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1. 发明授权

US07450685B2 X-ray fluorescence spectrometer and program for use therewith 失效
标题翻译： X射线荧光光谱仪及其使用的程序
公开(公告)号：US07450685B2
公开(公告)日：2008-11-11
申请号：US11581487
申请日：2006-10-17
申请人： Yoshiyuki Kataoka , Hisayuki Kohno , Masatsugu Kuraoka , Takashi Shoji , Yasujiro Yamada
发明人： Yoshiyuki Kataoka , Hisayuki Kohno , Masatsugu Kuraoka , Takashi Shoji , Yasujiro Yamada
IPC分类号： G01N23/223
CPC分类号： G01N23/223 , G01N2223/076
摘要： A scanning X-ray fluorescence spectrometer includes a quantitatively analyzing device (18) which calculates the concentration of hexavalent chrome based on the fact that the peak spectroscopic angle, at which the maximum intensity is attained in Cr—Kα line (22), changes depending on the ratio of the concentration of the hexavalent chrome vs. the concentration of the intensity of the total chrome. A plurality of detecting device (23) having different resolutions as a combination of a divergence slit (11), a spectroscopic device (6), a receiving slit (20) and a detector (8) is provided such that when the change of the peak spectroscopic angle is to be detected, a detecting device (23B) having a higher resolution than that of the detecting device (23A), which is selected when the concentration or the intensity of the total chrome is to be determined, is selected.
摘要翻译：扫描X射线荧光光谱仪包括：计算六价铬浓度的定量分析装置（18），其基于在Cr-Kalpha线（22）中获得的最大强度的峰值分光角随着取决于关于六价铬的浓度与总铬的强度的浓度的比率。具有分散狭缝（11），分光装置（6），接收狭缝（20）和检测器（8）的组合的具有不同分辨率的多个检测装置（23）被设置成使得当要检测峰值分光角度，选择当要确定总铬的浓度或强度时选择的具有比检测装置（23A）高的分辨率的检测装置（23B）。

2. 发明申请

US20070086567A1 X-ray fluorescence spectrometer and program for use therewith 失效
标题翻译： X射线荧光光谱仪及其使用的程序
公开(公告)号：US20070086567A1
公开(公告)日：2007-04-19
申请号：US11581487
申请日：2006-10-17
申请人： Yoshiyuki Kataoka , Hisayuki Kohno , Masatsugu Kuraoka , Takashi Shoji , Yasujiro Yamada
发明人： Yoshiyuki Kataoka , Hisayuki Kohno , Masatsugu Kuraoka , Takashi Shoji , Yasujiro Yamada
IPC分类号： G01N23/223 , G01T1/36
CPC分类号： G01N23/223 , G01N2223/076
摘要： A scanning X-ray fluorescence spectrometer includes a quantitatively analyzing device (18) which calculates the concentration of hexavalent chrome based on the fact that the peak spectroscopic angle, at which the maximum intensity is attained in Cr-Kα line (22), changes depending on the ratio of the concentration of the hexavalent chrome vs. the concentration of the intensity of the total chrome. A plurality of detecting device (23) having different resolutions as a combination of a divergence slit (11), a spectroscopic device (6), a receiving slit (20) and a detector (8) is provided such that when the change of the peak spectroscopic angle is to be detected, a detecting device (23B) having a higher resolution than that of the detecting device (23A), which is selected when the concentration or the intensity of the total chrome is to be determined, is selected.
摘要翻译：扫描X射线荧光光谱仪包括：计算六价铬浓度的定量分析装置（18），其基于在Cr-Kalpha线（22）中获得的最大强度的峰值分光角随着取决于关于六价铬的浓度与总铬的强度的浓度的比率。具有分散狭缝（11），分光装置（6），接收狭缝（20）和检测器（8）的组合的具有不同分辨率的多个检测装置（23）被设置成使得当要检测峰值分光角度，选择当要确定总铬的浓度或强度时选择的具有比检测装置（23A）高的分辨率的检测装置（23B）。

