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1. 发明申请

US20090116005A1 FINE PARTICLE MEASURING METHOD, SUBSTRATE FOR MEASUREMENT, AND MEASURING APPARATUS 有权
标题翻译：精细颗粒测量方法，测量用基板和测量装置
公开(公告)号：US20090116005A1
公开(公告)日：2009-05-07
申请号：US12259235
申请日：2008-10-27
申请人： Motohiro FURUKI , Shingo IMANISHI , Masataka SHINODA , Akitoshi SUZUKI , Kazushi MIYAKE
发明人： Motohiro FURUKI , Shingo IMANISHI , Masataka SHINODA , Akitoshi SUZUKI , Kazushi MIYAKE
IPC分类号： G01N21/05
CPC分类号： G01N15/1425 , G01N15/1436 , G01N15/1459 , G01N15/1484 , G01N21/6428 , G01N21/645 , G01N2015/1006 , G01N2015/1497 , G01N2021/058 , G01N2021/6419 , G01N2021/6421 , G01N2201/10 , G01N2201/11
摘要： A fine particle measuring method of performing optical measurement of fine particles introduced into a plurality of sample fluidic channels provided at predetermined distances on a substrate by scanning light to the sample fluidic channels is disclosed. The method includes: sequentially irradiating the light to at least two or more reference regions provided together with the sample fluidic channels; detecting a change of optical property occurring in the light due to the reference regions; and controlling timing of emission of the light to the sample fluidic channels.
摘要翻译：公开了一种微粒测量方法，其通过向样品流体通道扫描光来对引入到以预定距离设置在基板上的多个样品流体通道中的微粒进行光学测量。该方法包括：顺序地将光照射到与样品流体通道一起提供的至少两个或更多个参考区域; 检测由于参考区域而在光中发生的光学特性的变化; 并控制向样品流体通道发射光的定时。

2. 发明申请

US20190079008A1 SAMPLE SUBSTANCE MOLECULAR BONDS BREAKDOWN AND SEL COLLECTION 审中-公开
公开(公告)号：US20190079008A1
公开(公告)日：2019-03-14
申请号：US15772493
申请日：2016-02-28
申请人： Hewlett-Packard Development Company, L.P.
发明人： Ning GE
IPC分类号： G01N21/64 , G01N21/65
CPC分类号： G01N21/648 , G01N21/658 , G01N2021/1734 , G01N2201/06113 , G01N2201/11
摘要： A sample comprising a first substance and a second substance is modified by breaking down molecular bonds of the second substance of the sample to form a modified sample having altered surface enhanced luminescence (SEL) characteristics to reduce overlapping of SEL characteristics of the first substance in the second substance. Surface enhanced luminescence data resulting from excitation of the modified sample is collected. Characteristics of the first substance based upon the collected surface enhanced luminescence data are identified.

3. 发明授权

US09702827B1 Optical mode analysis with design-based care areas 有权
公开(公告)号：US09702827B1
公开(公告)日：2017-07-11
申请号：US14946604
申请日：2015-11-19
申请人： KLA-Tencor Corporation
发明人： Bjorn Brauer , Ravikumar Sanapala
IPC分类号： G01N21/00 , G01N21/88 , G01N21/95
CPC分类号： G01N21/8851 , G01N21/9501 , G01N2201/11
摘要： Methods and systems for selecting one or more modes of an inspection subsystem or system for inspection of a specimen are provided. The systems described herein are configured to acquire output for all of the modes to be considered at a location of a known defect on the specimen by aligning output, which is generated at the location with a mode known to generate output in which patterned features on the specimen are resolved to a degree that allows the output to be aligned to design data, with the design data for the specimen to identify the location with substantially high accuracy and then without moving the field of view of the inspection subsystem or system from that location, acquiring the output for all other modes. All of the acquired output can then be used to select mode(s) for inspection of the specimen or another specimen of the same type.

4. 发明申请

US20170146458A1 A System and Method for Inducing and Detecting Multi-Photon Processes in a Sample 有权
公开(公告)号：US20170146458A1
公开(公告)日：2017-05-25
申请号：US15316568
申请日：2015-06-03
申请人： Ludwig-Maximilians-Universität München
发明人： Robert Alexander Huber , Sebastian Karpf , Matthias Eibl
IPC分类号： G01N21/64 , G01N21/65
CPC分类号： G01N21/6456 , G01J3/0218 , G01J3/10 , G01J3/44 , G01J3/4406 , G01N21/6408 , G01N21/65 , G01N2021/6484 , G01N2201/06146 , G01N2201/0635 , G01N2201/105 , G01N2201/11 , G01N2201/12 , H01S3/06712 , H01S3/06754 , H01S3/094007 , H01S3/10015 , H01S3/1618 , H01S3/2316 , H01S3/302 , H01S2301/02
摘要： Described is a system for inducing and detecting multi-photon processes, in particular multi-photon fluorescence or higher harmonic generation in a sample. The system comprises a dynamically-controllable light source, said dynamically-controllable light source comprising a first sub-light source, said first sub-light source being electrically controllable such as to generate controllable time-dependent intensity patterns of light having a first wavelength, and at least one optical amplifier, thereby allowing for active time-control of creation of multi-photon-excitation. The system further comprises a beam delivery unit for delivering light generated by said dynamically-controllable light source to a sample site, and a detector unit or detector assembly for detecting signals indicative of said multi-photon process, in particular multi-photon fluorescence signals or higher harmonics signals.

