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    • 3. 发明申请
    • Controller for Gas Turbine Power Plant
    • 燃气轮机发电厂控制器
    • US20140033720A1
    • 2014-02-06
    • US13983140
    • 2011-02-04
    • Eunkyeong KimKazuhito KoyamaShigeo HatamiyaYukinori KatagiriTakuya YoshidaNaohiro KusumiKazuo Takahashi
    • Eunkyeong KimKazuhito KoyamaShigeo HatamiyaYukinori KatagiriTakuya YoshidaNaohiro KusumiKazuo Takahashi
    • F02C9/00
    • F02C9/00F02C3/30F02C7/1435F02C9/20
    • A controller for use in a gas turbine power plant includes a compressor that compresses combustion air; a water-atomization cooling apparatus that sprays water drops of atomized water supplied via a water-atomization flow-rate regulating valve over a flow of air drawn in the compressor; a combustor that mixes the compressed combustion air with fuel to thereby burn a fuel-air mixture and generate combustion gas at high temperature and performs combustion switching during operation; a turbine that uses the combustion gas to drive the compressor and a generator; the water-atomization flow-rate regulating valve that controls a flow rate of the atomized water; and a compressor inlet inner blade that controls a flow rate of air drawn in the compressor. The controller includes control means that calculates a fuel-air ratio correction command signal for compensating for reduction in a fuel-air ratio in the combustor occurring during the combustion switching.
    • 用于燃气轮机发电厂的控制器包括压缩燃烧空气的压缩机; 水雾化冷却装置,其经由水雾化流量调节阀在压缩机内吸入的空气流喷射供给的水雾滴; 燃烧器,其将压缩的燃烧空气与燃料混合,从而燃烧燃料 - 空气混合物并在高温下产生燃烧气体并在运行期间进行燃烧切换; 使用燃烧气体驱动压缩机和发电机的涡轮机; 控制雾化水流量的水雾化流量调节阀; 以及压缩机入口内叶片,其控制在压缩机中吸入的空气的流量。 该控制器包括控制装置,该控制装置计算用于补偿在燃烧切换期间发生的燃烧室中的燃料空气比的降低的燃料空气比校正指令信号。
    • 9. 发明授权
    • Cylindrical cosmetic container
    • 圆柱形化妆品容器
    • US08651759B2
    • 2014-02-18
    • US12423179
    • 2009-04-14
    • Kazuo TakahashiTakahiro KusumotoKenichi HiyamaYoshinobu AbeYutaka Mihara
    • Kazuo TakahashiTakahiro KusumotoKenichi HiyamaYoshinobu AbeYutaka Mihara
    • B43K21/08B43K21/00
    • A45D40/00
    • A cylindrical cosmetic container with an inner cap (7) inside a cap (5) fit outside an upper end of a container body (X) uses a first motion resistance at a halfway covering posture to an immediately preceding covering posture and a second motion resistance from the immediately preceding covering posture to a fully cover posture while the container body (X) is covered with the cap (5), in which the inner cap (7) includes a protrusion (7f) to deform towards an outer diameter side while applying the first motion resistance by being pressed into sliding contact with an extending upper end (4c) of the container body (X) and a projection (7d) projecting from an outer circumferential surface for applying the second motion resistance greater than the first motion resistance when a convex rib (4b) moves over the projection (7d).
    • 在容器主体(X)的上端外侧的盖(5)内部具有内盖(7)的圆筒状的化妆品容器,以中间覆盖姿态的第一运动阻力与前一个覆盖姿势和第二运动阻力 当所述容器主体(X)被所述盖(5)覆盖时,所述内盖(7)包括突起(7f),所述突起(7f)在施加时朝向外径侧变形 通过与容器主体(X)的延伸的上端(4c)压入滑动接触的第一运动阻力和从外周面突出的用于施加大于第一运动阻力的第二运动阻力的突起(7d) 凸肋(4b)在突起(7d)上方移动。
    • 10. 发明申请
    • INSPECTION APPARATUS
    • 检查装置
    • US20130271754A1
    • 2013-10-17
    • US13993814
    • 2011-11-09
    • Nobuaki HiroseTakahiro JinguHidetoshi NishiyamaKazuo TakahashiHisashi Hatano
    • Nobuaki HiroseTakahiro JinguHidetoshi NishiyamaKazuo TakahashiHisashi Hatano
    • G01N21/95
    • G01N21/9501G01N21/95623
    • This invention implements reduction in the amount of background-scattered light from a semiconductor wafer surface and highly sensitive inspection, without increasing the number of detectors. A surface inspection apparatus that detects defects on the surface of an object (semiconductor wafer surface) to be inspected, by irradiating the surface of the object with a beam of light such as laser light and detecting the light reflected or scattered from the surface; wherein a widely apertured lens with an optical Fourier transform function is disposed between the object to be inspected and a detector, a filter variable in position as well in aperture diameter is provided on a Fourier transform plane, and background-scattered light from the semiconductor wafer surface is effectively blocked, whereby only a signal from a defect such as a foreign substance is detected.
    • 本发明实现了半导体晶片表面的背景散射光的量的减少和高灵敏度的检查,而不增加检测器的数量。 一种表面检查装置,其通过用诸如激光的光束照射物体的表面来检测从表面反射或散射的光来检测待检查的物体(半导体晶片表面)的表面上的缺陷; 其中具有光学傅里叶变换功能的广泛有孔的透镜设置在待检查对象与检测器之间,在傅里叶变换平面上设置了孔径直径可变的滤光器以及来自半导体晶片的背景散射光 表面被有效地阻挡,从而仅检测到诸如异物的缺陷的信号。