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1. 发明授权

US5740333A Image processing method and image processing apparatus for converting an inputted color image into a two-color image 失效
标题翻译：用于将输入的彩色图像转换成双色图像的图像处理方法和图像处理装置
公开(公告)号：US5740333A
公开(公告)日：1998-04-14
申请号：US428990
申请日：1995-04-26
申请人： Anki Yoh , Kouichi Kamon , Masaaki Ito , Yoshiyuki Namizuka , Hiroyuki Kawamoto , Takeharu Tone
发明人： Anki Yoh , Kouichi Kamon , Masaaki Ito , Yoshiyuki Namizuka , Hiroyuki Kawamoto , Takeharu Tone
IPC分类号： H04N1/46 , G06T1/00 , G06T7/00 , H04N1/40 , H04N1/56 , G06F15/00 , G03F3/08
CPC分类号： H04N1/40012 , H04N1/56
摘要： With the present invention, an inputted color image is separated to image signals for three colors of Red, Green and Blue, determination is made as to whether a remarked pixel is for a specified color or not according to the image signals for the separated three colors, brightness data for the inputted color image is detected, determination is made as to whether a remarked pixel is for a white color or a black color depending on the detected brightness data, a pixel determined as for a specified color is converted to a specified color, and a pixel determined as not for a specified color is converted to a white color or a black color according to a result of determination as to whether the remarked pixel is for a white color or a black color, so that a separation area for a specified color can clearly be defined.
摘要翻译：利用本发明，将输入的彩色图像分离成红色，绿色和蓝色三种颜色的图像信号，根据分离的三种颜色的图像信号确定是否为特定颜色指定颜色，检测输入的彩色图像的亮度数据，根据检测到的亮度数据确定是否针对白色或黑色表示的像素，将针对指定颜色确定的像素转换为指定的颜色并且根据关于该标记像素是白色还是黑色的确定结果将被确定为不是针对指定颜色的像素转换为白色或黑色，从而使得用于指定的颜色可以明确定义。

2. 发明授权

US5715070A Freely configurable image processing apparatus 失效
标题翻译：可自由配置的图像处理设备
公开(公告)号：US5715070A
公开(公告)日：1998-02-03
申请号：US429273
申请日：1995-04-25
申请人： Takeharu Tone , Kouichi Kamon , Masaaki Ito , Yoshiyuki Namizuka , Hiroyuki Kawamoto , Anki Yoh
发明人： Takeharu Tone , Kouichi Kamon , Masaaki Ito , Yoshiyuki Namizuka , Hiroyuki Kawamoto , Anki Yoh
IPC分类号： G06T1/20 , H04N1/00 , H04N1/32 , G03G21/00 , G06F15/00 , H04N1/40
CPC分类号： H04N1/32577 , G06T1/20 , H04N1/32561 , H04N1/32582 , H04N1/32587 , H04N1/32603 , H04N1/00204 , H04N2201/0081 , H04N2201/0082 , H04N2201/0086 , H04N2201/0087
摘要： A freely configurable image processing apparatus comprises a plurality of processing sections each executing a specified processing to a digital image signal; namely a scanner section, a shading section, a filter section, an image size changing section, a .gamma.-conversion section, a tone processing section, an editorial section, a storage section, an external interface section, a printing section, and a plot section, wherein a sequence of processing by these processing section can freely be changed by a selector control section according to an instruction from a main control section by switching a mains elector and an out selector connected to each processing section.
摘要翻译：一种可自由配置的图像处理装置，包括：对数字图像信号执行指定处理的多个处理部; 即扫描器部分，阴影部分，过滤部分，图像尺寸改变部分，伽玛转换部分，色调处理部分，编辑部分，存储部分，外部接口部分，打印部分和图形其中，通过切换连接到每个处理部分的主电源和输出选择器，根据来自主控制部分的指令，这些处理部分的处理序列可以由选择器控制部分自由地改变。

