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1. 发明授权

US06452416B1 Abnormality detecting apparatus for a rotating electric machine 有权
标题翻译：旋转电机异常检测装置
公开(公告)号：US06452416B1
公开(公告)日：2002-09-17
申请号：US09575526
申请日：2000-05-22
申请人： Yoshiharu Kaneda , Takao Tsurimoto , Nobuo Urakawa
发明人： Yoshiharu Kaneda , Takao Tsurimoto , Nobuo Urakawa
IPC分类号： G01R3134
CPC分类号： G01R31/343 , G01R31/1263
摘要： An abnormality detecting apparatus in which noise is rejected in determining the condition of each of rotating electrical machines, so that a partial discharge of a rotating electric machine is detected with high accuracy. The abnormality detecting apparatus includes partial discharge detectors for detecting a partial discharge of a rotating electrical machine, a switching unit for selecting a partial discharge detector, a partial discharge measurement section for measuring the signal from the selected switch, a computer for selecting the respective partial discharge detectors or sequentially selecting respective partial discharge detectors for measurement, noise rejection, insulation diagnosis judgement, and data management for the respective discharge detectors, and for displaying measurement results, and a control section for controlling the switching unit and the partial discharge measurement section through the computer.
摘要翻译：在确定每个旋转电机的状况下噪声被拒绝的异常检测装置，从而以高精度检测旋转电机的局部放电。异常检测装置包括用于检测旋转电机的局部放电的局部放电检测器，用于选择局部放电检测器的切换单元，用于测量来自所选开关的信号的局部放电测量部分，用于选择各部分放电检测器或者依次选择用于各放电检测器的测量，噪声抑制，绝缘诊断判断和数据管理的各个局部放电检测器，以及用于显示测量结果的控制部分，以及用于控制开关单元和局部放电测量部分的控制部分电脑

2. 发明授权

US09335380B2 Device for detecting insulation degradation 有权
标题翻译：绝缘降解检测装置
公开(公告)号：US09335380B2
公开(公告)日：2016-05-10
申请号：US13254696
申请日：2010-02-08
申请人： Yoshimasa Watanabe , Ryuichi Nishiura , Yoshiharu Kaneda , Hiroshi Nishizawa , Toru Oka , Hirotaka Muto , Toshiki Tanaka , Yoji Tsutsumishita
发明人： Yoshimasa Watanabe , Ryuichi Nishiura , Yoshiharu Kaneda , Hiroshi Nishizawa , Toru Oka , Hirotaka Muto , Toshiki Tanaka , Yoji Tsutsumishita
IPC分类号： G01R31/34 , G01R31/12
CPC分类号： G01R31/343 , G01R31/1227
摘要： The invention is related to a device for detecting insulation degradation in an inverter-driven load device, in particular a motor, the device including: zero-phase current measuring means for measuring a zero-phase current in power-feed lines, provided in the power-feed lines between an inverter device and the motor; and command control means for putting rotation of the motor on standby; wherein the zero-phase current measuring means measures the total of phase currents fed into respective phases so as not to rotate a shaft even when an external force is applied to the shaft during the rotation being on standby, whereby allowing regular detection of insulation degradation without switching over the power-feed lines connected with the load device.
摘要翻译：本发明涉及一种用于检测逆变器驱动的负载装置，特别是电动机中的绝缘劣化的装置，该装置包括：零相电流测量装置，用于测量供电线路中的零相电流，逆变器装置与电动机之间的供电线; 以及指令控制装置，用于使马达的转动置于待机状态; 其中零相电流测量装置测量馈送到各相中的相电流的总和，以便即使当旋转期间外部力施加到轴时也不转动轴，从而允许定期检测绝缘降级而不会切换与负载设备连接的供电线路。

