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    • 9. 发明申请
    • MAGNETO-RESISTIVE EFFECT DEVICE, THIN-FILM MAGNETIC HEAD, HEAD GIMBAL ASSEMBLY, AND HARD DISK SYSTEM
    • 磁阻效应器件,薄膜磁头,头盖组件和硬盘系统
    • US20080117554A1
    • 2008-05-22
    • US11943171
    • 2007-11-20
    • Shinji HaraKei HirataKoji ShimazawaYoshihiro TsuchiyaTomohito Mizuno
    • Shinji HaraKei HirataKoji ShimazawaYoshihiro TsuchiyaTomohito Mizuno
    • G11B5/127
    • G11B5/59683
    • The invention provides a giant magneto-resistive effect device having a CPP structure comprising a spacer layer, and a fixed magnetization layer and a free layer stacked one upon another with said spacer layer interposed between them, wherein the free layer functions such that its magnetization direction changes depending on an external magnetic field, and the spacer layer comprises a first nonmagnetic metal layer and a second nonmagnetic metal layer, each formed of a nonmagnetic metal material, and a semiconductor oxide layer interposed between them, wherein the semiconductor oxide layer forming a part of the spacer layer comprises zinc oxide as a main ingredient, wherein the main ingredient zinc oxide contains at least one selected from among oxides containing a trivalent cation of Al2O3, Ga2O3, In2O3, and B2O3, and a tetravalent cation of TiO2. It is thus possible to make thicker the semiconductor oxide layer forming a part of the spacer layer while keeping the device's area resistivity low as desired, thereby offering the advantages: much higher MR performance with much less variable device's area resistivity, and much more improved film performance reliability.
    • 本发明提供一种具有包括间隔层的CPP结构的巨磁阻效应器件,以及一个彼此层叠的所述间隔层彼此层叠的固定磁化层和自由层,其中自由层的功能是使其磁化方向 变化取决于外部磁场,并且间隔层包括由非磁性金属材料形成的第一非磁性金属层和第二非磁性金属层以及介于它们之间的半导体氧化物层,其中形成部分的半导体氧化物层 的间隔层包含氧化锌作为主要成分,其中主要成分氧化锌含有选自含有三价阳离子的氧化物中的至少一种,其中含有三价阳离子的Al 2 O 3, Ga 2 O 3,以及B 2 O 3,以及B 2 O 3, SUB> 3 <! - SIPO - >和TiO 2的四价阳离子。 因此,可以使形成间隔层的一部分的半导体氧化物层变得更厚,同时保持器件的面积电阻率为期望的低,从而具有以下优点:MR性能更高,可变器件的面积电阻率更小得多,并且更多改进的膜 性能可靠性。