3. 发明授权

US5687006A Image regenerating apparatus having improved character resolution and pattern gradation 失效
标题翻译：具有改善的字符分辨率和图案等级的图像再生装置
公开(公告)号：US5687006A
公开(公告)日：1997-11-11
申请号：US428305
申请日：1995-04-26
申请人： Yoshiyuki Namizuka , Kouichi Kamon , Masaaki Ito , Hiroyuki Kawamoto , Anki Yoh , Takeharu Tone
发明人： Yoshiyuki Namizuka , Kouichi Kamon , Masaaki Ito , Hiroyuki Kawamoto , Anki Yoh , Takeharu Tone
IPC分类号： H04N1/40
CPC分类号： H04N1/40062
摘要： In order to realize reduction of product cost without deteriorating quality of a regenerated image, there is provided by the present invention an image regenerating apparatus comprising an emphasizing unit for filtering an image for emphasis, a smoothing unit for filtering image for smoothing, an area determinator for determining a character area and a photograph area of an image, selecting said emphasizing unit for said character area and also selecting said smoothing unit for said photograph area, an image size changing unit for changing size of an image according to a set image size changing ratio, and a controller for providing control so that said area determinator executes specified selection when an image size changing ratio set by said image size changing unit is equal to or larger than a specified magnification ratio.
摘要翻译：为了实现降低产品成本而不降低再生图像的质量，本发明提供了一种图像再生装置，包括用于对强调图像进行滤波的加强单元，用于滤波图像以进行平滑处理的平滑单元，区域确定器用于确定图像的字符区域和照片区域，为所述字符区域选择所述加强单元，并且还为所述照片区域选择所述平滑单元，图像尺寸改变单元，用于根据设置的图像尺寸改变来改变图像的尺寸比例的控制器和用于提供控制的控制器，使得当由所述图像尺寸改变单元设置的图像尺寸变化率等于或大于指定放大率时，所述区域确定器执行指定的选择。

4. 发明授权

US5892852A Image processing apparatus 失效
标题翻译：图像处理装置
公开(公告)号：US5892852A
公开(公告)日：1999-04-06
申请号：US834849
申请日：1997-04-10
申请人： Yoshiyuki Namizuka , Kouichi Kamon , Masaaki Ito , Hiroyuki Kawamoto , AnQi Ye , Takeharu Tone
发明人： Yoshiyuki Namizuka , Kouichi Kamon , Masaaki Ito , Hiroyuki Kawamoto , AnQi Ye , Takeharu Tone
IPC分类号： H04N1/40 , G06T5/00 , G06T5/20 , H04N1/405
CPC分类号： H04N1/40062 , H04N1/405
摘要： An image processing apparatus includes a converter for reading out a manuscript image signal and converting the read-out signal to an electric signal. A signal processor executes signal processing for the electric signal, and an image generator generates an image in accordance with the processed signal. An outputting unit separates a character area and a photograph area of the manuscript from the read-out signal and outputs an area signal. A changing-over circuit changes over a filtering process in accordance with the area signal. A halftone processor executes in parallel a halftone process for the character area image and a halftone process for the photograph area image, and the changing-over circuit selectively changes over the halftone processing result for the character and the halftone processing result in accordance with the area signal.
摘要翻译：图像处理装置包括用于读出原稿图像信号并将读出的信号转换为电信号的转换器。信号处理器对电信号执行信号处理，并且图像发生器根据处理的信号生成图像。输出单元从读出的信号中分离原稿的字符区域和照片区域，并输出区域信号。转换电路根据区域信号改变滤波处理。半色调处理器并行执行用于字符区域图像的半色调处理和用于照片区域图像的半色调处理，并且转换电路根据区域选择性地改变字符的半色调处理结果和半色调处理结果信号。

5. 发明申请

US20140198321A1 SURFACE SHAPE MEASURING APPARATUS 有权
标题翻译：表面形状测量装置
公开(公告)号：US20140198321A1
公开(公告)日：2014-07-17
申请号：US14240669
申请日：2012-07-27
申请人： Masaaki Ito , Takahiro Jingu , Hisashi Hatano
发明人： Masaaki Ito , Takahiro Jingu , Hisashi Hatano
IPC分类号： G01B11/24 , G01N21/55
CPC分类号： G01B11/303 , G01B11/24 , G01B2210/56 , G01N21/4738 , G01N21/55 , G01N21/9501 , G01N2201/12
摘要： In related art, consideration is not given to that a spatial distribution of scattered light changes in various direction such as forward/backward/sideways according to a difference in micro roughness. Particularly, although a step-terrace structure appearing on an epitaxial growth wafer produces anisotropy in the scattered light distribution, consideration is not given to this point in the related art. The invention includes a process in which light is illuminated to a sample surface, plural detection optical systems mutually different in directions of optical axes detect a spatial distribution of scattered light, and a spatial frequency spectrum of the sample surface is calculated.
摘要翻译：在现有技术中，不考虑散射光的空间分布根据微粗糙度的差异而在各种方向如前后/侧面变化。特别地，虽然出现在外延生长晶片上的台阶平台结构在散射光分布中产生各向异性，但是在现有技术中没有考虑到这一点。本发明包括将光照射到样品表面的方法，在光轴方向上彼此不同的多个检测光学系统检测散射光的空间分布，并且计算样品表面的空间频谱。