3. 发明授权

US07985624B2 Method of manufacturing semiconductor device having plural dicing steps 失效
标题翻译：具有多个切割步骤的半导体器件的制造方法
公开(公告)号：US07985624B2
公开(公告)日：2011-07-26
申请号：US12203189
申请日：2008-09-03
申请人： Yoshiharu Kaneda
发明人： Yoshiharu Kaneda
IPC分类号： H01L21/56 , H01L23/28
CPC分类号： H01L23/3185 , H01L21/78 , H01L24/48 , H01L2224/48091 , H01L2224/73265 , H01L2924/00014 , H01L2924/01078 , H01L2924/01079 , H01L2224/45099 , H01L2224/45015 , H01L2924/207
摘要： Provided is a method of manufacturing a semiconductor device including: arranging multiple dies planarly between a first lead frame plate and a second lead frame plate, which face each other, to connect the multiple semiconductor chips to each of the first lead frame plate and the second lead frame plate; filling a resin between the first lead frame plate and the second lead frame plate to seal the multiple dies; performing a first dicing on a laminated body including the first lead frame plate, the resin, and the second lead frame plate, between the adjacent dies, to separate at least the first lead frame plate by cutting; applying plating to the laminated body with at least the first lead frame plate being separated by cutting; and performing a second dicing on a remainder of the laminated body between the adjacent dies, to separate the laminated body into individual semiconductor devices.
摘要翻译：提供一种制造半导体器件的方法，包括：在彼此面对的第一引线框架板和第二引线框架板之间平面地布置多个管芯，以将多个半导体芯片连接到第一引线框架板和第二引线框架板引线框板; 在第一引线框架板和第二引线框架板之间填充树脂以密封多个模具; 在相邻的模具之间在包括第一引线框架板，树脂和第二引线框架板的层叠体上进行第一切割，以通过切割分开至少第一引线框架板; 将至少第一引线框架板通过切割分开来对层压体进行电镀; 并且在相邻模具之间的层叠体的其余部分上进行第二切割，以将层压体分离成单独的半导体器件。

4. 发明申请

US20080029857A1 Semiconductor device comprising an excess resin portion, manufacturing method thereof, and apparatus for manufacturing semiconductor device comprising a excess resin portion 有权
标题翻译：包含多余的树脂部分的半导体器件，其制造方法以及包含多余的树脂部分的半导体器件的制造装置
公开(公告)号：US20080029857A1
公开(公告)日：2008-02-07
申请号：US11882415
申请日：2007-08-01
申请人： Toshinori Kiyohara , Yoshiharu Kaneda , Yoshikazu Takada
发明人： Toshinori Kiyohara , Yoshiharu Kaneda , Yoshikazu Takada
IPC分类号： H01L21/301 , H01L21/02 , H01L23/28 , H01L23/495
CPC分类号： H01L21/4842 , H01L2924/0002 , H01L2924/00
摘要： A partly finished product of a semiconductor device includes a resin body encapsulating a semiconductor chip, first and second leads extended outwardly from the resin body, a dam bar connected between said first and second leads, and an excess resin portion protruding from the resin body between the first and second leads and the dam bar. The excess resin portion is cut off at two limited portions, and thereby two groove portions are formed in the excess resin portion. An apparatus for cutting the dam bar includes a punch having a cutting edge for cutting connection portions between the first and second leads and the dam bar and for cutting off the two limited portions of the excess resin portion. Since the cut region of the excess resin portion becomes smaller, a stress imparted to the resin body and/or the semiconductor chip through the excess resin portion can be smaller.
摘要翻译：半导体器件的部分成品包括封装半导体芯片的树脂体，从树脂体向外延伸的第一和第二引线，连接在所述第一和第二引线之间的阻挡杆和从树脂体之间突出的多余的树脂部分，第一和第二引线和坝条。在两个限制部分切断多余的树脂部分，从而在过剩的树脂部分中形成两个槽部。一种用于切割挡板的设备包括具有用于切割第一和第二引线与阻挡杆之间的连接部分的切割边缘并用于切断多余树脂部分的两个限制部分的冲头。由于过剩树脂部分的切割区域变小，所以通过多余的树脂部分赋予树脂体和/或半导体芯片的应力可以更小。

