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1. 发明授权

US09417341B2 Device and method for determining the energetic composition of electromagnetic waves 有权
标题翻译：用于确定电磁波的能量组成的装置和方法
公开(公告)号：US09417341B2
公开(公告)日：2016-08-16
申请号：US14253943
申请日：2014-04-16
申请人： IfG—Institute for Scientific Instruments GmbH , Helmholtz-Zentrum Berlin fur Materialien und Energie GmbH
发明人： Alexei Erko , Norbert Langhoff , Aniuar Bjeoumikhov
IPC分类号： G01T1/36 , G01N23/20 , G01N23/207 , G21K1/06
CPC分类号： G01T1/36 , G01N23/20091 , G01N23/2076 , G01N2223/0568 , G21K1/067 , H01J2237/2445 , H01J2237/24485
摘要： The present invention relates to a method and device for determining the energetic composition of electromagnetic waves. It is the object of the present invention to provide a method and device for X-ray spectroscopy that allows simultaneous detection of the individual energies at a comparatively higher resolution and/or across a comparatively wider energy range. According to the invention, at least one reflective zone plate (12) is used that comprises a multitude of predefined wavelength-selective regions (14) arranged next to one another, wherein the wavelength-selective regions (14) each include a multitude of reflecting arched portions (20), which extend exclusively and continuously across the respective wavelength-selective region (14).
摘要翻译：本发明涉及一种用于确定电磁波的能量组成的方法和装置。本发明的目的是提供一种用于X射线光谱学的方法和装置，其允许以相对较高的分辨率和/或跨越较宽的能量范围同时检测各个能量。根据本发明，使用至少一个反射区域板（12），其包括彼此相邻布置的多个预定波长选择区域（14），其中波长选择区域（14）各自包括多个反射拱形部分（20），其横跨相应的波长选择区域（14）专门且连续地延伸。

2. 发明授权

US5371366A Ion scattering spectroscope 失效
标题翻译：离子散射光谱仪
公开(公告)号：US5371366A
公开(公告)日：1994-12-06
申请号：US77366
申请日：1993-06-17
申请人： Takao Marui
发明人： Takao Marui
IPC分类号： G01N23/225 , G01N23/20 , G01N23/203 , G01Q30/08 , G01Q60/44 , H01J27/24 , H01J37/08 , H01J37/252 , H01J49/40
CPC分类号： H01J49/446 , G01N23/20091 , G01N23/203 , G01N2223/053 , G01N2223/0568 , G01N2223/104
摘要： A time-of-flight (TOF) type ion scattering spectroscope (ISS) using a mixture of ions of different masses. Ions having a mass smaller than the smallest mass of the atoms in the sample surface can precisely discriminate light-weight object atoms of slightly different masses. Ions having an intermediate mass between heavy-weight atoms and light-weight atoms in the sample surface can precisely discriminate heavy-weight object atoms of slightly different masses.
摘要翻译：使用不同质量的离子的混合物的飞行时间（TOF）型离子散射光谱仪（ISS）。具有小于样品表面中原子的最小质量的质量的离子可以精确地区分稍微不同质量的轻质物体原子。在样品表面的重质原子和轻质原子之间具有中间质量的离子可以精确地区分稍微不同质量的重物体原子。

3. 发明授权

US3914605A X-ray spectroscope 失效
标题翻译： X光分光镜
公开(公告)号：US3914605A
公开(公告)日：1975-10-21
申请号：US47389874
申请日：1974-05-28
申请人： HITACHI LTD
发明人： HARA KOUICHI
IPC分类号： G01N23/225 , G01N23/20 , G01N23/206 , G01N23/207 , G01N23/22 , G21K1/06 , H01J37/244 , H01J37/252 , G01T1/00
CPC分类号： G01N23/2076 , G01N23/20008 , G01N23/206 , G01N2223/0568 , G01N2223/079 , G01N2223/418
摘要： In an X-ray spectrometer, an X-ray source which uses X-rays generated by irradiating a specimen with a primary electron beam, a curved dispersing crystal to diffract the X-rays and a slit device to take out desired components of the X-rays, are diposed on a Rowland''s circle. The X-ray spectroscope is so designed that the crystal and the slit device may be rotated about the same crystal maintained in the center of rotation in such a manner that the radius of the Rowland''s circle is varied while Bragg equation and the condition of convergence are satisfied, and that the radius of curvature of the curved crystal may be varied in accordance with the angle of rotation.
摘要翻译：在X射线光谱仪中，使用通过用一次电子束照射试样而产生的X射线的X射线源，将X射线衍射的弯曲分散晶体和狭缝装置取出X的所需成分 - 被划分在罗兰的圈子上。 X射线分光镜的设计使得晶体和狭缝器件可以围绕保持在旋转中心的相同晶体旋转，使得罗兰圆的半径变化，而布拉格方程和收敛条件是满足，并且弯曲晶体的曲率半径可以根据旋转角度而变化。

