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1. 发明授权

US09404958B2 Dielectric strength voltage testing method for electronics device 有权
标题翻译：电子器件绝缘强度电压测试方法
公开(公告)号：US09404958B2
公开(公告)日：2016-08-02
申请号：US13766241
申请日：2013-02-13
申请人： CANON KABUSHIKI KAISHA
发明人： Tetsuya Nozaki
IPC分类号： G01R31/18 , G01R31/02 , G06F1/26 , G01R31/12
CPC分类号： G01R31/18 , G01R31/028 , G01R31/129 , G06F1/26
摘要： A first X capacitor is connected between one of a plurality of hot line sections of a hot line that is located at an output side of a first relay as viewed from a commercial alternating-current power supply, and one of a plurality of neutral line sections of a neutral line that is located at an input side of a second relay as viewed from the commercial alternating-current power supply. A second X capacitor is connected between one of the hot line sections that is located at the output side of the first relay as viewed from the commercial alternating-current power supply, and one of the neutral line sections that is located at an output side of the second relay as viewed from the commercial alternating-current power supply.
摘要翻译：第一X电容器连接在从商用交流电源观察的位于第一继电器的输出侧的热线的多个热线部分之一和多个中性线部分中的一个之间位于从商用交流电源观察的第二继电器的输入侧的中性线。第二X电容器连接在从商用交流电源观察时位于第一继电器的输出侧的一个热线部分和位于输出侧的一个中性线部分从商业交流电源观察的第二继电器。

2. 发明申请

US20080145995A1 Methods for Forming Process Test Capacitors for Testing Embedded Passives During Embedment into a Printed Wiring Board 失效
标题翻译：嵌入到印刷电路板中的嵌入式无源元件测试过程测试电容器的方法
公开(公告)号：US20080145995A1
公开(公告)日：2008-06-19
申请号：US11612089
申请日：2006-12-18
申请人： William J. Borland , Saul Ferguson , Diptarka Majumdar , Daniel I. Amey
发明人： William J. Borland , Saul Ferguson , Diptarka Majumdar , Daniel I. Amey
IPC分类号： H01L21/20
CPC分类号： G01R31/18 , H05K1/0268 , H05K1/162 , H05K3/1291 , H05K2201/0355 , H05K2203/1126 , H05K2203/1476 , Y10T29/417 , Y10T29/4913
摘要： Making process test capacitors simultaneously with circuit capacitors that are to be embedded into a printed wiring board and firing the test capacitors to result in fired-on-foil test capacitors for the purpose of using the test capacitors as test substitutes for the embedded circuit capacitors to predict whether capacitance, dissipation factor or insulation resistance of the circuit capacitors will fall within acceptable specified ranges prior to and after embedment.
摘要翻译：将待测电容器与要嵌入印刷电路板的电路电容器同时烧制，并对测试电容器进行烧结，以产生烧结箔测试电容器，以将测试电容器用作嵌入式电路电容器的替代品预测电路电容器的电容，耗散因数或绝缘电阻在嵌入之前和之后是否落在可接受的规定范围内。

3. 发明申请

US20040082083A1 Process parameter event monitoring system and method for process 失效
标题翻译：过程参数事件监控系统及过程方法
公开(公告)号：US20040082083A1
公开(公告)日：2004-04-29
申请号：US10282771
申请日：2002-10-28
发明人： Vladimir Kraz , Kirk Alan Martin
IPC分类号： H01L021/66 , G01R031/26
CPC分类号： H01L21/67253 , G01R31/18 , H05K13/0413 , H05K13/082
摘要： A system and method for measuring process parameters in a process machine is described. The system is synchronized to the operation of the process machine so that spurious process parameters events are filtered out.
摘要翻译：描述了用于测量过程机器中的过程参数的系统和方法。该系统与过程机器的操作同步，以便过滤出杂散过程参数事件。

