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1. 发明授权

US11693029B2 Methods and assemblies for tuning electronic modules 有权
公开(公告)号：US11693029B2
公开(公告)日：2023-07-04
申请号：US17378349
申请日：2021-07-16
申请人： NXP USA, Inc.
发明人： Joshua Bennett English , Lu Wang
IPC分类号： G01R1/04 , G01R1/067 , G01R1/073 , G01R31/28
CPC分类号： G01R1/07335 , G01R31/2808 , G01R1/06766
摘要： Evaluation board (EVB) assemblies or stacks utilized in tuning electronic modules are disclosed, as are methods for tuning such modules. In embodiments, the module testing assembly includes an EVB and an EVB baseplate. The EVB includes, in turn, an EVB through-port extending from a first EVB side to a second, opposing EVB side; and a module mount region on the first EVB side and extending about a periphery of the EVB through-port. The module mount region is shaped and sized to accommodate installation of a sample electronic module provided in a partially-completed, pre-encapsulated state fabricated in accordance with a separate thermal path electronic module design. A baseplate through-port combines with the EVB through-port to form a tuning access tunnel providing physical access to circuit components of the sample electronic module through the EVB baseplate from the second EVB side when the sample electronic module is installed on the module mount region.

2. 发明申请

US20090153146A1 APPARATUS FOR INSPECTING CIRCUIT BOARD AND METHOD OF INSPECTING CIRCUIT BOARD 审中-公开
标题翻译：检查电路板的装置和检查电路板的方法
公开(公告)号：US20090153146A1
公开(公告)日：2009-06-18
申请号：US12349132
申请日：2009-01-06
申请人： Kiyoshi Kimura , Sugiro Shimoda , Satoshi Suzuki , Fujio Hara
发明人： Kiyoshi Kimura , Sugiro Shimoda , Satoshi Suzuki , Fujio Hara
IPC分类号： G01R31/02
CPC分类号： G01R1/07335
摘要： An apparatus and method for inspecting a circuit board is described which can well absorb a variation in a height of an electrode to be inspected and can maintain an insulating property between adjacent inspection electrodes even if the electrode to be inspected is arranged at a fine pitch.
摘要翻译：描述了一种用于检查电路板的装置和方法，其可以很好地吸收待检查电极的高度变化，并且即使被检查的电极以细间距布置，也可以保持相邻检查电极之间的绝缘性。

3. 发明申请

US20060097738A1 UNIVERSAL TEST FIXTURE 失效
标题翻译：通用测试仪器
公开(公告)号：US20060097738A1
公开(公告)日：2006-05-11
申请号：US10975140
申请日：2004-10-28
申请人： Charles Hoke , Ken Nishimura
发明人： Charles Hoke , Ken Nishimura
IPC分类号： G01R31/02
CPC分类号： G01R1/07385 , G01R1/07328 , G01R1/07335
摘要： A universal fixture for testing a device, such as a bare printed circuit board, includes a plurality of addressable contact points. Each of the contact points includes a switch connected to a conductor capable of creating an electrical connection to the device. To obtain a measurement of a target on the device, two of the contact points on the universal fixture are selected based on the position of the target on the device relative to the contact points.
摘要翻译：用于测试诸如裸印刷电路板的设备的通用夹具包括多个可寻址的接触点。每个接触点包括连接到能够产生与设备的电连接的导体的开关。为了获得设备上的目标的测量，通用夹具上的两个接触点是根据目标在设备上相对于接触点的位置来选择的。