6. 发明申请

US20130286191A1 INSPECTION APPARATUS 有权
标题翻译：检查装置
公开(公告)号：US20130286191A1
公开(公告)日：2013-10-31
申请号：US13997496
申请日：2011-11-02
申请人： Masaaki Ito , Hidetoshi Nishimura , Takahiro Jingu
发明人： Masaaki Ito , Hidetoshi Nishimura , Takahiro Jingu
IPC分类号： H04N7/18
CPC分类号： H04N7/18 , G01N21/47 , G01N21/9501 , G01N21/956 , H01L22/12 , H01L2924/0002 , H01L2924/00
摘要： In a defect inspecting apparatus, the strength of a fatal defect signal decreases due to miniaturization. Thus, in order to assure a high SN ratio, it is necessary to reduce noises caused by scattered light from a wafer. Roughness of a pattern edge and surface roughness which serve as a scattered-light source are spread over the entire wafer. The present invention has discovered the fact that reduction of an illuminated area is a technique effective for decreasing noises. That is to say, the present invention has discovered the fact that creation of an illuminated area having a spot shape and reduction of the dimension of a spot beam are effective. A plurality of temporally and spatially divided spot beams are radiated to the wafer serving as a sample.
摘要翻译：在缺陷检查装置中，致命缺陷信号的强度由于小型化而降低。因此，为了确保高的SN比，需要减少由晶片散射的光产生的噪声。用作散射光源的图案边缘和表面粗糙度的粗糙度分布在整个晶片上。本发明已经发现，减少照明区域是有效降低噪声的技术。也就是说，本发明已经发现了具有斑点形状的照明区域的创建和点光束的尺寸的减小的事实是有效的。将多个时间上和空间上分开的光束照射到作为样品的晶片。

7. 发明申请

US20130250297A1 INSPECTION APPARATUS AND INSPECTION SYSTEM 审中-公开
标题翻译：检查装置和检查系统
公开(公告)号：US20130250297A1
公开(公告)日：2013-09-26
申请号：US13990103
申请日：2011-10-11
申请人： Masaaki Ito , Minori Noguchi
发明人： Masaaki Ito , Minori Noguchi
IPC分类号： G01N21/95
CPC分类号： G01N21/9501 , G01N21/95607
摘要： Disclosed here is a macro inspection apparatus for a sample such as a semiconductor wafer having a pattern formed thereon, the apparatus being capable of detecting abnormalities in dimension and size with high sensitivity.The inspection apparatus for a sample having pattern formed thereon includes: an illumination optical system which illuminates the sample having the pattern formed thereon; a detection optical system which receives scattered light from the pattern; an imaging device which is disposed over a pupil plane of the detection optical system, the imaging device acquiring Fourier images of the pattern; and a processing unit which compares the Fourier images with the Fourier image of the normal pattern to detect an irregularity of the pattern.
摘要翻译：这里公开了一种用于诸如其上形成有图案的半导体晶片的样品的宏观检查装置，该装置能够以高灵敏度检测尺寸和尺寸的异常。用于其上形成有图案的样品的检查装置包括：照射具有形成在其上的图案的样品的照明光学系统; 检测光学系统，其接收来自图案的散射光; 成像装置，其设置在所述检测光学系统的光瞳平面上，所述成像装置获取所述图案的付里叶图像; 以及处理单元，其将傅立叶图像与正常图案的傅里叶图像进行比较，以检测图案的不规则性。