4. 发明授权

US11885755B2 X-ray sequential array wavelength dispersive spectrometer 有权
公开(公告)号：US11885755B2
公开(公告)日：2024-01-30
申请号：US18309021
申请日：2023-04-28
申请人： Sigray, Inc.
发明人： Wenbing Yun , Ruimin Qiao , Sylvia Jia Yun Lewis , Srivatsan Seshadri , Janos Kirz , Benjamin Donald Stripe
IPC分类号： G01N23/207 , G01N23/20008 , G01N23/085 , G01N23/2209
CPC分类号： G01N23/2076 , G01N23/085 , G01N23/20008 , G01N23/2209 , G01N2223/041 , G01N2223/0568 , G01N2223/076 , G01N2223/1016 , G01N2223/316 , G01N2223/32 , G01N2223/50 , G01N2223/652
摘要： An apparatus is configured to receive x-rays propagating from an x-ray source. The apparatus includes first and second x-ray diffractors, the second x-ray diffractor downstream from the first x-ray diffractor and first and second x-ray detectors. The first x-ray diffractor is configured to receive the x-rays, to diffract a first spectral band of the x-rays to the first x-ray detector, and to transmit at least 2% of the received x-rays to the second x-ray diffractor. The second x-ray diffractor is configured to receive the transmitted x-rays from the first x-ray diffractor and to diffract a second spectral band of the x-rays to the second x-ray detector. The first x-ray detector is configured to measure a first spectrum of the first spectral band of the x-rays and the second x-ray detector is configured to measure a second spectrum of the second spectral band of the x-rays.

5. 发明申请

US20110188631A1 X-ray spectrometer 失效
标题翻译： X光谱仪
公开(公告)号：US20110188631A1
公开(公告)日：2011-08-04
申请号：US12931255
申请日：2011-01-26
申请人： Alexander Georgievich Turyansky , Mikhail Alexandrovich Negodaev , Roman Abramovich Khmelnitsky
发明人： Alexander Georgievich Turyansky , Mikhail Alexandrovich Negodaev , Roman Abramovich Khmelnitsky
IPC分类号： G01T1/36
CPC分类号： G01N23/2076 , G01N2223/0568 , G01N2223/1016 , G01N2223/5015
摘要： The invention relates to X-ray spectral analysis and can be used for control of radiation spectra of X-ray generators as well as for analysis of elemental chemical composition and atomic structure of the specimens by measuring their absorption spectra. The X-ray spectrometer comprises at least one dispersing prism element, means of translation of the dispersing element relative to an X-ray beam, a refracted radiation detector and measuring tools for angle positioning of the dispersing element and the refracted radiation detector. The main distinction of the claimed spectrometer is that it contains an additional radiation detector, means to install it downstream the radiation reflected from the refracting surface of the dispersing element and measuring tools for its angle position in relation to the primary X-ray beam. The dispersing element is made of diamond, or beryllium, lithium hydride or boron carbide. The claimed spectrometer scheme provides a multiple increase of spectral measurements accuracy within the energy range up to 100 keV and possibility of pulse spectra calibration.
摘要翻译：本发明涉及X射线光谱分析，可用于控制X射线发生器的辐射光谱，以及通过测量其吸收光谱分析样品的元素化学成分和原子结构。 X射线光谱仪包括至少一个分散棱镜元件，相对于X射线束平移分散元件的装置，折射辐射检测器和用于分散元件和折射辐射探测器角度定位的测量工具。所要求保护的光谱仪的主要区别在于它包含附加的辐射探测器，用于将其安装在从分散元件的折射表面反射的辐射的下游，以及用于其相对于主X射线束的角度位置的测量工具。分散元件由金刚石或铍，氢化锂或碳化硼制成。所要求的光谱仪方案提供在高达100keV的能量范围内的光谱测量精度的多次增加和脉冲光谱校准的可能性。