4. 发明授权

US06677773B2 Testing device for printed circuit boards 失效
标题翻译：印刷电路板测试装置
公开(公告)号：US06677773B2
公开(公告)日：2004-01-13
申请号：US10245905
申请日：2002-09-17
申请人： Manfred Prokopp
发明人： Manfred Prokopp
IPC分类号： G01R1073
CPC分类号： G01R1/07335 , G01R31/2806 , G01R31/2808
摘要： A circuit board tester includes a contact array, contact fingers arranged for travelling in a plane parallel to the contact array, two contact fingers forming a probe pair as a component of a test current circuit, a controller for positioning the contact fingers on circuit board test points of a circuit board to be tested, the circuit boards being insertable into the tester simultaneously during a test procedure being tested, and two sets of contact fingers, one set being arranged for testing the front side and the other set for testing the rear side of a circuit board to be tested. Arranged between the two sets of contact fingers is a holder comprising portions for accommodating at least two circuit b to be tested, at least one of the circuit boards to be tested being insertable in the holder with its front side, and the other circuit board to be tested with its rear side, facing one of the two sets of contact fingers, and the controller is configured such that with both sets of contact fingers the circuit board test points on both the front and rear side of the circuit board to be tested can be contacted during a test procedure.
摘要翻译：电路板测试器包括接触阵列，布置成在与接触阵列平行的平面中行进的接触指状物，两个接触指形成探针对作为测试电流电路的组件，用于将接触指针定位在电路板测试上的控制器要测试的电路板的点，电路板可以在被测试的测试过程中同时插入测试仪中，并且两组接触指，一组被设置用于测试前侧，另一组用于测试后侧的电路板进行测试。在两组接触指状物之间布置有保持器，其包括用于容纳至少两个待测试电路b的部分，待测试的电路板中的至少一个可插入到保持器中，其前侧，而另一个电路板在其背面进行测试，面向两组接触指针中的一组，并且控制器被配置为使得通过两组接触指，要测试的电路板的前侧和后侧上的电路板测试点可以在测试过程中联系。

5. 发明申请

US20030016039A1 Wireless test fixture for printed circuit board test systems 失效
公开(公告)号：US20030016039A1
公开(公告)日：2003-01-23
申请号：US09908355
申请日：2001-07-18
发明人： Michael C. Williams , Robert A. Slutz
IPC分类号： G01R031/02
CPC分类号： G01R1/07328 , G01R1/07335
摘要： A wireless test fixture is disclosed for connecting printed circuit boards or other electrical interconnect devices having electronic components to a test system. Rigid support beams and insulating spacers are used to reduce the structural loads on the electrical interconnect plane and to minimize probe mounting plate deflections in the wireless test fixture. The test system electrical interface is via a series of floating transfer pins. The floating transfer pins provide electrical signal paths between test system interface probes and the electrical interconnect plane that interfaces with double-end sockets coupled to a probe for making electrical contact with the DUT. One or more fixed double-ended sockets and spring probes are used to make electrical contact with the DUT.

6. 发明授权

US5889407A Press assembly for electrically testing a printed circuit board having an exchangeable lower adapter 失效
标题翻译：用于电测试具有可更换的下适配器的印刷电路板的压力组件
公开(公告)号：US5889407A
公开(公告)日：1999-03-30
申请号：US768125
申请日：1996-12-17
申请人： Fernando Nucci
发明人： Fernando Nucci
IPC分类号： G01R1/073 , G01R31/28 , G01R1/06
CPC分类号： G01R31/2806 , G01R1/07314 , G01R1/07335
摘要： A press assembly for electrically testing at least one side of a printed circuit board has an upper part and a lower part, a constant gauge grid with spring contacts, an exchangeable lower adapter having a plurality of needles, each of which is engageable with a corresponding one of the spring contacts of the constant gauge grid. The circuit board to be tested is supportable on the lower adapter and a lower insulating sheet is disposed between the adapter and the grid. The insulating sheet is provided with a plurality of holes for the passage of the plurality of needles, and has a thickness which is coordinated to the height of the lower adapter and the length of the plurality of needles.
摘要翻译：用于电测试印刷电路板的至少一侧的压制组件具有上部和下部，具有弹簧触点的恒定规格网格，具有多个针的可更换下部适配器，每个针可与相应的恒定量规网格的弹簧触点之一。要测试的电路板可以在下部适配器上支撑，并且下部绝缘片设置在适配器和电网之间。绝缘片设置有多个用于多个针通过的孔，并且具有与下适配器的高度和多个针的长度相配合的厚度。

