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    • 3. 发明申请
    • LED DRIVING APPARATUS
    • LED驱动装置
    • US20120206433A1
    • 2012-08-16
    • US13371821
    • 2012-02-13
    • Shinichi SUZUKIShingo TAKATSUKA
    • Shinichi SUZUKIShingo TAKATSUKA
    • G06F3/038
    • H05B33/0815H05B33/0848Y02B20/347
    • An LED driving apparatus comprising: a power feed unit; a driving control unit; a current detection unit that detects load current flowing in an LED module; and an output control unit that determines whether the LED module is under conducting state or opening state, and outputs a signal in accordance with a result of the determination, wherein, when the LED module is under conducting state, the output control unit outputs a first signal to the driving control unit so that the load current is constant, wherein, when the LED module is under opening state, the output control unit outputs a second signal to the driving control unit so that a voltage becomes a predetermined constant-voltage value, and wherein the predetermined voltage value is a voltage or higher, at which the LED module starts conduction, and a voltage or lower corresponding to an upper limit of the LED.
    • 一种LED驱动装置,包括:供电单元; 驱动控制单元; 检测在LED模块中流动的负载电流的电流检测单元; 以及输出控制单元,其确定所述LED模块是否处于导通状态或打开状态,并且根据所述确定的结果输出信号,其中,当所述LED模块处于导通状态时,所述输出控制单元输出第一 向驱动控制单元发送信号,使得负载电流恒定,其中,当LED模块处于打开状态时,输出控制单元向驱动控制单元输出第二信号,使得电压变为预定的恒定电压值, 并且其中所述预定电压值是所述LED模块开始导通的电压或更高电压,以及对应于所述LED的上限的电压或更低。
    • 6. 发明申请
    • LED DRIVING CIRCUIT
    • LED驱动电路
    • US20110140622A1
    • 2011-06-16
    • US12950106
    • 2010-11-19
    • Shinichi SUZUKI
    • Shinichi SUZUKI
    • H05B37/02
    • H05B33/0809
    • An LED driving circuit includes a dimming circuit that controls a conducting angle of an alternating current supplied from a power supply to phase-control a current to be supplied to an LED, a rectifier circuit that rectifies an alternating-current voltage output from the dimming circuit, a smoothing circuit that smoothes a direct current voltage output from the rectifier circuit, a switching device that is connected with the LED in series; a constant current control circuit that outputs a high frequency pulse signal to the switching device to control the switching device, and a bleeder circuit that is provided between an output terminal of the rectifier circuit and a ground and that has a bleeder resistance and a bleeder switch connected in series. The high frequency pulse signal is input to the bleeder switch so that a bleeder current having a high frequency pulse form flows in the bleeder resistance.
    • LED驱动电路包括调光电路,该调光电路控制从电源供给的交流电的导通角以对要提供给LED的电流进行相位控制;整流电路,对从调光电路输出的交流电压进行整流 平滑化从整流电路输出的直流电压的平滑电路,与LED串联连接的开关元件; 将高频脉冲信号输出到开关装置以控制开关装置的恒流控制电路,以及设置在整流电路的输出端子与地之间并具有放电阻抗和泄放开关的放电电路 串联连接。 高频脉冲信号被输入到泄放开关,使得具有高频脉冲形式的泄放电流在泄放电阻中流动。
    • 7. 发明申请
    • APPARATUS AND METHOD OF SEMICONDUCTOR DEFECT INSPECTION
    • 半导体缺陷检查的装置和方法
    • US20090218490A1
    • 2009-09-03
    • US12369405
    • 2009-02-11
    • Shinichi SUZUKIKaoru UmemuraDaiji Fujiwara
    • Shinichi SUZUKIKaoru UmemuraDaiji Fujiwara
    • G01N23/00
    • G06T7/001G06T2207/30148H01L22/12
    • An object of the present invention is to provide an apparatus and a method of semiconductor defect inspection in which an optimal process condition can be determined without performing electrical evaluation. To achieve the object, the present invention includes a configuration in which the type of an extracted defect is identified with reference to a database that stores the types of defects obtained by inspecting a sample, a defect density according to each defect type is obtained for each region of the sample, and the defect density is displayed. Moreover, the present invention includes a configuration in which the type of an extracted defect is identified with reference to a database that stores the types of defects obtained by inspecting a sample, a defect density according to each defect type is determined for each production process of the sample, and the defect density is displayed on a display.
