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1. 发明申请

US20070171152A1 Method for driving a flat-type display device 失效
标题翻译：驱动平板式显示装置的方法
公开(公告)号：US20070171152A1
公开(公告)日：2007-07-26
申请号：US11654507
申请日：2007-01-18
申请人： Yukinobu Iguchi , Hiroyuki Ikeda , Yasuhito Hatano , Kunihiko Nagamine
发明人： Yukinobu Iguchi , Hiroyuki Ikeda , Yasuhito Hatano , Kunihiko Nagamine
IPC分类号： G09G3/22
CPC分类号： G09G3/22 , G09G2300/0426 , G09G2300/0443 , G09G2300/0452 , G09G2320/0209 , G09G2320/0233 , G09G2320/0285 , G09G2330/021 , G09G2360/02
摘要： A method for driving a flat-type display device which includes a cathode panel having first electrodes and second electrodes and an anode panel, the cathode panel and the anode panel having spacers is provided. The method includes the steps of: in the non-display operation period of the flat-type display device, determining a normalized first current from a first current by non-display-driving the electron emitter areas near the spacers, and determining a normalized second current from a second current by non-display-driving the electron emitter areas which are not near the spacers; and in the actual display operation period of the flat-type display device, setting the driving conditions for the electron emitter areas on the basis of the normalized first current and normalized second current so that the electron emission conditions in the electron emitter areas near the spacers and not near the spacers are substantially the same.
摘要翻译：一种用于驱动平板显示装置的方法，其包括具有第一电极和第二电极的阴极面板和阳极面板，阴极面板和具有间隔物的阳极面板。该方法包括以下步骤：在平板型显示装置的非显示操作期间，通过不显示驱动间隔物附近的电子发射极区域，从第一电流确定归一化的第一电流，并且确定标准化的第二电流通过不显示驱动不在间隔物附近的电子发射体区域的第二电流的电流; 并且在平板显示装置的实际显示操作期间，根据归一化的第一电流和归一化的第二电流来设定电子发射区的驱动条件，使得靠近隔板的电子发射区中的电子发射条件并且不靠近间隔件基本相同。

2. 发明授权

US07750872B2 Method for driving a flat-type display device 失效
标题翻译：驱动平板式显示装置的方法
公开(公告)号：US07750872B2
公开(公告)日：2010-07-06
申请号：US11654507
申请日：2007-01-18
申请人： Yukinobu Iguchi , Hiroyuki Ikeda , Yasuhito Hatano , Kunihiko Nagamine
发明人： Yukinobu Iguchi , Hiroyuki Ikeda , Yasuhito Hatano , Kunihiko Nagamine
IPC分类号： G09G3/22
CPC分类号： G09G3/22 , G09G2300/0426 , G09G2300/0443 , G09G2300/0452 , G09G2320/0209 , G09G2320/0233 , G09G2320/0285 , G09G2330/021 , G09G2360/02
摘要： A method for driving a flat-type display device which includes a cathode panel having first electrodes and second electrodes and an anode panel, the cathode panel and the anode panel having spacers is provided. The method includes the steps of: in the non-display operation period of the flat-type display device, determining a normalized first current from a first current by non-display-driving the electron emitter areas near the spacers, and determining a normalized second current from a second current by non-display-driving the electron emitter areas which are not near the spacers; and in the actual display operation period of the flat-type display device, setting the driving conditions for the electron emitter areas on the basis of the normalized first current and normalized second current so that the electron emission conditions in the electron emitter areas near the spacers and not near the spacers are substantially the same.
摘要翻译：一种用于驱动平板显示装置的方法，其包括具有第一电极和第二电极的阴极面板和阳极面板，阴极面板和具有间隔物的阳极面板。该方法包括以下步骤：在平板型显示装置的非显示操作期间，通过不显示驱动间隔物附近的电子发射极区域，从第一电流确定归一化的第一电流，并且确定标准化的第二电流通过不显示驱动不在间隔物附近的电子发射体区域的第二电流的电流; 并且在平板显示装置的实际显示操作期间，根据归一化的第一电流和归一化的第二电流来设定电子发射区的驱动条件，使得靠近隔板的电子发射区中的电子发射条件并且不靠近间隔件基本相同。

3. 发明授权

US08885052B2 Unevenness inspection apparatus and unevenness inspection method 有权
标题翻译：不均匀检查装置和不均匀性检查方法
公开(公告)号：US08885052B2
公开(公告)日：2014-11-11
申请号：US13523546
申请日：2012-06-14
申请人： Kunihiko Nagamine , Satoshi Tomioka
发明人： Kunihiko Nagamine , Satoshi Tomioka
IPC分类号： H04N17/00 , H04N17/02 , G01J3/50 , G01J3/46
CPC分类号： G01J3/506 , G01J3/462 , H04N17/02
摘要： An unevenness inspection apparatus including: an image pickup section obtaining a pickup image of a test object; an image generating section generating each of a color unevenness inspection image and a luminance unevenness inspection image based on the pickup image; a calculating section calculating an evaluation parameter using both of the color unevenness inspection image and the luminance unevenness inspection image; and an inspecting section performing unevenness inspection using the calculated evaluation parameter. The calculating section calculates the evaluation parameter in consideration of unevenness visibility for both color and luminance.
摘要翻译：一种不均匀性检查装置，包括：图像拾取部件，其获得测试对象的拾取图像; 图像生成部，其基于所述拍摄图像生成颜色不均匀性检查图像和亮度不均匀性检查图像; 计算部，使用所述颜色不均匀检查图像和所述亮度不均匀检查图像两者来计算评价参数; 以及使用所计算的评价参数进行不均匀性检查的检查部。考虑到颜色和亮度两者的不均匀性可见度，计算部分计算评价参数。