7. 发明授权

US5543726A Open frame gantry probing system 失效
标题翻译：开式龙门探测系统
公开(公告)号：US5543726A
公开(公告)日：1996-08-06
申请号：US176810
申请日：1994-01-03
申请人： James E. Boyette, Jr. , Jiann-Chang Lo , Michael Servedio
发明人： James E. Boyette, Jr. , Jiann-Chang Lo , Michael Servedio
IPC分类号： G01R31/28 , G01R1/06 , G01R1/073 , G01R31/02
CPC分类号： G01R1/07335
摘要： A system for probing both sides of a high density printed circuit board includes an open frame extending around the circuit board when it is held in a test position by a circuit board carrier. The frame includes two parallel rail structures extending above, and at opposite ends of, the circuit board in the test position. The frame also includes another two parallel rail structures extending below, and at opposite ends of, the circuit board. The upper and lower rail structures extend perpendicularly to one another, and are fastened together at the corners of the frame by means of compression bolt assemblies. Two gantry structures are moved in a first direction between the upper rail structures, while two other gantry structures are moved in a direction perpendicular to the first direction between the lower rail structures. A carriage moves along each gantry structure, and a probe is mounted on each carriage to be moved toward and away from the adjacent surface of the circuit board. The circuit board is moved by a board carrier between a position, outside the frame, in which it is loaded and unloaded, and the test position.
摘要翻译：用于探测高密度印刷电路板的两侧的系统包括当通过电路板载体保持在测试位置时围绕电路板延伸的开放框架。该框架包括在测试位置的电路板的上方和相对两端延伸的两个平行的轨道结构。框架还包括在电路板的下方和相对端延伸的另外两个平行的轨道结构。上下轨道结构彼此垂直延伸，并通过压缩螺栓组件在框架的角部处紧固在一起。两个龙门结构在上轨道结构之间沿第一方向移动，而两个其他机架结构在垂直于下轨道结构之间的第一方向的方向上移动。托架沿着每个机架结构移动，并且探针安装在每个托架上以朝向和远离电路板的相邻表面移动。电路板由板载体在框架外部位于其装载和卸载位置之间的位置和测试位置之间移动。

8. 发明授权

US5068600A Testing device for both-sided two-stage contacting of equipped printed circuit boards 失效
标题翻译：装备印刷电路板双面接触的测试装置
公开(公告)号：US5068600A
公开(公告)日：1991-11-26
申请号：US528340
申请日：1990-05-23
申请人： Wolfgang Hilz , Rudolf Schuster , Hans Schauflinger
发明人： Wolfgang Hilz , Rudolf Schuster , Hans Schauflinger
IPC分类号： G01R1/073
CPC分类号： G01R1/07335
摘要： A testing device for both-sided two-stage contacting of equipped printed circuit boards. A lower needle adaptor has first and second resilient or spring-seated contact needles of different lengths and an upper needle adaptor has third and fourth resilient or spring-seated contact needles also differing in length, which are provided for both-sided, two-stage contacting of component equipped printed circuit boards. In all stages of the contacting, the printed circuit boards are firmly clamped between lower and upper pressure rams arranged test-specimen-associated. The testing device provides a high contacting reliability.
摘要翻译：用于配备印刷电路板双面两级接触的测试装置。下针适配器具有不同长度的第一和第二弹性或弹簧座接触针，并且上针适配器具有也具有不同长度的第三和第四弹性或弹簧座接触针，其针对双侧，两段接触组件装配的印刷电路板。在接触的所有阶段，印刷电路板牢固地夹紧在测试样本相关联的下和上压力柱之间。测试装置提供高接触可靠性。

