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    • 10. 发明授权
    • Method for manufacturing electronic device
    • 电子设备制造方法
    • US08121394B2
    • 2012-02-21
    • US12050598
    • 2008-03-18
    • Takashi Miyauchi
    • Takashi Miyauchi
    • G06K9/00
    • H05K3/323G02F1/1303G02F1/1309G02F1/13452H01L2224/2929H01L2224/293H01L2224/81903H01L2224/83851H01L2924/00011H05K1/0269H05K2201/0108H05K2201/0382H05K2203/163H01L2224/29075
    • A method for manufacturing an electronic device is provided. The method includes: pressure-bonding a plurality of terminals of an electronic component to a plurality of electrodes formed on a surface of a transparent substrate, respectively, via an anisotropic conductive film to mount the electronic component on the transparent substrate; obtaining an image of the electrodes by imaging the transparent substrate with the electronic component mounted thereon from backside of the transparent substrate; measuring the number of indentations for each said electrode using the image of the electrode, the indentation being formed when the electrode is pressed by a conductive particle in the anisotropic conductive film; calculating an average and a standard deviation of the number of indentations per electrode throughout the transparent substrate; and calculating a probability that the number of indentations per electrode is less than a reference value on basis of the average and the standard deviation.
    • 提供了一种用于制造电子设备的方法。 该方法包括:通过各向异性导电膜将电子部件的多个端子分别压接到形成在透明基板的表面上的多个电极,以将电子部件安装在透明基板上; 通过从透明基板的背面安装有电子部件的透明基板成像来获得电极的图像; 使用电极的图像测量每个所述电极的压痕数量,当电极被各向异性导电膜中的导电颗粒挤压时形成凹陷; 计算每个电极在整个透明基板上的压痕数量的平均值和标准偏差; 并根据平均值和标准偏差计算每个电极的压痕数量小于参考值的概率。