5. 发明申请

US20110320146A1 DEVICE FOR DETECTING INSULATION DEGRADATION 有权
标题翻译：用于检测绝缘降解的装置
公开(公告)号：US20110320146A1
公开(公告)日：2011-12-29
申请号：US13254696
申请日：2010-02-08
申请人： Yoshimasa Watanabe , Ryuichi Nishiura , Yoshiharu Kaneda , Hiroshi Nishizawa , Toru Oka , Hirotaka Muto , Toshiki Tanaka , Yoji Tsutsumishita
发明人： Yoshimasa Watanabe , Ryuichi Nishiura , Yoshiharu Kaneda , Hiroshi Nishizawa , Toru Oka , Hirotaka Muto , Toshiki Tanaka , Yoji Tsutsumishita
IPC分类号： G06F19/00
CPC分类号： G01R31/343 , G01R31/1227
摘要： The invention is related to a device for detecting insulation degradation in an inverter-driven load device, in particular a motor, the device including: zero-phase current measuring means for measuring a zero-phase current in power-feed lines, provided in the power-feed lines between an inverter device and the motor; and command control means for putting rotation of the motor on standby; wherein the zero-phase current measuring means measures the total of phase currents fed into respective phases so as not to rotate a shaft even when an external force is applied to the shaft during the rotation being on standby, whereby allowing regular detection of insulation degradation without switching over the power-feed lines connected with the load device.
摘要翻译：本发明涉及一种用于检测逆变器驱动的负载装置，特别是电动机中的绝缘劣化的装置，该装置包括：零相电流测量装置，用于测量供电线路中的零相电流，逆变器装置与电动机之间的供电线; 以及指令控制装置，用于使马达的转动置于待机状态; 其中零相电流测量装置测量馈送到各相中的相电流的总和，以便即使当旋转期间外部力施加到轴时也不转动轴，从而允许定期检测绝缘降级而不会切换与负载设备连接的供电线路。

6. 发明授权

US07858447B2 Lead frame, semiconductor device, and method of manufacturing semiconductor device 失效
标题翻译：引线框架，半导体器件和半导体器件的制造方法
公开(公告)号：US07858447B2
公开(公告)日：2010-12-28
申请号：US12203374
申请日：2008-09-03
申请人： Yoshiharu Kaneda
发明人： Yoshiharu Kaneda
IPC分类号： H01L21/50 , H01L21/48 , H01L21/44
CPC分类号： H01L23/49575 , H01L23/49537 , H01L24/97 , H01L2224/05124 , H01L2224/05155 , H01L2224/05166 , H01L2224/05568 , H01L2224/05573 , H01L2224/05639 , H01L2224/05644 , H01L2224/16 , H01L2224/16245 , H01L2924/01021 , H01L2924/01078 , H01L2924/01079 , H01L2924/181 , H01L2924/00 , H01L2924/00014
摘要： A lead frame according to one aspect of the present invention is used for a resin-sealed-type semiconductor device and includes a first lead frame having a frame body part and a lead part, and a second lead frame having a frame body part and a lead part. The lead part of the first lead frame and the lead part of the second lead frame do not contact with each other and an inner lead part formed in the lead part of the first lead frame and an inner lead part formed in the lead part of the second lead frame are provided in substantially the same plane when the frame body part of the first lead frame and the frame body part of the second lead frame are laminated together.
摘要翻译：根据本发明的一个方面的引线框架用于树脂密封型半导体器件，并且包括具有框体部分和引线部分的第一引线框架和具有框体部分和第二引线框架的第二引线框架引导部分。第一引线框架的引线部分和第二引线框架的引线部分彼此不接触，并且形成在第一引线框架的引线部分中的内引线部分和形成在引线部分的引线部分中的内引线部分当第一引线框架的框架主体部分和第二引线框架的框架主体部分层叠在一起时，第二引线框架设置在基本相同的平面中。