4. 发明授权

US4399401A Method for destructive testing of dielectric ceramic capacitors 失效
标题翻译：介质陶瓷电容器的破坏性测试方法
公开(公告)号：US4399401A
公开(公告)日：1983-08-16
申请号：US296452
申请日：1981-08-26
申请人： Solomon Levinson , William Reilly
发明人： Solomon Levinson , William Reilly
IPC分类号： G01R31/01 , G01R31/18 , G01R31/02
CPC分类号： G01R31/028 , G01R31/18
摘要： This invention covers a destructive testing procedure in which a voltage 2.5 times the rated voltage is applied to the capacitor, at a relatively high current. The resistance in series with capacitors being tested is reduced step-by-step until the resistance value is reached such that the percentage of capacitor failures on any given sample of capacitors remains constant. Thereafter, all similar capacitors are tested at that resistance value and at 2.5 times the rated voltage. Those which do not explode exhibit remarkable reliability.
摘要翻译：本发明涉及一种破坏性测试程序，其中以相对较高的电流将2.5倍额定电压的电压施加到电容器。与要测试的电容器串联的电阻逐步降低，直到达到电阻值，使得任何给定电容样本上的电容器故障百分比保持不变。此后，以该电阻值和额定电压的2.5倍测试所有类似的电容器。不爆炸的可靠性显着。

5. 发明授权

US4184112A Capacitor testing apparatus 失效
标题翻译：电容器测试仪器
公开(公告)号：US4184112A
公开(公告)日：1980-01-15
申请号：US883142
申请日：1978-03-03
申请人： Elbert W. Cox
发明人： Elbert W. Cox
IPC分类号： G01R27/26 , G01R31/01 , G01R31/18
CPC分类号： G01R31/028 , G01R27/2605 , G01R31/18
摘要： Capacitor testing apparatus comprises a plurality of individual coils of differing numbers of turns forming a toroid peritting use of a conventional tong-type alternating current ammeter to measure the alternating current flowing through a selected coil and the capacitor under test. The toroid is supported on and external to a box which contains the coil terminals and is made in a variety of shapes and sizes as the need demands. Mounted within the box is a switch associated wth each of the coils providing a plurality of electrical circuits between an alternating current power source and capacitor test leads to which the capacitor under test is connected. The capacity value of the capacitor is determined by energizing the capacitor through one of the circuits, noting the ammeter reading in amperes and multiplying the reading by the multiplier designating the selected coil's switch.
摘要翻译：电容器测试装置包括多个不同匝数的单独的线圈，其形成环形线圈，以使用传统的钳型交流电流表来测量流经选定线圈的交流电流和被测电容器。环形线圈支撑在包含线圈端子的盒子的外部并且外部，并根据需要制成各种形状和尺寸。安装在盒子内的是开关，每个线圈提供在交流电源和被测电容器连接的电容器测试引线之间的多个电路。电容器的容量值通过使电容器通过其中一个电路来确定，注意电流表读数以安培为单位，并将读数乘以指定所选线圈的开关的倍增器。

6. 发明授权

US3165674A Electrical testing apparatus 失效
标题翻译：电气测试仪器
公开(公告)号：US3165674A
公开(公告)日：1965-01-12
申请号：US21588662
申请日：1962-08-09
申请人： PREC METAL PRODUCTS CO INC
发明人： SWAN DEAN R
IPC分类号： G01R31/18
CPC分类号： G01R31/18

7. 发明授权

US3024906A Automatic digital sorting system 失效
标题翻译：自动数字分拣系统
公开(公告)号：US3024906A
公开(公告)日：1962-03-13
申请号：US84430459
申请日：1959-10-05
申请人： GEN DYNAMICS CORP
发明人： JAENSCH KLAUS H
IPC分类号： B07C5/344 , G01R27/26 , G01R31/18 , G07C3/00 , G07C3/04
CPC分类号： G07C3/005 , B07C5/344 , G01R27/2605 , G01R31/18 , G07C3/045 , Y10S209/933

