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    • 3. 发明申请
    • ANALOG SPECTRUM ANALYZER
    • 模拟光谱分析仪
    • US20160305994A1
    • 2016-10-20
    • US15101359
    • 2014-12-04
    • THALESCENTRE NATIONAL DE LA RECHERCHE SCIENTIFIQUE
    • Julien KERMORVANTPaolo BORTOLOTTIBruno MARCILHACJean-Claude MAGEVincent CROS
    • G01R23/163
    • G01R23/163G01R23/165
    • A spectrum analyzer for a signal IRF comprising a plurality of frequencies fi comprises N entities each made up of a structure formed by a stack of magnetic and non-magnetic layers having in at least one of the magnetic layers a magnetic configuration in the shape of a vortex, the excitation modes of the magnetic configuration being suitable for detecting the frequencies contained in an incident signal in real time, each entity having a first lower electrode and a second upper electrode, a voltage-measuring device suitable for measuring an electric voltage showing the presence of a frequency fk in the analyzed signal IRF, the device being connected to the lower electrode and to the upper electrode, a measurement-processing device suitable for determining the value of the frequencies fk in the signal IRF, and a line carrying the signal to be analyzed to each of the entities.
    • 用于包括多个频率fi的信号IRF的频谱分析仪包括N个实体,每个实体由由磁性层和非磁性层的堆叠形成的结构构成,所述结构在至少一个磁性层中具有形状为 涡旋,磁性配置的激励模式适合于实时检测入射信号中包含的频率,每个实体具有第一下部电极和第二上部电极,适用于测量表示该电压的电压的电压测量装置 在分析的信号IRF中存在频率fk,该装置连接到下电极和上电极,适合于确定信号IRF中的频率fk的值的测量处理装置和承载信号的线 对每个实体进行分析。
    • 5. 发明申请
    • Minimal Reconfiguration Spectrum Stitching with Overlapped Bands
    • 带重叠带的最小重构频谱拼接
    • US20120269252A1
    • 2012-10-25
    • US13331017
    • 2011-12-20
    • Benjamin A. WARD
    • Benjamin A. WARD
    • H04B17/00
    • G01R23/163G06K15/00G06K17/00H04B17/00
    • Embodiments of this invention include a test and measurement instrument and associated methods for acquiring and stitching wide overlapped non-uniform frequency bands so that a user specified band can be efficiently displayed and analyzed. The test and measurement instrument includes a user interface to receive the user specified frequency span. Acquisition circuitry acquires one or more predefined frequency bands having non-uniform overlapping frequency ranges. A frequency band processing section can decimate the acquired frequency bands, mask the acquired frequency bands, and stitch the masked frequency bands together. A display section displays the user specified frequency span using the stitched frequency bands. Due to the overlap configuration of the wide non-uniform bands, any user specified span between 50 kHz and 6 GHz, or thereabout, can be covered by two bands.
    • 本发明的实施例包括测试和测量仪器以及用于获取和拼接宽重叠的非均匀频带的相关方法,从而可以有效地显示和分析用户指定的频带。 测试和测量仪器包括用于接收用户指定频率跨度的用户界面。 采集电路获取具有不均匀重叠频率范围的一个或多个预定频带。 频带处理部分可以抽取获取的频带,掩蔽获取的频带,并将屏蔽的频带编织在一起。 显示部分使用缝合的频带显示用户指定的频率跨度。 由于宽非均匀频带的重叠配置,任何用户指定的距离范围在50 kHz到6 GHz之间,或者在其上可以被两个频带覆盖。