7. 发明授权

US06677666B2 Lead frame for fabricating surface mount type semiconductor devices with high reliability 失效
标题翻译：用于制造具有高可靠性的表面贴装型半导体器件的引线框架
公开(公告)号：US06677666B2
公开(公告)日：2004-01-13
申请号：US10318068
申请日：2002-12-13
申请人： Yoshiharu Kaneda , Tokuhiro Uchiyama
发明人： Yoshiharu Kaneda , Tokuhiro Uchiyama
IPC分类号： H01L23495
CPC分类号： H01L23/49562 , H01L24/48 , H01L24/49 , H01L2224/05599 , H01L2224/48091 , H01L2224/48247 , H01L2224/49171 , H01L2224/85399 , H01L2924/00014 , H01L2924/181 , H01L2924/18301 , H01L2924/00 , H01L2224/45015 , H01L2924/207 , H01L2224/45099 , H01L2924/00012
摘要： A lead frame and a semiconductor device fabricated by using the same. The lead frame comprises: first and second band shaped members disposed parallel to each other; a plurality of island portions for mounting semiconductor pellets thereon having first end portions connected to the first band shaped member; coupling strip each provided for one of the island portions whose first end portion connects to a second end portion of each of the island portions and whose second end portion connects to the second band shaped member. The lead frame further comprises at least one electrode portion for each of the island portions and electrically coupled with a corresponding electrode of the semiconductor pellet. The at least one electrode portion is disposed between each of the island portions and the second band shaped member, a first end portion thereof is connected to the second band shaped member, and a second end portion thereof is opposed to the second end portion of each of the island portions.
摘要翻译：引线框架和使用其制造的半导体器件。引线框架包括：彼此平行设置的第一和第二带状构件; 多个岛部，用于在其上安装半导体颗粒，其第一端部连接到第一带状构件; 每个岛状部分的一个岛部，其第一端部连接到每个岛部的第二端部，并且其第二端部连接到第二带状构件。引线框架还包括用于每个岛部分的至少一个电极部分并与半导体芯片的相应电极电耦合。至少一个电极部分设置在每个岛部分和第二带状构件之间，其第一端部连接到第二带状构件，并且其第二端部与第二带状构件的第二端部相对的岛屿部分。

8. 发明申请

US20120319699A1 INSULATION DETERIORATION DIAGNOSIS APPARATUS 有权
标题翻译：绝缘检测诊断装置
公开(公告)号：US20120319699A1
公开(公告)日：2012-12-20
申请号：US13582758
申请日：2011-04-04
申请人： Yoshimasa Watanabe , Yoshiharu Kaneda , Hiroshi Nishizawa , Toru Oka
发明人： Yoshimasa Watanabe , Yoshiharu Kaneda , Hiroshi Nishizawa , Toru Oka
IPC分类号： G01R31/12
CPC分类号： G01R31/025 , G01R31/14 , G01R31/34 , G01R31/40
摘要： The invention is related to an insulation deterioration diagnostic apparatus for an electric path connected between an inverter device and an inverter-driven load device, including: a zero-phase current transformer having an annular magnetic core, a magnetizing coil wound around the magnetic core, and a detecting coil wound around the magnetic core, the transformer being for detecting a zero-phase current of an electric path; a magnetization control circuit for supplying an alternating current having a frequency at least twice as high as a drive frequency of the load device to the magnetizing coil to magnetize the magnetic core; and a frequency extracting circuit for extracting a frequency component identical to the drive frequency fd, from the output signal of the detecting coil, whereby precisely measuring a current leaking from an inverter-driven load device over a wide range of frequencies.
摘要翻译：本发明涉及一种连接在逆变器装置和逆变器驱动的负载装置之间的电路的绝缘劣化诊断装置，包括：具有环形磁芯，缠绕在磁芯上的磁化线圈的零相电流互感器，以及缠绕在所述磁芯上的检测线圈，所述变压器用于检测电路的零相电流; 磁化控制电路，用于将具有至少两倍于负载装置的驱动频率的频率的交流电提供给磁化线圈以磁化磁芯; 以及频率提取电路，用于从检测线圈的输出信号中提取与驱动频率fd相同的频率分量，从而精确地测量在宽频率范围内从逆变器驱动的负载装置泄漏的电流。

