专利快速检索-快速检索全球专利，免费商用专利数据库-IPRDB

1. 发明授权

US06898545B2 Semiconductor test data analysis system 失效
标题翻译：半导体测试数据分析系统
公开(公告)号：US06898545B2
公开(公告)日：2005-05-24
申请号：US10186171
申请日：2002-06-28
申请人： Yasuhiko Iguchi , Hiroshi Tamura , Mitsuhiro Enokida , Earl Louis Dombroski , Thomas Robert Claus
发明人： Yasuhiko Iguchi , Hiroshi Tamura , Mitsuhiro Enokida , Earl Louis Dombroski , Thomas Robert Claus
IPC分类号： G01R31/28 , H01L21/02 , H01L21/66
CPC分类号： G01R31/2846 , H01L22/20 , H01L2924/0002 , H01L2924/00
摘要： A semiconductor test data analysis system (1) automatically recording, during an analysis operation, operation information of the analysis operation, including analysis conditions or an analysis procedure for input test data, or analysis information obtained by the analysis operation. The analysis system includes a processing means (101), an analysis target data storage means (109), which stores the test data as analysis target data, a historical data storage means (107), which stores as historical data either operation information of the analysis operation or analysis information obtained by the analysis operation, and a display data storage means (112), which stores analysis information obtained by the analysis operation, which stores analysis display data generated by the processing means for the purpose of displaying the analysis information obtained by the analysis operation. In this system, when a new analysis operation is specified, the processing means (101) processes the input test data in accordance with the analysis operation, and processes at least one of the analysis target data, historical data, and display data by the new analysis operation.
摘要翻译：半导体测试数据分析系统（1）在分析操作期间自动记录分析操作的操作信息，包括分析条件或输入测试数据的分析程序或通过分析操作获得的分析信息。分析系统包括处理装置（101），存储测试数据作为分析目标数据的分析对象数据存储装置（109），历史数据存储装置（107），其存储作为历史数据的操作信息分析操作或通过分析操作获得的分析操作或分析信息;以及显示数据存储装置，其存储通过分析操作获得的分析信息，其存储由处理装置生成的用于显示所获得的分析信息的分析显示数据通过分析操作。在该系统中，当指定新的分析操作时，处理装置（101）根据分析操作处理输入的测试数据，并且通过新的处理处理分析目标数据，历史数据和显示数据中的至少一个分析操作。

2. 发明授权

US07035752B2 Semiconductor test data analysis system 失效
标题翻译：半导体测试数据分析系统
公开(公告)号：US07035752B2
公开(公告)日：2006-04-25
申请号：US11028823
申请日：2005-01-04
申请人： Yasuhiko Iguchi , Hiroshi Tamura , Mitsuhiro Enokida , Earl Louis Dombroski , Thomas Robert Claus
发明人： Yasuhiko Iguchi , Hiroshi Tamura , Mitsuhiro Enokida , Earl Louis Dombroski , Thomas Robert Claus
IPC分类号： H01L21/66
CPC分类号： G01R31/2846 , H01L22/20 , H01L2924/0002 , H01L2924/00
摘要： A semiconductor test data analysis system (1) automatically recording, during an analysis operation, operation information of the analysis operation, including analysis conditions or an analysis procedure for input test data, or analysis information obtained by the analysis operation. The analysis system includes a processing means (101), an analysis target data storage means (109), which stores the test data as analysis target data, a historical data storage means (107), which stores as historical data either operation information of the analysis operation or analysis information obtained by the analysis operation, and a display data storage means (112), which stores analysis information obtained by the analysis operation, which stores analysis display data generated by the processing means for the purpose of displaying the analysis information obtained by the analysis operation. In this system, when a new analysis operation is specified, the processing means (101) processes the input test data in accordance with the analysis operation, and processes at least one of the analysis target data, historical data, and display data by the new analysis operation.
摘要翻译：半导体测试数据分析系统（1）在分析操作期间自动记录分析操作的操作信息，包括分析条件或输入测试数据的分析程序或通过分析操作获得的分析信息。分析系统包括处理装置（101），存储测试数据作为分析目标数据的分析对象数据存储装置（109），历史数据存储装置（107），其存储作为历史数据的操作信息分析操作或通过分析操作获得的分析操作或分析信息;以及显示数据存储装置，其存储通过分析操作获得的分析信息，其存储由处理装置生成的用于显示所获得的分析信息的分析显示数据通过分析操作。在该系统中，当指定新的分析操作时，处理装置（101）根据分析操作处理输入的测试数据，并且通过新的处理处理分析目标数据，历史数据和显示数据中的至少一个分析操作。

你已经成功收藏专利！

检索式保存成功!

IPRDB

热门服务

关于我们

友情链接

联系方式