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    • 1. 发明授权
    • Test access control for plural processors of an integrated circuit
    • 集成电路的多个处理器的测试访问控制
    • US07743278B2
    • 2010-06-22
    • US11600208
    • 2006-11-16
    • Yuri IkedaYoshikazu AotoJun MatsushimaHiroyuki SasakiTomoyoshi UjiiMakoto Saen
    • Yuri IkedaYoshikazu AotoJun MatsushimaHiroyuki SasakiTomoyoshi UjiiMakoto Saen
    • G06F11/00
    • G01R31/31705G01R31/318572
    • The present invention is directed to facilitate debugging in a semiconductor integrated circuit device including a plurality of microprocessors. A semiconductor integrated circuit device includes: a plurality of processors; a plurality of debug interfaces enabling debugging of the corresponding processors; a plurality of common terminals shared by the plurality of debug interfaces; a selection circuit capable of selectively connecting the plurality of debug interfaces to the common terminals; and a controller capable of controlling selecting operation in the selection circuit in accordance with a predetermined instruction. A first selector capable of selectively connecting the plurality of debug interfaces to a TRST terminal in the terminal group conformed with the JTAG specifications, and a second selector capable of selectively connecting the plurality of debug interfaces to terminals other than the TRST terminal are provided. With the configuration, even in the case where the number of processors increases, the invention can flexibly address the increase.
    • 本发明旨在促进包括多个微处理器的半导体集成电路器件的调试。 半导体集成电路装置包括:多个处理器; 多个调试接口,能够调试相应的处理器; 由所述多个调试接口共享的多个公共终端; 选择电路,其能够将所述多个调试接口选择性地连接到所述公共端子; 以及控制器,其能够根据预定指令来控制选择电路中的选择操作。 提供能够选择性地将多个调试接口连接到符合JTAG规范的终端组中的TRST终端的第一选择器,并且提供能够选择性地将多个调试接口连接到除了TRST终端之外的终端的第二选择器。 利用该配置,即使在处理器数量增加的情况下,本发明可以灵活地解决增加的问题。
    • 2. 发明申请
    • Semiconductor integrated circuit device
    • 半导体集成电路器件
    • US20070226558A1
    • 2007-09-27
    • US11600208
    • 2006-11-16
    • Yuri IkedaYoshikazu AotoJun MatsushimaHiroyuki SasakiTomoyoshi UjiiMakoto Saen
    • Yuri IkedaYoshikazu AotoJun MatsushimaHiroyuki SasakiTomoyoshi UjiiMakoto Saen
    • G01R31/28
    • G01R31/31705G01R31/318572
    • The present invention is directed to facilitate debugging in a semiconductor integrated circuit device including a plurality of microprocessors. A semiconductor integrated circuit device includes: a plurality of processors; a plurality of debug interfaces enabling debugging of the corresponding processors; a plurality of common terminals shared by the plurality of debug interfaces; a selection circuit capable of selectively connecting the plurality of debug interfaces to the common terminals; and a controller capable of controlling selecting operation in the selection circuit in accordance with a predetermined instruction. A first selector capable of selectively connecting the plurality of debug interfaces to a TRST terminal in the terminal group conformed with the JTAG specifications, and a second selector capable of selectively connecting the plurality of debug interfaces to terminals other than the TRST terminal are provided. With the configuration, even in the case where the number of processors increases, the invention can flexibly address the increase.
    • 本发明旨在促进包括多个微处理器的半导体集成电路器件的调试。 半导体集成电路装置包括:多个处理器; 多个调试接口,能够调试相应的处理器; 由所述多个调试接口共享的多个公共终端; 选择电路,其能够将所述多个调试接口选择性地连接到所述公共端子; 以及控制器,其能够根据预定指令来控制选择电路中的选择操作。 提供能够选择性地将多个调试接口连接到符合JTAG规范的终端组中的TRST终端的第一选择器,并且提供能够选择性地将多个调试接口连接到除了TRST终端之外的终端的第二选择器。 利用该配置,即使在处理器数量增加的情况下,本发明可以灵活地解决增加的问题。