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1. 发明授权

US06323776B1 Method and apparatus of automatically identifying faults in a machine vision measuring system 有权
标题翻译：自动识别机器视觉测量系统故障的方法和装置
公开(公告)号：US06323776B1
公开(公告)日：2001-11-27
申请号：US09468743
申请日：1999-12-21
申请人： David A. Jackson , Hoshang Shroff , Donald J. Christian , Stephen Glickman
发明人： David A. Jackson , Hoshang Shroff , Donald J. Christian , Stephen Glickman
IPC分类号： G08B2100
CPC分类号： G06K9/6211 , G01B11/00 , G01B11/2755 , G01B2210/14 , G01B2210/26 , G01B2210/30 , G05B19/401 , G05B19/4184 , G05B2219/32207 , G05B2219/33327 , G05B2219/37205 , G05B2219/45019 , Y02P90/14
摘要： An apparatus and method for automatically identifying faults in the operation of a machine vision measuring systems provides an improved self-diagnostic capability for machine vision based metrology and tracking systems. The method and apparatus validate performance of tracking operations, and detect deterioration that may be caused by electronic noise, environmental contamination, etc. A mathematical model of the target visualized by the system is created and stored. A target is imaged in the field and fiducials of the target are identified. Centroid positions of detected fiducials of the imaged target are compared to the centroid positions of fiducials in the mathematical model. When a fiducial is obscured or dirty, its geometric characteristics (such as centroid, brightness, edge smoothness, area, or shape) differ from the true or idealized values of the characteristics. Values representing detected fiducials are discarded when the offset exceeds predetermined criteria, or when its properties vary from ideal. If the remaining number of detected fiducials is below a predetermined threshold, a warning message is displayed or an error is generated. Thus, when a fault is detected that degrades performance beyond a preset tolerance, the fault is flagged for attention and a suggested corrective action is displayed.
摘要翻译：用于自动识别机器视觉测量系统的操作中的故障的装置和方法为基于机器视觉的计量和跟踪系统提供了改进的自诊断能力。该方法和装置验证跟踪操作的性能，并且检测可能由电子噪声，环境污染等引起的劣化。创建并存储由系统可视化的目标的数学模型。目标在场中成像，并确定目标的基准。将检测到的成像目标基准点的质心位置与数学模型中基准点的质心位置进行比较。当基准被遮蔽或弄脏时，其几何特征（如质心，亮度，边缘平滑度，面积或形状）与特征的真实或理想值不同。当偏移超过预定标准时，或当其性质与理想变化时，表示检测到的基准的值被丢弃。如果检测到的基准的剩余数量低于预定阈值，则显示警告消息或产生错误。因此，当检测到故障将性能降低到预设容差以下时，将该故障标记为需要注意，并显示建议的纠正措施。

2. 发明授权

US4814969A Control apparatus 失效
标题翻译：控制装置
公开(公告)号：US4814969A
公开(公告)日：1989-03-21
申请号：US222298
申请日：1988-07-22
申请人： Hiroshi Kiyooka
发明人： Hiroshi Kiyooka
IPC分类号： G05B23/02 , B25J9/18 , G05B19/4063 , G05B19/4155 , G06F15/46
CPC分类号： G05B19/4063 , G05B2219/33287 , G05B2219/33304 , G05B2219/33327 , G05B2219/33328 , G05B2219/34427 , G05B2219/41142
摘要： A control apparatus for performing a self test of a robot arm or the like has a solenoid for controlling the movement of the arm, a keyboard for allowing the operator to set operation conditions of the robot, sensors for sensing the operation state of the robot such as temperatures or pressures, and a CPU for controlling the operation of the robot in accordance with detection results of the sensors. The self-test can be performed under different reset conditions to which the robot is assumed to be exposed during actual operation.
摘要翻译：用于执行机器人臂等的自检的控制装置具有用于控制臂的运动的螺线管，用于允许操作者设置机器人的操作条件的键盘，用于感测机器人的操作状态的传感器，作为温度或压力，以及用于根据传感器的检测结果来控制机器人的操作的CPU。可以在不同的复位条件下执行自检，在实际操作期间假设机器人将被暴露于其中。