4. 发明授权

US08941730B2 Color-unevenness inspection apparatus and method 有权
标题翻译：颜色不均匀性检查装置及方法
公开(公告)号：US08941730B2
公开(公告)日：2015-01-27
申请号：US13033417
申请日：2011-02-23
申请人： Kunihiko Nagamine , Satoshi Tomioka
发明人： Kunihiko Nagamine , Satoshi Tomioka
IPC分类号： H04N7/18 , G06T7/00
CPC分类号： G06T7/00 , H04N7/18
摘要： A color-unevenness inspection apparatus includes: an image pickup section picking up an image of an inspection target in a color-unevenness inspection; and an image generation section generating an uneven-color image by, in the picked-up image of the inspection target obtained by the image pickup section, calculating a chroma in each unit region and identifying an uneven-color region based on a magnitude of the calculated chroma. The color-unevenness inspection apparatus further includes: a calculation section calculating, for the uneven-color region in the uneven-color image, an evaluation parameter to be used in the color-unevenness inspection; and an inspection section performing the color-unevenness inspection based on the calculated evaluation parameter. The image generation section calculates the chroma, in each unit region of the picked-up image, while performing correction processing that reflects variations in color-unevenness visibility from color to color.
摘要翻译：颜色不均匀性检查装置包括：图像拾取部，其在颜色不均匀性检查中拾取检查对象的图像; 以及图像生成部，其通过由所述摄像部获得的所述检查对象的拍摄图像中的每个单位区域中的色度进行计算，基于所述图像生成部的大小来识别不均匀色区域，计算色度。颜色不均匀性检查装置还包括：计算部，针对不均匀色图像中的不均匀色区域计算要用于颜色不均匀性检查的评价参数; 以及检查部，其基于所计算的评价参数进行颜色不均匀性检查。图像生成部分在执行反映颜色到颜色的颜色不均匀性的变化的校正处理的同时，计算拾取图像的每个单位区域中的色度。

5. 发明申请

US20120327399A1 UNEVENNESS INSPECTION APPARATUS AND UNEVENNESS INSPECTION METHOD 有权
标题翻译：无障碍检查装置和无人检查方法
公开(公告)号：US20120327399A1
公开(公告)日：2012-12-27
申请号：US13523546
申请日：2012-06-14
申请人： Kunihiko Nagamine , Satoshi Tomioka
发明人： Kunihiko Nagamine , Satoshi Tomioka
IPC分类号： G01J3/50 , G01J1/44
CPC分类号： G01J3/506 , G01J3/462 , H04N17/02
摘要： An unevenness inspection apparatus including: an image pickup section obtaining a pickup image of a test object; an image generating section generating each of a color unevenness inspection image and a luminance unevenness inspection image based on the pickup image; a calculating section calculating an evaluation parameter using both of the color unevenness inspection image and the luminance unevenness inspection image; and an inspecting section performing unevenness inspection using the calculated evaluation parameter. The calculating section calculates the evaluation parameter in consideration of unevenness visibility for both color and luminance.
摘要翻译：一种不均匀性检查装置，包括：图像拾取部件，其获得测试对象的拾取图像; 图像生成部，其基于所述拍摄图像生成颜色不均匀性检查图像和亮度不均匀性检查图像; 计算部，使用所述颜色不均匀检查图像和所述亮度不均匀检查图像两者来计算评价参数; 以及使用所计算的评价参数进行不均匀性检查的检查部。考虑到颜色和亮度两者的不均匀性可见度，计算部分计算评价参数。

