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1. 发明授权

US08269967B2 Method for measuring characteristic of object to be measured, structure causing diffraction phenomenon, and measuring device 有权
$Method for measuring characteristic of object to be measured, structure causing diffraction phenomenon, and measuring device$
标题翻译：用于测量待测物体的特性的方法，引起衍射现象的结构和测量装置
公开(公告)号：US08269967B2
公开(公告)日：2012-09-18
申请号：US13239830
申请日：2011-09-22
申请人： Seiji Kamba , Takashi Kondo , Koji Tanaka , Kazuhiro Takigawa , Yuichi Ogawa
发明人： Seiji Kamba , Takashi Kondo , Koji Tanaka , Kazuhiro Takigawa , Yuichi Ogawa
IPC分类号： G01J3/28
CPC分类号： G01N21/4788 , G01N33/54373
摘要： A method of attaching an object to be measured to a structure causing a diffraction phenomenon; irradiating the structure to which the object to be measured is attached and which causes the diffraction phenomenon with an electromagnetic wave; detecting the electromagnetic wave scattered by the structure causing the diffraction phenomenon; and measuring a characteristic of the object to be measured from the frequency characteristic of the detected electromagnetic wave. The object to be measured is attached directly to the surface of the structure causing the diffraction phenomenon. Thus, the method for measuring the characteristic of an object to be measured exhibits an improved measurement sensitivity and high reproducibility. A structure causing a diffraction phenomenon and used for the method, and a measuring device are provided.
摘要翻译：将测量对象附着到引起衍射现象的结构的方法; 照射被测定对象物的结构，并用电磁波引起衍射现象; 检测由结构散射的电磁波引起的衍射现象; 并根据检测到的电磁波的频率特性来测量待测物体的特性。要测量的物体直接附着在结构的表面，引起衍射现象。因此，用于测量待测物体的特性的方法具有改进的测量灵敏度和高再现性。提供引起衍射现象并用于该方法的结构和测量装置。

2. 发明申请

US20120008142A1 METHOD FOR MEASURING CHARACTERISTIC OF OBJECT TO BE MEASURED, STRUCTURE CAUSING DIFFRACTION PHENOMENON, AND MEASURING DEVICE 有权
标题翻译：用于测量待测物体特征的方法，结构导致衍射原子和测量装置
公开(公告)号：US20120008142A1
公开(公告)日：2012-01-12
申请号：US13239830
申请日：2011-09-22
申请人： Seiji Kamba , Takashi Kondo , Koji Tanaka , Kazuhiro Takigawa , Yuichi Ogawa
发明人： Seiji Kamba , Takashi Kondo , Koji Tanaka , Kazuhiro Takigawa , Yuichi Ogawa
IPC分类号： G01J3/28
CPC分类号： G01N21/4788 , G01N33/54373
摘要： A method of attaching an object to be measured to a structure causing a diffraction phenomenon; irradiating the structure to which the object to be measured is attached and which causes the diffraction phenomenon with an electromagnetic wave; detecting the electromagnetic wave scattered by the structure causing the diffraction phenomenon; and measuring a characteristic of the object to be measured from the frequency characteristic of the detected electromagnetic wave. The object to be measured is attached directly to the surface of the structure causing the diffraction phenomenon. Thus, the method for measuring the characteristic of an object to be measured exhibits an improved measurement sensitivity and high reproducibility. A structure causing a diffraction phenomenon and used for the method, and a measuring device are provided.
摘要翻译：将测量对象附着到引起衍射现象的结构的方法; 照射被测定对象物的结构，并用电磁波引起衍射现象; 检测由结构散射的电磁波引起的衍射现象; 并根据检测到的电磁波的频率特性来测量待测物体的特性。要测量的物体直接附着在结构的表面，引起衍射现象。因此，用于测量待测物体的特性的方法具有改进的测量灵敏度和高再现性。提供引起衍射现象并用于该方法的结构和测量装置。