    • 本发明的目的是提供一种半导体缺陷检查的装置和方法,其中可以在不进行电气评估的情况下确定最佳工艺条件。 为了实现该目的,本发明包括一种结构,其中参考存储通过检查样品获得的缺陷类型的数据库来识别提取的缺陷的类型,获得每种缺陷类型的缺陷密度 区域,并显示缺陷密度。 此外,本发明还提供一种结构,其中参考存储通过检查样品获得的缺陷类型的数据库来识别提取的缺陷的类型,根据每种缺陷类型的缺陷密度来确定每个缺陷类型的缺陷密度 样品和缺陷密度显示在显示器上。
    • 8. 发明申请
    • DIGITAL CAMERA USING A FOCAL-PLANE SHUTTER
    • 数码相机使用FOCAL-PLANE SHUTTER
    • US20080252768A1
    • 2008-10-16
    • US11865164
    • 2007-10-01
    • Shinichi SUZUKI
    • Shinichi SUZUKI
    • H04N5/335
    • H04N5/2353H04N5/2254H04N5/2355H04N5/3532H04N5/35581
    • A digital camera includes an image pickup device; a focal plane shutter including a shutter leading curtain and a shutter trailing curtain; a timer for measuring exposure time; a shutter controller which commences measurement of an exposure time when the shutter leading curtain starts traveling, and drives the shutter trailing curtain upon completing the exposure time measurement; and a charge readout controller which reads out electric charges accumulated by the image pickup device during the exposure time at least twice, first before the shutter trailing curtain commences traveling upon the shutter leading curtain commencing traveling and second upon the shutter trailing curtain commencing traveling. The charge readout controller carries out the electric charge readout, before the shutter trailing curtain commences traveling, at a scanning speed in synchronization with a travel speed of the shutter leading curtain in a same direction of the traveling shutter leading curtain.
    • 数码相机包括图像拾取装置; 包括快门引导帘和快门帘幕的焦平面快门; 用于测量曝光时间的计时器; 快门控制器,其在快门引导帘幕开始行进时开始测量曝光时间,并且在完成曝光时间测量时驱动快门后帘; 以及电荷读取控制器,其在曝光时间期间至少读取由图像拾取装置累积的电荷至少两次,首先在快门后帘开始行进时,快门引导帘幕开始行进,第二次快门后帘开始行进。 电荷读出控制器在快门帘幕开始行进之前以扫描速度与行进快门帘幕的相同方向上的快门引导帘幕的行进速度同步地执行电荷读出。
    • 9. 发明申请
    • POWER SUPPLY DEVICE
    • 电源设备
    • US20130099699A1
    • 2013-04-25
    • US13584676
    • 2012-08-13
    • Shinichi SUZUKIKazuaki SAITO
    • Shinichi SUZUKIKazuaki SAITO
    • H05B37/02G06F1/26
    • H05B37/0254H05B33/0815H05B33/0845
    • A power supply device containing a first board, a second board, an enclosure into which the first board and the second board are installed, a power supply unit which supplies power to an external load, a control circuit unit for controlling output current and/or output voltage from the power supply unit to the external load, the control circuit unit being embedded on the first board, a memory which stores control information, the memory being utilized in the control circuit unit for controlling the output current and/or the output voltage from the power supply unit, and an interface unit which is capable of receiving the control information from an external device and transmitting the control information to the memory, the interface unit being embedded on the second board which is physically separated from the first board.
    • 一种电源装置,包括第一板,第二板,安装有第一板和第二板的壳体,向外部负载供电的电源单元,用于控制输出电流的控制电路单元和/或 从电源单元向外部负载输出的电压,控制电路单元嵌入在第一板上,存储控制信息的存储器,用于控制电路单元的存储器,用于控制输出电流和/或输出电压 以及能够从外部设备接收控制信息并将控制信息发送到存储器的接口单元,所述接口单元嵌入在物理上与第一板分离的第二板上。
    • 10. 发明申请
    • DATA PROCESSING SYSTEM
    • 数据处理系统
    • US20120311242A1
    • 2012-12-06
    • US13486857
    • 2012-06-01
    • Shinichi SUZUKI
    • Shinichi SUZUKI
    • G06F12/02
    • G06F9/4401G06F8/654
    • A data processing system is provided, which can realize speeding up and facilitation of data processing using a program and a parameter of a scale larger than the maximum storage capacity of an available on-chip nonvolatile memory. A program and a parameter of a scale larger than the maximum storage capacity of the on-chip nonvolatile memory are stored in a nonvolatile semiconductor memory device coupled to the exterior of a semiconductor data processing device, and responding to the determination result of the information supplied from the exterior, the semiconductor data processing device downloads an internally required program and parameter from the nonvolatile semiconductor memory device, and rewrites the on-chip nonvolatile memory. When the program is rewritten, software reset processing is performed to execute the program from a starting address.
    • 提供了一种数据处理系统,其可以使用程序和比可用的片上非易失性存储器的最大存储容量大的规模的参数来实现数据处理的加速和便利化。 存储在与半导体数据处理装置的外部耦合的非易失性半导体存储器件中的程序和比该片上非易失性存储器的最大存储容量大的刻度的参数,并响应所提供的信息的确定结果 从外部,半导体数据处理装置从非易失性半导体存储器件下载内部需要的程序和参数,并重写片上非易失性存储器。 当程序被重写时,执行软件复位处理以从起始地址执行程序。