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    • 1. 发明申请
    • BUS SYSTEM AND SEMICONDUCTOR INTEGRATED CIRCUIT
    • 总线系统和半导体集成电路
    • US20070255872A1
    • 2007-11-01
    • US11780031
    • 2007-07-19
    • Yasuhiro TAWARAJunichi Nishimoto
    • Yasuhiro TAWARAJunichi Nishimoto
    • G06F13/00
    • G06F13/404
    • A technology for allowing easy handling of a change in the address range of the subject of access or any of bus masters is provided. There is provided an address monitor unit including a table which is shared among a plurality of bus masters and stores therein access right information that has been preset in correspondence to the subject of access and to address information corresponding thereto and capable of determining, by referencing the table, the presence or absence of an access right for each of the bus masters based on the subject-of-access information of each of the bus masters and on address information outputted from the bus master. Since the table is shared among the plurality of bus masters, when the address range of the subject of access or any of the bus masters is changed, the table may be rewritten appropriately. This allows, when a plurality of bus masters are connected to a common bus, easy handling of a change in the address range of the subject of access or any of the bus masters.
    • 提供了一种允许容易地处理访问主体的地址范围或任何总线主机的改变的技术。 提供了一种地址监视器单元,包括在多个总线主机之间共享的表,其中存储对应于访问对象预先设置的访问权限信息和与其对应的地址信息,并且能够通过参考 基于每个总线主机的访问主体信息以及从总线主机输出的地址信息,每个总线主机的访问权限的存在或不存在。 由于在多个总线主机之间共享表,当访问对象的地址范围或任何总线主机的地址范围改变时,可以适当地重写表。 这允许当多个总线主机连接到公共总线时,容易地处理访问对象的地址范围的变化或任何总线主控器。
    • 3. 发明申请
    • Bus system and semiconductor integrated circuit
    • 总线系统和半导体集成电路
    • US20060080485A1
    • 2006-04-13
    • US11213795
    • 2005-08-30
    • Yasuhiro TawaraJunichi Nishimoto
    • Yasuhiro TawaraJunichi Nishimoto
    • G06F13/00
    • G06F13/404
    • A technology for allowing easy handling of a change in the address range of the subject of access or any of bus masters is provided. There is provided an address monitor unit including a table which is shared among a plurality of bus masters and stores therein access right information that has been preset in correspondence to the subject of access and to address information corresponding thereto and capable of determining, by referencing the table, the presence or absence of an access right for each of the bus masters based on the subject-of-access information of each of the bus masters and on address information outputted from the bus master. Since the table is shared among the plurality of bus masters, when the address range of the subject of access or any of the bus masters is changed, the table may be rewritten appropriately. This allows, when a plurality of bus masters are connected to a common bus, easy handling of a change in the address range of the subject of access or any of the bus masters.
    • 提供了一种允许容易地处理访问主体的地址范围或任何总线主机的改变的技术。 提供了一种地址监视器单元,包括在多个总线主机之间共享的表,其中存储对应于访问对象预先设置的访问权限信息和与其对应的地址信息,并且能够通过参考 基于每个总线主机的访问主体信息以及从总线主机输出的地址信息,每个总线主机的访问权限的存在或不存在。 由于在多个总线主机之间共享表,当访问对象的地址范围或任何总线主机的地址范围改变时,可以适当地重写表。 这允许当多个总线主机连接到公共总线时,容易地处理访问对象的地址范围的变化或任何总线主控器。
    • 8. 发明申请
    • Semiconductor integrated circuit incorporating test configuration and test method for the same
    • 半导体集成电路结合测试配置和测试方法相同
    • US20060282730A1
    • 2006-12-14
    • US11397899
    • 2006-04-05
    • Masayuki AraiKazuhiko IwasakiSatoshi FukumotoTakeshi ShodaJunichi Nishimoto
    • Masayuki AraiKazuhiko IwasakiSatoshi FukumotoTakeshi ShodaJunichi Nishimoto
    • G01R31/28
    • G01R31/318544G01R31/318536
    • An object of the invention is to drastically reduce the area overhead in a semiconductor integrated circuit incorporating a test configuration that uses a partially rotational scan circuit. To achieve this, in the semiconductor integrated circuit incorporating the test configuration that comprises a combinational circuit (3) and a scan chain (2) constructed by connecting a plurality of scan flip-flops (5) in a chain, the scan chain (2) is divided into a plurality of sub scan-chains (20a to 20n) each of which has a partially rotational scan (PRS) function and a test response compaction (MISR) function. By performing a scan test in a plurality of steps while changing the combination of the sub scan-chains to be set as PRS and the sub scan-chains to be set as MISR, the test can be performed without having to provide a test response compactor separately from the scan chain, and thus the area overhead can be reduced.
    • 本发明的一个目的是大大减少包含使用部分旋转扫描电路的测试配置的半导体集成电路中的面积开销。 为了实现这一点,在包括组合电路(3)和通过连接多个扫描触发器(5)构成的扫描链(2)的测试配置的半导体集成电路中,扫描链(2) )被分成多个子扫描链(20a至20n),每个子扫描链具有部分旋转扫描(PRS)功能和测试响应压缩(MISR)功能。 通过在将要设置为PRS的子扫描链和将被设置为MISR的副扫描链的组合改变的同时执行多个步骤中的扫描测试,可以执行测试而不必提供测试响应压缩器 与扫描链分开,因此可以减少面积开销。