3. 发明授权

US07337343B2 Arrangement consisting of a program-controlled unit and a power chip connected to it 有权
标题翻译：由程序控制单元和与其连接的电源芯片组成
公开(公告)号：US07337343B2
公开(公告)日：2008-02-26
申请号：US10727101
申请日：2003-12-02
申请人： Jens Barrenscheen , Peter Rohm
发明人： Jens Barrenscheen , Peter Rohm
IPC分类号： G06F1/00 , G05B24/00
CPC分类号： G05B19/0428 , G05B19/058 , G05B2219/25257 , G05B2219/33327
摘要： An arrangement including a program-controlled unit and a power chip, the power chip connected to drive electric loads in accordance with load control data, and the program-controlled unit transmitting the load control data and power chip control data, and the power chip transmitting to the program-controlled unit diagnostic data. The program-controlled unit, by transmitting corresponding control data to the power chip, can input the behavior of the output drivers of the power chip and/or configure protective mechanisms present in the power chip and/or input to the power chip the format of the diagnostic data to be output and/or input to the power chip when it has to output what diagnostic data and/or input to the power chip which load is to be controlled by which load control data section, and/or input to the power chip whether the load control data contains redundant data suitable for detecting transmission errors.
摘要翻译：一种包括程序控制单元和功率芯片的布置，根据负载控制数据连接驱动电力负载的电源芯片，以及发送负载控制数据和电源芯片控制数据的程序控制单元，以及功率芯片发送到程序控制单元的诊断数据。程序控制单元通过将相应的控制数据发送到功率芯片，可以输入功率芯片的输出驱动器的行为和/或配置电源芯片中存在的保护机制和/或输入到电源芯片的格式要输出和/或输入到功率芯片的诊断数据，当它必须输出哪些诊断数据和/或输入到功率芯片的负载将由哪个负载控制数据部分控制和/或输入到功率芯片负载控制数据是否包含适合于检测传输错误的冗余数据。

4. 发明授权

US06438454B1 Robot failure diagnosing system 失效
标题翻译：机器人故障诊断系统
公开(公告)号：US06438454B1
公开(公告)日：2002-08-20
申请号：US09722163
申请日：2000-11-24
申请人： Yoshihiro Kuroki
发明人： Yoshihiro Kuroki
IPC分类号： G06F1900
CPC分类号： B25J13/003 , G05B2219/33327 , G05B2219/35453 , G10L13/00
摘要： A robot failure diagnosing system in which sound input by the user is interpreted/recognized by a command recognizing section in order to notify a request for a diagnosis to a self-diagnosis section. For example, the user can input a command which prompts a self-diagnosis operation in the form of a natural communication, such as by saying, “Perform a self-diagnosis operation,” and by asking, “How do you feel, robot?” With respect to this, the robot can indicate the self-diagnosis result in the form of a natural conversation, such as by saying, “I'm not feeling well,” “My leg hurts,” and “I'm hungry.” The robot failure diagnosing system performs a self-diagnosis of a failure or abnormality in a system, and feeds back the diagnosis result to the user.
摘要翻译：一种机器人故障诊断系统，其中由用户输入的声音由命令识别部分解释/识别，以向自诊断部分通知诊断请求。例如，用户可以输入以自然通信的形式提示自诊断操作的命令，例如通过说“执行自诊断操作”，并通过询问“你感觉如何，机器人？ “ 相对于此，机器人可以以自然对话的形式表示自我诊断结果，例如说“我感觉不舒服”，“我的腿疼”，“我饿了”。机器人故障诊断系统对系统中的故障或异常进行自我诊断，并将诊断结果反馈给用户。

5. 发明授权

US5194789A Automatic mirror repositioning system diagnostics 失效
标题翻译：自动镜面重新定位系统诊断
公开(公告)号：US5194789A
公开(公告)日：1993-03-16
申请号：US739534
申请日：1991-08-02
申请人： John A. Barrs
发明人： John A. Barrs
IPC分类号： B60R1/07 , G05B19/4062
CPC分类号： B60R1/07 , G05B19/4062 , G05B2219/33327 , G05B2219/42329 , G05B2219/45185 , Y10S388/909
摘要： A memory mirror system having a mirror 19, two constant speed motors 16,18 each controlling an axis of mirror movement, position feedback signals 26,28 from each motor, switch inputs 12, a diagnostic push button 40, and an electronic controller 10, is provided with a diagnostic procedure after a self-test push button 40 has been depressed by automatically driving the mirror to the center of movement when manual movement is not requested, thereby allowing system level failures, such as position feedback sensor failures, to be detected quickly by visual inspection of mirror movement as the mirror attemps to return to the origin, without altering existing memory settings or disconnecting the controller 10 from the system. When manual movement is not requested for a predetermined period of time, the diagnostic procedure is prevented from running.
摘要翻译：具有镜子19的记忆镜系统，每个控制镜子运动轴的两个恒速电动机16,18，来自每个电动机的位置反馈信号26,28，开关输入12，诊断按钮40和电子控制器10，在没有请求手动移动时通过自动将镜子移动到移动中心而在自检按钮40被按下之后被提供诊断过程，从而允许检测诸如位置反馈传感器故障的系统级故障通过镜像运动的目视检查，快速地通过镜像运动来重新回到原点，而不改变现有的存储器设置或者断开控制器10与系统的连接。当在预定时间段内没有请求手动移动时，防止诊断过程运行。