8. 发明授权

US07819159B2 Substrate assembly apparatus and substrate assembly method 有权
标题翻译：基板装配装置和基板装配方法
公开(公告)号：US07819159B2
公开(公告)日：2010-10-26
申请号：US11439953
申请日：2006-05-25
申请人： Masaaki Ito , Yukinori Nakayama , Tatsuharu Yamamoto , Hiroaki Imai
发明人： Masaaki Ito , Yukinori Nakayama , Tatsuharu Yamamoto , Hiroaki Imai
IPC分类号： B29C65/00 , B32B37/00
CPC分类号： G02F1/1341 , G02F1/1303 , G02F2001/133354 , G02F2001/13415 , G02F2202/28
摘要： A bonding apparatus, suitable for accurately bonding large substrates for a liquid crystal display, includes Z-axis drive mechanisms, and upper and lower chambers. The Z-axis drive mechanisms for moving an upper frame vertically are disposed at four corners of a mount. The upper chamber is supported by the upper frame and has an upper table inside. The lower chamber has a lower table inside and is supported on the mount. The upper and lower chambers are united through a seal ring to define a vacuum chamber. Moving the upper frame moves the upper chamber vertically to open or close the vacuum chamber. The lower table is supported via a free joint stage between the plurality of support legs and the table, and is moved horizontally by a side thrust mechanism disposed outside of the vacuum chamber.
摘要翻译：适合于将液晶显示器的大基板精确地接合的接合装置包括Z轴驱动机构和上下室。用于垂直移动上框架的Z轴驱动机构设置在底座的四个角处。上部腔室由上部框架支撑，内部具有上部工作台。下腔室内有一个较低的台面，并支撑在支架上。上部和下部腔室通过密封环联合以限定真空室。移动上框架使上室垂直移动以打开或关闭真空室。下表通过多个支撑腿和台之间的自由关节台支撑，并且通过设置在真空室外部的侧推力机构水平移动。

9. 发明授权

US07746659B2 Electro-optical device and electronic apparatus 有权
标题翻译：电光装置和电子设备
公开(公告)号：US07746659B2
公开(公告)日：2010-06-29
申请号：US12072165
申请日：2008-02-25
申请人： Masaaki Ito
发明人： Masaaki Ito
IPC分类号： H05K1/18
CPC分类号： G02F1/13452 , G02F1/133385
摘要： The invention provides a heat dissipater such as a heat dissipation member that dissipates heat of an integrated circuit that is formed on a flexible substrate such as a flexible printed circuit board. The heat dissipater according to an aspect of the invention includes; a main body section that is formed in the shape of a hollow sleeve in such a manner that the flexible substrate can be inserted through and inserted inside the main body section; and an adhering section that is formed on an inner surface of the main body section in such a manner that the main body section and the integrated circuit are adhered to each other via the adhering section.
摘要翻译：本发明提供一种散热器，例如散热构件，其散热形成在诸如柔性印刷电路板的柔性基板上的集成电路的热量。根据本发明的一个方面的散热器包括：主体部，其形成为中空套筒的形状，使得柔性基板能够插入并插入到主体部内; 以及粘附部，其以主体部和集成电路经由粘接部彼此粘合形成在主体部的内表面上。

10. 发明申请

US20090202138A1 INSPECTION APPARATUS 有权
标题翻译：检查装置
公开(公告)号：US20090202138A1
公开(公告)日：2009-08-13
申请号：US12361954
申请日：2009-01-29
申请人： Masaaki Ito , Minori Noguchi , Shigeru Matsui
发明人： Masaaki Ito , Minori Noguchi , Shigeru Matsui
IPC分类号： G06K9/00
CPC分类号： G01N21/9501 , G01N21/95623 , G01N2021/8822 , G06K9/74
摘要： The present invention provides an inspection apparatus having a high throughput and high sensitivity with respect to a number of various manufacturing processes and defects of interest in inspection of a specimen such as a semiconductor wafer on which a pattern is formed. The apparatus illuminates with light the specimen having the pattern formed thereon, forms an image of the specimen on an image sensor through a reflective optics, and determines the existence/nonexistence of a defect. The reflective optics has a conjugate pair of Fourier transform optics. An aberration of the reflective optics is corrected off-axis. The reflective optics has a field of view in non-straight-line slit form on the specimen surface. Also, the optics is of a reflection type, includes a conjugate pair of Fourier transform optics and has a field of view in non-straight-line slit form. An optimum wavelength band is selected according to the specimen (FIG. 1).
摘要翻译：本发明提供了一种检测装置，其相对于在其上形成有图案的半导体晶片的样本的检查中的多种制造工艺和多个不同的制造工艺和缺陷而具有高生产率和高灵敏度。该装置用光照射具有形成在其上的图案的样本，通过反射光学元件在图像传感器上形成样本的图像，并且确定缺陷的存在/不存在。反射光学器件具有傅立叶变换光学器件的共轭对。反射光学器件的像差被偏离校正。反射光学元件在样品表面上具有非直线狭缝形式的视场。此外，光学器件是反射型的，包括傅立叶变换光学器件的共轭对，并且具有非直线狭缝形式的视场。根据样品选择最佳波长带（图1）。

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