3. 发明授权

US09007578B2 Method for measurement of properties of analyte 有权
标题翻译：分析物性质的测定方法
公开(公告)号：US09007578B2
公开(公告)日：2015-04-14
申请号：US13398016
申请日：2012-02-16
申请人： Kazuhiro Takigawa , Takashi Kondo , Seiji Kamba , Yuichi Ogawa
发明人： Kazuhiro Takigawa , Takashi Kondo , Seiji Kamba , Yuichi Ogawa
IPC分类号： G01N21/25 , G01N21/3581
CPC分类号： G01N21/3581
摘要： A measurement method that includes irradiating a void-arranged structure on which an analyte has been held with an electromagnetic wave, detecting an electromagnetic wave scattered on the void-arranged structure, and determining a property of the analyte on the basis of at least one parameter, the parameter including the amount of change in the ratio of the detected electromagnetic wave to the irradiated electromagnetic wave at a specific frequency between the presence and the absence of the analyte.
摘要翻译： 1.一种测定方法，其特征在于，包括用电磁波照射被分析物保持的空隙排列结构，检测在所述空隙排列结构上散布的电磁波，并基于至少一个参数来确定分析物的性质，该参数包括在分析物的存在和不存在之间以特定频率检测到的电磁波与照射的电磁波的比率的变化量。

4. 发明申请

US20120137755A1 METHOD FOR MEASUREMENT OF PROPERTIES OF ANALYTE 有权
标题翻译：分析仪性质的测定方法
公开(公告)号：US20120137755A1
公开(公告)日：2012-06-07
申请号：US13398016
申请日：2012-02-16
申请人： Kazuhiro Takigawa , Takashi Kondo , Seiji Kamba , Yuichi Ogawa
发明人： Kazuhiro Takigawa , Takashi Kondo , Seiji Kamba , Yuichi Ogawa
IPC分类号： G01N29/02
CPC分类号： G01N21/3581
摘要： A measurement method that includes irradiating a void-arranged structure on which an analyte has been held with an electromagnetic wave, detecting an electromagnetic wave scattered on the void-arranged structure, and determining a property of the analyte on the basis of at least one parameter, the parameter including the amount of change in the ratio of the detected electromagnetic wave to the irradiated electromagnetic wave at a specific frequency between the presence and the absence of the analyte.
摘要翻译： 1.一种测定方法，其特征在于，包括用电磁波照射被分析物保持的空隙排列结构，检测在所述空隙排列结构上散布的电磁波，以及基于至少一个参数确定分析物的性质，该参数包括在分析物的存在和不存在之间以特定频率检测的电磁波与照射的电磁波的比率的变化量。

5. 发明授权

US08304732B2 Method of measuring characteristics of specimen and flat-plate periodic structure 有权
标题翻译：测量样品和平板周期结构特征的方法
公开(公告)号：US08304732B2
公开(公告)日：2012-11-06
申请号：US13405651
申请日：2012-02-27
申请人： Seiji Kamba , Kazuhiro Takigawa , Takashi Kondo , Koji Tanaka
发明人： Seiji Kamba , Kazuhiro Takigawa , Takashi Kondo , Koji Tanaka
IPC分类号： G01J5/02
CPC分类号： G01N21/3581
摘要： A measuring method that includes holding a specimen to be measured on a flat-plate periodic structure, applying a linearly-polarized electromagnetic wave to the flat-plate periodic structure, detecting the electromagnetic wave scattered forward or backward by the flat-plate periodic structure, and measuring characteristics of the specimen on the basis of a phenomenon that a dip waveform appearing in a frequency characteristic of the forward-scattered electromagnetic wave or a peak waveform appearing in a frequency characteristic of the backward-scattered electromagnetic wave is changed with the presence of the specimen. The flat-plate periodic structure is a flat-plate structure in which at least two voids penetrating through the structure in a direction perpendicular to a principal surface thereof are periodically arrayed in at least one direction on the principal surface, and the electromagnetic wave is applied to the principal surface of the flat-plate periodic structure from the direction perpendicular to the principal surface.
摘要翻译：一种测量方法，其包括将平板周期性结构上的测量样本保持在平板周期结构上，对平板周期结构施加线性偏振电磁波，通过平板周期性结构检测前后散射的电磁波，并根据出现在前向散射电磁波的频率特性中的下降波形或出现在后向散射电磁波的频率特性中的峰值波形发生变化的现象，测量样本的特性，标本。平板周期性结构是平板结构，其中在垂直于其主表面的方向上贯穿结构的至少两个空隙在主表面上沿至少一个方向周期性排列，并且施加电磁波从垂直于主表面的方向到平板周期性结构的主表面。