6. 发明申请

US20170090436A1 NUMERICAL CONTROL SYSTEM 审中-公开
公开(公告)号：US20170090436A1
公开(公告)日：2017-03-30
申请号：US15277310
申请日：2016-09-27
申请人： FANUC CORPORATION
发明人： Hiroshige Ando
IPC分类号： G05B13/04 , G06F17/50 , G05B23/02
CPC分类号： G05B13/041 , G05B19/4063 , G05B23/0243 , G05B2219/31359 , G05B2219/33327 , G05B2219/35502 , G05B2219/50129 , G06F17/50
摘要： A numerical control system includes a computer aided design (CAD) data storage means for storing CAD data, an input/output (I/O) assignment data storage means for storing I/O assignment data, and a relevant information storage means for recording relevant information between the I/O assignment data and mounting information included in CAD data of each of the I/O units, and displays a defect occurrence region on a shape image of a control panel.

7. 发明申请

US20040217385A1 Arrangement consisting of a program-controlled unit and a power chip connected to it 有权
标题翻译：由程序控制单元和与其连接的电源芯片组成
公开(公告)号：US20040217385A1
公开(公告)日：2004-11-04
申请号：US10727101
申请日：2003-12-02
申请人： Infineon Technologies AG
发明人： Jens Barrenscheen , Peter Rohm
IPC分类号： H01L027/10
CPC分类号： G05B19/0428 , G05B19/058 , G05B2219/25257 , G05B2219/33327
摘要： An arrangement including a program-controlled unit and a power chip, the power chip connected to drive electric loads in accordance with load control data, and the program-controlled unit transmitting the load control data and power chip control data, and the power chip transmitting to the program-controlled unit diagnostic data. The aprogram-controlled unit, by transmitting corresponding control data to the power chip, can input the behavior of the output drivers of the power chip and/or configure protective mechanisms present in the power chip and/or input to the power chip the format of the diagnostic data to be output and/or input to the power chip when it has to output what diagnostic data and/or input to the power chip which load is to be controlledby which load control data section, and/or input to the power chip whether the load control data contains redundant data suitable for detecting transmission errors.
摘要翻译：一种包括程序控制单元和功率芯片的布置，根据负载控制数据连接驱动电力负载的电源芯片，以及发送负载控制数据和电源芯片控制数据的程序控制单元，以及功率芯片发送到程序控制单元的诊断数据。控制单元通过将相应的控制数据发送到功率芯片，可以输入功率芯片的输出驱动器的行为和/或配置电源芯片中存在的保护机制和/或输入到电源芯片的格式要输出和/或输入到功率芯片的诊断数据，当它必须输出哪些诊断数据和/或输入到功率芯片的负载将由哪个负载控制数据部分控制和/或输入到功率芯片负载控制数据是否包含适合于检测传输错误的冗余数据。

8. 发明授权

US5274546A Diagnosis system of numerical control apparatus 失效
标题翻译：数控设备诊断系统
公开(公告)号：US5274546A
公开(公告)日：1993-12-28
申请号：US924577
申请日：1992-08-05
申请人： Jiro Kinoshita
发明人： Jiro Kinoshita
IPC分类号： G05B19/4063 , G05B19/405 , G06F11/22
CPC分类号： G05B19/4063 , G05B2219/33287 , G05B2219/33288 , G05B2219/33327
摘要： Disclosed is a diagnosis system of a numerical control system (CNC) for monitoring an internal state of the CNC, wherein a processor (11) of the CNC acts as a host processor, and a diagnostic processor (1) monitors the processor (11) for the CNC or other processors (18a, 24) in a usual CNC operation mode, and the diagnostic processor (1) executes software for diagnosing the processor (11) for the CNC and the other processors (18a, 24), as the host processor, to detect a cause of malfunction of the CNC, whereby the time required for a normal operation is shortened, when a malfunction occurs, and the operational reliability is thus improved.
摘要翻译： PCT No.PCT / JP89 / 00855 Sec。 371日期1990年04月18日 102（e）1990年4月18日PCT PCT 1989年8月22日提交PCT。出版物WO90 / 02981 日期为1990年3月22日。公开是用于监控CNC内部状态的数控系统（CNC）的诊断系统，其中CNC的处理器（11）用作主处理器，诊断处理器（1））在通常的CNC操作模式下监视用于CNC或其他处理器（18a，24）的处理器（11），并且诊断处理器（1）执行用于诊断CNC和其他处理器（18a）的处理器（11）的软件，24）作为主处理器，以检测CNC的故障原因，由此在发生故障时缩短正常操作所需的时间，从而提高了操作可靠性。