8. 发明授权

US09983228B2 Triaxial DC-AC connection system 有权
公开(公告)号：US09983228B2
公开(公告)日：2018-05-29
申请号：US14846121
申请日：2015-09-04
申请人： Keithley Instruments, LLC
发明人： Wayne C. Goeke , Gregory Sobolewski
IPC分类号： G01R1/067 , G01R31/00 , G01R1/04 , G01R31/28 , G01R27/28 , G01R31/24 , G01R31/06 , G01R31/18 , G01R31/26
CPC分类号： G01R1/0416 , G01R27/28 , G01R31/06 , G01R31/18 , G01R31/24 , G01R31/2607 , G01R31/2822 , G01R31/2889
摘要： Embodiments of the present invention provide an improved two-cable connection system for connecting electrical test instrumentation to a device under test (DUT). In one embodiment, a single pair of equal-length triaxial cables each has a desired characteristic impedance. Each cable has a center connecter, intermediate conductor, and outer conductor. The proximal end of each cable is connected to the test instrumentation, and the distal ends are located at the DUT. At the distal end, the center conductors are connected to the DUT, the intermediate conductors are allowed to float, and the outer conductors are connected to each other. The proximal end of each cable is connected to the device using an appropriate connection for the test that will be performed. This allows the test instrumentation to perform different types of tests without changing connections to the DUT.

9. 发明授权

US09134365B2 System for testing semiconductor modules 有权
标题翻译：半导体模块测试系统
公开(公告)号：US09134365B2
公开(公告)日：2015-09-15
申请号：US14024364
申请日：2013-09-11
申请人： Samsung Electronics Co., Ltd.
发明人： Min-Woo Kim , Bae-Ki Lee , Young-Soo Lee , Hyung-Yun Lee
IPC分类号： B07C5/08 , G01R31/28 , G01R31/26 , G01R31/18
CPC分类号： G01R31/2868 , G01R31/18 , G01R31/26 , G01R31/2601 , G01R31/2806 , G01R31/2893
摘要： A system for testing semiconductor modules may include a first testing unit, a second testing unit, a classifying unit and a transferring unit. The first testing unit may test functions of the semiconductor modules mounted on a main board. The second testing unit may test the semiconductor modules tested by the first testing unit using a terminal. The classifying unit may classify the semiconductor modules tested by the second testing unit into normal semiconductor modules and abnormal semiconductor modules, or pass/fail. The transferring unit may be connected in-line between the first testing unit and the second testing unit, and between the second testing unit and the classifying unit to transfer the semiconductor modules from the first testing unit to the second testing unit and the classifying unit. Thus, the semiconductor modules may be automatically transferred to the units, so that a test time may be reduced.
摘要翻译：用于测试半导体模块的系统可以包括第一测试单元，第二测试单元，分类单元和传送单元。第一测试单元可以测试安装在主板上的半导体模块的功能。第二测试单元可以使用终端来测试由第一测试单元测试的半导体模块。分类单元可以将由第二测试单元测试的半导体模块分类为正常半导体模块和异常半导体模块，或者通过/失败。传送单元可以在第一测试单元和第二测试单元之间以及第二测试单元与分类单元之间的串联连接，以将半导体模块从第一测试单元传送到第二测试单元和分类单元。因此，可以将半导体模块自动转移到单元，从而可以减少测试时间。

10. 发明申请

US20150118525A1 METHODS AND DEVICES FOR BATTERY PROTECTION 有权
标题翻译：用于电池保护的方法和装置
公开(公告)号：US20150118525A1
公开(公告)日：2015-04-30
申请号：US14327632
申请日：2014-07-10
申请人： Xiaomi Inc.
发明人： Zhongxiang Zheng , Jianjun Zhang , Jinchao Li
IPC分类号： H01M10/42 , G05B9/02
CPC分类号： H01M10/425 , G01R31/18 , G05B9/02 , H01M10/48 , H01M2010/4271
摘要： An electronic apparatus is provided. The electronic apparatus includes: a battery; at least one pressure sensor provided on a surface of the battery; and a controller electrically connected with the at least one pressure sensor. The at least one pressure sensor samples a pressure parameter on the surface of the battery. The controller acquires the pressure parameter, detects a magnitude relation between the pressure parameter and a predefined threshold value, and generates a control instruction for protecting the battery based on the detected magnitude relation.
摘要翻译：提供电子设备。电子设备包括：电池; 设置在所述电池的表面上的至少一个压力传感器; 以及与所述至少一个压力传感器电连接的控制器。至少一个压力传感器对电池表面上的压力参数进行采样。控制器获取压力参数，检测压力参数与预定阈值之间的大小关系，并根据检测到的大小关系产生用于保护电池的控制指令。

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