6. 发明申请

US20110216189A1 COLOR-UNEVENNESS INSPECTION APPARATUS AND METHOD 有权
标题翻译：彩色检测装置和方法
公开(公告)号：US20110216189A1
公开(公告)日：2011-09-08
申请号：US13033417
申请日：2011-02-23
申请人： Kunihiko Nagamine , Satoshi Tomioka
发明人： Kunihiko Nagamine , Satoshi Tomioka
IPC分类号： H04N7/18 , G06T7/00
CPC分类号： G06T7/00 , H04N7/18
摘要： A color-unevenness inspection apparatus includes: an image pickup section picking up an image of an inspection target in a color-unevenness inspection; and an image generation section generating an uneven-color image by, in the picked-up image of the inspection target obtained by the image pickup section, calculating a chroma in each unit region and identifying an uneven-color region based on a magnitude of the calculated chroma. The color-unevenness inspection apparatus further includes: a calculation section calculating, for the uneven-color region in the uneven-color image, an evaluation parameter to be used in the color-unevenness inspection; and an inspection section performing the color-unevenness inspection based on the calculated evaluation parameter. The image generation section calculates the chroma, in each unit region of the picked-up image, while performing correction processing that reflects variations in color-unevenness visibility from color to color.
摘要翻译：颜色不均匀性检查装置包括：图像拾取部，其在颜色不均匀性检查中拾取检查对象的图像; 以及图像生成部，其通过由所述摄像部获得的所述检查对象的拍摄图像中的每个单位区域中的色度进行计算，基于所述图像生成部的大小来识别不均匀色区域，计算色度。颜色不均匀性检查装置还包括：计算部，针对不均匀色图像中的不均匀色区域计算要用于颜色不均匀性检查的评价参数; 以及检查部，其基于所计算的评价参数进行颜色不均匀性检查。图像生成部分在执行反映颜色到颜色的颜色不均匀性的变化的校正处理的同时，计算拾取图像的每个单位区域中的色度。

7. 发明授权

US08520077B2 Color-unevenness inspection apparatus and method 失效
标题翻译：颜色不均匀性检查装置及方法
公开(公告)号：US08520077B2
公开(公告)日：2013-08-27
申请号：US12906646
申请日：2010-10-18
申请人： Kunihiko Nagamine , Satoshi Tomioka
发明人： Kunihiko Nagamine , Satoshi Tomioka
IPC分类号： H04N5/228 , H04N9/083 , H04N5/235 , H04N1/40 , G03B7/00 , G06F15/00 , G06K1/00 , G06K15/00 , G06K9/00
CPC分类号： H04N17/04 , H04N17/02
摘要： A color-unevenness inspection apparatus includes: an image pickup section picking up an image of an inspection target for a color-unevenness inspection; an image generation section generating an uneven-color image by determining one or more uneven-color regions existing in the picked-up image of the inspection target obtained by the image pickup section, and by classifying unit regions included in each of the uneven-color regions into a plurality of color groups; a calculation section calculating, on the uneven-color regions in the uneven-color image, an evaluation parameter to be used in the color-unevenness inspection; a correction section making a correction to the calculated evaluation parameter in consideration of a difference of color-unevenness visibility between the color groups; and an inspection section performing the color-unevenness inspection, based on a resultant evaluation parameter obtained by the correction.
摘要翻译：颜色不均匀性检查装置包括：摄像部，其拾取用于颜色不均匀检查的检查对象的图像; 图像生成部，其通过确定存在于由摄像部获得的检查对象的拍摄图像中存在的一个或多个不均匀色区域，并且将包含在每个不均匀颜色中的单位区域分类，生成不均匀色图像区域分成多个颜色组; 计算部，对所述不均匀色图像中的不均匀颜色区域计算要用于所述颜色不均匀性检查中的评价参数; 考虑到色组之间的颜色不均匀度可见度的差异，对所计算的评价参数进行校正的校正部分; 以及基于通过校正获得的得到的评价参数进行颜色不均匀性检查的检查部。

8. 发明申请

US20110096191A1 COLOR-UNEVENNESS INSPECTION APPARATUS AND METHOD 失效
标题翻译：彩色检测装置和方法
公开(公告)号：US20110096191A1
公开(公告)日：2011-04-28
申请号：US12906646
申请日：2010-10-18
申请人： Kunihiko Nagamine , Satoshi Tomioka
发明人： Kunihiko Nagamine , Satoshi Tomioka
IPC分类号： H04N9/73 , G06K9/00
CPC分类号： H04N17/04 , H04N17/02
摘要： A color-unevenness inspection apparatus includes: an image pickup section picking up an image of an inspection target for a color-unevenness inspection; an image generation section generating an uneven-color image by determining one or more uneven-color regions existing in the picked-up image of the inspection target obtained by the image pickup section, and by classifying unit regions included in each of the uneven-color regions into a plurality of color groups; a calculation section calculating, on the uneven-color regions in the uneven-color image, an evaluation parameter to be used in the color-unevenness inspection; a correction section making a correction to the calculated evaluation parameter in consideration of a difference of color-unevenness visibility between the color groups; and an inspection section performing the color-unevenness inspection, based on a resultant evaluation parameter obtained by the correction.
摘要翻译：颜色不均匀性检查装置包括：摄像部，其拾取用于颜色不均匀检查的检查对象的图像; 图像生成部，其通过确定存在于由摄像部获得的检查对象的拍摄图像中存在的一个或多个不均匀色区域，并且将包含在每个不均匀颜色中的单位区域分类，生成不均匀色图像区域分成多个颜色组; 计算部，对所述不均匀色图像中的不均匀颜色区域计算要用于所述颜色不均匀性检查中的评价参数; 考虑到色组之间的颜色不均匀度可见度的差异，对所计算的评价参数进行校正的校正部分; 以及基于通过校正获得的得到的评价参数进行颜色不均匀性检查的检查部。

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