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    • 1. 发明授权
    • Method and system for manufacturing copper-based capacitor
    • 制造铜基电容器的方法和系统
    • US08395200B2
    • 2013-03-12
    • US12950973
    • 2010-11-19
    • Zhen ChenYung Feng LinLin Huang
    • Zhen ChenYung Feng LinLin Huang
    • H01L27/108H01L29/94H01L21/20
    • H01L28/40H01L23/5223H01L27/0805H01L2924/0002H01L2924/00
    • A method for manufacturing a capacitor on an integrated circuit includes providing an inter-metal dielectric layer on a substrate, a bottom layer having a first and second portions, a first insulating layer having via plug openings on the bottom layer, and via plugs disposed in the via plug openings. The via plugs include a first and second via plugs and are electrically coupled to the first portion of the bottom layer. The method further includes providing a capacitor layer having a first barrier metal layer coupled to the first via plug. The capacitor layer also has a capacitor dielectric layer overlying the first barrier metal layer and a second barrier metal overlying the capacitor dielectric layer. The method further includes defining a first and second capacitor layer portions. The first capacitor layer portion has two opposite sides and spacers disposed on their surface.
    • 一种在集成电路上制造电容器的方法包括在基片上提供金属间电介质层,底层具有第一和第二部分,在底层上具有通孔插头开口的第一绝缘层,以及设置在 通孔插头开口。 通孔塞包括第一和第二通孔塞,并且电耦合到底层的第一部分。 该方法还包括提供具有耦合到第一通孔插头的第一阻挡金属层的电容器层。 电容器层还具有覆盖第一阻挡金属层的电容器电介质层和覆盖电容器介电层的第二阻挡金属。 该方法还包括限定第一和第二电容器层部分。 第一电容器层部分具有设置在其表面上的两个相对侧和间隔物。
    • 2. 发明授权
    • Method and structure for high Q varactor
    • 高Q变容二极管的方法和结构
    • US08722475B2
    • 2014-05-13
    • US12986123
    • 2011-01-06
    • Zhen ChenYung Feng Lin
    • Zhen ChenYung Feng Lin
    • H01L21/338
    • H01L29/93H01L29/66181H01L29/94
    • A method for forming a variable capacitor includes providing a semiconductor substrate of a first conductivity type and forming an active region of a second conductivity type within the substrate. The method forms a first dielectric layer overlying the active region. The method provides a conductive gate layer over the first dielectric layer and selectively patterns the conductive gate layer to form a plurality of holes in the conductive gate layer. A perimeter of the holes and a spacing between a first and a second holes are selective to provide a high quality factor (Q) of the capacitor. The method implants impurities of the second conductivity type into the active region through the plurality of holes in the conductive layer. The method also includes providing a second dielectric layer and patterning the second dielectric layer to form contacts to the active region and the gate.
    • 形成可变电容器的方法包括提供第一导电类型的半导体衬底,并在衬底内形成第二导电类型的有源区。 该方法形成覆盖有源区的第一介电层。 该方法在第一电介质层之上提供导电栅极层,并且选择性地图案化导电栅极层以在导电栅极层中形成多个孔。 孔的周长和第一孔和第二孔之间的间隔是选择性的,以提供电容器的高品质因数(Q)。 该方法将第二导电类型的杂质通过导电层中的多个孔埋入有源区。 该方法还包括提供第二电介质层和图案化第二电介质层以形成与有源区和栅极的接触。
    • 3. 发明授权
    • Integrated inductor
    • 集成电感
    • US08324692B2
    • 2012-12-04
    • US12953426
    • 2010-11-23
    • Zhen ChenYung Feng LinLin Huang
    • Zhen ChenYung Feng LinLin Huang
    • H01L27/11
    • H01L27/13H01F17/0006H01F2017/0046H01F2017/0073H01F2017/0086H01L23/5222H01L23/5227H01L23/53295H01L27/08H01L2924/0002H01L2924/00
    • A method of fabricating an integrated inductor device includes providing a silicon substrate and forming a thickness of an insulating layer overlying the silicon substrate. The insulating layer includes a dummy structure within a portion of the thickness. The method includes forming an inductor having a first portion and a second portion. The first portion includes a spiral coil of conductor lines. The method also includes exposing the dummy structure by forming an opening in the insulating layer and removing the dummy structure to form a cavity underlying the inductor to reduce a dielectric constant and to increase a Q value of the inductor. The method includes using aluminum or copper for the dummy structures. The method includes dry etching the insulator and wet etching the dummy structure. The method also includes forming the inductors using aluminum or copper.