6. 发明授权

US3204097A Method of X-ray spectographic analysis of a mixture of solid particles and liquid 失效
标题翻译：固体颗粒和液体混合物的X射线光谱分析方法
公开(公告)号：US3204097A
公开(公告)日：1965-08-31
申请号：US22831862
申请日：1962-10-04
申请人： RHOANGLA MINE SERVICES LTD
发明人： MOFFAT WALTER G , ROBERT CARSON
IPC分类号： G01N23/22
CPC分类号： G01N23/22 , G01N2223/03 , G01N2223/0568 , G01N2223/071 , G01N2223/076 , G01N2223/309 , G01N2223/635

7. 发明公开

US20240280515A1 X-RAY DETECTOR SYSTEM WITH AT LEAST TWO STACKED FLAT BRAGG DIFFRACTORS 审中-公开
公开(公告)号：US20240280515A1
公开(公告)日：2024-08-22
申请号：US18439625
申请日：2024-02-12
申请人： Sigray, Inc.
发明人： Wenbing Yun , Janos Kirz
IPC分类号： G01N23/20008 , G01N23/085 , G01N23/20091 , G01N23/207
CPC分类号： G01N23/20008 , G01N23/085 , G01N23/20091 , G01N23/2076 , G01N23/2209 , G21K1/06 , G21K1/062 , G01N2223/041 , G01N2223/0563 , G01N2223/0568 , G01N2223/076 , G01N2223/1016 , G01N2223/315
摘要： An apparatus includes a plurality of stacked flat Bragg diffractors having at least a first flat Bragg diffractor and a second flat Bragg diffractor. The first and second flat Bragg diffractors are positioned sequentially along an x-ray propagation axis of an x-ray beam. The x-ray beam includes x-rays and has an angular beam divergence less than 30 mrad in at least one direction.

8. 发明申请

US20140314207A1 Device and method for determining the energetic composition of electromagnetic waves 有权
标题翻译：用于确定电磁波的能量组成的装置和方法
公开(公告)号：US20140314207A1
公开(公告)日：2014-10-23
申请号：US14253943
申请日：2014-04-16
申请人： IfG - Institute for Scientific Instruments GmbH , Helmholtz-Zentrum Berlin fur Materialien und Energie GmbH
发明人： Alexei ERKO , Norbert LANGHOFF , Aniuar BJEOUMIKHOV
IPC分类号： G01T1/36
CPC分类号： G01T1/36 , G01N23/20091 , G01N23/2076 , G01N2223/0568 , G21K1/067 , H01J2237/2445 , H01J2237/24485
摘要： The present invention relates to a method and device for determining the energetic composition of electromagnetic waves. It is the object of the present invention to provide a method and device for X-ray spectroscopy that allows simultaneous detection of the individual energies at a comparatively higher resolution and/or across a comparatively wider energy range. According to the invention, at least one reflective zone plate (12) is used that comprises a multitude of predefined wavelength-selective regions (14) arranged next to one another, wherein the wavelength-selective regions (14) each include a multitude of reflecting arched portions (20), which extend exclusively and continuously across the respective wavelength-selective region (14).
摘要翻译：本发明涉及一种用于确定电磁波的能量组成的方法和装置。本发明的目的是提供一种用于X射线光谱学的方法和装置，其允许以相对较高的分辨率和/或跨越较宽的能量范围同时检测各个能量。根据本发明，使用至少一个反射区域板（12），其包括彼此相邻布置的多个预定波长选择区域（14），其中波长选择区域（14）各自包括多个反射拱形部分（20），其横跨相应的波长选择区域（14）专门且连续地延伸。