3. 发明授权

US07356114B2 X-ray fluorescence spectrometer 有权
标题翻译： X射线荧光光谱仪
公开(公告)号：US07356114B2
公开(公告)日：2008-04-08
申请号：US11531481
申请日：2006-09-13
申请人： Yoshiyuki Kataoka , Eiichi Furusawa , Hisayuki Kohno
发明人： Yoshiyuki Kataoka , Eiichi Furusawa , Hisayuki Kohno
IPC分类号： G01N23/223
CPC分类号： G01B15/02 , G01N23/223 , G01N2223/076
摘要： An X-ray fluorescence spectrometer includes an X-ray source 7 for irradiating a sample 1 at a predetermined incident angle ø with primary X-rays 6, and a detecting device 9 for measuring an intensity of fluorescent X-rays 8 generated from the sample at a predetermined detection angle α and β, wherein with two combinations of the incident angle ø and the detection angle α and β, in which combinations the incident angles ø and/or the detection angles α and β are different from each other, each intensity of the fluorescent X-rays 8 is measured and, also, the incident angle ø and the detection angle α and β in each of the combination are so set that with respect to a measurement depth represented by the coating weight, at which the intensity of the fluorescent X-rays 8 attains a value equal to 99% of the uppermost limit when the coating weight of a target coating to be measured is increased, respective measurement depths in the two combinations may be a value greater than the coating weight of a coating 3.
摘要翻译： X射线荧光光谱仪包括用于以一次X射线6以预定的入射角Θ照射样品1的X射线源7和用于测量从样品产生的荧光X射线8的强度的检测装置9 在预定的检测角α和β处，其中入射角ψ和检测角α和β的两个组合的入射角ψ和/或检测角α和β彼此不同的组合中的每一个强度测量荧光X射线8，并且每个组合中的入射角ø和检测角α和β被设定为相对于由涂层重量表示的测量深度，其中强度当测量的目标涂层的涂层重量增加时，荧光X射线8达到等于上限的99％的值，两种组合中的测量深度可以是val ue大于涂层的涂层重量3。

4. 发明授权

US07949093B2 X-ray fluorescence spectrometer 有权
标题翻译： X射线荧光光谱仪
公开(公告)号：US07949093B2
公开(公告)日：2011-05-24
申请号：US12296383
申请日：2006-11-24
申请人： Yoshiyuki Kataoka , Hisayuki Kohno , Noboru Yamashita , Makoto Doi
发明人： Yoshiyuki Kataoka , Hisayuki Kohno , Noboru Yamashita , Makoto Doi
IPC分类号： G01N23/223
CPC分类号： G01N23/223 , G01N2223/076
摘要： An X-ray fluorescence spectrometer for measuring the concentration of sulfur contained in a sample (S), by irradiating the sample (S) with primary X-rays from an X-ray tube (11), monochromating fluorescent X-rays emitted from the sample (S) with a spectroscopic device, and detecting monochromated fluorescent X-rays with an X-ray detector. The spectrometer includes the X-ray tube (11) having a target with an element including chromium, an X-ray filter (13) disposed on a path of travel of X-rays between the X-ray tube (11) and the sample (S) and having a predetermined transmittance for Cr—Kα line from the X-ray tube (11) and made of a material which is an element of which absorption edges do not exist between energies of S—Kα line and Cr—Kα line, and a proportional counter (18) having a detector gas containing a neon gas or a helium gas.
摘要翻译：一种X射线荧光光谱仪，用于通过从X射线管（11）照射样品（S）的初级X射线来测量样品（S）中所含的硫的浓度，所述X射线荧光光谱仪从样品（S），并用X射线检测器检测单色荧光X射线。光谱仪包括具有包含铬的元素的靶的X射线管（11），设置在X射线管（11）和样品之间的X射线行进路径上的X射线过滤器（13）（S），并且对于来自X射线管（11）的Cr-Kα线具有预定的透射率，并且由在S-Kα线和Cr-Kα线的能量之间不存在吸收边缘的元素的材料制成，以及具有包含氖气或氦气的检测器气体的比例计数器（18）。

5. 发明申请

US20090116613A1 X-RAY FLUORESCENCE SPECTROMETER 有权
标题翻译： X射线荧光光谱仪
公开(公告)号：US20090116613A1
公开(公告)日：2009-05-07
申请号：US12296383
申请日：2006-11-24
申请人： Yoshiyuki Kataoka , Hisayuki Kohno , Noboru Yamashita , Makoto Doi
发明人： Yoshiyuki Kataoka , Hisayuki Kohno , Noboru Yamashita , Makoto Doi
IPC分类号： G01N23/223
CPC分类号： G01N23/223 , G01N2223/076
摘要： An X-ray fluorescence spectrometer for measuring the concentration of sulfur contained in a sample (S), by irradiating the sample (S) with primary X-rays from an X-ray tube (11), monochromating fluorescent X-rays emitted from the sample (S) with a spectroscopic device, and detecting monochromated fluorescent X-rays with an X-ray detector. The spectrometer includes the X-ray tube (11) having a target with an element including chromium, an X-ray filter (13) disposed on a path of travel of X-rays between the X-ray tube (11) and the sample (S) and having a predetermined transmittance for Cr—Kα line from the X-ray tube (11) and made of a material which is an element of which absorption edges do not exist between energies of S—Kα line and Cr—Kα line, and a proportional counter (18) having a detector gas containing a neon gas or a helium gas.
摘要翻译：一种X射线荧光光谱仪，用于通过从X射线管（11）照射样品（S）的初级X射线来测量样品（S）中所含的硫的浓度，所述X射线荧光光谱仪从样品（S），并用X射线检测器检测单色荧光X射线。光谱仪包括具有包含铬的元素的靶的X射线管（11），设置在X射线管（11）和样品之间的X射线行进路径上的X射线过滤器（13）（S），并且对于来自X射线管（11）的Cr-Kalpha线具有预定的透射率，并且由在S-Kalpha线和Cr-Kalpha线的能量之间不存在吸收边缘的元素的材料制成，以及具有包含氖气或氦气的检测器气体的比例计数器（18）。