    • 制造集成电感器件的方法包括提供硅衬底并形成覆盖硅衬底的绝缘层的厚度。 绝缘层在厚度的一部分内包括虚拟结构。 该方法包括形成具有第一部分和第二部分的电感器。 第一部分包括导线的螺旋线圈。 该方法还包括通过在绝缘层中形成开口并去除虚拟结构以形成电感器下面的空腔来暴露虚拟结构,以降低介电常数并增加电感器的Q值。 该方法包括使用铝或铜作为虚拟结构。 该方法包括干法蚀刻绝缘体并湿式蚀刻虚拟结构。 该方法还包括使用铝或铜形成电感器。
    • 4. 发明申请
    • METHOD AND STRUCTURE FOR HIGH Q VARACTOR
    • 高Q变压器的方法与结构
    • US20120139020A1
    • 2012-06-07
    • US12986123
    • 2011-01-06
    • Zhen ChenYung Feng Lin
    • Zhen ChenYung Feng Lin
    • H01L27/06H01L21/336
    • H01L29/93H01L29/66181H01L29/94
    • A method for forming a variable capacitor includes providing a semiconductor substrate of a first conductivity type and forming an active region of a second conductivity type within the substrate. The method forms a first dielectric layer overlying the active region. The method provides a conductive gate layer over the first dielectric layer and selectively patterns the conductive gate layer to form a plurality of holes in the conductive gate layer. A perimeter of the holes and a spacing between a first and a second holes are selective to provide a high quality factor (Q) of the capacitor. The method implants impurities of the second conductivity type into the active region through the plurality of holes in the conductive layer. The method also includes providing a second dielectric layer and patterning the second dielectric layer to form contacts to the active region and the gate.
    • 形成可变电容器的方法包括提供第一导电类型的半导体衬底,并在衬底内形成第二导电类型的有源区。 该方法形成覆盖有源区的第一介电层。 该方法在第一电介质层之上提供导电栅极层,并且选择性地图案化导电栅极层以在导电栅极层中形成多个孔。 孔的周长和第一孔和第二孔之间的间隔是选择性的,以提供电容器的高品质因数(Q)。 该方法将第二导电类型的杂质通过导电层中的多个孔埋入有源区。 该方法还包括提供第二电介质层和图案化第二电介质层以形成与有源区和栅极的接触。
    • 9. 发明授权
    • LED that has bounding silicon-doped regions on either side of a strain release layer
    • LED在应变释放层的任一侧具有界限的硅掺杂区域
    • US08669585B1
    • 2014-03-11
    • US13602145
    • 2012-09-01
    • Zhen ChenYi Fu
    • Zhen ChenYi Fu
    • H01L29/36
    • H01L33/325H01L33/0025H01L33/04H01L33/06H01L33/12
    • A strain release layer adjoining the active layer in a blue LED is bounded on the bottom by a first relatively-highly silicon-doped region and is also bounded on the top by a second relatively-highly silicon-doped region. The second relatively-highly silicon-doped region is a sublayer of the active layer of the LED. The first relatively-highly silicon-doped region is a sublayer of the N-type layer of the LED. The first relatively-highly silicon-doped region is also separated from the remainder of the N-type layer by an intervening sublayer that is only lightly doped with silicon. The silicon doping profile promotes current spreading and high output power (lumens/watt). The LED has a low reverse leakage current and a high ESD breakdown voltage. The strain release layer has a concentration of indium that is between 5×1019 atoms/cm3 and 5×102° atoms/cm3, and the first and second relatively-highly silicon-doped regions have silicon concentrations that exceed 1×1018 atoms/cm3.
    • 在蓝色LED中邻接有源层的应变释放层在底部由第一相对高的硅掺杂区域界定,并且在顶部由第二相对高的硅掺杂区域界定。 第二相对高的硅掺杂区域是LED的有源层的子层。 第一相对高的硅掺杂区域是LED的N型层的子层。 第一相对高的硅掺杂区域也通过仅轻微掺杂硅的中间子层与N型层的其余部分分离。 硅掺杂分布促进电流扩散和高输出功率(流明/瓦特)。 LED具有低反向漏电流和高ESD电压。 应变释放层的铟浓度介于5×1019原子/ cm3至5×102°原子/ cm3之间,第一和第二相对高度的硅掺杂区域的硅浓度超过1×1018原子/ cm3 。