5. 发明授权

US09851303B2 System and method for inducing and detecting multi-photon processes in a sample 有权
公开(公告)号：US09851303B2
公开(公告)日：2017-12-26
申请号：US15316568
申请日：2015-06-03
申请人： Ludwig-Maximilians-Universität München
发明人： Robert Alexander Huber , Sebastian Karpf , Matthias Eibl
IPC分类号： G01N21/64 , G01N21/65
CPC分类号： G01N21/6456 , G01J3/0218 , G01J3/10 , G01J3/44 , G01J3/4406 , G01N21/6408 , G01N21/65 , G01N2021/6484 , G01N2201/06146 , G01N2201/0635 , G01N2201/105 , G01N2201/11 , G01N2201/12 , H01S3/06712 , H01S3/06754 , H01S3/094007 , H01S3/10015 , H01S3/1618 , H01S3/2316 , H01S3/302 , H01S2301/02
摘要： Described is a system for inducing and detecting multi-photon processes, in particular multi-photon fluorescence or higher harmonic generation in a sample. The system comprises a dynamically-controllable light source, said dynamically-controllable light source comprising a first sub-light source, said first sub-light source being electrically controllable such as to generate controllable time-dependent intensity patterns of light having a first wavelength, and at least one optical amplifier, thereby allowing for active time-control of creation of multi-photon-excitation. The system further comprises a beam delivery unit for delivering light generated by said dynamically-controllable light source to a sample site, and a detector unit or detector assembly for detecting signals indicative of said multi-photon process, in particular multi-photon fluorescence signals or higher harmonics signals.

6. 发明授权

US08553229B2 Fine particle optical measuring method in fluidic channels 有权
标题翻译：流体通道中的微粒光学测量方法
公开(公告)号：US08553229B2
公开(公告)日：2013-10-08
申请号：US12259235
申请日：2008-10-27
申请人： Motohiro Furuki , Shingo Imanishi , Masataka Shinoda , Akitoshi Suzuki , Kazushi Miyake
发明人： Motohiro Furuki , Shingo Imanishi , Masataka Shinoda , Akitoshi Suzuki , Kazushi Miyake
IPC分类号： G01N35/08 , G01N21/05
CPC分类号： G01N15/1425 , G01N15/1436 , G01N15/1459 , G01N15/1484 , G01N21/6428 , G01N21/645 , G01N2015/1006 , G01N2015/1497 , G01N2021/058 , G01N2021/6419 , G01N2021/6421 , G01N2201/10 , G01N2201/11
摘要： A fine particle measuring method of performing optical measurement of fine particles introduced into a plurality of sample fluidic channels provided at predetermined distances on a substrate by scanning light to the sample fluidic channels is disclosed. The method includes: sequentially irradiating the light to at least two or more reference regions provided together with the sample fluidic channels; detecting a change of optical property occurring in the light due to the reference regions; and controlling timing of emission of the light to the sample fluidic channels.
摘要翻译：公开了一种微粒测量方法，其通过向样品流体通道扫描光来对引入到以预定距离设置在基板上的多个样品流体通道中的微粒进行光学测量。该方法包括：顺序地将光照射到与样品流体通道一起提供的至少两个或更多个参考区域; 检测由于参考区域而在光中发生的光学特性的变化; 并控制向样品流体通道发射光的定时。

7. 发明授权

US08222615B2 Data acquisition method using a laser scanner 有权
标题翻译：数据采集方法采用激光扫描仪
公开(公告)号：US08222615B2
公开(公告)日：2012-07-17
申请号：US12666035
申请日：2009-02-13
申请人： Alois Schausberger , Andreas Gfrörer , Wolfgang Fuchs
发明人： Alois Schausberger , Andreas Gfrörer , Wolfgang Fuchs
IPC分类号： G01J1/58
CPC分类号： G02B21/26 , G01N21/278 , G01N21/6458 , G01N2021/6419 , G01N2201/104 , G01N2201/11 , G02B21/0076
摘要： Method has laser scanner for pixel-precise imaging of fluorescent samples having fluorescent dyes. The scanner has sample table, laser and first optical system providing laser beam for exciting the samples, scanner head with deflecting element for scanning sample, first lens, second optical system for forwarding emission beams triggered by the laser beam and deflected by first lens and deflecting element to a detector, position encoder emitting position signals indicating location of the scanner head, electronic element for filtering the detector signals with a time constant and an A/D converter for digitizing the filtered detector signals. The filtered detector signals and the position encoder signals are acquired independently, in parallel and continuously by a computer and are related to a common time base, the A/D conversion being carried out often so that each pixel of an image is always assigned more than one data point.
摘要翻译：方法具有用于具有荧光染料的荧光样品的像素精确成像的激光扫描仪。扫描仪具有样品台，激光和第一光学系统，提供用于激发样品的激光束，扫描头具有用于扫描样品的偏转元件，第一透镜，用于转发由激光束触发并由第一透镜偏转的发射光束的第二光学系统发送位置信号的位置编码器，用于指示扫描仪头部的位置，用于对时间常数进行检测器信号的滤波的电子元件和用于数字化滤波的检测器信号的A / D转换器。经滤波的检测器信号和位置编码器信号由计算机并行并连续地获取并且与公共时基相关，经常执行A / D转换，使得图像的每个像素总是被分配多于一个数据点。