6. 发明申请

US20060153332A1 X-ray fluorescence analyzer 审中-公开
标题翻译： X射线荧光分析仪
公开(公告)号：US20060153332A1
公开(公告)日：2006-07-13
申请号：US10545612
申请日：2004-03-11
申请人： Hisayuki Kohno , Takashi Shoji , Makoto Doi
发明人： Hisayuki Kohno , Takashi Shoji , Makoto Doi
IPC分类号： G01T1/36
CPC分类号： G21K1/06 , G01N23/223 , G01N2223/076
摘要： A wavelength dispersion type X-ray fluorescence spectrometer, though simple and inexpensive in structure owning to the use of a single X-ray detector, has a capability of measuring the respective intensities of a plurality of secondary X-rays of different wavelengths with a sufficient sensitivity over a wide range. The spectrometer includes an X-ray source (3), a divergence slit (5), an analyzing crystal (7), and a single detector (9), in which a plurality of bent analyzing crystals (7A and 7B), fixedly arranged in a direction, in which the optical paths (6 and 8) of travel of the secondary X-rays spread as viewed from a sample (1) and the detector (9), are used as the analyzing crystal (7) to thereby measure the respective intensities of the plural secondary X-rays (8a and 8b) of the different wavelength.
摘要翻译：波长色散型X射线荧光光谱仪虽然简单且成本低廉，但是具有使用单个X射线检测器的结构，但是具有能够以足够的方式测量多个不同波长的次级X射线的各自的强度灵敏度在很大范围内。光谱仪包括多个弯曲分析晶体（7A和7B）的X射线源（3），发散狭缝（5），分析晶体（7）和单个检测器（9）固定地布置在从样品（1）和检测器（9）观察时扩展的次级X射线的行进光路（6和8）用作分析晶体（7）至从而测量不同波长的多个二次X射线（8a和8b）的强度。

7. 发明授权

US06240159B1 Fluorescent X-ray analyzer with path switching device 失效
标题翻译：带路径切换装置的荧光X射线分析仪
公开(公告)号：US06240159B1
公开(公告)日：2001-05-29
申请号：US09456480
申请日：1999-12-07
申请人： Hisayuki Kohno , Shirou Higaki
发明人： Hisayuki Kohno , Shirou Higaki
IPC分类号： G01N23223
CPC分类号： G21K1/06 , G01J3/04 , G01N23/207
摘要： A fluorescent X-ray analyzer has at least three optical detection paths along which the secondary fluorescent X-ray to be analyzed travels selectively and includes a monochromator (6) carried by a first spindle (14) having a longitudinal axis (O) passing in touch with a light receiving surface of the monochromator (6). A first detector (8A) for measuring the intensity of at least a portion of the secondary X-ray (7) monochromatized by the monochromator (6) while allowing the remaining portion of the secondary X-ray (7) to pass therethrough, and a light receiving slit member (11) for passing the secondary X-ray (7) monochromatized by the monochromator (6) therethrough are carried by a second spindle (17) in side-by-side relation in a circumferential direction. A third spindle (20) is utilized separate from the second spindle (17) for carrying a second detector (8B) for measuring the intensity of the secondary X-ray (7) having passed through the first detector (8A) or the light receiving slit member (11).
摘要翻译：荧光X射线分析仪具有至少三个光学检测路径，待分析的次要荧光X射线沿着该光路检测路径选择性行进，并且包括由第一主轴（14）承载的单色仪（6），第一心轴（14）具有纵向轴线（O）与单色仪（6）的光接收表面接触。第一检测器（8A），用于测量由单色仪（6）单色化的二次X射线（7）的至少一部分的强度，同时允许次X射线（7）的剩余部分通过其中，以及用于使由单色仪（6）单色化的次级X射线（7）穿过的光接收狭缝构件（11）通过第二心轴（17）沿圆周方向并排地承载。使用与第二主轴（17）分离的第三主轴（20），用于承载用于测量已经通过第一检测器（8A）的次级X射线（7）的强度的第二检测器（8B）或光接收狭缝构件（11）。

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