6. 发明申请

US20130011935A1 METHOD OF MEASURING CHARACTERISTICS OF SPECIMEN AND SENSING DEVICE FOR USE WITH THE SAME 审中-公开
标题翻译：测量样品和传感装置特性的方法与其使用
公开(公告)号：US20130011935A1
公开(公告)日：2013-01-10
申请号：US13616805
申请日：2012-09-14
申请人： Koji Tanaka , Seiji Kamba , Takashi Kondo , Kazuhiro Takigawa , Yoshiko Miura
发明人： Koji Tanaka , Seiji Kamba , Takashi Kondo , Kazuhiro Takigawa , Yoshiko Miura
IPC分类号： G01N21/35
CPC分类号： G01N21/3581 , G01N2021/3595
摘要： A method of measuring characteristics of a specimen, the measuring method including the steps of bonding the specimen to a host molecule on a sensing device, emitting an electromagnetic wave of a particular frequency to the sensing device to which the specimen is bonded, measuring a frequency characteristic of the transmitted or reflected light, and measuring the characteristics of the specimen based on a change of the frequency characteristic, wherein an absorbance of the host molecule per unit quantity at the particular frequency is smaller than that of the specimen.
摘要翻译：一种测定试样的特性的方法，所述测定方法包括以下步骤：将试样与检测装置上的主体分子接合，将特定频率的电磁波发射到所述检体所接合的检测装置，测定频率透射或反射光的特性，并且基于频率特性的变化来测量样品的特性，其中在特定频率下每单位量的主体分子的吸光度小于样品的吸光度。

7. 发明申请

US20120153159A1 Method of Measuring Characteristics of Specimen and Flat-Plate Periodic Structure 有权
标题翻译：测量样品和平板周期结构特征的方法
公开(公告)号：US20120153159A1
公开(公告)日：2012-06-21
申请号：US13405651
申请日：2012-02-27
申请人： Seiji Kamba , Kazuhiro Takigawa , Takashi Kondo , Koji Tanaka
发明人： Seiji Kamba , Kazuhiro Takigawa , Takashi Kondo , Koji Tanaka
IPC分类号： G01J5/10
CPC分类号： G01N21/3581
摘要： A measuring method that includes holding a specimen to be measured on a flat-plate periodic structure, applying a linearly-polarized electromagnetic wave to the flat-plate periodic structure, detecting the electromagnetic wave scattered forward or backward by the flat-plate periodic structure, and measuring characteristics of the specimen on the basis of a phenomenon that a dip waveform appearing in a frequency characteristic of the forward-scattered electromagnetic wave or a peak waveform appearing in a frequency characteristic of the backward-scattered electromagnetic wave is changed with the presence of the specimen. The flat-plate periodic structure is a flat-plate structure in which at least two voids penetrating through the structure in a direction perpendicular to a principal surface thereof are periodically arrayed in at least one direction on the principal surface, and the electromagnetic wave is applied to the principal surface of the flat-plate periodic structure from the direction perpendicular to the principal surface.
摘要翻译：一种测量方法，其包括将平板周期性结构上的测量样本保持在平板周期结构上，对平板周期结构施加线性偏振电磁波，通过平板周期性结构检测前后散射的电磁波，并根据出现在前向散射电磁波的频率特性中的下降波形或出现在后向散射电磁波的频率特性中的峰值波形发生变化的现象，测量样本的特性，标本。平板周期性结构是平板结构，其中在垂直于其主表面的方向上贯穿结构的至少两个空隙在主表面上沿至少一个方向周期性排列，并且施加电磁波从垂直于主表面的方向到平板周期性结构的主表面。

