的两个隔间以及挡板的底部边缘与地板之间的开口。 废液收集在第一级隔间中,其中重力首先从含有油和油脂,一些水和细碎的废物分离出水和粗碎屑。 部分浸没的旋转分离器进一步吸附废料。 废物收集系统将废料转移到第二级隔室,其中重力进一步将细碎屑和额外的水从油和油脂中分离出来。 油和油脂通过废水排放系统流出第二级隔室。 细碎的碎屑和水沿着向下倾斜的地板流过,通过挡板底部的开口回到第一级隔间。 单个罐可以并入多个挡板,分离器系统和废物收集系统,以分阶段进行分离。
    • 8. 发明授权
    • Lehr roll cleaning apparatus
    • Lehr卷筒清洗设备
    • US06170293B2
    • 2001-01-09
    • US09237080
    • 1999-01-25
    • Bryan Cody
    • Bryan Cody
    • B08B1300
    • C03B35/168B08B1/008
    • In situ lehr-roll cleaning apparatus includes a carriage supported within the space between first and second adjacent rolls, the carriage having a first set of elements contacting the surface of the first roll and a second set of elements contacting the surface of the second roll, whereby the carriage is movable back and forth along a path parallel to the rolls. A mechanism such as a rotating wire wheel disposed on the carriage is used to clean at least one of the first and second rolls as the carriage moves along the path and in between the adjacent rolls. The invention further including means for forcing the carriage away from an adjacent roll toward the one being cleaned so that the elements contacting the surface of the roll being cleaned are forced thereagainst to precisely position the cleaning mechanism relative to the surface. Means are preferably further provided for fine-adjusting the distance of the cleaning mechanism relative to the surface of the roll being cleaned. The preferred apparatus further includes a dust cover disposed over the carriage, and air-inlet and air-output ports formed through the cover to provide a recirculating air path to remove particulates and cool the apparatus.
    • 原位光滑清洁装置包括支撑在第一和第二相邻辊之间的空间内的滑架,滑架具有接触第一辊的表面的第一组元件和与第二辊的表面接触的第二组元件, 由此托架可以沿着平行于辊的路径来回移动。 当托架沿着路径移动并且在相邻的辊之间时,诸如设置在托架上的旋转线轮的机构用于清洁第一和第二辊中的至少一个。 本发明还包括用于迫使托架离开相邻的辊朝向被清洁的辊的装置,使得接触待清洁的辊的表面的元件被迫在其上以相对于表面精确地定位清洁机构。 进一步提供了用于精细调整清洁机构相对于被清洁辊的表面的距离的装置。 优选的装置还包括设置在滑架上的防尘盖,以及通过盖形成的空气入口和空气输出端口,以提供循环空气路径以去除微粒并冷却设备。
    • 10. 发明授权
    • Methods and apparatus to control pressure in a supercritical fluid reactor
    • 控制超临界流体反应器压力的方法和装置
    • US06766810B1
    • 2004-07-27
    • US10078213
    • 2002-02-15
    • Patrick A. Van Cleemput
    • Patrick A. Van Cleemput
    • B08B1300
    • B08B7/0021B01D11/0203B01D11/0403Y10T137/0379Y10T137/8326
    • The present invention pertains to methods and apparatus for controlling the pressure in a supercritical processing system. Active methods for controlling the pressure include anticipating a pressure deviation due to a solute addition to a system, and changing the pressure within the system to compensate for the deviation. In this way, a desired pressure is achieved when the solute is added, without phase separation of the solute from the solvent. Pressure is adjusted by changing the volume of the supercritical processing system. Passive methods include adjusting the pressure of a supercritical system by changing the volume in response to a pressure deviation from a desired pressure. Apparatus for controlling the pressure in a supercritical processing system are described.
    • 本发明涉及用于控制超临界处理系统中的压力的​​方法和装置。 用于控制压力的主动方法包括预测由于系统中的溶质添加引起的压力偏差,以及改变系统内的压力以补偿偏差。 以这种方式,当添加溶质而不使溶质从溶剂中分离时,获得所需的压力。 通过改变超临界处理系统的体积来调节压力。 被动方法包括通过响应于与期望压力的压力偏差来改变体积来调节超临界系统的压力。 描述了用于控制超临界处理系统中的压力的​​装置。