9. 发明申请

US20070129913A1 Supply apparatus and receiving apparatus 审中-公开
标题翻译：供应装置和接收装置
公开(公告)号：US20070129913A1
公开(公告)日：2007-06-07
申请号：US11540601
申请日：2006-10-02
申请人： Hideaki Yamamoto , Shinichi Aono , Susumu Oka , Koji Tsukawaki , Hideki Baba , Takashi Sasaki , Nobuyoshi Kobayashi , Yoichi Sugitomo
发明人： Hideaki Yamamoto , Shinichi Aono , Susumu Oka , Koji Tsukawaki , Hideki Baba , Takashi Sasaki , Nobuyoshi Kobayashi , Yoichi Sugitomo
IPC分类号： G21C17/00
CPC分类号： G05B19/4063 , G05B2219/33327 , G05B2219/34427 , G05B2219/45029 , Y02P90/86
摘要： The present invention provides a supply apparatus and a receiving apparatus for enabling a user of a production apparatus such as a component mounter, to visually comprehend accurate support information provided from a manufacturer in accordance with the life cycle of the production apparatus, and realize more appropriate production apparatus maintenance. In the support information received by the receiving apparatus, the period after the purchase of the component mounter is displayed in the life cycle, and a list of equipment productivity-related items as well as diagnosis-related items is displayed as support items which are predicted for such life cycle. Moreover, as equipment productivity-related items, optimal support information for each year of use of the component mounter are indicated such as: “training” for training the component mounter user; “warranted inspection” for inspection within the warranty period; “maintenance inspection” for inspection under a contract, and “nozzle unit recycling” corresponding to the timing for recycling of the nozzle unit.
摘要翻译：本发明提供了一种供给装置和接收装置，用于使得诸如组件安装机的生产设备的用户能够根据生产设备的生命周期直观地理解从制造商提供的准确的支持信息，并且实现更合适的生产设备维修。在由接收装置接收到的支持信息中，在生命周期中显示购买组件安装机之后的周期，并且显示设备生产力相关项目以及诊断相关项目的列表作为预测的支持项目在这样的生命周期。此外，作为设备生产力相关项目，指示组件安装机每年使用的最佳支持信息，例如：用于训练组件安装者用户的“培训”; “保证检验”在保修期内进行检查; 根据合同进行检查的“维护检查”和对应于喷嘴单元的再循环的定时的“喷嘴单元回收”。

10. 发明授权

US07047095B2 Process control system and process control method 有权
标题翻译：过程控制系统和过程控制方法
公开(公告)号：US07047095B2
公开(公告)日：2006-05-16
申请号：US10727544
申请日：2003-12-05
申请人： Masayuki Tomoyasu
发明人： Masayuki Tomoyasu
IPC分类号： G06F19/00
CPC分类号： G05B19/41875 , G05B2219/33327 , G05B2219/37575 , G05B2219/37576 , G05B2219/45031 , Y02P90/22
摘要： A process control system that controls processing executed on semiconductor wafers by processing apparatuses 120, 122, 124 installed in each bay (area) 110 inside a factory the processing results of which are predictable, having installed in the corresponding bay, at least one measuring apparatus 130 that executes a measuring operation on workpieces undergoing the processing in the bay, a transfer path 140 of a transfer apparatus, through which the workpieces are transferred among various apparatuses installed within the bay including the individual processing apparatuses and the measuring apparatus and a process control device 150 that controls the processing apparatuses, the measuring apparatus and the transfer apparatus in the bay. This structure reduces the length of time (cycle time) to elapse from the processing through the inspection operation and also improves the operating rate of each processing apparatus.
摘要翻译：一种过程控制系统，其通过安装在工厂内的每个托架（区域）110中的处理装置120,122,124来控制在半导体晶片上执行的处理，其处理结果可预测地安装在相应的间隔中，至少一个测量装置 130，其执行在间隔中进行处理的工件上的测量操作，传送装置的传送路径140，工件在安装在包括各个处理设备和测量设备的托架内的各种设备中被传送到其中，并且处理控制设备150，其控制在间隔中的处理设备，测量设备和传送设备。该结构减少了从通过检查操作的处理中经过的时间长度（循环时间），并且还提高了每个处理装置的操作速率。

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