8. 发明授权

US09063078B2 Method and apparatus for measuring characteristics of object 有权
标题翻译：测量物体特性的方法和装置
公开(公告)号：US09063078B2
公开(公告)日：2015-06-23
申请号：US13530188
申请日：2012-06-22
申请人： Takashi Kondo , Kazuhiro Takigawa , Seiji Kamba , Ryoichi Fukasawa , Tomofumi Ikari
发明人： Takashi Kondo , Kazuhiro Takigawa , Seiji Kamba , Ryoichi Fukasawa , Tomofumi Ikari
IPC分类号： G01N22/00 , G01N21/3581 , G01N22/04 , G01N22/02 , G01N21/03 , G01N21/3563
CPC分类号： G01N21/3581 , G01N21/3563 , G01N22/00 , G01N22/02 , G01N22/04 , G01N2021/0339
摘要： A measuring method for measuring characteristics of an object to be measured, the measuring method including holding the object on a void-arranged structure having at least two void portions that pass therethrough in a direction perpendicular to a principal surface thereof, and applying electromagnetic waves to the void-arranged structure on which the object is held to detect frequency characteristics of the electromagnetic waves transmitted through the void-arranged structure. The void-arranged structure has a grid structure in which the void portions are periodically arranged in at least one direction on the principal surface of the void-arranged structure. The characteristics of the object are measured on the basis of a relationship between a first frequency characteristic and a second frequency characteristic.
摘要翻译：一种用于测量待测物体的特性的测量方法，所述测量方法包括将物体保持在具有至少两个沿垂直于其主表面的方向穿过的空隙部分的空隙布置结构上，并将电磁波施加到保持物体的空间排列结构以检测透过空隙排列结构的电磁波的频率特性。空隙排列结构具有栅格结构，其中空隙部分在空间排列结构的主表面上沿至少一个方向周期性地布置。基于第一频率特性和第二频率特性之间的关系来测量对象的特性。

9. 发明申请

US20120262190A1 Method and Apparatus for Measuring Characteristics of Object 有权
标题翻译：测量物体特性的方法和装置
公开(公告)号：US20120262190A1
公开(公告)日：2012-10-18
申请号：US13530188
申请日：2012-06-22
申请人： Takashi Kondo , Kazuhiro Takigawa , Seiji Kamba , Ryoichi Fukazawa , Tomofumi Ikari
发明人： Takashi Kondo , Kazuhiro Takigawa , Seiji Kamba , Ryoichi Fukazawa , Tomofumi Ikari
IPC分类号： G01R27/04
CPC分类号： G01N21/3581 , G01N21/3563 , G01N22/00 , G01N22/02 , G01N22/04 , G01N2021/0339
摘要： A measuring method for measuring characteristics of an object to be measured, the measuring method including holding the object on a void-arranged structure having at least two void portions that pass therethrough in a direction perpendicular to a principal surface thereof, and applying electromagnetic waves to the void-arranged structure on which the object is held to detect frequency characteristics of the electromagnetic waves transmitted through the void-arranged structure. The void-arranged structure has a grid structure in which the void portions are periodically arranged in at least one direction on the principal surface of the void-arranged structure. The characteristics of the object are measured on the basis of a relationship between a first frequency characteristic and a second frequency characteristic.
摘要翻译：一种用于测量待测物体的特性的测量方法，所述测量方法包括将物体保持在具有至少两个沿垂直于其主表面的方向穿过的空隙部分的空隙布置结构上，并将电磁波施加到保持物体的空间排列结构以检测透过空隙排列结构的电磁波的频率特性。空隙排列结构具有栅格结构，其中空隙部分在空间排列结构的主表面上沿至少一个方向周期性地布置。基于第一频率特性和第二频率特性之间的关系来测量对象的特性。

10. 发明申请

US20120126123A1 Method of Measuring Characteristics of Specimen, Measuring Device, and Filter Device 审中-公开
标题翻译：测量样品，测量装置和过滤装置特性的方法
公开(公告)号：US20120126123A1
公开(公告)日：2012-05-24
申请号：US13359609
申请日：2012-01-27
申请人： Takashi Kondo , Kazuhiro Takigawa , Seiji Kamba
发明人： Takashi Kondo , Kazuhiro Takigawa , Seiji Kamba
IPC分类号： G01J5/00 , G02B5/20
CPC分类号： G01N21/3581
摘要： A method of measuring specimen characteristics that includes holding a specimen on a gap array structure that includes gaps regularly arrayed in at least one array direction, applying a linearly-polarized electromagnetic wave to the gap array structure on which the specimen is held, detecting the electromagnetic wave scattered by the gap array structure, and measuring characteristics of the specimen based on a frequency characteristic of the detected scattered electromagnetic wave, wherein a polarizing direction of the linearly-polarized electromagnetic wave and a principal surface of the gap array structure are not parallel to each other.
摘要翻译：一种测量样本特性的方法，包括将样本保持在间隙阵列结构上，所述间隙阵列结构包括沿至少一个阵列方向规则排列的间隙，将线性极化电磁波施加到其上保持有样本的间隙阵列结构，检测电磁通过间隙阵列结构散射的波，并且基于检测到的散射电磁波的频率特性来测量样本的特性，其中线偏振电磁波的偏振方向和间隙阵列结构的主表面不平行于彼此。

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