8. 发明公开

US20240210319A1 SAMPLE OBSERVATION DEVICE AND SAMPLE OBSERVATION METHOD 审中-公开
公开(公告)号：US20240210319A1
公开(公告)日：2024-06-27
申请号：US18382177
申请日：2023-10-20
申请人： HAMAMATSU PHOTONICS K.K.
发明人： Satoshi YAMAMOTO
IPC分类号： G01N21/64
CPC分类号： G01N21/6456 , G01N2201/11 , G01N2201/127
摘要： In a sample observation device, an image capturing unit includes an area image sensor that performs image capturing by the rolling shutter method in which a start of an exposure period of pixel columns in the pixel region is shifted by predetermined time, and a control unit controls the image capturing unit so that an exposure order in each of the pixel columns is reversed between a period in which a scanning unit scans a sample in a first direction and a period in which the scanning unit scans the sample in a second direction.

9. 发明申请

US20160238533A1 SPECTROSCOPY APPARATUS AND METHODS 审中-公开
标题翻译：光谱仪器和方法
公开(公告)号：US20160238533A1
公开(公告)日：2016-08-18
申请号：US15025464
申请日：2014-09-30
申请人： RENISHAW PLC
发明人： Thomas Anthony MASON
IPC分类号： G01N21/65
CPC分类号： G01N21/65 , G01J3/0208 , G01J3/0237 , G01J3/0248 , G01J3/2803 , G01J3/2823 , G01J3/44 , G01J2003/2826 , G01N2201/025 , G01N2201/06113 , G01N2201/103 , G01N2201/11 , G01N2201/117 , G01N2201/122
摘要： This invention concerns spectroscopy apparatus comprising a light source arranged to generate a light profile on a sample, a photodetector having at least one photodetector element for detecting characteristic light generated from interaction of the sample with light from the light source, a support for supporting the sample, the support movable relative to the light profile, and a processing unit. The processing unit is arranged to associate a spectral value recorded by the photodetector element at a particular time with a point on the sample predicted to have generated the characteristic light recorded by the photodetector element at the particular time based on relative motion anticipated to have occurred between the support and the light profile.
摘要翻译：本发明涉及光谱装置，其包括被配置为在样品上产生光分布的光源，具有至少一个光电探测元件的光电检测器，该光电检测元件用于检测由样品与来自光源的光的相互作用产生的特征光;支撑样品，相对于光轮廓可移动的支撑件，以及处理单元。处理单元被布置为将由特定时间的光电检测器元件记录的光谱值与预测的样品上的点相关联，以在特定时间基于由光电检测器元件记录的特征光，基于预期发生在支持和光线。

10. 发明申请

US20160153894A1 OPTICAL ELEMENT ROTATION TYPE MUELLER-MATRIX ELLIPSOMETER AND METHOD FOR MEASURING MUELLER-MATRIX OF SAMPLE USING THE SAME 审中-公开
标题翻译：光学元件旋转型MUELLER-MATRIX ELLIPSOMETER和用于测量使用其的样品的MUELLER-MATRIX的方法
公开(公告)号：US20160153894A1
公开(公告)日：2016-06-02
申请号：US14906433
申请日：2014-05-13
申请人： KOREA RESEARCH INSTITUTE OF STANDARDS AND SCIENCE
发明人： Yong Jai Cho , Won Chegal , Hyun Mo Cho
IPC分类号： G01N21/21
CPC分类号： G01N21/211 , G01J4/00 , G01J4/04 , G01J2004/001 , G01N2021/213 , G01N2201/0683 , G01N2201/11
摘要： Provided is an optical element rotation type Mueller-matrix ellipsometer for solving a problem of measurement accuracy and measurement precision occurring due to residual polarization of a light source, polarization dependence of a photo-detector, measurement values of Fourier coefficients of a high order term in dual optical element rotation type Mueller-matrix ellipsometers according to the related art capable of measuring some or all of components of a Mueller-matrix for any sample.
摘要翻译：提供一种光学元件旋转型米勒矩阵椭偏仪，用于解决由于光源的残余极化产生的测量精度和测量精度的问题，光检测器的偏振度依赖性，高阶项的傅里叶系数的测量值根据相关技术的双光学元件旋转型米勒矩阵椭偏仪能够测量任何样品的Mueller矩阵的一些或全部组分。

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