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    • 1. 发明授权
    • Sample analysis method
    • 样品分析方法
    • US08514403B2
    • 2013-08-20
    • US13086759
    • 2011-04-14
    • Yuichi OgawaShinichiro HayashiSeiji KambaTakashi Kondo
    • Yuichi OgawaShinichiro HayashiSeiji KambaTakashi Kondo
    • G01B11/02
    • G01N21/3581G01N21/3563
    • A sample analysis method is provided for analyzing a sample having a permeability to terahertz radiation and accurately measure the composition, physical properties, mass and dimensions of a very small sample or a minute amount of sample by irradiating the sample with terahertz radiation. In the method, a reflective member is provided adjoining a first principal surface of the sample, an entrance member is provided adjoining a second principal surface of the sample, terahertz radiation is delivered from outside of entrance member towards the sample, and the sample is analyzed using an interference wave generated from a first-surface reflected wave at the interface between the first principal surface of the sample and the reflective member and a second-surface reflected wave at the interface between the second principal surface of the sample and the entrance member.
    • 提供样品分析方法,用于分析具有太赫兹辐射渗透性的样品,并通过用太赫兹辐射照射样品来精确测量非常小样品或微量样品的组成,物理性质,质量和尺寸。 在该方法中,邻接样品的第一主表面设置反射构件,邻接样品的第二主表面设置入口构件,将太赫兹辐射从入口构件的外部朝向样品传送,并分析样品 使用从样品的第一主表面和反射构件之间的界面处的第一表面反射波产生的干涉波和在样品的第二主表面与入口构件之间的界面处的第二表面反射波。
    • 2. 发明申请
    • SAMPLE ANALYSIS METHOD
    • 样本分析方法
    • US20110205528A1
    • 2011-08-25
    • US13086759
    • 2011-04-14
    • Yuichi OgawaShinichiro HayashiSeiji KambaTakashi Kondo
    • Yuichi OgawaShinichiro HayashiSeiji KambaTakashi Kondo
    • G01N21/55
    • G01N21/3581G01N21/3563
    • A sample analysis method is provided for analyzing a sample having a permeability to terahertz radiation and accurately measure the composition, physical properties, mass and dimensions of a very small sample or a minute amount of sample by irradiating the sample with terahertz radiation. In the method, a reflective member is provided adjoining a first principal surface of the sample, an entrance member is provided adjoining a second principal surface of the sample, terahertz radiation is delivered from outside of entrance member towards the sample, and the sample is analyzed using an interference wave generated from a first-surface reflected wave at the interface between the first principal surface of the sample and the reflective member and a second-surface reflected wave at the interface between the second principal surface of the sample and the entrance member.
    • 提供样品分析方法,用于分析具有太赫兹辐射渗透性的样品,并通过用太赫兹辐射照射样品来精确测量非常小样品或微量样品的组成,物理性质,质量和尺寸。 在该方法中,邻接样品的第一主表面设置反射构件,邻接样品的第二主表面设置入口构件,将太赫兹辐射从入口构件的外部朝向样品传送,并分析样品 使用从样品的第一主表面和反射构件之间的界面处的第一表面反射波产生的干涉波和在样品的第二主表面与入口构件之间的界面处的第二表面反射波。
    • 9. 发明授权
    • Method of measuring characteristics of specimen and flat-plate periodic structure
    • 测量样品和平板周期结构特征的方法
    • US08304732B2
    • 2012-11-06
    • US13405651
    • 2012-02-27
    • Seiji KambaKazuhiro TakigawaTakashi KondoKoji Tanaka
    • Seiji KambaKazuhiro TakigawaTakashi KondoKoji Tanaka
    • G01J5/02
    • G01N21/3581
    • A measuring method that includes holding a specimen to be measured on a flat-plate periodic structure, applying a linearly-polarized electromagnetic wave to the flat-plate periodic structure, detecting the electromagnetic wave scattered forward or backward by the flat-plate periodic structure, and measuring characteristics of the specimen on the basis of a phenomenon that a dip waveform appearing in a frequency characteristic of the forward-scattered electromagnetic wave or a peak waveform appearing in a frequency characteristic of the backward-scattered electromagnetic wave is changed with the presence of the specimen. The flat-plate periodic structure is a flat-plate structure in which at least two voids penetrating through the structure in a direction perpendicular to a principal surface thereof are periodically arrayed in at least one direction on the principal surface, and the electromagnetic wave is applied to the principal surface of the flat-plate periodic structure from the direction perpendicular to the principal surface.
    • 一种测量方法,其包括将平板周期性结构上的测量样本保持在平板周期结构上,对平板周期结构施加线性偏振电磁波,通过平板周期性结构检测前后散射的电磁波, 并根据出现在前向散射电磁波的频率特性中的下降波形或出现在后向散射电磁波的频率特性中的峰值波形发生变化的现象,测量样本的特性, 标本。 平板周期性结构是平板结构,其中在垂直于其主表面的方向上贯穿结构的至少两个空隙在主表面上沿至少一个方向周期性排列,并且施加电磁波 从垂直于主表面的方向到平板周期性结构的主表面。