9. 发明授权

US5828227A Abnormality detecting apparatus for electric equipment, particularly for a rotating electric machine 失效
标题翻译：用于电气设备的异常检测装置，特别是用于旋转电机的异常检测装置
公开(公告)号：US5828227A
公开(公告)日：1998-10-27
申请号：US846316
申请日：1997-04-30
申请人： Tetsu Shiota , Hideki Tokura , Kenji Morimoto , Takaho Tanaka , Yoshiharu Kaneda , Keiichi Itoh , Ken Kimura , Shigeo Kitamura
发明人： Tetsu Shiota , Hideki Tokura , Kenji Morimoto , Takaho Tanaka , Yoshiharu Kaneda , Keiichi Itoh , Ken Kimura , Shigeo Kitamura
IPC分类号： G01R23/00 , G01R31/00 , G01R31/12 , G01R31/34 , G05B23/02
CPC分类号： G01R31/1227 , G01R31/1254 , G01R31/343 , G01R31/34
摘要： An abnormality detecting method and apparatus for electrical equipment measures the frequency spectrum of a signal detected by a partial discharge sensor and detects a partial discharge signal having a frequency component in the neighborhood of a resonance frequency to detect the abnormality of the electrical equipment. The resonance frequency is determined on the basis of the electrical equipment and the measuring circuit. Where the electrical equipment is a rotating electric machine, the resonance frequency is determined on the basis of the length of the stator core, and a narrow bandpass filter circuit passes a frequency component around a resonance frequency to detect a partial discharge signal from the passed signal.
摘要翻译：用于电气设备的异常检测方法和装置测量由局部放电传感器检测到的信号的频谱，并检测具有在谐振频率附近的频率分量的局部放电信号，以检测电气设备的异常。谐振频率基于电气设备和测量电路确定。在电气设备是旋转电机的情况下，谐振频率基于定子铁芯的长度来确定，窄带通滤波器电路通过谐振频率周围的频率分量，以从通过的信号中检测局部放电信号。

10. 发明授权

US5680059A Abnormality detecting method and apparatus for electric equipment, particularly for a rotating electric machine 失效
标题翻译：电气设备异常检测方法及装置，特别适用于旋转电机
公开(公告)号：US5680059A
公开(公告)日：1997-10-21
申请号：US359427
申请日：1994-12-20
申请人： Tetsu Shiota , Hideki Tokura , Kenji Morimoto , Takaho Tanaka , Yoshiharu Kaneda , Keiichi Itoh , Ken Kimura , Shigeo Kitamura
发明人： Tetsu Shiota , Hideki Tokura , Kenji Morimoto , Takaho Tanaka , Yoshiharu Kaneda , Keiichi Itoh , Ken Kimura , Shigeo Kitamura
IPC分类号： G01R23/00 , G01R31/00 , G01R31/12 , G01R31/34 , G05B23/02 , G01R31/02
CPC分类号： G01R31/1227 , G01R31/1254 , G01R31/343 , G01R31/34
摘要： The abnormality detecting method and apparatus for electric equipment measure the frequency spectrum of a signal detected by a partial discharge sensor 9, and detect a partial discharge signal having a frequency component in the neighborhood of a resonance frequency determined on the basis of the electric equipment and its measuring circuit, then detect the abnormality of the electric equipment. In a rotating electric machine particularly, the narrow band filter circuit 23 passes a frequency component around a resonance frequency determined on the basis of the length of the stator core to detect a partial discharge signal from the passed signal.
摘要翻译：电气设备的异常检测方法和装置测量由局部放电传感器9检测的信号的频谱，并且检测具有基于电气设备确定的共振频率附近的频率分量的局部放电信号，以及其测量电路，然后检测电气设备的异常。特别地，在旋转电机中，窄带滤波器电路23通过基于定子铁芯的长度确定的共振频率的频率分量，以从通过的信号检测局部放电信号。

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