9. 发明授权

US08675816B2 X-ray spectrometer 失效
标题翻译： X光谱仪
公开(公告)号：US08675816B2
公开(公告)日：2014-03-18
申请号：US12931255
申请日：2011-01-26
申请人： Alexander Georgievich Turyansky , Mikhail Alexandrovich Negodaev , Roman Abramovich Khmelnitsky
发明人： Alexander Georgievich Turyansky , Mikhail Alexandrovich Negodaev , Roman Abramovich Khmelnitsky
IPC分类号： G01T1/36 , G21K1/06
CPC分类号： G01N23/2076 , G01N2223/0568 , G01N2223/1016 , G01N2223/5015
摘要： The invention relates to X-ray spectral analysis and can be used for control of radiation spectra of X-ray generators as well as for analysis of elemental chemical composition and atomic structure of the specimens by measuring their absorption spectra. The X-ray spectrometer comprises at least one dispersing prism element, means of translation of the dispersing element relative to an X-ray beam, a refracted radiation detector and measuring tools for angle positioning of the dispersing element and the refracted radiation detector. The main distinction of the claimed spectrometer is that it contains an additional radiation detector, means to install it downstream the radiation reflected from the refracting surface of the dispersing element and measuring tools for its angle position in relation to the primary X-ray beam. The dispersing element is made of diamond, or beryllium, lithium hydride or boron carbide. The claimed spectrometer scheme provides a multiple increase of spectral measurements accuracy within the energy range up to 100 keV and possibility of pulse spectra calibration.
摘要翻译：本发明涉及X射线光谱分析，可用于控制X射线发生器的辐射光谱，以及通过测量其吸收光谱分析样品的元素化学成分和原子结构。 X射线光谱仪包括至少一个分散棱镜元件，相对于X射线束平移分散元件的装置，折射辐射检测器和用于分散元件和折射辐射探测器角度定位的测量工具。所要求保护的光谱仪的主要区别在于它包含附加的辐射探测器，用于将其安装在从分散元件的折射表面反射的辐射的下游，以及用于其相对于主X射线束的角度位置的测量工具。分散元件由金刚石或铍，氢化锂或碳化硼制成。所要求的光谱仪方案提供在高达100keV的能量范围内的光谱测量精度的多次增加和脉冲光谱校准的可能性。

10. 发明授权

US5357551A X-ray analysis apparatus with pulse amplitude shift correction and detector reading circuit means suited for use in such an apparatus 失效
标题翻译：具有脉冲幅度偏移校正和检测器读取电路的X射线分析装置适用于这种装置
公开(公告)号：US5357551A
公开(公告)日：1994-10-18
申请号：US48087
申请日：1993-04-15
申请人： Hendrik J. J. Bolk , Georges C. P. Zieltjens
发明人： Hendrik J. J. Bolk , Georges C. P. Zieltjens
IPC分类号： G01N23/00 , G01N23/207 , G01T1/36 , G01T1/40 , G01N23/223
CPC分类号： G01N23/2076 , G01T1/40 , G01N2223/0568 , G01N2223/076 , G01N2223/304
摘要： In a gas ionization x-ray detector pulse-amplitude shifts will adversely affect the accuracy of the analysis. At increasing count rates a space charge building up leads to a decrease of the impact ionization in the detector thereby causing the detected pulse amplitude to become lower. By means of addressing a pulse-shift correction random-access memory with digital signals representing detected pulse amplitudes count rates pertaining to high-energy parts and low-energy parts, respectively of a peak in a pulse-height distribution are generated. A difference of count rates for a high-energy part and for a low-energy part of the same peak in the pulse-height distribution indicates pulse-amplitude shift. On the basis of the differences of the high-energy count rate and the low-energy count rate a correction signal is produced for adjusting the amplification of the pulse-amplitudes. To obtain stable operation pulse-shift correction is activated only when the count rate exceeds a threshold value.
摘要翻译：在气体电离X射线检测器中，脉冲幅度偏移将不利地影响分析的准确性。在增加的计数率时，建立空间电荷导致检测器中的电离电离的降低，从而导致检测到的脉冲幅度变低。通过寻址脉冲偏移校正随机存取存储器，分别产生表示检测到的脉冲幅度的数字信号，分别与脉冲高度分布中的峰值相关的高能量部分和低能量部分相关的计数率。脉冲高度分布中的高能量部分和相同峰值的低能量部分的计数率的差异表示脉冲幅度偏移。基于高能量计数率和低能量计数率的差异，产生用于调整脉冲幅度的放大的校正信号。为了获得稳定的运行，只有当计数率超过阈值时才激活脉冲移位校正。

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