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    • 6. 发明申请
    • Defect detection circuit
    • 缺陷检测电路
    • US20060120188A1
    • 2006-06-08
    • US11261639
    • 2005-10-31
    • Nobuyuki MitsuiMotonori Taniguchi
    • Nobuyuki MitsuiMotonori Taniguchi
    • G11C29/00G11C7/00
    • G11B7/00375G11B19/04
    • A defect detection circuit capable of accurately detecting a defect existing in correspondence with a time period in which the operation of an optical disk unit is changed from recording operation to reproducing operation or from reproducing operation to recording operation. When the operation of the optical disk unit is changed, a mono-multi circuit outputs a signal MM1 for turning on the switch in an integration circuit to reduce the time constant of the integration circuit. A logic circuit is supplied with a defect detection circuit DD output from a comparator and the output signal MM1 from the mono-multi circuit, executes a computation to make ineffective the signal MM1 during a time period during which the defect detection signal DD indicates the existence of a defect, and outputs a signal CP to the switch in the integration circuit.
    • 一种缺陷检测电路,其能够精确地检测与光盘单元的操作从记录操作改变为再现操作或从再现操作到记录操作的时间段相对应地存在的缺陷。 当光盘单元的操作改变时,单声道多路电路输出用于使积分电路中的开关导通的信号MM 1,以减小积分电路的时间常数。 在逻辑电路中提供从比较器输出的缺陷检测电路DD和来自单声道多路电路的输出信号MM 1,在缺陷检测信号DD指示的时间段期间执行计算使信号MM 1无效 存在缺陷,并将信号CP输出到积分电路中的开关。