9. 发明授权

US4820975A Test apparatus for printed circuit boards 失效
标题翻译：印刷电路板测试装置
公开(公告)号：US4820975A
公开(公告)日：1989-04-11
申请号：US138864
申请日：1987-12-29
申请人： Brian Diggle
发明人： Brian Diggle
IPC分类号： G01R1/073 , G01R31/28 , G01R15/12
CPC分类号： G01R31/2805 , G01R1/07335
摘要： Test apparatus is described for testing a printed circuit board (PCB). The apparatus includes two test heads, one for each side of the board. Each test head carries an array of spring loaded probes for making electrical contact with the pads on the PCB. Each head also includes two optical fiber image guides for viewing alignment marks at diagonally opposite corners of the PCB, so as to indicate the degree of misalignment between the head and the PCB. The alignment can be adjusted by means of linear drive mechanisms which allow the position of the head to be adjusted in two dimensions relative to the PCB.
摘要翻译：描述了用于测试印刷电路板（PCB）的测试装置。该装置包括两个测试头，一个用于板的每一侧。每个测试头都带有弹簧加载的探针阵列，用于与PCB上的焊盘电接触。每个头还包括两个光纤图像引导件，用于在PCB的对角相对拐角处观察对准标记，以指示头部和PCB之间的未对准程度。可以通过直线驱动机构来调整对准，这样可以相对于PCB在两个维度上调整头部的位置。

10. 发明申请

US20080054921A1 Inspection Equipment of Circuit Board and Inspection Method of Circuit Board 失效
标题翻译：电路板检查设备及电路板检查方法
公开(公告)号：US20080054921A1
公开(公告)日：2008-03-06
申请号：US11632287
申请日：2005-07-14
申请人： Kiyoshi Kimura , Sugiro Shimoda , Satoshi Suzuki , Fujio Hara
发明人： Kiyoshi Kimura , Sugiro Shimoda , Satoshi Suzuki , Fujio Hara
IPC分类号： G01R27/08
CPC分类号： G01R1/07335
摘要： It is an object to provide an apparatus for inspecting a circuit board and a method of inspecting a circuit board which can well absorb a variation in a height of an electrode to be inspected in a circuit board to be inspected and can maintain an insulating property between adjacent inspection electrodes even if the electrode to be inspected is arranged at a fine pitch. An intermediate holding plate 36 is provided in a relay pin unit 31, and a first abutment support position 38A of a first support pin 33 disposed between a first insulating plate 34 and the intermediate holding plate 36 with respect to the intermediate holding plate and a second abutment support position 38B of a second support pin 37 disposed between a second insulating plate 35 and the intermediate holding plate 36 with respect to the intermediate holding plate 36 are placed differently from each other over an intermediate holding plate projecting surface which is projected in a direction of a thickness of the intermediate holding plate 36. Moreover, a relay board 29 having a plurality of rigid conductor electrodes penetrating through the board which is held to be movable in a direction of a thickness of the board is disposed on the side of a circuit board to be inspected in a board 23 for pitch conversion, and furthermore, thin anisotropically conductive sheets 22 and 22 of a dispersion type are provided on both sides thereof and an electrical connection of the board 23 for pitch conversion and a circuit board 1 to be inspected is relayed by means of the relay board 29 through the anisotropically conductive sheets 22 and 22 of a dispersion type.
摘要翻译：本发明的目的是提供一种用于检查电路板的装置和检查电路板的方法，该电路板可以很好地吸收要检查的电路板中待检查的电极的高度变化，并且可以保持两者之间的绝缘性即使被检查的电极以细间距排列，也可以是相邻的检查电极。中间保持板36设置在中继销单元31中，第一支撑销33的第一抵接支撑位置38A相对于中间保持板设置在第一绝缘板34和中间保持板36之间，第一支撑位置38 相对于中间保持板36设置在第二绝缘板35和中间保持板36之间的第二支撑销37的第二抵靠支撑位置38B彼此不同地放置在投影在中间保持板突出表面上的中间保持板突出表面上中间保持板36的厚度方向。此外，具有穿过板的多个刚性导体电极的继电器板29被设置在电路板的侧板上，该电路板被保持在板的厚度方向上可移动，转换，此外，分散型的各向异性导电片22和22设置在其两侧，并且用于音调转换的电路板23和待检查电路板1的电连接通过继电器板29中继通过分散型的各向异性导电片22和22。

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